"High temperature reliability testing of aluminum and tantalum electrolytic ..."

A. Dehbi et al. (2002)

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DOI: 10.1016/S0026-2714(02)00021-5

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type: Journal Article

metadata version: 2020-02-22

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A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto:
High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectron. Reliab. 42(6): 835-840 (2002)

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