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2020 – today
- 2023
[j29]Giorgio Montisci
, Giovanna Mura, Giacomo Muntoni, Giovanni Andrea Casula, Francesco Paolo Chietera, Mahmoud Aburish-Hmidat:
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films. IEEE Access 11: 839-848 (2023)
2010 – 2019
- 2018
- [j28]Giovanna Mura:
Reliability concerns from the gray market. Microelectron. Reliab. 88-90: 26-30 (2018) - [j27]Massimo Vanzi, Giovanna Mura, G. Martines:
Further improvements of an extended Hakki-Paoli method. Microelectron. Reliab. 88-90: 859-863 (2018) - 2017
- [j26]Riccardo Enrici Vaion, Matteo Medda, Alberto Mancaleoni, Giovanna Mura, A. Pintus, M. De Tomasi:
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. Microelectron. Reliab. 76-77: 438-443 (2017) - [j25]Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou:
Practical optical gain by an extended Hakki-Paoli method. Microelectron. Reliab. 76-77: 579-583 (2017) - 2016
- [j24]Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante:
Single Event Transient acquisition and mapping for space device Characterization. Microelectron. Reliab. 64: 73-78 (2016) - [j23]Massimo Vanzi, Giovanna Mura, Giulia Marcello, Kunhui Xiao:
ESD tests on 850 nm GaAs-based VCSELs. Microelectron. Reliab. 64: 617-622 (2016) - 2015
- [j22]Massimo Vanzi, Giovanna Mura, Giulia Marcello, G. Martines:
Clamp voltage and ideality factor in laser diodes. Microelectron. Reliab. 55(9-10): 1736-1740 (2015) - [c1]Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, D. Tonini, A. Voltan, Giorgio Cellere:
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. IRPS 2015: 3 - 2014
- [j21]Giovanna Mura, Massimo Vanzi, Giulia Marcello:
FIB-induced electro-optical alterations in a DFB InP laser diode. Microelectron. Reliab. 54(9-10): 2151-2153 (2014) - 2013
- [j20]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
"Hot-plugging" of LED modules: Electrical characterization and device degradation. Microelectron. Reliab. 53(9-11): 1524-1528 (2013) - [j19]Massimo Vanzi, Giovanna Mura, M. Marongiu, T. Tomasi:
Optical losses in single-mode laser diodes. Microelectron. Reliab. 53(9-11): 1529-1533 (2013) - [j18]Giovanna Mura, Massimo Vanzi, Giulia Marcello, Robert Cao:
The role of the optical trans-characteristics in laser diode analysis. Microelectron. Reliab. 53(9-11): 1538-1542 (2013) - [j17]Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso:
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53(9-11): 1809-1813 (2013) - 2012
- [j16]Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
Chip and package-related degradation of high power white LEDs. Microelectron. Reliab. 52(5): 804-812 (2012) - [j15]Jia Lu, BoCheng Cao, WenShe Wu, YuFeng Dai, ChuangJun Huang, Giovanna Mura:
MIM capacitor-related early-stage field failures. Microelectron. Reliab. 52(9-10): 2073-2076 (2012) - [j14]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectron. Reliab. 52(9-10): 2164-2167 (2012) - 2011
- [j13]Massimo Vanzi, Giovanna Mura, G. Martines:
DC parameters for laser diodes from experimental curves. Microelectron. Reliab. 51(9-11): 1752-1756 (2011) - 2010
- [j12]Giovanna Mura, Massimo Vanzi:
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. Microelectron. Reliab. 50(4): 471-478 (2010)
2000 – 2009
- 2009
- [j11]Giovanna Mura, Massimo Vanzi:
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectron. Reliab. 49(9-11): 1196-1199 (2009) - 2008
- [j10]Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi:
Sulfur-contamination of high power white LED. Microelectron. Reliab. 48(8-9): 1208-1211 (2008) - 2007
- [j9]Matteo Meneghini, Lorenzo Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectron. Reliab. 47(9-11): 1625-1629 (2007) - 2006
- [j8]G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano:
Failure Analysis-assisted FMEA. Microelectron. Reliab. 46(9-11): 1795-1799 (2006) - 2005
- [j7]G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini:
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45(9-11): 1321-1326 (2005) - 2004
- [j6]Giovanna Mura, Massimo Vanzi, G. Micheletti:
Failure analysis of RFIC amplifiers. Microelectron. Reliab. 44(9-11): 1599-1604 (2004) - 2003
- [j5]Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich:
Reliability of visible GaN LEDs in plastic package. Microelectron. Reliab. 43(9-11): 1737-1742 (2003) - [j4]Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner:
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43(9-11): 1771-1776 (2003) - 2002
- [j3]Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi:
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42(9-11): 1293-1298 (2002) - [j2]Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42(9-11): 1303-1306 (2002) - [j1]M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi:
An automated lifetest equipment for optical emitters. Microelectron. Reliab. 42(9-11): 1311-1315 (2002)
Coauthor Index
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