"Reliability estimation of BGA and CSP assemblies using degradation law ..."

Jean-Yves Delétage et al. (2003)

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DOI: 10.1016/S0026-2714(03)00101-X

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type: Journal Article

metadata version: 2020-02-22

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Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto:
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectron. Reliab. 43(7): 1137-1144 (2003)

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