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2010 – 2019
- 2018
[j19]M. Balmont, Isabelle Bord-Majek
, B. Poupard, Laurent Béchou, Yves Ousten:
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Microelectron. Reliab. 88-90: 1108-1112 (2018)- [c1]Zaineb Jebri, Isabelle Bord-Majek, Celine Delafosse, Christophe Pasquet, Yves Ousten:
A new non-magnetic trimmer for the magnetic resonance imaging system. MOCAST 2018: 1-5 - 2015
- [j18]Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou:
Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage. Microelectron. Reliab. 55(9-10): 1759-1764 (2015) - [j17]Walide Chenniki, Isabelle Bord-Majek, Mélanie Louarn, Vincent Gaud, Jean-Luc Diot, Komkrisd Wongtimnoi, Yves Ousten:
Liquid Crystal Polymer for QFN packaging: Predicted thermo-mechanical fatigue and Design for Reliability. Microelectron. Reliab. 55(12): 2793-2798 (2015) - 2013
- [j16]Amadou Sow, Sinivassane Somaya, Yves Ousten, Jean-Michel Vinassa, Fanny Patoureaux:
Power MOSFET active power cycling for medical system reliability assessment. Microelectron. Reliab. 53(9-11): 1697-1702 (2013) - 2011
- [j15]Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi:
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51(9-11): 1999-2003 (2011) - 2010
- [j14]Raphael Baillot, Yannick Deshayes, Laurent Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten:
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectron. Reliab. 50(9-11): 1568-1573 (2010)
2000 – 2009
- 2008
- [j13]M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul:
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectron. Reliab. 48(8-9): 1202-1207 (2008) - [j12]Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, Philippe Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten:
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. Microelectron. Reliab. 48(8-9): 1354-1360 (2008) - 2006
- [j11]Jean Augereau, Yves Ousten, Bruno Levrier, Laurent Béchou:
Use of signal processing imaging for the study of a 3D package in harsh environment. Microelectron. Reliab. 46(9-11): 1922-1925 (2006) - [j10]V. Krieger, Wolfgang Wondrak, A. Dehbi, W. Bartel, Yves Ousten, Bruno Levrier:
Defect detection in multilayer ceramic capacitors. Microelectron. Reliab. 46(9-11): 1926-1931 (2006) - 2005
- [j9]H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi:
Failure mechanisms and qualification testing of passive components. Microelectron. Reliab. 45(9-11): 1626-1632 (2005) - [j8]A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak:
Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectron. Reliab. 45(9-11): 1658-1661 (2005) - 2004
- [j7]Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto:
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. Microelectron. Reliab. 44(9-11): 1299-1304 (2004) - 2003
- [j6]G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43(9-11): 1803-1807 (2003) - [j5]Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano:
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52(1): 135-142 (2003) - 2002
- [j4]A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto:
High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectron. Reliab. 42(6): 835-840 (2002) - [j3]B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier:
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectron. Reliab. 42(7): 1113-1120 (2002) - [j2]Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto:
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectron. Reliab. 42(9-11): 1517-1522 (2002) - [j1]Geneviève Duchamp, Yves Ousten, Yves Danto:
Evaluation of a micropackaging analysis technique by highfrequency microwaves. Microelectron. Reliab. 42(9-11): 1551-1554 (2002)
Coauthor Index
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