"Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and ..."

Omar Chihani et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.076

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type: Journal Article

metadata version: 2024-10-06

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Omar Chihani, L. Théolier, Alain Bensoussan, Jean-Yves Delétage, André Durier, Eric Woirgard:
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. Microelectron. Reliab. 88-90: 402-405 (2018)

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