"Failure mechanisms and qualification testing of passive components."

H. A. Post et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.085

access: closed

type: Journal Article

metadata version: 2020-02-22

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H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi:
Failure mechanisms and qualification testing of passive components. Microelectron. Reliab. 45(9-11): 1626-1632 (2005)

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