"Defect detection in multilayer ceramic capacitors."

V. Krieger et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.082

access: closed

type: Journal Article

metadata version: 2020-02-22

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V. Krieger, Wolfgang Wondrak, A. Dehbi, W. Bartel, Yves Ousten, Bruno Levrier:
Defect detection in multilayer ceramic capacitors. Microelectron. Reliab. 46(9-11): 1926-1931 (2006)

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