"Backside Failure Analysis of GaAs ICs after ESD tests."

Gaudenzio Meneghesso et al. (2002)

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DOI: 10.1016/S0026-2714(02)00137-3

access: closed

type: Journal Article

metadata version: 2023-03-21

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Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi:
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42(9-11): 1293-1298 (2002)

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