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Jean-Yves Delétage

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Journal Articles

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2018
[j20]
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  - journals/mr/ChihaniTBDDW18
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  - https://dblp.org/rec/journals/mr/ChihaniTBDDW18
Omar Chihani, L. Théolier, Alain Bensoussan, Jean-Yves Delétage, André Durier, Eric Woirgard:
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. Microelectron. Reliab. 88-90: 402-405 (2018)
[j19]
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  - journals/mr/ArabiGDF18
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Faical Arabi, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont:
Sequential combined thermal cycling and vibration test and simulation of printed circuit board. Microelectron. Reliab. 88-90: 768-773 (2018)
[j18]
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  - journals/mr/PinGDF18
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S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont:
Creep measurement and choice of creep laws for BGA assemblies' reliability simulation. Microelectron. Reliab. 88-90: 1172-1176 (2018)
[j17]
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  - journals/mr/ZhangBDMCV18
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Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Nicolas Chadourne, Jean-Michel Vinassa:
Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications. Microelectron. Reliab. 88-90: 1231-1235 (2018)
2017
[j16]
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  - journals/mr/Hairoud-Airieau17
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  - https://dblp.org/rec/journals/mr/Hairoud-Airieau17
S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont:
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectron. Reliab. 76-77: 674-679 (2017)
2016
[j15]
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  - journals/mr/BaghdadiBDGV16
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Issam Baghdadi, Olivier Briat, Jean-Yves Delétage, Philippe Gyan, Jean-Michel Vinassa:
Chemical rate phenomenon approach applied to lithium battery capacity fade estimation. Microelectron. Reliab. 64: 134-139 (2016)
[j14]
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  - journals/mr/Guedon-GraciaFP16
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Alexandrine Guédon-Gracia, Hélène Frémont, Bernard Plano, Jean-Yves Delétage, Kirsten Weide-Zaage:
Effects of salt spray test on lead-free solder alloy. Microelectron. Reliab. 64: 242-247 (2016)
[j13]
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  - journals/mr/ArabiTMDMW16
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Faical Arabi, Loic Théolier, Donatien Martineau, Jean-Yves Delétage, M. Medina, Eric Woirgard:
Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. Microelectron. Reliab. 64: 409-414 (2016)
2013
[j12]
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  - journals/mr/JullienFD13
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J. B. Jullien, Hélène Frémont, Jean-Yves Delétage:
Conductive adhesive joint for extreme temperature applications. Microelectron. Reliab. 53(9-11): 1597-1601 (2013)
[j11]
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  - journals/mr/BaccarATBDW13
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F. Baccar, Stephane Azzopardi, L. Théolier, K. El Boubkari, Jean-Yves Delétage, Eric Woirgard:
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. Microelectron. Reliab. 53(9-11): 1719-1724 (2013)
2012
[j10]
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  - journals/mr/HenaffADWBJ12
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François Le Henaff, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard, Serge Bontemps, Julien Joguet:
A preliminary study on the thermal and mechanical performances of sintered nano-scale silver die-attach technology depending on the substrate metallization. Microelectron. Reliab. 52(9-10): 2321-2325 (2012)
2011
[j9]
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  - journals/mr/EddahechBHDWV11
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Akram Eddahech, Olivier Briat, Hervé Henry, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa:
Ageing monitoring of lithium-ion cell during power cycling tests. Microelectron. Reliab. 51(9-11): 1968-1971 (2011)
[j8]
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  - journals/mr/ChaariBDWV11
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Ramzi Chaari, Olivier Briat, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa:
How supercapacitors reach end of life criteria during calendar life and power cycling tests. Microelectron. Reliab. 51(9-11): 1976-1979 (2011)
2010
[j7]
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  - journals/mr/BriatVBBDW10
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Olivier Briat, Jean-Michel Vinassa, Nicolas Bertrand, H. El Brouji, Jean-Yves Delétage, Eric Woirgard:
Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling. Microelectron. Reliab. 50(9-11): 1796-1803 (2010)
[j6]
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  - journals/mr/BelmehdiADW10
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Yassine Belmehdi, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard:
Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature. Microelectron. Reliab. 50(9-11): 1815-1821 (2010)
2009
[j5]
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  - journals/mr/BelmehdiABDW09
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Yassine Belmehdi, Stephane Azzopardi, A. Benmansour, Jean-Yves Delétage, Eric Woirgard:
Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation. Microelectron. Reliab. 49(9-11): 1398-1403 (2009)
2004
[j4]
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  - journals/mr/FremontDWD04
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Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto:
How to study delamination in plastic encapsulated devices. Microelectron. Reliab. 44(9-11): 1311-1316 (2004)
2003
[j3]
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  - journals/mr/DeshayesBDVDLG03
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Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43(7): 1125-1136 (2003)
[j2]
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  - journals/mr/DeletageVPDBD03
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Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto:
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectron. Reliab. 43(7): 1137-1144 (2003)
[j1]
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  - journals/mr/TetelinPDCD03
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Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto:
Moisture diffusion in BCB resins used for MEMS packaging. Microelectron. Reliab. 43(9-11): 1939-1944 (2003)

Conference and Workshop Papers

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2018
[c3]
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  - conf/icit2/ZhangBDMGV18
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Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa:
Characterization of external pressure effects on lithium-ion pouch cell. ICIT 2018: 2055-2059
[c2]
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  dblp key:
  - conf/irps/ChihaniTDWCBD18
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Omar Chihani, Loic Théolier, Jean-Yves Delétage, Eric Woirgard, Alain Bensoussan, André Durier:
Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs. IRPS 2018: 2-1
2017
[c1]
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  - conf/iecon/ZhangBDMGV17
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Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa:
Performance quantification of latest generation Li-ion batteries in wide temperature range. IECON 2017: 7666-7671

Coauthor Index

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