• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 6,351 matches

• 2018
• 
  Carmine Abbate, Giovanni Busatto, S. Mattiazzo, Annunziata Sanseverino, L. Silvestrin, D. Tedesco, Francesco Velardi:
  Progressive drain damage in SiC power MOSFETs exposed to ionizing radiation. Microelectron. Reliab. 88-90: 941-945 (2018)
• 
  Carmine Abbate, Giovanni Busatto, Annunziata Sanseverino, D. Tedesco, Francesco Velardi:
  Measure of high frequency input impedance to study the instability of power devices in short circuit. Microelectron. Reliab. 88-90: 540-544 (2018)
• 
  Carmine Abbate, Giovanni Busatto, Annunziata Sanseverino, D. Tedesco, Francesco Velardi:
  Failure analysis of 650 V enhancement mode GaN HEMT after short circuit tests. Microelectron. Reliab. 88-90: 677-683 (2018)
• 
  Roberto S. Aga, Eric B. Kreit, Steven R. Dooley, Carrie M. Bartsch, Emily M. Heckman, Rachel S. Aga:
  Considerations in printing conductive traces for high pulsed power applications. Microelectron. Reliab. 81: 342-351 (2018)
• 
  Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
  Impact and mitigation of SRAM read path aging. Microelectron. Reliab. 87: 158-167 (2018)
• 
  Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget:
  Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. 88-90: 920-924 (2018)
• 
  Ali Ahari, Alexander Viehl, Oliver Bringmann, Wolfgang Rosenstiel:
  Mission profile-based assessment of semiconductor technologies for automotive applications. Microelectron. Reliab. 91: 129-138 (2018)
• 
  Bahar Ahmadi, Bahram Javidi, Sina Shahbazmohamadi:
  Automated detection of counterfeit ICs using machine learning. Microelectron. Reliab. 88-90: 371-377 (2018)
• 
  Bahar Ahmadi, Pouya Tavousi, Joseph Favata, Peiman Shahbeigi-Roodposhti, Rengarajan Pelapur, Sina Shahbazmohamadi:
  A novel crowdsourcing platform for microelectronics counterfeit defect detection. Microelectron. Reliab. 88-90: 48-53 (2018)
• 
  Woojin Ahn, Sang Hoon Shin, Chunsheng Jiang, Hai Jiang, M. A. Wahab, Muhammad Ashraful Alam:
  Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits. Microelectron. Reliab. 81: 262-273 (2018)
• 
  S. Ahsan, Kamran Ali Khan Niazi, Hassan Abbas Khan, Yongheng Yang:
  Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules. Microelectron. Reliab. 88-90: 1014-1018 (2018)
• 
  Thomas Aichinger, Gerald Rescher, Gregor Pobegen:
  Threshold voltage peculiarities and bias temperature instabilities of SiC MOSFETs. Microelectron. Reliab. 80: 68-78 (2018)
• 
  Mohsen Akbari, Amir Sajjad Bahman, Paula Diaz Reigosa, Francesco Iannuzzo, Mohammad Tavakoli Bina:
  Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions. Microelectron. Reliab. 88-90: 1135-1140 (2018)
• 
  Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard:
  New defect detection approach using near electromagnetic field probing of high density PCBAs. Microelectron. Reliab. 88-90: 288-293 (2018)
• 
  Anton Alexeev, Genevieve Martin, Grigory Onushkin:
  Multiple heat path dynamic thermal compact modeling for silicone encapsulated LEDs. Microelectron. Reliab. 87: 89-96 (2018)
• 
  Bakhtiar Ali, Mohd Faizul Mohd Sabri, Suhana Binti Mohd Said, Nazatul Liana Sukiman, Iswadi Jauhari, Mohammad Hossein Mahdavifard:
  Microstructural and tensile properties of Fe and Bi added Sn-1Ag-0.5Cu solder alloy under high temperature environment. Microelectron. Reliab. 82: 171-178 (2018)
• 
  Roberto B. Almeida, Cleiton Magano Marques, Paulo F. Butzen, Fábio G. R. G. da Silva, Ricardo A. L. Reis, Cristina Meinhardt:
  Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies. Microelectron. Reliab. 88-90: 196-202 (2018)
• 
  Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, R. Muydinov, Bernd Szyszka, Christian Boit:
  IC security and quality improvement by protection of chip backside against hardware attacks. Microelectron. Reliab. 88-90: 22-25 (2018)
• 
  Oskar Amster, K. A. Rubin, Y. Yang, D. Iyer, Arron Messinger:
  Application of Scanning Microwave Microscopy nano-C-V to investigate dopant defect under a poly gate device. Microelectron. Reliab. 88-90: 250-254 (2018)
• 
  Tong An, Chao Fang, Fei Qin, Huaicheng Li, Tao Tang, Pei Chen:
  Failure study of Sn37Pb PBGA solder joints using temperature cycling, random vibration and combined temperature cycling and random vibration tests. Microelectron. Reliab. 91: 213-226 (2018)
• 
  Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer:
  Study of the operation and SET robustness of a CMOS pulse stretching circuit. Microelectron. Reliab. 82: 100-112 (2018)
• 
  Mattia Antonini, Paolo Cova, Nicola Delmonte, Alberto Castellazzi:
  GaN transistors efficient cooling by graphene foam. Microelectron. Reliab. 88-90: 812-816 (2018)
• 
  Faical Arabi, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont:
  Sequential combined thermal cycling and vibration test and simulation of printed circuit board. Microelectron. Reliab. 88-90: 768-773 (2018)
• 
  Besar Asllani, Asad Fayyaz, Alberto Castellazzi, Hervé Morel, Dominique Planson:
  V_TH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs. Microelectron. Reliab. 88-90: 604-609 (2018)
• 
  Jürgen Auersperg, Ellen Auerswald, Christian Collet, Thierry Dean, Dietmar Vogel, Thomas Winkler, Sven Rzepka:
  Investigations of the impact of initial stresses on fracture and delamination risks of an avionics MEMS pressure sensor. Microelectron. Reliab. 87: 238-244 (2018)
• 
  Oriol Avino-Salvado, Hervé Morel, Cyril Buttay, Denis Labrousse, Stéphane Lefebvre:
  Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode. Microelectron. Reliab. 88-90: 636-640 (2018)
• 
  Sarah Azimi, Luca Sterpone, Boyang Du, Luca Boragno:
  On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs. Microelectron. Reliab. 88-90: 936-940 (2018)
• 
  Hassen Aziza, Basma Hajri, Mohammad M. Mansour, Ali Chehab, Annie Pérez:
  A lightweight write-assist scheme for reduced RRAM variability and power. Microelectron. Reliab. 88-90: 6-10 (2018)
• 
  Roman Baburske, Franz-Josef Niedernostheide, Hans-Joachim Schulze, Riteshkumar Bhojani, J. Kowalsky, Josef Lutz:
  Unified view on energy and electrical failure of the short-circuit operation of IGBTs. Microelectron. Reliab. 88-90: 236-241 (2018)
• 
  Amir Sajjad Bahman, S. M. Jensen, Francesco Iannuzzo:
  Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses. Microelectron. Reliab. 88-90: 304-308 (2018)

skipping 6,321 more matches