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ORCIDJean-Yves Delétage
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2010 – 2019
- 2018
[j20]Omar Chihani, L. Théolier
, Alain Bensoussan, Jean-Yves Delétage, André Durier, Eric Woirgard:
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. Microelectron. Reliab. 88-90: 402-405 (2018)- [j19]Faical Arabi, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont:
Sequential combined thermal cycling and vibration test and simulation of printed circuit board. Microelectron. Reliab. 88-90: 768-773 (2018) - [j18]S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont:
Creep measurement and choice of creep laws for BGA assemblies' reliability simulation. Microelectron. Reliab. 88-90: 1172-1176 (2018) - [j17]Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Nicolas Chadourne, Jean-Michel Vinassa:
Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications. Microelectron. Reliab. 88-90: 1231-1235 (2018) - [c3]Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa:
Characterization of external pressure effects on lithium-ion pouch cell. ICIT 2018: 2055-2059 - [c2]Omar Chihani, Loic Théolier, Jean-Yves Delétage, Eric Woirgard, Alain Bensoussan, André Durier:
Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs. IRPS 2018: 2-1 - 2017
- [j16]S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont:
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectron. Reliab. 76-77: 674-679 (2017) - [c1]Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa:
Performance quantification of latest generation Li-ion batteries in wide temperature range. IECON 2017: 7666-7671 - 2016
- [j15]Issam Baghdadi, Olivier Briat, Jean-Yves Delétage, Philippe Gyan, Jean-Michel Vinassa:
Chemical rate phenomenon approach applied to lithium battery capacity fade estimation. Microelectron. Reliab. 64: 134-139 (2016) - [j14]Alexandrine Guédon-Gracia, Hélène Frémont, Bernard Plano, Jean-Yves Delétage, Kirsten Weide-Zaage:
Effects of salt spray test on lead-free solder alloy. Microelectron. Reliab. 64: 242-247 (2016) - [j13]Faical Arabi, Loic Théolier, Donatien Martineau, Jean-Yves Delétage, M. Medina, Eric Woirgard:
Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. Microelectron. Reliab. 64: 409-414 (2016) - 2013
- [j12]J. B. Jullien, Hélène Frémont, Jean-Yves Delétage:
Conductive adhesive joint for extreme temperature applications. Microelectron. Reliab. 53(9-11): 1597-1601 (2013) - [j11]F. Baccar, Stephane Azzopardi, L. Théolier, K. El Boubkari, Jean-Yves Delétage, Eric Woirgard:
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. Microelectron. Reliab. 53(9-11): 1719-1724 (2013) - 2012
- [j10]François Le Henaff, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard, Serge Bontemps, Julien Joguet:
A preliminary study on the thermal and mechanical performances of sintered nano-scale silver die-attach technology depending on the substrate metallization. Microelectron. Reliab. 52(9-10): 2321-2325 (2012) - 2011
- [j9]Akram Eddahech, Olivier Briat, Hervé Henry, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa:
Ageing monitoring of lithium-ion cell during power cycling tests. Microelectron. Reliab. 51(9-11): 1968-1971 (2011) - [j8]Ramzi Chaari, Olivier Briat, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa:
How supercapacitors reach end of life criteria during calendar life and power cycling tests. Microelectron. Reliab. 51(9-11): 1976-1979 (2011) - 2010
- [j7]Olivier Briat, Jean-Michel Vinassa, Nicolas Bertrand, H. El Brouji, Jean-Yves Delétage, Eric Woirgard:
Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling. Microelectron. Reliab. 50(9-11): 1796-1803 (2010) - [j6]Yassine Belmehdi, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard:
Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature. Microelectron. Reliab. 50(9-11): 1815-1821 (2010)
2000 – 2009
- 2009
- [j5]Yassine Belmehdi, Stephane Azzopardi, A. Benmansour, Jean-Yves Delétage, Eric Woirgard:
Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation. Microelectron. Reliab. 49(9-11): 1398-1403 (2009) - 2004
- [j4]Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto:
How to study delamination in plastic encapsulated devices. Microelectron. Reliab. 44(9-11): 1311-1316 (2004) - 2003
- [j3]Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43(7): 1125-1136 (2003) - [j2]Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto:
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectron. Reliab. 43(7): 1137-1144 (2003) - [j1]Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto:
Moisture diffusion in BCB resins used for MEMS packaging. Microelectron. Reliab. 43(9-11): 1939-1944 (2003)
Coauthor Index
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