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ORCIDLaurent Béchou
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2010 – 2019
- 2018
[j21]M. Balmont, Isabelle Bord-Majek
, B. Poupard, Laurent Béchou, Yves Ousten:
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Microelectron. Reliab. 88-90: 1108-1112 (2018)- 2017
- [j20]Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou:
Practical optical gain by an extended Hakki-Paoli method. Microelectron. Reliab. 76-77: 579-583 (2017) - 2015
- [j19]Pamela Del Vecchio, Arnaud Curutchet, Yannick Deshayes, M. Bettiati, F. Laruelle, Nathalie Labat, Laurent Béchou:
Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes. Microelectron. Reliab. 55(9-10): 1741-1745 (2015) - [j18]Jérémy Michaud, Guillaume Pedroza, Laurent Béchou, L. S. How, Olivier Gilard, David Veyrié, F. Laruelle, Stéphane Grauby:
Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. Microelectron. Reliab. 55(9-10): 1746-1749 (2015) - [j17]Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou:
Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage. Microelectron. Reliab. 55(9-10): 1759-1764 (2015) - 2013
- [j16]Ephraim Suhir, Laurent Béchou:
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing. Microelectron. Reliab. 53(9-11): 1506-1509 (2013) - [j15]A. Royon, K. Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, Yannick Deshayes:
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy. Microelectron. Reliab. 53(9-11): 1514-1518 (2013) - 2011
- [j14]Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi:
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51(9-11): 1999-2003 (2011) - 2010
- [j13]Daniel T. Cassidy, Chadwick K. Hall, Othman Rehioui, Laurent Béchou:
Strain estimation in III-V materials by analysis of the degree of polarization of luminescence. Microelectron. Reliab. 50(4): 462-466 (2010) - [j12]Raphael Baillot, Yannick Deshayes, Laurent Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten:
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectron. Reliab. 50(9-11): 1568-1573 (2010)
2000 – 2009
- 2008
- [j11]M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul:
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectron. Reliab. 48(8-9): 1202-1207 (2008) - [j10]Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, Philippe Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten:
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. Microelectron. Reliab. 48(8-9): 1354-1360 (2008) - 2006
- [j9]Jean Augereau, Yves Ousten, Bruno Levrier, Laurent Béchou:
Use of signal processing imaging for the study of a 3D package in harsh environment. Microelectron. Reliab. 46(9-11): 1922-1925 (2006) - 2005
- [j8]S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto:
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectron. Reliab. 45(9-11): 1593-1599 (2005) - 2004
- [j7]Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé:
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectron. Reliab. 44(9-11): 1337-1342 (2004) - 2003
- [j6]Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43(7): 1125-1136 (2003) - [j5]Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto:
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectron. Reliab. 43(7): 1137-1144 (2003) - [j4]Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectron. Reliab. 43(9-11): 1743-1749 (2003) - [j3]Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano:
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52(1): 135-142 (2003) - 2002
- [j2]B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier:
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectron. Reliab. 42(7): 1113-1120 (2002) - [j1]Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto:
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectron. Reliab. 42(9-11): 1517-1522 (2002)
Coauthor Index
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