default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "stream:journals/mr:"
more than 1000 matches, exporting first 1000 hits only!
download as .bib file
@article{DBLP:journals/mr/AbbateBMSSTV18,
author = {Carmine Abbate and
Giovanni Busatto and
S. Mattiazzo and
Annunziata Sanseverino and
L. Silvestrin and
D. Tedesco and
Francesco Velardi},
title = {Progressive drain damage in SiC power MOSFETs exposed to ionizing
radiation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {941--945},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.100},
doi = {10.1016/J.MICROREL.2018.07.100},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AbbateBMSSTV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbbateBSTV18,
author = {Carmine Abbate and
Giovanni Busatto and
Annunziata Sanseverino and
D. Tedesco and
Francesco Velardi},
title = {Measure of high frequency input impedance to study the instability
of power devices in short circuit},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {540--544},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.035},
doi = {10.1016/J.MICROREL.2018.07.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbbateBSTV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbbateBSTV18a,
author = {Carmine Abbate and
Giovanni Busatto and
Annunziata Sanseverino and
D. Tedesco and
Francesco Velardi},
title = {Failure analysis of 650{\unicode{8239}}V enhancement mode GaN {HEMT}
after short circuit tests},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {677--683},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.071},
doi = {10.1016/J.MICROREL.2018.07.071},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbbateBSTV18a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AgaKDBHA18,
author = {Roberto S. Aga and
Eric B. Kreit and
Steven R. Dooley and
Carrie M. Bartsch and
Emily M. Heckman and
Rachel S. Aga},
title = {Considerations in printing conductive traces for high pulsed power
applications},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {342--351},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.037},
doi = {10.1016/J.MICROREL.2017.10.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AgaKDBHA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AgboTKHWCCD18,
author = {Innocent Agbo and
Mottaqiallah Taouil and
Daniel Kraak and
Said Hamdioui and
Pieter Weckx and
Stefan Cosemans and
Francky Catthoor and
Wim Dehaene},
title = {Impact and mitigation of {SRAM} read path aging},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {158--167},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.011},
doi = {10.1016/J.MICROREL.2018.05.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AgboTKHWCCD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AguiarWALSTP18,
author = {Ygor Q. Aguiar and
Frederic Wrobel and
Jean{-}Luc Autran and
Paul Leroux and
Fr{\'{e}}d{\'{e}}ric Saign{\'{e}} and
Antoine D. Touboul and
Vincent Pouget},
title = {Analysis of the charge sharing effect in the {SET} sensitivity of
bulk 45{\unicode{8239}}nm standard cell layouts under heavy ions},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {920--924},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.018},
doi = {10.1016/J.MICROREL.2018.07.018},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AguiarWALSTP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhariV0R18,
author = {Ali Ahari and
Alexander Viehl and
Oliver Bringmann and
Wolfgang Rosenstiel},
title = {Mission profile-based assessment of semiconductor technologies for
automotive applications},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {129--138},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.008},
doi = {10.1016/J.MICROREL.2018.08.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AhariV0R18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhmadiJS18,
author = {Bahar Ahmadi and
Bahram Javidi and
Sina Shahbazmohamadi},
title = {Automated detection of counterfeit ICs using machine learning},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {371--377},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.083},
doi = {10.1016/J.MICROREL.2018.06.083},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AhmadiJS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhmadiTFSPS18,
author = {Bahar Ahmadi and
Pouya Tavousi and
Joseph Favata and
Peiman Shahbeigi{-}Roodposhti and
Rengarajan Pelapur and
Sina Shahbazmohamadi},
title = {A novel crowdsourcing platform for microelectronics counterfeit defect
detection},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {48--53},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.107},
doi = {10.1016/J.MICROREL.2018.07.107},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AhmadiTFSPS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhnSJJWA18,
author = {Woojin Ahn and
Sang Hoon Shin and
Chunsheng Jiang and
Hai Jiang and
M. A. Wahab and
Muhammad Ashraful Alam},
title = {Integrated modeling of Self-heating of confined geometry (FinFET,
NWFET, and {NSHFET)} transistors and its implications for the reliability
of sub-20 nm modern integrated circuits},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {262--273},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.034},
doi = {10.1016/J.MICROREL.2017.12.034},
timestamp = {Fri, 03 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AhnSJJWA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhsanNKY18,
author = {S. Ahsan and
Kamran Ali Khan Niazi and
Hassan Abbas Khan and
Yongheng Yang},
title = {Hotspots and performance evaluation of crystalline-silicon and thin-film
photovoltaic modules},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1014--1018},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.097},
doi = {10.1016/J.MICROREL.2018.06.097},
timestamp = {Fri, 08 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AhsanNKY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AichingerRP18,
author = {Thomas Aichinger and
Gerald Rescher and
Gregor Pobegen},
title = {Threshold voltage peculiarities and bias temperature instabilities
of SiC MOSFETs},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {68--78},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.020},
doi = {10.1016/J.MICROREL.2017.11.020},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AichingerRP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AkbariBRIB18,
author = {Mohsen Akbari and
Amir Sajjad Bahman and
Paula Diaz Reigosa and
Francesco Iannuzzo and
Mohammad Tavakoli Bina},
title = {Thermal modeling of wire-bonded power modules considering non-uniform
temperature and electric current interactions},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1135--1140},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.150},
doi = {10.1016/J.MICROREL.2018.07.150},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AkbariBRIB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlaouiBTV18,
author = {Nabil El Belghiti Alaoui and
Alexandre Boyer and
Patrick Tounsi and
Arnaud Viard},
title = {New defect detection approach using near electromagnetic field probing
of high density PCBAs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {288--293},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.090},
doi = {10.1016/J.MICROREL.2018.07.090},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlaouiBTV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlexeevMO18,
author = {Anton Alexeev and
Genevieve Martin and
Grigory Onushkin},
title = {Multiple heat path dynamic thermal compact modeling for silicone encapsulated
LEDs},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {89--96},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.014},
doi = {10.1016/J.MICROREL.2018.05.014},
timestamp = {Thu, 16 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlexeevMO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AliSSSJM18,
author = {Bakhtiar Ali and
Mohd Faizul Mohd Sabri and
Suhana Binti Mohd Said and
Nazatul Liana Sukiman and
Iswadi Jauhari and
Mohammad Hossein Mahdavifard},
title = {Microstructural and tensile properties of Fe and Bi added Sn-1Ag-0.5Cu
solder alloy under high temperature environment},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {171--178},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.015},
doi = {10.1016/J.MICROREL.2018.01.015},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AliSSSJM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlmeidaMBSRM18,
author = {Roberto B. Almeida and
Cleiton Magano Marques and
Paulo F. Butzen and
F{\'{a}}bio G. R. G. da Silva and
Ricardo A. L. Reis and
Cristina Meinhardt},
title = {Analysis of 6{\unicode{8239}}T {SRAM} cell in sub-45{\unicode{8239}}nm
{CMOS} and FinFET technologies},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {196--202},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.134},
doi = {10.1016/J.MICROREL.2018.07.134},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlmeidaMBSRM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AminiBHSMSB18,
author = {Elham Amini and
Anne Beyreuther and
Norbert Herfurth and
Alexander Steigert and
R. Muydinov and
Bernd Szyszka and
Christian Boit},
title = {{IC} security and quality improvement by protection of chip backside
against hardware attacks},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {22--25},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.099},
doi = {10.1016/J.MICROREL.2018.06.099},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AminiBHSMSB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AmsterRYIM18,
author = {Oskar Amster and
K. A. Rubin and
Y. Yang and
D. Iyer and
Arron Messinger},
title = {Application of Scanning Microwave Microscopy nano-C-V to investigate
dopant defect under a poly gate device},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {250--254},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.106},
doi = {10.1016/J.MICROREL.2018.06.106},
timestamp = {Fri, 04 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AmsterRYIM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AnFQLTC18,
author = {Tong An and
Chao Fang and
Fei Qin and
Huaicheng Li and
Tao Tang and
Pei Chen},
title = {Failure study of Sn37Pb {PBGA} solder joints using temperature cycling,
random vibration and combined temperature cycling and random vibration
tests},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {213--226},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.003},
doi = {10.1016/J.MICROREL.2018.10.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AnFQLTC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndjelkovicKK18,
author = {Marko S. Andjelkovic and
Milos Krstic and
Rolf Kraemer},
title = {Study of the operation and {SET} robustness of a {CMOS} pulse stretching
circuit},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {100--112},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.022},
doi = {10.1016/J.MICROREL.2017.12.022},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AndjelkovicKK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AntoniniCDC18,
author = {Mattia Antonini and
Paolo Cova and
Nicola Delmonte and
Alberto Castellazzi},
title = {GaN transistors efficient cooling by graphene foam},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {812--816},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.004},
doi = {10.1016/J.MICROREL.2018.07.004},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AntoniniCDC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArabiGDF18,
author = {Faical Arabi and
Alexandrine Gu{\'{e}}don{-}Gracia and
Jean{-}Yves Del{\'{e}}tage and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Sequential combined thermal cycling and vibration test and simulation
of printed circuit board},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {768--773},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.050},
doi = {10.1016/J.MICROREL.2018.07.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ArabiGDF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsllaniFCMP18,
author = {Besar Asllani and
Asad Fayyaz and
Alberto Castellazzi and
Herv{\'{e}} Morel and
Dominique Planson},
title = {\emph{V}\({}_{\mbox{\emph{TH}}}\) subthreshold hysteresis technology
and temperature dependence in commercial 4H-SiC MOSFETs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {604--609},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.047},
doi = {10.1016/J.MICROREL.2018.06.047},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AsllaniFCMP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AuerspergACDVWR18,
author = {J{\"{u}}rgen Auersperg and
Ellen Auerswald and
Christian Collet and
Thierry Dean and
Dietmar Vogel and
Thomas Winkler and
Sven Rzepka},
title = {Investigations of the impact of initial stresses on fracture and delamination
risks of an avionics {MEMS} pressure sensor},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {238--244},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.019},
doi = {10.1016/J.MICROREL.2018.06.019},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AuerspergACDVWR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Avino-SalvadoMB18,
author = {Oriol Avino{-}Salvado and
Herv{\'{e}} Morel and
Cyril Buttay and
Denis Labrousse and
St{\'{e}}phane Lefebvre},
title = {Threshold voltage instability in SiC MOSFETs as a consequence of current
conduction in their body diode},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {636--640},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.033},
doi = {10.1016/J.MICROREL.2018.06.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Avino-SalvadoMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzimiSDB18,
author = {Sarah Azimi and
Luca Sterpone and
Boyang Du and
Luca Boragno},
title = {On the analysis of radiation-induced Single Event Transients on SRAM-based
FPGAs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {936--940},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.135},
doi = {10.1016/J.MICROREL.2018.07.135},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AzimiSDB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzizaHMCP18,
author = {Hassen Aziza and
Basma Hajri and
Mohammad M. Mansour and
Ali Chehab and
Annie P{\'{e}}rez},
title = {A lightweight write-assist scheme for reduced {RRAM} variability and
power},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {6--10},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.065},
doi = {10.1016/J.MICROREL.2018.07.065},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AzizaHMCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaburskeNSBKL18,
author = {Roman Baburske and
Franz{-}Josef Niedernostheide and
Hans{-}Joachim Schulze and
Riteshkumar Bhojani and
J. Kowalsky and
Josef Lutz},
title = {Unified view on energy and electrical failure of the short-circuit
operation of IGBTs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {236--241},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.091},
doi = {10.1016/J.MICROREL.2018.06.091},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BaburskeNSBKL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BahmanJI18,
author = {Amir Sajjad Bahman and
S. M. Jensen and
Francesco Iannuzzo},
title = {Failure mechanism analysis of fuses subjected to manufacturing and
operational thermal stresses},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {304--308},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.108},
doi = {10.1016/J.MICROREL.2018.06.108},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BahmanJI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BahrebarZRWB18,
author = {S. Bahrebar and
Dao Zhou and
Sima Rastayesh and
Huai Wang and
Frede Blaabjerg},
title = {Reliability assessment of power conditioner considering maintenance
in a {PEM} fuel cell system},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1177--1182},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.085},
doi = {10.1016/J.MICROREL.2018.07.085},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BahrebarZRWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BakerI18,
author = {Nick Baker and
Francesco Iannuzzo},
title = {Smart SiC {MOSFET} accelerated lifetime testing},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {43--47},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.067},
doi = {10.1016/J.MICROREL.2018.07.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BakerI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BalmontBPBO18,
author = {M. Balmont and
Isabelle Bord{-}Majek and
B. Poupard and
Laurent B{\'{e}}chou and
Yves Ousten},
title = {Highlighting two integration technologies based on vias: Through silicon
vias and embedded components into {PCB.} Strengths and weaknesses
for manufacturing and reliability},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1108--1112},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.077},
doi = {10.1016/J.MICROREL.2018.06.077},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BalmontBPBO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaoWLLYC18,
author = {Mengtian Bao and
Ying Wang and
Xingji Li and
Chaoming Liu and
Cheng{-}Hao Yu and
Fei Cao},
title = {Simulation study of single event effects in the SiC {LDMOS} with a
step compound drift region},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {170--178},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.09.002},
doi = {10.1016/J.MICROREL.2018.09.002},
timestamp = {Thu, 21 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaoWLLYC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BardalenKMAO18,
author = {Eivind Bardalen and
Bj{\o}rnar Karlsen and
Helge Malmbekk and
Muhammad Nadeem Akram and
Per Alfred Ohlckers},
title = {Reliability study of fiber-coupled photodiode module for operation
at 4 {K}},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {362--367},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.034},
doi = {10.1016/J.MICROREL.2017.10.034},
timestamp = {Fri, 22 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BardalenKMAO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarnesHVSBBGMMS18,
author = {Andrew Barnes and
Florence H{\'{e}}li{\`{e}}re and
P. Villar and
Hannes Stuhldreier and
C. Beaurain and
D. Bouw and
M. Grunwald and
E. Moess and
Tobias Muck and
C. Schildbach and
T. Ayles and
A. Kramer and
B. Bildner},
title = {Qualification of GaN microwave transistors for the European Space
Agency Biomass mission},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {378--384},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.065},
doi = {10.1016/J.MICROREL.2018.06.065},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarnesHVSBBGMMS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarrosBRMCP18,
author = {R. C. de Barros and
E. M. S. Brito and
Giovani G. Rodrigues and
Victor Flores Mendes and
Allan Fagner Cupertino and
Heverton Augusto Pereira},
title = {Lifetime evaluation of a multifunctional {PV} single-phase inverter
during harmonic current compensation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1071--1076},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.009},
doi = {10.1016/J.MICROREL.2018.07.009},
timestamp = {Thu, 17 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BarrosBRMCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BasuSJR18,
author = {Joyeeta Basu and
Nirmalya Samanta and
Sukhendu Jana and
Chirasree RoyChaudhuri},
title = {Towards reliability enhancement of graphene {FET} biosensor in complex
analyte: Artificial neural network approach},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {154--159},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.09.001},
doi = {10.1016/J.MICROREL.2018.09.001},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BasuSJR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaszynskiRW18,
author = {Michal Baszynski and
P. Rydygier and
Mariusz Wojcik},
title = {Experimental studies of: Laminate composition, drill bit wear out,
and chloride ion concentration as factors affecting {CAF} formation
rate},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {31--37},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.086},
doi = {10.1016/J.MICROREL.2018.06.086},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaszynskiRW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bat-OchirBHTDO18,
author = {Bat{-}Otgon Bat{-}Ochir and
Battuvshin Bayarkhuu and
Kazunori Hasegawa and
Masanori Tsukuda and
Bayasgalan Dugarjav and
Ichiro Omura},
title = {Envelop tracking based embedded current measurement for monitoring
of {IGBT} and power converter system},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {500--504},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.028},
doi = {10.1016/J.MICROREL.2018.06.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bat-OchirBHTDO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BatunluA18,
author = {Canras Batunlu and
Al{-}Hussein Albarbar},
title = {Strategy for enhancing reliability and lifetime of {DC-AC} inverters
used for wind turbines},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {25--37},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.006},
doi = {10.1016/J.MICROREL.2018.04.006},
timestamp = {Tue, 21 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BatunluA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeckmeierM18,
author = {D. Beckmeier and
Andreas Martin},
title = {Variation-resilient quantifiable plasma process induced damage monitoring},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {152--158},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.118},
doi = {10.1016/J.MICROREL.2018.06.118},
timestamp = {Thu, 11 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeckmeierM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Belaid18,
author = {Mohamed Ali Bela{\"{\i}}d},
title = {Performance analysis of S-parameter in {N-MOSFET} devices after thermal
accelerated tests},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {8--14},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.133},
doi = {10.1016/J.MICROREL.2018.07.133},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Belaid18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BernardoniDCC18,
author = {Mirko Bernardoni and
Nicola Delmonte and
Diego Chiozzi and
Paolo Cova},
title = {Non-linear thermal simulation at system level: Compact modelling and
experimental validation},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {223--229},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.005},
doi = {10.1016/J.MICROREL.2017.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BernardoniDCC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bey-TemsamaniKH18,
author = {Abdellatif Bey{-}Temsamani and
S. Kauffmann and
Stijn Helsen and
T. Gaens and
V. Driesen},
title = {Physics-of-Failure (PoF) methodology for qualification and lifetime
assessment of supercapacitors for industrial applications},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {54--60},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.084},
doi = {10.1016/J.MICROREL.2018.06.084},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bey-TemsamaniKH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeyreutherHANWB18,
author = {Anne Beyreuther and
Norbert Herfurth and
Elham Amini and
Tomonori Nakamura and
Ingrid De Wolf and
Christian Boit},
title = {Photon emission as a characterization tool for bipolar parasitics
in FinFET technology},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {273--276},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.091},
doi = {10.1016/J.MICROREL.2018.07.091},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BeyreutherHANWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BiDXL18,
author = {Jinshun Bi and
Yuan Duan and
Kai Xi and
Bo Li},
title = {Total ionizing dose and single event effects of 1{\unicode{8239}}Mb
HfO\({}_{\mbox{2}}\)-based resistive-random-access memory},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {891--897},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.017},
doi = {10.1016/J.MICROREL.2018.07.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BiDXL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BirmpiliotisKKP18,
author = {Dimitrios Birmpiliotis and
Matroni Koutsoureli and
J. Kohylas and
George J. Papaioannou and
A. Ziaei},
title = {Charging mechanisms in Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) dielectric
films for {MEMS} capacitive switches},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {840--845},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.087},
doi = {10.1016/J.MICROREL.2018.07.087},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BirmpiliotisKKP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoigeRLBGB18,
author = {F. Boige and
Fr{\'{e}}d{\'{e}}ric Richardeau and
St{\'{e}}phane Lefebvre and
Jean{-}Marc Blaqui{\`{e}}re and
G. Guibaud and
A. Bourennane},
title = {Ensure an original and safe "fail-to-open" mode in planar and trench
power SiC {MOSFET} devices in extreme short-circuit operation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {598--603},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.026},
doi = {10.1016/J.MICROREL.2018.07.026},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BoigeRLBGB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BojitaBPFSP18,
author = {Adrian Bojita and
Cristian Boianceanu and
Marius Purcar and
Ciprian Florea and
Dan Simon and
Cosmin{-}Sorin Plesa},
title = {A simple metal-semiconductor substructure for the advanced thermo-mechanical
numerical modeling of the power integrated circuits},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {142--150},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.013},
doi = {10.1016/J.MICROREL.2018.06.013},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BojitaBPFSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BorgaMSHZLDZM18,
author = {Matteo Borga and
Matteo Meneghini and
Steve Stoffels and
Marleen Van Hove and
M. Zhao and
X. Li and
Stefaan Decoutere and
Enrico Zanoni and
Gaudenzio Meneghesso},
title = {Impact of the substrate and buffer design on the performance of GaN
on Si power HEMTs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {584--588},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.036},
doi = {10.1016/J.MICROREL.2018.06.036},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BorgaMSHZLDZM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BothFW18,
author = {Thiago Hanna Both and
Gabriela Firpo Furtado and
Gilson In{\'{a}}cio Wirth},
title = {Modeling and simulation of the charge trapping component of {BTI}
and {RTS}},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {278--283},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.009},
doi = {10.1016/J.MICROREL.2017.11.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BothFW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrandeleroEDM18,
author = {Julio Brandelero and
Jeffrey Ewanchuk and
Nicolas Degrenne and
Stefan Mollov},
title = {Lifetime extension through Tj equalisation by use of intelligent gate
driver with multi-chip power module},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {428--432},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.034},
doi = {10.1016/J.MICROREL.2018.07.034},
timestamp = {Tue, 12 Nov 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrandeleroEDM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrinckerKSEP18,
author = {Mads Brincker and
Peter Kj{\ae}r Kristensen and
S. S{\"{o}}hl and
R. Eisele and
Vladimir N. Popok},
title = {Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo
interconnects - {A} novel approach for hybrid metal baseplates},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {774--778},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.051},
doi = {10.1016/J.MICROREL.2018.06.051},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrinckerKSEP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BritoCRYMP18,
author = {E. M. S. Brito and
Allan Fagner Cupertino and
Paula Diaz Reigosa and
Yongheng Yang and
Victor Flores Mendes and
Heverton Augusto Pereira},
title = {Impact of meteorological variations on the lifetime of grid-connected
{PV} inverters},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1019--1024},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.066},
doi = {10.1016/J.MICROREL.2018.07.066},
timestamp = {Thu, 17 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BritoCRYMP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuffoloPSSDBMZM18,
author = {Matteo Buffolo and
M. Pietrobon and
Carlo De Santi and
F. Samparisi and
Michael L. Davenport and
John E. Bowers and
Gaudenzio Meneghesso and
Enrico Zanoni and
Matteo Meneghini},
title = {Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror
laser diodes for photonic integrated circuits},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {855--858},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.058},
doi = {10.1016/J.MICROREL.2018.06.058},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BuffoloPSSDBMZM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuonomoTBWRGKC18,
author = {Marco Buonomo and
Lorenzo Torto and
Marco Barbato and
Nicola Wrachien and
Antonio Rizzo and
Suren A. Gevorgyan and
Frederik C. Krebs and
Andrea Cester},
title = {Analysis of the effects of voltage pulses on {P3HT:} {PCBM} polymeric
solar cells by means of {TLP} technique},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {878--881},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.059},
doi = {10.1016/J.MICROREL.2018.06.059},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BuonomoTBWRGKC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuonomoWLCC18,
author = {Marco Buonomo and
Nicola Wrachien and
Nicol{\`{o}} Lago and
Giuseppe Cantarella and
Andrea Cester},
title = {Effects of stair case gate bias stress in IGZO/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
flexible TFTs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {882--886},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.056},
doi = {10.1016/J.MICROREL.2018.06.056},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BuonomoWLCC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CavallaroGB18,
author = {Daniela Cavallaro and
Rosario Greco and
Gaetano Bazzano},
title = {Effect of solder material thickness on Power {MOSFET} reliability
by Electro-thermo-Mechanical Simulations},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1168--1171},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.082},
doi = {10.1016/J.MICROREL.2018.07.082},
timestamp = {Sat, 11 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CavallaroGB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CeccarelliLI18,
author = {Lorenzo Ceccarelli and
Haoze Luo and
Francesco Iannuzzo},
title = {Investigating SiC {MOSFET} body diode's light emission as temperature-sensitive
electrical parameter},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {627--630},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.027},
doi = {10.1016/J.MICROREL.2018.07.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CeccarelliLI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChellvarajooA18,
author = {Srivalli Chellvarajoo and
Mohd Zulkifly Abdullah},
title = {Investigation on nano-reinforced solder paste after reflow soldering
part 1: Effects of nano-reinforced solder paste on melting, hardness,
spreading rate, and wetting quality},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {230--237},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.027},
doi = {10.1016/J.MICROREL.2018.03.027},
timestamp = {Sat, 21 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChellvarajooA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenCLH18,
author = {Kai{-}Huang Chen and
Chien{-}Min Cheng and
Cheng{-}Ying Li and
Shou{-}Jen Huang},
title = {Hopping conduction distance of bipolar switching GdOx resistance random
access memory thin films devices modified by different constant compliance
current},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {330--334},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.018},
doi = {10.1016/J.MICROREL.2018.05.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenCLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenHLWC18,
author = {Kuan{-}Ting Chen and
Ren{-}Yu He and
Chia{-}Feng Lee and
Ming{-}Ting Wu and
Shu{-}Tong Chang},
title = {Compact conduction band model for transition-metal dichalcogenide
alloys},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {223--229},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.04.022},
doi = {10.1016/J.MICROREL.2017.04.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenHLWC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenK18,
author = {Wen{-}Chieh Chen and
Ming{-}Dou Ker},
title = {Surge protection design with surge-to-digital converter for microelectronic
circuits and systems},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {2--5},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.087},
doi = {10.1016/J.MICROREL.2018.06.087},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenL18,
author = {Shun{-}Tong Chen and
Sheng{-}min Lin},
title = {Development of a capacitive sensing technology for the measurement
of perpendicularity in the narrow, deep slot-walls of micromolds},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {216--222},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.03.029},
doi = {10.1016/J.MICROREL.2017.03.029},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenMP18,
author = {Yukai Chen and
Enrico Macii and
Massimo Poncino},
title = {Empirical derivation of upper and lower bounds of {NBTI} aging for
embedded cores},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {294--305},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.07.067},
doi = {10.1016/J.MICROREL.2017.07.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenMP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWEHQA18,
author = {Si Chen and
Zhizhe Wang and
Yunfei En and
Yun Huang and
Fei Qin and
Tong An},
title = {The experimental analysis and the mechanical model for the debonding
failure of TSV-Cu/Si interface},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {52--66},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.005},
doi = {10.1016/J.MICROREL.2018.08.005},
timestamp = {Wed, 10 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenWEHQA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenZ18,
author = {Gang Chen and
Xiaochen Zhao},
title = {Constitutive modelling on the whole-life uniaxial ratcheting behavior
of sintered nano-scale silver paste at room and high temperatures},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {47--54},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.010},
doi = {10.1016/J.MICROREL.2017.11.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChengLYCH18,
author = {Pi{-}Ying Cheng and
Po{-}Ying Lai and
Jiun{-}Ming Ye and
Tsung{-}Chia Chen and
Cheng{-}Li Hsieh},
title = {High temperature storage reliability of palladium coated copper wire
in different {EFO} current settings},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {1--6},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.036},
doi = {10.1016/J.MICROREL.2017.10.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChengLYCH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChienZZW18,
author = {Wei{-}Ting Kary Chien and
Atman Yong Zhao and
Liwen Zhang and
Zhijuan Wang},
title = {Investigations and detections on a new {BEOL} dielectric failure mechanism
at advanced technologies},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {368--372},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.033},
doi = {10.1016/J.MICROREL.2017.10.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChienZZW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChihaniTBDDW18,
author = {Omar Chihani and
L. Th{\'{e}}olier and
Alain Bensoussan and
Jean{-}Yves Del{\'{e}}tage and
Andr{\'{e}} Durier and
Eric Woirgard},
title = {Effect of {HTRB} lifetest on AlGaN/GaN HEMTs under different voltages
and temperatures stresses},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {402--405},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.076},
doi = {10.1016/J.MICROREL.2018.07.076},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChihaniTBDDW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChithambaramTZL18,
author = {Shaalini Chithambaram and
Pik Kee Tan and
Yuzhe Zhao and
Binghai Liu and
Yinzhe Ma and
Alfred Quah and
Dayanand Nagalingam and
Yanlin Pan and
Zhihong Mai},
title = {Failure analysis on 14{\unicode{8239}}nm FinFET devices with {ESD}
{CDM} failure},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {321--333},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.105},
doi = {10.1016/J.MICROREL.2018.06.105},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChithambaramTZL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuCCLWPWH18,
author = {Hsien{-}Chin Chiu and
Shang{-}Cyun Chen and
Jiun{-}Wei Chiu and
Bo{-}Hong Li and
Hou{-}Yu Wang and
Li{-}Yi Peng and
Hsiang{-}Chun Wang and
Kuang{-}Po Hsueh},
title = {AlGaN/GaN Schottky barrier diodes on silicon substrates with various
Fe doping concentrations in the buffer layers},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {238--241},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.05.034},
doi = {10.1016/J.MICROREL.2017.05.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuCCLWPWH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuY18,
author = {Tz{-}Cheng Chiu and
En{-}Yu Yeh},
title = {Warpage simulation for the reconstituted wafer used in fan-out wafer
level packaging},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {14--23},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.008},
doi = {10.1016/J.MICROREL.2017.11.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoeNCKS18,
author = {Chanyang Choe and
Seungjun Noh and
Chuantong Chen and
Dongjin Kim and
Katsuaki Suganuma},
title = {Influence of thermal exposure upon mechanical/electrical properties
and microstructure of sintered micro-porous silver},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {695--700},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.048},
doi = {10.1016/J.MICROREL.2018.07.048},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoeNCKS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoiJIB18,
author = {Ui{-}Min Choi and
S{\o}ren J{\o}rgensen and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {Power cycling test of transfer molded {IGBT} modules by advanced power
cycler under different junction temperature swings},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {788--794},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.002},
doi = {10.1016/J.MICROREL.2018.07.002},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChoiJIB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoiYAKBK18,
author = {Kyeonggon Choi and
Dong{-}Youl Yu and
Sungdo Ahn and
Kyoung{-}Ho Kim and
Jung{-}Hwan Bang and
Yong{-}Ho Ko},
title = {Joint reliability of various Pb-free solders under harsh vibration
conditions for automotive electronics},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {66--71},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.006},
doi = {10.1016/J.MICROREL.2018.05.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoiYAKBK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouCW18,
author = {Dei{-}Wei Chou and
Kuan{-}Lin Chen and
Shih{-}Feng Wang},
title = {Pentacene bottom-contact thin film transistors with solution-processed
{BZT} gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {323--329},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.016},
doi = {10.1016/J.MICROREL.2018.03.016},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChouCW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouYLLCCWW18,
author = {Jung{-}Chuan Chou and
Siao{-}Jie Yan and
Yi{-}Hung Liao and
Chih{-}Hsien Lai and
Jian{-}Syun Chen and
Hsiang{-}Yi Chen and
Cian{-}Yi Wu and
You{-}Xiang Wu},
title = {Reaction of NiO film on flexible substrates with buffer solutions
and application to flexible arrayed lactate biosensor},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {249--253},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.06.036},
doi = {10.1016/J.MICROREL.2017.06.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChouYLLCCWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChungS18,
author = {Philip Y. Chung and
Suresh K. Sitaraman},
title = {Random vibration analysis of 3-Arc-Fan compliant interconnects},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {7--21},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.014},
doi = {10.1016/J.MICROREL.2017.11.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChungS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiappaCMI18,
author = {Mauro Ciappa and
Paolo Cova and
Gaudenzio Meneghesso and
Francesco Iannuzzo},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.09.003},
doi = {10.1016/J.MICROREL.2018.09.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CiappaCMI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiappaPS18,
author = {Mauro Ciappa and
Ying Pang and
Chenchen Sun},
title = {Experimental characterization of critical high-electric field spots
in power semiconductors by planar and scanning collimated alpha sources},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {476--481},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.129},
doi = {10.1016/J.MICROREL.2018.07.129},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CiappaPS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CilentoYTLMLKSL18,
author = {Tommaso Cilento and
Chan{-}Su Yun and
Arsen Terterian and
Chang Hwi Lee and
Jung Eon Moon and
Si Woo Lee and
Hyoungcheol Kwon and
Manho Seung and
Seokkiu Lee},
title = {Investigation of layout effects in diode-triggered SCRs under very-fast
{TLP} stress through full-size, calibrated 3D {TCAD} simulation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1103--1107},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.064},
doi = {10.1016/J.MICROREL.2018.07.064},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CilentoYTLMLKSL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CobrecesRTRSM18,
author = {Ana C{\'{o}}breces and
Alberto Regad{\'{\i}}o and
Jes{\'{u}}s Tabero and
Pedro Reviriego and
Alfonso S{\'{a}}nchez{-}Maci{\'{a}}n and
Juan Antonio Maestro},
title = {Seu and Sefi error detection and correction on a ddr3 memory system},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {23--30},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.002},
doi = {10.1016/J.MICROREL.2018.08.002},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CobrecesRTRSM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CodecasaBDdMR18,
author = {Lorenzo Codecasa and
Robin Bornoff and
James Dyson and
Vincenzo d'Alessandro and
Alessandro Magnani and
Niccol{\`{o}} Rinaldi},
title = {Versatile MOR-based boundary condition independent compact thermal
models with multiple heat sources},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {194--205},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.030},
doi = {10.1016/J.MICROREL.2018.03.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CodecasaBDdMR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CodecasaR18,
author = {Lorenzo Codecasa and
M{\'{a}}rta Rencz},
title = {To the special issue constructed from the selected papers of Thermal
investigations of integrated circuits and systems, THERMINIC'17},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {128},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.010},
doi = {10.1016/J.MICROREL.2018.08.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CodecasaR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Conseil-GudlaSM18,
author = {H. Conseil{-}Gudla and
Zygimantas Staliulionis and
Sankhya Mohanty and
Morten Stendahl Jellesen and
Jesper Henri Hattel and
Rajan Ambat},
title = {Humidity build-up in electronic enclosures exposed to different geographical
locations by {RC} modelling and reliability prediction},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {136--146},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.013},
doi = {10.1016/J.MICROREL.2018.01.013},
timestamp = {Sun, 14 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Conseil-GudlaSM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CornigliRGGBFVT18,
author = {Davide Cornigli and
Susanna Reggiani and
Antonio Gnudi and
Elena Gnani and
Giorgio Baccarani and
Davide Fabiani and
Dhanoop Varghese and
Enis Tuncer and
S. Krishnan and
Luu Nguyen},
title = {Electrical characterization of epoxy-based molding compounds for next
generation {HV} ICs in presence of moisture},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {752--755},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.030},
doi = {10.1016/J.MICROREL.2018.07.030},
timestamp = {Tue, 29 Oct 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CornigliRGGBFVT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CoutetMDGJLPC18,
author = {Julien Coutet and
Fran{\c{c}}ois Marc and
Flavien Dozolme and
Romain Gu{\'{e}}tard and
Aur{\'{e}}lien Janvresse and
Pierre Leboss{\'{e}} and
Antonin Pastre and
Jean{-}Claude Clement},
title = {Influence of temperature of storage, write and read operations on
multiple level cells {NAND} flash memories},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {61--66},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.088},
doi = {10.1016/J.MICROREL.2018.06.088},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CoutetMDGJLPC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaDCPVM18,
author = {Paolo Cova and
Nicola Delmonte and
Diego Chiozzi and
Marco Portesine and
F. Vaccaro and
E. Mantegazza},
title = {Water cold plates for high power converters: {A} software tool for
easy optimized design},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {801--805},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.050},
doi = {10.1016/J.MICROREL.2018.06.050},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CovaDCPVM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaDL18,
author = {Paolo Cova and
Nicola Delmonte and
Massimo Lazzaroni},
title = {Photovoltaic plant maintainability optimization and degradation detection:
Modelling and characterization},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1077--1082},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.021},
doi = {10.1016/J.MICROREL.2018.07.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CovaDL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CzernyK18,
author = {Bernhard Czerny and
Golta Khatibi},
title = {Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {745--751},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.003},
doi = {10.1016/J.MICROREL.2018.07.003},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CzernyK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DabrowskiD18,
author = {Arkadiusz Dabrowski and
Andrzej Dziedzic},
title = {Stability of low ohmic thick-film resistors under pulsed operation},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {95--104},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.024},
doi = {10.1016/J.MICROREL.2018.03.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DabrowskiD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DammannBBKKGSQ18,
author = {Maximilian Dammann and
Martina Baeumler and
Peter Br{\"{u}}ckner and
Tobias Kemmer and
Helmer Konstanzer and
Andreas Graff and
Mich{\'{e}}l Simon{-}Najasek and
R{\"{u}}diger Quay},
title = {Comparison of reliability of 100{\unicode{8239}}nm AlGaN/GaN HEMTs
with T-gate and SAG-gate technology},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {385--388},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.042},
doi = {10.1016/J.MICROREL.2018.06.042},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DammannBBKKGSQ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DankovicMPDPGDP18,
author = {Danijel Dankovic and
Ivica Manic and
Aneta Prijic and
Vojkan Davidovic and
Zoran Prijic and
Snezana Golubovic and
Snezana Djoric{-}Veljkovic and
Albena Paskaleva and
Dencho Spassov and
Ninoslav Stojadinovic},
title = {A review of pulsed {NBTI} in P-channel power VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {28--36},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.003},
doi = {10.1016/J.MICROREL.2018.01.003},
timestamp = {Tue, 26 Nov 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DankovicMPDPGDP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DasNT18,
author = {Subhas Chandra Das and
G. Narayanan and
Arvind Tiwari},
title = {Experimental study on the influence of junction temperature on the
relationship between {IGBT} switching energy loss and device current},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {134--143},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.023},
doi = {10.1016/J.MICROREL.2017.11.023},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DasNT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DavariKI18,
author = {Pooya Davari and
O. Kristensen and
Francesco Iannuzzo},
title = {Investigation of acoustic emission as a non-invasive method for detection
of power semiconductor aging},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {545--549},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.074},
doi = {10.1016/J.MICROREL.2018.06.074},
timestamp = {Fri, 22 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DavariKI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DavisMBRLYJ18,
author = {J. Lynn Davis and
Karmann C. Mills and
Georgiy V. Bobashev and
Kelley J. Rountree and
Michael Lamvik and
Robert Yaga and
Cortina Johnson},
title = {Understanding chromaticity shifts in {LED} devices through analytical
models},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {149--156},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.023},
doi = {10.1016/J.MICROREL.2018.03.023},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DavisMBRLYJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DeckerRRB18,
author = {Karsten M. Decker and
Ren{\'{e}} M. Rehmann and
Mike Roellig and
Karlheinz Bock},
title = {Fatigue measurement setup under combined thermal and vibration loading
on electronic {SMT} assembly},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {125--132},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.003},
doi = {10.1016/J.MICROREL.2018.06.003},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DeckerRRB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DiasCSSCG18,
author = {Marcelino Dias and
Thiago A. Costa and
Bismarck Luiz Silva and
Jos{\'{e}} E. Spinelli and
No{\'{e}} Cheung and
Amauri Garcia},
title = {A comparative analysis of microstructural features, tensile properties
and wettability of hypoperitectic and peritectic Sn-Sb solder alloys},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {150--158},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.029},
doi = {10.1016/J.MICROREL.2017.12.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DiasCSSCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DingCGWCLZP18,
author = {Lili Ding and
Wei Chen and
Hongxia Guo and
Tan Wang and
Rongmei Chen and
Yinhong Luo and
Fengqi Zhang and
Xiaoyu Pan},
title = {Modeling the impact of well contacts on {SEE} response with bias-dependent
Single-Event compact model},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {337--341},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.001},
doi = {10.1016/J.MICROREL.2017.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DingCGWCLZP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dixon-Luinenburg18,
author = {O. Dixon{-}Luinenburg and
J. Fine},
title = {In-situ transistor reliability measurements through nanoprobing},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {98--102},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.100},
doi = {10.1016/J.MICROREL.2018.06.100},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dixon-Luinenburg18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DornicIKTOEM18,
author = {Nausicaa Dornic and
Ali Ibrahim and
Zoubir Khatir and
Son{-}Ha Tran and
Jean{-}Pierre Ousten and
Jeffrey Ewanchuk and
Stefan Mollov},
title = {Analysis of the degradation mechanisms occurring in the topside interconnections
of {IGBT} power devices during power cycling},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {462--469},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.041},
doi = {10.1016/J.MICROREL.2018.07.041},
timestamp = {Fri, 05 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DornicIKTOEM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DouziKBTS18,
author = {Shawki Douzi and
Moncef Kadi and
Habib Boulzazen and
Mohamed Tlig and
Jaleleddine Ben Hadj Slama},
title = {Conducted {EMI} evolution of power SiC {MOSFET} in a Buck converter
after short-circuit aging tests},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {219--224},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.092},
doi = {10.1016/J.MICROREL.2018.06.092},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DouziKBTS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DreherSVHAB18,
author = {Patrick Dreher and
Roman Schmidt and
A. Vetter and
J. Hepp and
Karl Aberer and
Christoph J. Brabec},
title = {Non-destructive imaging of defects in Ag-sinter die attach layers
- {A} comparative study including X-ray, Scanning Acoustic Microscopy
and Thermography},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {365--370},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.121},
doi = {10.1016/J.MICROREL.2018.07.121},
timestamp = {Fri, 31 Mar 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DreherSVHAB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DrumlEBGPHH18,
author = {Norbert Druml and
Christoph Ehrenh{\"{o}}fer and
Walter Bell and
Christian Gailer and
Hannes Plank and
Thomas Herndl and
Gerald Holweg},
title = {A fast and flexible {HW/SW} co-processing framework for Time-of-Flight
3D imaging},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {64--76},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.004},
doi = {10.1016/J.MICROREL.2017.12.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DrumlEBGPHH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuRIC18,
author = {H. Du and
Paula Diaz Reigosa and
Francesco Iannuzzo and
Lorenzo Ceccarelli},
title = {Investigation on the degradation indicators of short-circuit tests
in 1.2{\unicode{8239}}kV SiC {MOSFET} power modules},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {661--665},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.039},
doi = {10.1016/J.MICROREL.2018.06.039},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DuRIC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DubeySSJ18,
author = {Deepak Kumar Dubey and
Meenu Singh and
Snehasis Sahoo and
Jwo{-}Huei Jou},
title = {Simple-structured efficient white organic light emitting diode via
solution process},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {293--296},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.07.076},
doi = {10.1016/J.MICROREL.2017.07.076},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DubeySSJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DudekHRFDSO18,
author = {Rainer Dudek and
M. Hildebrand and
Sven Rzepka and
T. Fries and
Ralf D{\"{o}}ring and
Bettina Seiler and
R. W. Ortmann},
title = {Combined simulation and optical measurement technique for investigation
of system effects on components solder fatigue},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {162--172},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.016},
doi = {10.1016/J.MICROREL.2018.02.016},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DudekHRFDSO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuongPR18,
author = {Pham Luu Trung Duong and
Hyunseok Park and
Nagarajan Raghavan},
title = {Application of expectation maximization and Kalman smoothing for prognosis
of lumen maintenance life for light emitting diodes},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {206--212},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.011},
doi = {10.1016/J.MICROREL.2018.06.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuongPR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuongPR18a,
author = {Pham Luu Trung Duong and
Hyunseok Park and
Nagarajan Raghavan},
title = {Application of multi-output Gaussian process regression for remaining
useful life prediction of light emitting diodes},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {80--84},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.106},
doi = {10.1016/J.MICROREL.2018.07.106},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuongPR18a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuongR18,
author = {Pham Luu Trung Duong and
Nagarajan Raghavan},
title = {Heuristic Kalman optimized particle filter for remaining useful life
prediction of lithium-ion battery},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {232--243},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.028},
doi = {10.1016/J.MICROREL.2017.12.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuongR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuongXYR18,
author = {Pham Luu Trung Duong and
Xuechu Xu and
Qing Yang and
Nagarajan Raghavan},
title = {Gaussian process regression approach for robust design and yield enhancement
of self-assembled nanostructures},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {85--90},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.062},
doi = {10.1016/J.MICROREL.2018.07.062},
timestamp = {Fri, 06 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DuongXYR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/El-DalyI18,
author = {A. A. El{-}Daly and
A. A. Ibrahiem},
title = {Influence of rotating magnetic field on solidification microstructure
and tensile properties of Sn-Bi lead-free solders},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {352--361},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.035},
doi = {10.1016/J.MICROREL.2017.10.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/El-DalyI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ElhariziZIKO18,
author = {Malika Elharizi and
Fadi Zaki and
Ali Ibrahim and
Zoubir Khatir and
Jean{-}Pierre Ousten},
title = {Effect of power cycling tests on traps under the gate of Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/AlGaN/GaN
normally-ON devices},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {671--676},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.070},
doi = {10.1016/J.MICROREL.2018.07.070},
timestamp = {Fri, 05 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ElhariziZIKO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM18,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {206},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.020},
doi = {10.1016/J.MICROREL.2018.02.020},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ErslandM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EshaghiE18,
author = {Siavash Es'haghi and
Mohammad Eshghi},
title = {Lifetime-aware scheduling in high level synthesis},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {86--97},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.016},
doi = {10.1016/J.MICROREL.2018.06.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EshaghiE18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EvansS18,
author = {John W. Evans and
Koustav Sinha},
title = {Applications of fracture mechanics to quantitative accelerated life
testing of plastic encapsulated microelectronics},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {317--327},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.022},
doi = {10.1016/J.MICROREL.2017.10.022},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EvansS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FabrisMSHLNJXGM18,
author = {Eric E. Fabris and
Matteo Meneghini and
Carlo De Santi and
Zongyang Hu and
Wenshen Li and
Kazuki Nomoto and
Debdeep Jena and
Huili Grace Xing and
Xiang Gao and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Degradation of GaN-on-GaN vertical diodes submitted to high current
stress},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {568--571},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.041},
doi = {10.1016/J.MICROREL.2018.06.041},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FabrisMSHLNJXGM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanCYQFZ18,
author = {Jiajie Fan and
Jianwu Cao and
Chaohua Yu and
Cheng Qian and
Xuejun Fan and
Guoqi Zhang},
title = {A design and qualification of {LED} flip Chip-on-Board module with
tunable color temperatures},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {140--148},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.033},
doi = {10.1016/J.MICROREL.2018.03.033},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FanCYQFZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanHWLL18,
author = {Peng Fan and
Shoudao Huang and
Huai Wang and
Huimin Li and
Derong Luo},
title = {From chip to inverter: Electro-thermal modeling and design for paralleled
power devices in high power application},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {271--277},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.040},
doi = {10.1016/J.MICROREL.2018.03.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FanHWLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanHWLLS18,
author = {Peng Fan and
Shoudao Huang and
Huai Wang and
Derong Luo and
Huimin Li and
Meidi Sun},
title = {Fundamental frequency region-based thermal control of power electronics
modules in high power motor drive},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1242--1246},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.036},
doi = {10.1016/J.MICROREL.2018.07.036},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FanHWLLS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FangCCLHSS18,
author = {Hsin{-}Kai Fang and
Kuei{-}Shu Chang{-}Liao and
Chia{-}Hsin Cheng and
Po{-}Yao Lin and
Wen{-}Hsien Huang and
Chang{-}Hong Shen and
Jia{-}Min Shieh},
title = {SiO\({}_{\mbox{2}}\) tunneling and Si\({}_{\mbox{3}}\)N\({}_{\mbox{4}}\)/HfO\({}_{\mbox{2}}\)
trapping layers formed with low temperature processes on gate-all-around
junctionless charge-trapping flash memory devices},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {319--322},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.021},
doi = {10.1016/J.MICROREL.2018.02.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FangCCLHSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FavataS18,
author = {Joseph Favata and
Sina Shahbazmohamadi},
title = {Realistic non-destructive testing of integrated circuit bond wiring
using 3-D X-ray tomography, reverse engineering, and finite element
analysis},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {91--100},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.015},
doi = {10.1016/J.MICROREL.2018.02.015},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FavataS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FayyazACRI18,
author = {Asad Fayyaz and
Besar Asllani and
Alberto Castellazzi and
Michele Riccio and
Andrea Irace},
title = {Avalanche ruggedness of parallel SiC power MOSFETs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {666--670},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.038},
doi = {10.1016/J.MICROREL.2018.06.038},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FayyazACRI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FengLSH18,
author = {Ding Feng and
Sheng Lin and
Xiaojun Sun and
Zhengyou He},
title = {Reliability assessment for traction power supply system based on Quantification
of Margins and Uncertainties},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1195--1200},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.032},
doi = {10.1016/J.MICROREL.2018.06.032},
timestamp = {Tue, 21 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FengLSH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FengRMDPW18,
author = {Xuan Feng and
Nagarajan Raghavan and
Sen Mei and
Shurong Dong and
Kin Leong Pey and
Hei Wong},
title = {Statistical nature of hard breakdown recovery in high-{\(\kappa\)}
dielectric stacks studied using ramped voltage stress},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {164--168},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.104},
doi = {10.1016/J.MICROREL.2018.07.104},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FengRMDPW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fleetwood18,
author = {Daniel M. Fleetwood},
title = {Border traps and bias-temperature instabilities in {MOS} devices},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {266--277},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.007},
doi = {10.1016/J.MICROREL.2017.11.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fleetwood18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FratinONCR18,
author = {Vinicius Fratin and
Daniel Oliveira and
Philippe O. A. Navaux and
Luigi Carro and
Paolo Rech},
title = {Energy-Delay-FIT Product to compare processors and algorithm implementations},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {112--120},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.019},
doi = {10.1016/J.MICROREL.2018.03.019},
timestamp = {Wed, 01 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FratinONCR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FuFKD18,
author = {Jian{-}Zhi Fu and
Fran{\c{c}}ois Fouquet and
Moncef Kadi and
Pascal Dherb{\'{e}}court},
title = {Evolution of {C-V} and {I-V} characteristics for a commercial 600{\unicode{8239}}V
GaN {GIT} power device under repetitive short-circuit tests},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {652--655},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.034},
doi = {10.1016/J.MICROREL.2018.06.034},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FuFKD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FuSGWZW18,
author = {Guicui Fu and
Yutai Su and
Wendi Guo and
Bo Wan and
Zhongqing Zhang and
Ye Wang},
title = {Life prediction methodology of system-in-package based on physics
of failure},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {173--178},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.119},
doi = {10.1016/J.MICROREL.2018.06.119},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FuSGWZW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FujiwaraYK18,
author = {T. Fujiwara and
K. Yamamoto and
Hidehiko Kimura},
title = {Quantification of lead-free solder fatigue by {EBSD} analysis},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {691--694},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.006},
doi = {10.1016/J.MICROREL.2018.07.006},
timestamp = {Mon, 23 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FujiwaraYK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GabsiMZ18,
author = {I. Gabsi and
Samah Maalej and
Mohamed Chaker Zaghdoudi},
title = {Thermal performance modeling of loop heat pipes with flat evaporator
for electronics cooling},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {37--47},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.023},
doi = {10.1016/J.MICROREL.2018.02.023},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GabsiMZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GainZ18,
author = {Asit Kumar Gain and
Liangchi Zhang},
title = {High-temperature and humidity change the microstructure and degrade
the material properties of tin{\unicode{8209}}silver interconnect
material},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {101--110},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.022},
doi = {10.1016/J.MICROREL.2018.02.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GainZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GainZ18a,
author = {Asit Kumar Gain and
Liangchi Zhang},
title = {Growth nature of in-situ Cu\({}_{\mbox{6}}\)Sn\({}_{\mbox{5}}\)-phase
and their influence on creep and damping characteristics of Sn-Cu
material under high-temperature and humidity},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {278--285},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.053},
doi = {10.1016/J.MICROREL.2018.07.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GainZ18a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GajewskiGSWBMP18,
author = {Donald A. Gajewski and
Satyaki Ganguly and
Scott T. Sheppard and
Simon Wood and
Jeff B. Barner and
Jim W. Milligan and
John Palmour},
title = {Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {1--6},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.018},
doi = {10.1016/J.MICROREL.2018.02.018},
timestamp = {Fri, 16 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GajewskiGSWBMP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalluzzoSGBCL18,
author = {Fabio Ricco Galluzzo and
A. Scuto and
Cosimo Gerardi and
A. Battaglia and
Andrea Canino and
Salvatore Lombardo},
title = {Performance increase of tandem amorphous/microcrystalline Si {PV}
devices under variable illumination and temperature conditions},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1025--1029},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.139},
doi = {10.1016/J.MICROREL.2018.07.139},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GalluzzoSGBCL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoYCCLL18,
author = {Bing Gao and
Fan Yang and
Minyou Chen and
Yigao Chen and
Wei Lai and
Chao Liu},
title = {Thermal lifetime estimation method of {IGBT} module considering solder
fatigue damage feedback loop},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {51--61},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.046},
doi = {10.1016/J.MICROREL.2017.12.046},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GaoYCCLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GarrosLSFVR18,
author = {Xavier Garros and
Antoine Laurent and
Alexandre Subirats and
X. Federspiel and
E. Vincent and
Gilles Reimbold},
title = {Characterization and modeling of dynamic variability induced by {BTI}
in nano-scaled transistors},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {100--108},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.025},
doi = {10.1016/J.MICROREL.2017.11.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GarrosLSFVR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GatlaCZZN18,
author = {Ranjith Kumar Gatla and
Wei Chen and
Guorong Zhu and
Dingjun Zeng and
Ramchander Nirudi},
title = {Lifetime estimation of modular cascaded H-bridge {MLPVI} for grid-connected
{PV} systems considering mission profile},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1051--1056},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.024},
doi = {10.1016/J.MICROREL.2018.06.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GatlaCZZN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GeorgeZBKN18,
author = {Allen Jose George and
Juergen Zipprich and
Marlies Breitenbach and
Markus Klingler and
Mathias Nowottnick},
title = {Reliability investigation of large area solder joints in power electronics
modules and its simulative representation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {762--767},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.049},
doi = {10.1016/J.MICROREL.2018.06.049},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GeorgeZBKN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Gharaibeh18,
author = {Mohammad A. Gharaibeh},
title = {Reliability analysis of vibrating electronic assemblies using analytical
solutions and response surface methodology},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {238--247},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.029},
doi = {10.1016/J.MICROREL.2018.03.029},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Gharaibeh18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GharaibehSP18,
author = {Mohammad A. Gharaibeh and
Quang T. Su and
James M. Pitarresi},
title = {Analytical model for the transient analysis of electronic assemblies
subjected to impact loading},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {112--119},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.009},
doi = {10.1016/J.MICROREL.2018.08.009},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GharaibehSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GholamiradSS18,
author = {Maryam Gholamirad and
Siavash Soltani and
Panthea Sepehrband},
title = {Dislocation assisted diffusion: {A} mechanism for growth of intermetallic
compounds in copper ball bonds},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {210--217},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.038},
doi = {10.1016/J.MICROREL.2017.12.038},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GholamiradSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhorbaniCCM18,
author = {Hamidreza Ghorbani and
Vicent Sala Caselles and
Alejandro Paredes Camacho and
Jose Luis Romeral Martinez},
title = {Embedding a feedforward controller into the {IGBT} gate driver for
turn-on transient improvement},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {230--240},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.008},
doi = {10.1016/J.MICROREL.2017.12.008},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GhorbaniCCM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GirardDHD18,
author = {M. Girard and
Tristan Dubois and
Patrick Hoffmann and
Genevi{\`{e}}ve Duchamp},
title = {Effects of {HPEM} stress on GaAs low-noise amplifier from circuit
to component scale},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {914--919},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.108},
doi = {10.1016/J.MICROREL.2018.07.108},
timestamp = {Thu, 10 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GirardDHD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoerlVBBV18,
author = {Roger C. Goerl and
Paulo Ricardo Cechelero Villa and
Let{\'{\i}}cia Maria Veiras Bolzani and
Eduardo Augusto Bezerra and
Fabian Luis Vargas},
title = {An efficient {EDAC} approach for handling multiple bit upsets in memory
array},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {214--218},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.060},
doi = {10.1016/J.MICROREL.2018.07.060},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GoerlVBBV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GolanAAKB18,
author = {Gady Golan and
Moshe Azoulay and
Tsuriel Avraham and
Ilan Kremenetsky and
Joseph B. Bernstein},
title = {An improved reliability model for Si and GaN power {FET}},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {77--89},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.020},
doi = {10.1016/J.MICROREL.2017.12.020},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GolanAAKB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GomesSMMCK18,
author = {Iuri Albandes Cunha Gomes and
Alejandro Serrano{-}Cases and
Mayler G. A. Martins and
Antonio Mart{\'{\i}}nez{-}{\'{A}}lvarez and
Sergio Cuenca{-}Asensi and
Fernanda Lima Kastensmidt},
title = {Design of approximate-TMR using approximate library and heuristic
approaches},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {898--902},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.115},
doi = {10.1016/J.MICROREL.2018.07.115},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GomesSMMCK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoncalvesSA18,
author = {Marcio Gon{\c{c}}alves and
Mateus Saquetti and
Jos{\'{e}} Rodrigo Azambuja},
title = {Evaluating the reliability of a {GPU} pipeline to {SEU} and the impacts
of software-based and hardware-based fault tolerance techniques},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {931--935},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.007},
doi = {10.1016/J.MICROREL.2018.07.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoncalvesSA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GonzalezA18,
author = {Jose Angel Ortiz Gonzalez and
Olayiwola Alatise},
title = {Bias temperature instability and condition monitoring in SiC power
MOSFETs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {557--562},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.045},
doi = {10.1016/J.MICROREL.2018.06.045},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GonzalezA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoreckiP18,
author = {Krzysztof G{\'{o}}recki and
Przemyslaw Ptak},
title = {New dynamic electro-thermo-optical model of power LEDs},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {1--7},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.132},
doi = {10.1016/J.MICROREL.2018.07.132},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoreckiP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GosWERJSG18,
author = {Wolfgang Goes and
Yannick Wimmer and
Al{-}Moatasem El{-}Sayed and
Gerhard Rzepa and
Markus Jech and
Alexander L. Shluger and
Tibor Grasser},
title = {Identification of oxide defects in semiconductor devices: {A} systematic
approach linking {DFT} to rate equations and experimental evidence},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {286--320},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.021},
doi = {10.1016/J.MICROREL.2017.12.021},
timestamp = {Thu, 13 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GosWERJSG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GranigFZ18,
author = {Wolfgang Granig and
Lisa{-}Marie Faller and
Hubert Zangl},
title = {Sensor system optimization to meet reliability targets},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {113--124},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.005},
doi = {10.1016/J.MICROREL.2018.06.005},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GranigFZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuLLF18,
author = {Jian Gu and
Jian Lin and
Yongping Lei and
Hanguang Fu},
title = {Experimental analysis of Sn-3.0Ag-0.5Cu solder joint board-level drop/vibration
impact failure models after thermal/isothermal cycling},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {29--36},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.014},
doi = {10.1016/J.MICROREL.2017.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuLLF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuYZ18,
author = {Jingda Gu and
Xiaofeng Yang and
Trillion Q. Zheng},
title = {Influence factors analysis of rail potential in urban rail transit},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1300--1304},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.039},
doi = {10.1016/J.MICROREL.2018.07.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuYZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuoSZCL18,
author = {Qiang Guo and
Siyu Sun and
Zhihao Zhang and
Hongtao Chen and
Mingyu Li},
title = {Microstructure evolution and mechanical strength evaluation in Ag/Sn/Cu
{TLP} bonding interconnection during aging test},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {144--148},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.001},
doi = {10.1016/J.MICROREL.2017.12.001},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GuoSZCL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuoWRLLJWH18,
author = {Shaofeng Guo and
Runsheng Wang and
Pengpeng Ren and
Changze Liu and
Mulong Luo and
Xiaobo Jiang and
Yangyuan Wang and
Ru Huang},
title = {Investigation on NBTI-induced dynamic variability in nanoscale {CMOS}
devices: Modeling, experimental evidence, and impact on circuits},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {101--111},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.028},
doi = {10.1016/J.MICROREL.2017.11.028},
timestamp = {Mon, 03 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GuoWRLLJWH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HabersatLG18,
author = {Daniel B. Habersat and
Aivars J. Lelis and
Ronald Green},
title = {Measurement considerations for evaluating {BTI} effects in SiC MOSFETs},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {121--126},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.015},
doi = {10.1016/J.MICROREL.2017.12.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HabersatLG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HachemTMT18,
author = {D. Hachem and
David Tr{\'{e}}mouilles and
Frederic Morancho and
Ga{\"{e}}tan Toulon},
title = {A new electro-optical transmission-line measurement-method revealing
a possible contribution of source and drain contact resistances to
GaN {HEMT} dynamic on-resistance},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {406--410},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.119},
doi = {10.1016/J.MICROREL.2018.07.119},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HachemTMT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HalecekFS18,
author = {Ivo H{\'{a}}lecek and
Petr Fiser and
Jan Schmidt},
title = {Towards {AND/XOR} balanced synthesis: Logic circuits rewriting with
{XOR}},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {274--286},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.031},
doi = {10.1016/J.MICROREL.2017.12.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HalecekFS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HalickSSP18,
author = {Mohamed Halick Mohamed Sathik and
Prasanth Sundarajan and
F. Sasongko and
Josep Pou},
title = {Online condition monitoring of {IGBT} modules using voltage change
rate identification},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {486--492},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.040},
doi = {10.1016/J.MICROREL.2018.07.040},
timestamp = {Fri, 19 Jul 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HalickSSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Hammad18,
author = {Ahmed E. Hammad},
title = {Enhancing the ductility and mechanical behavior of Sn-1.0Ag-0.5Cu
lead-free solder by adding trace amount of elements Ni and Sb},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {133--141},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.015},
doi = {10.1016/J.MICROREL.2018.06.015},
timestamp = {Tue, 17 Sep 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Hammad18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanGCSL18,
author = {Chang{-}Fu Han and
Yi{-}Zhe Guo and
Chung{-}Jen Chung and
Chang{-}Hong Shen and
Jen{-}Fin Lin},
title = {Effects of SiO\({}_{\mbox{2}}\) film thickness and operating temperature
on thermally-induced failures in through-silicon-via structures},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {1--13},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.006},
doi = {10.1016/J.MICROREL.2018.02.006},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HanGCSL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HangYS18,
author = {Cuicui Hang and
Liming Ying and
Naiqiu Shu},
title = {Transistor open-circuit fault diagnosis in two-level three-phase inverter
based on similarity measurement},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {291--297},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.009},
doi = {10.1016/J.MICROREL.2018.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HangYS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaniniA18,
author = {Wasma Hanini and
Moez Ayadi},
title = {Electro thermal modeling of the power diode using Pspice},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {82--91},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.008},
doi = {10.1016/J.MICROREL.2018.05.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaniniA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HasegawaNO18,
author = {Kazunori Hasegawa and
Shinichi Nishizawa and
Ichiro Omura},
title = {{ESR} and capacitance monitoring of a dc-link capacitor used in a
three-phase {PWM} inverter with a front-end diode rectifier},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {433--437},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.023},
doi = {10.1016/J.MICROREL.2018.07.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HasegawaNO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HasegawaTN18,
author = {Kazunori Hasegawa and
Kousuke Tsuzaki and
Shinichi Nishizawa},
title = {DC-bias-voltage dependence of degradation of aluminum electrolytic
capacitors},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {115--118},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.012},
doi = {10.1016/J.MICROREL.2018.02.012},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HasegawaTN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeHZQHQWS18,
author = {Wei He and
Guan{-}Yu Hu and
Zhi{-}Jie Zhou and
Peili Qiao and
Xiaoxia Han and
Yuan{-}Yuan Qu and
Hang Wei and
Chun Shi},
title = {A new hierarchical belief-rule-based method for reliability evaluation
of wireless sensor network},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {33--51},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.019},
doi = {10.1016/J.MICROREL.2018.05.019},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeHZQHQWS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeinssenHTTPP18,
author = {Sascha Heinssen and
Theodor Hillebrand and
Maike Taddiken and
Konstantin Tscherkaschin and
Steffen Paul and
Dagmar Peters{-}Drolshagen},
title = {Design for reliability of generic sensor interface circuits},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {184--197},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.029},
doi = {10.1016/J.MICROREL.2017.11.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeinssenHTTPP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HertlVADMPRS18,
author = {Michael Hertl and
Nicolas Vivet and
Fabien Allanic and
Sandra Dureau and
Armelle Minguet and
Nicolas Porcher and
Isaline Richard and
Pauline Serre},
title = {Use of golden samples for the assessment of the quality and reproducibility
of scanning acoustic microscopy images of electronics samples},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {282--287},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.052},
doi = {10.1016/J.MICROREL.2018.07.052},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HertlVADMPRS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HollandB18,
author = {Steffen Holland and
Rolf Brenner},
title = {Voltage oscillations during surge pulses induced by self-extinguishing
non-destructive second breakdown in pn-junction diodes},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {208--213},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.016},
doi = {10.1016/J.MICROREL.2018.07.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HollandB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HongC18,
author = {Eun{-}Ki Hong and
Won{-}Ju Cho},
title = {Effect of microwave annealing on {SOI} MOSFETs: Post-metal annealing
with low thermal budget},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {306--311},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.07.070},
doi = {10.1016/J.MICROREL.2017.07.070},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HongC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HookHM18,
author = {Michael David Hook and
Stevan Hunter and
Michael Mayer},
title = {Deriving lifetime predictions for wire bonds at high temperatures},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1124--1129},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.078},
doi = {10.1016/J.MICROREL.2018.06.078},
timestamp = {Tue, 19 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HookHM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuDJWXLL18,
author = {Tao Hu and
Shurong Dong and
Hao Jin and
Hei Wong and
Zekun Xu and
Xiang Li and
Juin J. Liou},
title = {A double snapback {SCR} {ESD} protection scheme for 28{\unicode{8239}}nm
{CMOS} process},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {20--25},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.010},
doi = {10.1016/J.MICROREL.2018.03.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuDJWXLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuHLZ18,
author = {Jingge Hu and
Meng Huang and
Yi Liu and
Xiaoming Zha},
title = {Transient junction temperature estimation of {IGBT} using improved
thermal model},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1146--1150},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.098},
doi = {10.1016/J.MICROREL.2018.07.098},
timestamp = {Mon, 15 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuHLZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuJSLCZ18,
author = {Jiaxing Hu and
Bo Jing and
Zengjin Sheng and
Fang Lu and
Yaojun Chen and
Yulin Zhang},
title = {Failure and failure characterization of {QFP} package interconnect
structure under random vibration condition},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {120--127},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.011},
doi = {10.1016/J.MICROREL.2018.08.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuJSLCZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuLIB18,
author = {Keting Hu and
Zhigang Liu and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {Simple and effective open switch fault diagnosis of single-phase {PWM}
rectifier},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {423--427},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.023},
doi = {10.1016/J.MICROREL.2018.06.023},
timestamp = {Thu, 28 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuLIB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuYCLBHB18,
author = {Siyang Hu and
Chengdong Yuan and
Alessandro Castagnotto and
Boris Lohmann and
Sofiane Bouhedma and
Dennis Hohlfeld and
Tamara Bechtold},
title = {Stable reduced order modeling of piezoelectric energy harvesting modules
using implicit Schur complement},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {148--155},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.026},
doi = {10.1016/J.MICROREL.2018.03.026},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuYCLBHB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangCYC18,
author = {Shao{-}Chang Huang and
Hung{-}Wei Chen and
Jen{-}Hang Yang and
Mi{-}Chang Chang},
title = {Improving {ESD} protection of 5V {NMOSFET} large array device in 0.4{\(\mu\)}m
{BCD} process},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {48--54},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.005},
doi = {10.1016/J.MICROREL.2018.03.005},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangCYC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangFL18,
author = {Guo{-}Lun Huang and
Wei{-}Hao Fu and
Chun{-}Yu Lin},
title = {Investigation and application of vertical {NPN} devices for {RF} {ESD}
protection in BiCMOS technology},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {271--280},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.06.068},
doi = {10.1016/J.MICROREL.2017.06.068},
timestamp = {Wed, 04 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuangFL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangLCZM18,
author = {Darong Huang and
Lanyan Ke and
Xiaoyan Chu and
Ling Zhao and
Bo Mi},
title = {Fault diagnosis for the motor drive system of urban transit based
on improved Hidden Markov Model},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {179--189},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.017},
doi = {10.1016/J.MICROREL.2018.01.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangLCZM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangLXL18,
author = {Yongle Huang and
Yifei Luo and
Fei Xiao and
Binli Liu},
title = {Temperature monitoring inside {IGBT} modules at forward bias from
the cross section and its finite element analysis},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {187--197},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.008},
doi = {10.1016/J.MICROREL.2018.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangLXL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangNCP18,
author = {Chien{-}Ming Huang and
Daniel Nunez and
James Coburn and
Michael G. Pecht},
title = {Risk of tin whiskers in the nuclear industry},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {22--30},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.019},
doi = {10.1016/J.MICROREL.2017.12.019},
timestamp = {Mon, 04 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuangNCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HylskySVCVV18,
author = {Josef Hylsk{\'{y}} and
D{\'{a}}vid Strachala and
Petr Vyroubal and
Pavel Cudek and
Jir{\'{\i}} Vanek and
Petr Van{\'{y}}sek},
title = {Effect of negative potential on the extent of {PID} degradation in
photovoltaic power plant in a real operation mode},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {12--18},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.003},
doi = {10.1016/J.MICROREL.2018.04.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HylskySVCVV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Isaza-GonzalezR18,
author = {Jose Isaza{-}Gonzalez and
Felipe Restrepo{-}Calle and
Antonio Mart{\'{\i}}nez{-}{\'{A}}lvarez and
Sergio Cuenca{-}Asensi},
title = {{SHARC:} An efficient metric for selective protection of software
against soft errors},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {903--908},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.008},
doi = {10.1016/J.MICROREL.2018.07.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Isaza-GonzalezR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangKWJ18,
author = {Sheng{-}Lyang Jang and
Chih{-}Chiang Kang and
Huan{-}Chun Wang and
Miin{-}Horng Juang},
title = {Dual-resonance concurrent oscillator},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {208--215},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.03.012},
doi = {10.1016/J.MICROREL.2017.03.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JangKWJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JanickiTSRN18,
author = {Marcin Janicki and
Tomasz Torzewicz and
Agnieszka Samson and
Tomasz Raszkowski and
Andrzej Napieralski},
title = {Experimental identification of {LED} compact thermal model element
values},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {20--26},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.003},
doi = {10.1016/J.MICROREL.2018.05.003},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JanickiTSRN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JayaprasadDBH18,
author = {G. Jayaprasad and
P. P. Dhanalakshmi and
M. Baskaran and
S. Hemachandran},
title = {Analysis of low isolation problem in {HMC} using Ishikawa model: {A}
case study},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {195--200},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.041},
doi = {10.1016/J.MICROREL.2017.12.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JayaprasadDBH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiaLHWLL18,
author = {Yunpeng Jia and
Zhenhua Lin and
Dongqing Hu and
Yu Wu and
Peng Li and
Guanghai Liu},
title = {Micro-Raman spectroscopy applied in crystal structure analysis on
the {ESD} failure mechanism of SiC {JBS} diodes},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {37--41},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.001},
doi = {10.1016/J.MICROREL.2018.01.001},
timestamp = {Thu, 04 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JiaLHWLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiangWLCYLTS18,
author = {Xi Jiang and
Jun Wang and
Jiwu Lu and
Jianjun Chen and
Xin Yang and
Zongjian Li and
Chunming Tu and
Zheng John Shen},
title = {Failure modes and mechanism analysis of SiC {MOSFET} under short-circuit
conditions},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {593--597},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.101},
doi = {10.1016/J.MICROREL.2018.07.101},
timestamp = {Fri, 04 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JiangWLCYLTS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JinKKN18,
author = {Sanghun Jin and
Min{-}Su Kim and
Shutetsu Kanayama and
Hiroshi Nishikawa},
title = {Shear properties of In-Bi alloy joints with Cu substrates during thermal
aging},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {795--800},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.046},
doi = {10.1016/J.MICROREL.2018.07.046},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JinKKN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JinKKSKKP18,
author = {Minjung Jin and
Kangjung Kim and
Yoohwan Kim and
Hyewon Shim and
Jinju Kim and
Gunrae Kim and
Sangwoo Pae},
title = {Investigation of {BTI} characteristics and its behavior on 10 nm {SRAM}
with high-k/metal gate FinFET technology having multi-V\({}_{\mbox{T}}\)
gate stack},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {201--209},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.014},
doi = {10.1016/J.MICROREL.2017.12.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JinKKSKKP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JongSS18,
author = {Maurits J. de Jong and
Cora Salm and
Jurriaan Schmitz},
title = {Towards understanding recovery of hot-carrier induced degradation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {147--151},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.057},
doi = {10.1016/J.MICROREL.2018.07.057},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JongSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JuanLCKWS18,
author = {P. C. Juan and
K. C. Lin and
H. Y. Chu and
Y. C. Kuo and
H. W. Wang and
T. Y. Shih},
title = {Ferroelectric of HfO\({}_{\mbox{2}}\) dielectric layer sputtered with
TiN or ZrN for sandwich-like metal-insulator-metal capacitors},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {242--248},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.06.017},
doi = {10.1016/J.MICROREL.2017.06.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JuanLCKWS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerFWRPBSCLP18,
author = {Ben Kaczer and
Jacopo Franco and
Pieter Weckx and
Philippe Roussel and
Vamsi Putcha and
Erik Bury and
Marko Simicic and
Adrian Vaisman Chasin and
Dimitri Linten and
Bertrand Parvais and
Francky Catthoor and
Gerhard Rzepa and
Michael Waltl and
Tibor Grasser},
title = {A brief overview of gate oxide defect properties and their relation
to {MOSFET} instabilities and device and circuit time-dependent variability},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {186--194},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.022},
doi = {10.1016/J.MICROREL.2017.11.022},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaczerFWRPBSCLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KampmannH18,
author = {Matthias Kampmann and
Sybille Hellebrand},
title = {Design for Small Delay Test - {A} Simulation Study},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {124--133},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.019},
doi = {10.1016/J.MICROREL.2017.11.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KampmannH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KamraniYFSFWRWW18,
author = {Hamed Kamrani and
Feng Yu and
Kristian Frank and
Klaas Strempel and
Muhammad Fahlesa Fatahilah and
Hutomo Suryo Wasisto and
Friedhard R{\"{o}}mer and
Andreas Waag and
Bernd Witzigmann},
title = {Thermal performance analysis of GaN nanowire and fin-shaped power
transistors based on self-consistent electrothermal simulations},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {227--231},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.007},
doi = {10.1016/J.MICROREL.2018.10.007},
timestamp = {Tue, 22 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KamraniYFSFWRWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaoC18,
author = {Chin{-}Li Kao and
Tei{-}Chen Chen},
title = {Ball impact responses of Sn-1Ag-0.5Cu solder joints at different temperatures
and surface finishes},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {204--212},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.001},
doi = {10.1016/J.MICROREL.2018.02.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaoC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaramiAZ18,
author = {Masoomeh Karami and
Athena Abdi and
Hamid R. Zarandi},
title = {A cross-layer aging-aware task scheduling approach for multiprocessor
embedded systems},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {190--197},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.015},
doi = {10.1016/J.MICROREL.2018.04.015},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaramiAZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KarboyanUMPK18,
author = {Serge Karboyan and
Michael J. Uren and
Manikant and
James W. Pomeroy and
Martin Kuball},
title = {On the origin of dynamic R\({}_{\mbox{on}}\) in commercial GaN-on-Si
HEMTs},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {306--311},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.006},
doi = {10.1016/J.MICROREL.2017.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KarboyanUMPK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KarthigeyanC18,
author = {K. A. Karthigeyan and
Premanand Venkatesh Chandramani},
title = {Study and analysis of {DR-VCO} for rad-hardness in type {II} third
order {CPLL}},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {190--196},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.018},
doi = {10.1016/J.MICROREL.2018.01.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KarthigeyanC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaundalR18,
author = {Shalu Kaundal and
Ashwani K. Rana},
title = {Evaluation of statistical variability and parametric sensitivity of
non-uniformly doped Junctionless FinFET},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {298--305},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.017},
doi = {10.1016/J.MICROREL.2018.10.017},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaundalR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KawaharaWKK18,
author = {C. Kawahara and
Y. Wada and
S. Kinouchi and
H. Kobayashi},
title = {Non-destructive estimation method on cosmic ray ruggedness of power
semiconductors using repetitive monitoring technique},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {957--960},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.147},
doi = {10.1016/J.MICROREL.2018.07.147},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KawaharaWKK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KelleyPBSB18,
author = {Mitchell D. Kelley and
Bejoy N. Pushpakaran and
Argenis V. Bilbao and
James A. Schrock and
Stephen B. Bayne},
title = {Single-pulse avalanche mode operation of 10-kV/10-A SiC {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {174--180},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.011},
doi = {10.1016/J.MICROREL.2017.12.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KelleyPBSB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KennedyYR18,
author = {Simon Kennedy and
Mehmet Rasit Yuce and
Jean{-}Michel Redoute},
title = {Susceptibility of flash ADCs to electromagnetic interference},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {218--225},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.040},
doi = {10.1016/J.MICROREL.2017.12.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KennedyYR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KerberN18,
author = {Andreas Kerber and
Tanya Nigam},
title = {Bias temperature instability in scaled {CMOS} technologies: {A} circuit
perspective},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {31--40},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.006},
doi = {10.1016/J.MICROREL.2017.12.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KerberN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhalilullahRCPM18,
author = {Ibrahim Khalilullah and
Talukder Reza and
Liangbiao Chen and
Mark D. Placette and
A. K. M. Monayem H. Mazumder and
Jiang Zhou and
Jiajie Fan and
Cheng Qian and
Guoqi Zhang and
Xuejun Fan},
title = {In-situ characterization of moisture absorption and hygroscopic swelling
of silicone/phosphor composite film and epoxy mold compound in {LED}
packaging},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {208--214},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.025},
doi = {10.1016/J.MICROREL.2018.03.025},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhalilullahRCPM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhatibiKL18,
author = {Golta Khatibi and
A. Betzwar Kotas and
Martin Lederer},
title = {Effect of aging on mechanical properties of high temperature Pb-rich
solder joints},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {1--11},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.009},
doi = {10.1016/J.MICROREL.2018.03.009},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhatibiKL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KheraK18,
author = {Neeraj Khera and
Shakeb Ahmad Khan},
title = {Prognostics of aluminum electrolytic capacitors using artificial neural
network approach},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {328--336},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.002},
doi = {10.1016/J.MICROREL.2017.11.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KheraK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimCPCJ18,
author = {Dongshin Kim and
Ju{-}Hwan Choi and
Nochang Park and
Sung{-}Il Chan and
Yongchae Jeong},
title = {Analysis of semiconductor fault using {DS} (damped sinusoidal) {HPEM}
injection},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {411--417},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.117},
doi = {10.1016/J.MICROREL.2018.07.117},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimCPCJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimCSCSNS18,
author = {Dongjin Kim and
Chuantong Chen and
Aiji Suetake and
Chanyang Choe and
Tohru Sugahara and
Shijo Nagao and
Katsuaki Suganuma},
title = {Development of thermal shock-resistant of GaN/DBC die-attached module
by using Ag sinter paste and thermal stress relaxation structure},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {779--787},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.044},
doi = {10.1016/J.MICROREL.2018.07.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimCSCSNS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKPP18,
author = {Hyunwoo Kim and
DongJoon Kim and
No{-}Cheol Park and
Young{-}Pil Park},
title = {Acoustic noise and vibration analysis of solid state drive induced
by multi-layer ceramic capacitors},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {136--145},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.021},
doi = {10.1016/J.MICROREL.2018.01.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimKPP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKYYB18,
author = {Hye{-}Young Kim and
Jae{-}Yeon Kim and
Ki{-}Tae Yoo and
Won{-}Jon Yang and
Jai{-}Won Byeon},
title = {Failure mechanism of Ag nanowire-coated conductive transparent electrode
for wearable devices under folding and torsional fatigue condition},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {345--349},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.120},
doi = {10.1016/J.MICROREL.2018.07.120},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimKYYB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimLKLSL18,
author = {Jongkyun Kim and
Namhyun Lee and
Gang{-}Jun Kim and
Young{-}Yun Lee and
Jung{-}Eun Seok and
Yunsung Lee},
title = {Effect of OFF-state stress on reliability of nMOSFET in {SWD} circuits
of {DRAM}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {183--185},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.101},
doi = {10.1016/J.MICROREL.2018.06.101},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimLKLSL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimLKSL18,
author = {Gang{-}Jun Kim and
Nam{-}Hyun Lee and
Jongkyun Kim and
Jung Eun Seok and
Yunsung Lee},
title = {Effect of {DC/AC} stress on the reliability of cell capacitor in {DRAM}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {179--182},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.117},
doi = {10.1016/J.MICROREL.2018.06.117},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimLKSL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimYLKCCKK18,
author = {Junyeap Kim and
Hanbin Yoo and
Heesung Lee and
Seong Kwang Kim and
Sungju Choi and
Sung{-}Jin Choi and
Dae Hwan Kim and
Dong Myong Kim},
title = {Comprehensive separate extraction of parasitic resistances in MOSFETs
considering the gate bias-dependence and the asymmetric overlap length},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {66--70},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.011},
doi = {10.1016/J.MICROREL.2018.04.011},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimYLKCCKK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KohutkaS18,
author = {Luk{\'{a}}s Koh{\'{u}}tka and
Viera Stopjakov{\'{a}}},
title = {Reliable real-time task scheduler based on Rocket Queue architecture},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {7--19},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.007},
doi = {10.1016/J.MICROREL.2017.12.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KohutkaS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KolbingerWGRL18,
author = {Elisabeth Kolbinger and
Stefan Wagner and
Astrid Gollhardt and
Olaf R{\"{a}}mer and
Klaus{-}Dieter Lang},
title = {Corrosion behaviour of sintered silver under maritime environmental
conditions},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {715--720},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.123},
doi = {10.1016/J.MICROREL.2018.07.123},
timestamp = {Mon, 02 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KolbingerWGRL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KomatsuYMO18,
author = {Yutaka Komatsu and
Seira Yamaguchi and
Atsushi Masuda and
Keisuke Ohdaira},
title = {Multistage performance deterioration in n-type crystalline silicon
photovoltaic modules undergoing potential-induced degradation},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {127--133},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.018},
doi = {10.1016/J.MICROREL.2018.03.018},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KomatsuYMO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KozicHRSSSB18,
author = {Eva Kozic and
Ren{\'{e}} Hammer and
J{\"{o}}rdis Rosc and
Bernhard Sartory and
Joerg Siegert and
Franz Schrank and
Roland Brunner},
title = {Metallization defect detection in 3D integrated components using scanning
acoustic microscopy and acoustic simulations},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {262--266},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.075},
doi = {10.1016/J.MICROREL.2018.07.075},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KozicHRSSSB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KraemerRMAMW18,
author = {Frank Kraemer and
Mike Roellig and
Ren{\'{e}} Metasch and
Joseph Al Ahmar and
Karsten Meier and
Steffen Wiese},
title = {Experimental determination of the Young's modulus of copper and solder
materials for electronic packaging},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {251--256},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.002},
doi = {10.1016/J.MICROREL.2018.06.002},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KraemerRMAMW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrempS18,
author = {S. Kremp and
O. Schilling},
title = {Humidity robustness for high voltage power modules: Limiting mechanisms
and improvement of lifetime},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {447--452},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.043},
doi = {10.1016/J.MICROREL.2018.06.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KrempS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KristofikBM18,
author = {Stefan Kristof{\'{\i}}k and
Marcel Bal{\'{a}}z and
Peter Mal{\'{\i}}k},
title = {Hardware redundancy architecture based on reconfigurable logic blocks
with persistent high reliability improvement},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {38--53},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.010},
doi = {10.1016/J.MICROREL.2018.04.010},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KristofikBM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuczynskaSBMRKW18,
author = {Marta Kuczynska and
Natalja Schafet and
Ulrich Becker and
Ren{\'{e}} Metasch and
Mike Roellig and
Alexander Kabakchiev and
Stefan Weihe},
title = {Validation of different {SAC305} material models calibrated on isothermal
tests using in-situ {TMF} measurement of thermally induced shear load},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {67--85},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.007},
doi = {10.1016/J.MICROREL.2018.06.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KuczynskaSBMRKW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumarKC18,
author = {Bijender Kumar and
Neeta Khare and
P. K. Chaturvedi},
title = {FPGA-based design of advanced {BMS} implementing SoC/SoH estimators},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {66--74},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.015},
doi = {10.1016/J.MICROREL.2018.03.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KumarKC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KunwarSRWGCMSZ18,
author = {Anil Kunwar and
Shengyan Shang and
Peter R{\aa}back and
Yunpeng Wang and
Julien Givernaud and
Jun Chen and
Haitao Ma and
Xueguan Song and
Ning Zhao},
title = {Heat and mass transfer effects of laser soldering on growth behavior
of interfacial intermetallic compounds in Sn/Cu and Sn-3.5Ag0.5/Cu
joints},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {55--67},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.016},
doi = {10.1016/J.MICROREL.2017.11.016},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KunwarSRWGCMSZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KurniawanYLW18,
author = {Erry Dwi Kurniawan and
Hao Yang and
Chia{-}Chou Lin and
Yung{-}Chun Wu},
title = {Effect of fin shape of tapered FinFETs on the device performance in
5-nm node {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {254--259},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.06.037},
doi = {10.1016/J.MICROREL.2017.06.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KurniawanYLW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LawalLLH18,
author = {Olarewaju Mubashiru Lawal and
Shuhuan Liu and
Zhuoqi Li and
Aqil Hussain},
title = {\({}^{\mbox{60}}\)Co gamma radiation total ionizing dose combined
with conducted electromagnetic interference studies in BJTs},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {159--164},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.020},
doi = {10.1016/J.MICROREL.2018.01.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LawalLLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeB18,
author = {Hosung Lee and
Sanghyeon Baeg},
title = {Signal characteristic and test exploitation for intermittent nanometer-scale
cracks},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {26--36},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.001},
doi = {10.1016/J.MICROREL.2018.03.001},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeCLWW18,
author = {Ke{-}Jing Lee and
Yu{-}Chi Chang and
Cheng{-}Jung Lee and
Li{-}Wen Wang and
Yeong{-}Her Wang},
title = {Resistive switching properties of alkaline earth oxide-based memory
devices},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {281--285},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.06.080},
doi = {10.1016/J.MICROREL.2017.06.080},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeCLWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeK18,
author = {Changyong Lee and
Daeil Kwon},
title = {A similarity based prognostics approach for real time health management
of electronics using impedance analysis and {SVM} regression},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {77--83},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.014},
doi = {10.1016/J.MICROREL.2018.02.014},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeKHKLK18,
author = {Hyunju Lee and
Cheolmin Kim and
Cheolho Heo and
Chiho Kim and
Jae{-}Ho Lee and
Yangdo Kim},
title = {Effect of solder resist dissolution on the joint reliability of {ENIG}
surface and Sn-Ag-Cu solder},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {75--80},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.017},
doi = {10.1016/J.MICROREL.2018.05.017},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeKHKLK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLLH18,
author = {Chang{-}Chun Lee and
Chuan{-}Hsi Liu and
Dian{-}Yong Li and
Chia{-}Ping Hsieh},
title = {Effect of contact-etch-stop-layer and Si\({}_{\mbox{1-x}}\)Ge\({}_{\mbox{x}}\)
channel mechanical properties on nano-scaled short channel NMOSFETs
with dummy gate arrays},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {230--234},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.04.034},
doi = {10.1016/J.MICROREL.2017.04.034},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeLLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLM18,
author = {Kuan{-}Wei Lee and
Chuan{-}Hsi Liu and
Durga Misra},
title = {Wide Bandgap Materials for Semiconductor Devices},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {306},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.010},
doi = {10.1016/J.MICROREL.2018.10.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeLM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeiGTZZCEHCP18,
author = {Zhifeng Lei and
H. X. Guo and
M. H. Tang and
C. Zeng and
Zhangang Zhang and
H. Chen and
Y. F. En and
Y. Huang and
Yiqiang Chen and
Chao Peng},
title = {Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {312--316},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.07.086},
doi = {10.1016/J.MICROREL.2017.07.086},
timestamp = {Sun, 30 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeiGTZZCEHCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeiWTIFTYK18,
author = {Yiming Lei and
Hitoshi Wakabayashi and
Kazuo Tsutsui and
Hiroshi Iwai and
Masayuki Furuhashi and
Shingo Tomohisa and
Satoshi Yamakawa and
Kuniyuki Kakushima},
title = {Improvement of SiO\({}_{\mbox{2}}\)/4H-SiC Interface properties by
post-metallization annealing},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {226--229},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.036},
doi = {10.1016/J.MICROREL.2018.03.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeiWTIFTYK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeiWTIFTYK18a,
author = {Yiming Lei and
Hitoshi Wakabayashi and
Kazuo Tsutsui and
Hiroshi Iwai and
Masayuki Furuhashi and
Shingo Tomohisa and
Satoshi Yamakawa and
Kuniyuki Kakushima},
title = {Effect of lanthanum silicate interface layer on the electrical characteristics
of 4H-SiC metal-oxide-semiconductor capacitors},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {248--252},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.037},
doi = {10.1016/J.MICROREL.2018.03.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeiWTIFTYK18a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeiteFB18,
author = {Thiago Ferreira de Paiva Leite and
Laurent Fesquet and
Rodrigo Possamai Bastos},
title = {A body built-in cell for detecting transient faults and dynamically
biasing subcircuits of integrated systems},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {122--127},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.069},
doi = {10.1016/J.MICROREL.2018.07.069},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeiteFB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LenahanAWL18,
author = {Patrick M. Lenahan and
Mark A. Anders and
R. J. Waskiewicz and
Aivars J. Lelis},
title = {Bias temperature instabilities in 4H SiC metal oxide semiconductor
field effect transistors: Insight provided by electrically detected
magnetic resonance},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {1--6},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.010},
doi = {10.1016/J.MICROREL.2017.12.010},
timestamp = {Fri, 25 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LenahanAWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LetzFSS18,
author = {S. A. Letz and
A. Farooghian and
F. B. Simon and
Andreas Schletz},
title = {Modeling the rate-dependent inelastic deformation behavior of porous
polycrystalline silver films},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1113--1117},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.084},
doi = {10.1016/J.MICROREL.2018.07.084},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LetzFSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiCLD18,
author = {Hao Li and
Mifang Cong and
Ke Li and
Huan Du},
title = {Source engineering on ruggedness and {RF} performance of n-channel
{RFLDMOS}},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {57--63},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.001},
doi = {10.1016/J.MICROREL.2018.06.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiCLD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiCNCWLCKSGBWW18,
author = {Yuanqing Li and
Li Chen and
Issam Nofal and
Mo Chen and
Haibin Wang and
Rui Liu and
Qingyu Chen and
Milos Krstic and
Shuting Shi and
Gang Guo and
Sang H. Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Modeling and analysis of single-event transient sensitivity of a 65{\unicode{8239}}nm
clock tree},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {24--32},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.016},
doi = {10.1016/J.MICROREL.2018.05.016},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiCNCWLCKSGBWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiDJ18,
author = {Jianfeng Li and
Jingru Dai and
Christopher Mark Johnson},
title = {Comparison of power cycling reliability of flexible {PCB} interconnect
smaller/thinner and larger/thicker power devices with topside Sn-3.5Ag
solder joints},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {55--65},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.013},
doi = {10.1016/J.MICROREL.2018.03.013},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiDJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiGLZ18,
author = {Hong Li and
Zhongya Guo and
Chen Liu and
Trillion Q. Zheng},
title = {An extensible stability analysis method in time domain for cascaded
{DC-DC} converters in electrical vehicles},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1293--1299},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.070},
doi = {10.1016/J.MICROREL.2018.06.070},
timestamp = {Tue, 24 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiGLZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiHWHLZYWLHY18,
author = {Binhong Li and
Yang Huang and
Jianfei Wu and
Yunbo Huang and
Bo Li and
Qingzhu Zhang and
Ling Yang and
Fayu Wan and
Jiajun Luo and
Zhengsheng Han and
Huaxiang Yin},
title = {Constant voltage stress characterization of nFinFET transistor during
total ionizing dose experiment},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {969--973},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.136},
doi = {10.1016/J.MICROREL.2018.07.136},
timestamp = {Tue, 26 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiHWHLZYWLHY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiHYZZLZBYLHW18,
author = {Bo Li and
Yunbo Huang and
Ling Yang and
Qingzhu Zhang and
Zhongshan Zheng and
Binhong Li and
Huiping Zhu and
Jianhui Bu and
Huaxiang Yin and
Jiajun Luo and
Zhengsheng Han and
Haibin Wang},
title = {Process variation dependence of total ionizing dose effects in bulk
nFinFETs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {946--951},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.020},
doi = {10.1016/J.MICROREL.2018.07.020},
timestamp = {Thu, 23 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiHYZZLZBYLHW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiJYGGPV18,
author = {Lei Li and
Weichao Jin and
Huisheng Yang and
Kewei Gao and
Pengwen Guo and
Xiaolu Pang and
Alex A. Volinsky},
title = {First principles calculations study of crystallographic orientation
effects on SiC/Ti and SiC/Cr interfaces},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {119--126},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.019},
doi = {10.1016/J.MICROREL.2018.02.019},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiJYGGPV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLBB18,
author = {Tan Li and
Hosung Lee and
GeunYong Bak and
Sanghyeon Baeg},
title = {Failure signature analysis of power-opens in {DDR3} SDRAMs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {277--281},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.104},
doi = {10.1016/J.MICROREL.2018.06.104},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiLBB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLX18,
author = {Yiyuan Li and
Jianhua Li and
Lixin Xu},
title = {Failure mode analysis of {MEMS} suspended inductors under mechanical
shock},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {38--48},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.041},
doi = {10.1016/J.MICROREL.2018.03.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiLX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLZPWY18,
author = {Ting Li and
Zebin Li and
Ke Zhao and
Boan Pan and
Zhiyuan Wang and
Xiping Yang},
title = {Reliability analysis of a mini-instrument for simultaneous monitoring
water content, deep tissue temperature, and hemodynamic parameters},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {72--76},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.009},
doi = {10.1016/J.MICROREL.2018.05.009},
timestamp = {Thu, 22 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiLZPWY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiMDM18,
author = {Nga Man Li and
Subramani Manoharan and
Diganta Das and
F. Patrick McCluskey},
title = {Analysis of indentation measured mechanical properties on Multilayer
Ceramic Capacitors (MLCCs)},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {528--533},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.116},
doi = {10.1016/J.MICROREL.2018.07.116},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiMDM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiWWZLS18,
author = {Ke Li and
Lingyu Wang and
Jingjing Wu and
Qiuju Zhang and
Guanglan Liao and
Lei Su},
title = {Using {GA-SVM} for defect inspection of flip chips based on vibration
signals},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {159--166},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.032},
doi = {10.1016/J.MICROREL.2017.12.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiWWZLS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiYLBLL18,
author = {Xingji Li and
Jianqun Yang and
Chaoming Liu and
Gang Bai and
Wenbo Luo and
Pengwei Li},
title = {Synergistic effects of {NPN} transistors caused by combined proton
irradiations with different energies},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {130--135},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.010},
doi = {10.1016/J.MICROREL.2018.01.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiYLBLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiZO18,
author = {Zhongliang Li and
Zhixue Zheng and
Rachid Outbib},
title = {A prognostic methodology for power MOSFETs under thermal stress using
echo state network and particle filter},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {350--354},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.137},
doi = {10.1016/J.MICROREL.2018.07.137},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiZO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LibotADAMD18,
author = {J. B. Libot and
Jo{\"{e}}l Alexis and
Olivier Dalverny and
L. Arnaud and
P. Milesi and
F. Dulondel},
title = {Microstructural evolutions of Sn-3.0Ag-0.5Cu solder joints during
thermal cycling},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {64--76},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.009},
doi = {10.1016/J.MICROREL.2018.02.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LibotADAMD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimPBYPBWW18,
author = {Chul Seung Lim and
Kyungbae Park and
GeunYong Bak and
Donghyuk Yun and
Myungsang Park and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong},
title = {Study of proton radiation effect to row hammer fault in {DDR4} SDRAMs},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {85--90},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.018},
doi = {10.1016/J.MICROREL.2017.11.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LimPBYPBWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinFLYW18,
author = {Shuai Lin and
Xiaochun Fang and
Fei Lin and
Zhongping Yang and
Xiaofan Wang},
title = {Reliability of rail transit traction drive system-A review},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1281--1285},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.037},
doi = {10.1016/J.MICROREL.2018.07.037},
timestamp = {Tue, 07 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinFLYW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinH18,
author = {Yow{-}Jon Lin and
Cheng{-}Chun Hung},
title = {Temperature-dependent hole transport for pentacene thin-film transistors
with a SiO\({}_{\mbox{2}}\) gate dielectric modified by (NH\({}_{\mbox{4}}\))\({}_{\mbox{2}}\)S\({}_{\mbox{\emph{x}}}\)
treatment},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {90--94},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.024},
doi = {10.1016/J.MICROREL.2017.12.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiouY18,
author = {Jian{-}Chiun Liou and
Cheng{-}Fu Yang},
title = {Investigation of {DNA} sequencing droplet trajectory observation and
analysis},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {243--250},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.012},
doi = {10.1016/J.MICROREL.2018.10.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiouY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuCCL18,
author = {Chuan{-}Hsi Liu and
Chun{-}Hu Cheng and
Chin{-}Pao Cheng and
Juin J. Liou},
title = {Editorial: {IEDMS} 2016},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {207},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.037},
doi = {10.1016/J.MICROREL.2017.12.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuCCL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuFCLL18,
author = {Weichao Liu and
Xiang Fang and
Qianqian Chen and
Yingxin Li and
Ting Li},
title = {Reliability analysis of an integrated device of ECG, {PPG} and pressure
pulse wave for cardiovascular disease},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {183--187},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.008},
doi = {10.1016/J.MICROREL.2018.06.008},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuFCLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLWHZ18,
author = {Yi Liu and
Ping Liu and
Huai Wang and
Meng Huang and
Xiaoming Zha},
title = {Two-thermal-states model predictive control for {IGBT} in three-phase
inverter},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1098--1102},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.096},
doi = {10.1016/J.MICROREL.2018.07.096},
timestamp = {Mon, 15 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuLWHZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuMSN18,
author = {Shi{-}Qian Liu and
Stuart D. McDonald and
Keith W. Sweatman and
Kazuhiro Nogita},
title = {The effects of precipitation strengthening and solid solution strengthening
on strain rate sensitivity of lead-free solders: Review},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {170--180},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.038},
doi = {10.1016/J.MICROREL.2018.03.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuMSN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuRMX18,
author = {Shanshan Liu and
Pedro Reviriego and
Juan Antonio Maestro and
Liyi Xiao},
title = {Fault tolerant encoders for Single Error Correction and Double Adjacent
Error Correction codes},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {167--173},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.017},
doi = {10.1016/J.MICROREL.2017.12.017},
timestamp = {Wed, 10 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuRMX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuWJJX18,
author = {Zhao Liu and
Shuai Wang and
Zhendong Ji and
Xiaopeng Ji and
Yunyun Xie},
title = {A novel fault-tolerant control for battery-energy-storage system based
on cascaded multilevel converter with battery/BMS failure},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1268--1273},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.067},
doi = {10.1016/J.MICROREL.2018.06.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuWJJX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuWLB18,
author = {Ping Liu and
Huai Wang and
Yi Liu and
Frede Blaabjerg},
title = {Thermal stress reduction of quasi-Z source inverter drive by model
predictive control},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1247--1250},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.068},
doi = {10.1016/J.MICROREL.2018.06.068},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuWLB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuWWLWW18,
author = {Hongpeng Liu and
Wentao Wu and
Hui Wu and
Guihua Liu and
Panbao Wang and
Wei Wang},
title = {Lifetime prediction of a modified Y-source inverter in photo-voltaic
application},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1157--1163},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.063},
doi = {10.1016/J.MICROREL.2018.07.063},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuWWLWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuXGGWLD18,
author = {Xianqiang Liu and
Xiaodi Xu and
Chenjie Gu and
Renyuan Gu and
Weiwei Wang and
Wenjun Liu and
Tianli Duan},
title = {Investigating the impact of the defect dynamic characteristics on
the {PBTI} in the high-{\(\kappa\)} gate device},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {24--28},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.012},
doi = {10.1016/J.MICROREL.2017.11.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuXGGWLD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LoayzaGAPJG18,
author = {Jorge Loayza and
Nicolas Guitard and
Bruno Allard and
Luong{-}Vi{\^{e}}t Phung and
Blaise Jacquier and
Philippe Galy},
title = {Simulation, characterization and implementation of a new SCR-based
device with a turn-off capability for EOS-immune {ESD} power supply
clamps in advanced {CMOS} technology nodes},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {176--189},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.013},
doi = {10.1016/J.MICROREL.2018.04.013},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LoayzaGAPJG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LofranoCGB18,
author = {Melina Lofrano and
Vladimir Cherman and
Mario Gonzalez and
Eric Beyne},
title = {Enhanced Cu pillar design to reduce thermomechanical stress induced
during flip chip assembly},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {97--105},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.004},
doi = {10.1016/J.MICROREL.2018.06.004},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LofranoCGB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LorinVGGBGG18,
author = {Thomas Lorin and
William Vandendaele and
Romain Gwoziecki and
Charlotte Gillot and
J{\'{e}}rome Biscarrat and
G{\'{e}}rard Ghibaudo and
Fred Gaillard},
title = {Study of forward {AC} stress degradation of GaN-on-Si Schottky diodes},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {641--644},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.103},
doi = {10.1016/J.MICROREL.2018.07.103},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LorinVGGBGG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LowTTZL18,
author = {Yi Chao Low and
Pik Kee Tan and
Soon Leng Tan and
Yuzhe Zhao and
Jeffrey Lam},
title = {Solving 28{\unicode{8239}}nm {I/O} circuit reliability issue due to
{IC} design weakness},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {246--249},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.082},
doi = {10.1016/J.MICROREL.2018.06.082},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LowTTZL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuNY18,
author = {Chun{-}Lin Lu and
Pei{-}Rong Ni and
Meng{-}Kao Yeh},
title = {Stress analysis of {CMOS-MEMS} microphone under shock loading by Taguchi
method},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {824--828},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.110},
doi = {10.1016/J.MICROREL.2018.06.110},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuNY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuoRIB18,
author = {Haoze Luo and
Paula Diaz Reigosa and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {On-line solder layer degradation measurement for SiC-MOSFET modules
under accelerated power cycling condition},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {563--567},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.128},
doi = {10.1016/J.MICROREL.2018.07.128},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuoRIB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuongHWCC18,
author = {Tien Tung Luong and
Yen{-}Teng Ho and
Yuen Yee Wong and
Shane Chang and
Edward Yi Chang},
title = {Phase separation-suppressed and strain-modulated improvement of crystalline
quality of AlGaN epitaxial layer grown by {MOCVD}},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {286--292},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.07.021},
doi = {10.1016/J.MICROREL.2017.07.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuongHWCC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LutzF18,
author = {Josef Lutz and
J{\"{o}}rg Franke},
title = {Reliability and reliability investigation of wide-bandgap power devices},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {550--556},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.001},
doi = {10.1016/J.MICROREL.2018.07.001},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LutzF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaCZWL18,
author = {Mingyao Ma and
Kaiqi Chu and
Mingyue Zhan and
Ye Wang and
Fang Liu},
title = {Statistical analysis of characteristic of ageing precursor of {IGBT}
based on synthetic effect of multi-physical fields},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {75--79},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.010},
doi = {10.1016/J.MICROREL.2018.07.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaCZWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaKCQWSRMZ18,
author = {Haoran Ma and
Anil Kunwar and
Jun Chen and
Lin Qu and
Yunpeng Wang and
Xueguan Song and
Peter R{\aa}back and
Haitao Ma and
Ning Zhao},
title = {Study of electrochemical migration based transport kinetics of metal
ions in Sn-9Zn alloy},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {198--205},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.013},
doi = {10.1016/J.MICROREL.2018.02.013},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaKCQWSRMZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaSWWW18,
author = {Mingyao Ma and
Zhiyu Sun and
Ye Wang and
Jianing Wang and
Rui Wang},
title = {Method of junction temperature estimation and over temperature protection
used for electric vehicle's {IGBT} power modules},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1226--1230},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.109},
doi = {10.1016/J.MICROREL.2018.07.109},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaSWWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaWLWY18,
author = {Mingyao Ma and
Rui Wang and
Fei Li and
Jianing Wang and
Shuying Yang},
title = {A fault-tolerant control strategy for switched reluctance motor drive
for electric vehicles under short-fault condition},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1221--1225},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.033},
doi = {10.1016/J.MICROREL.2018.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaWLWY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaYCZZSG18,
author = {Teng Ma and
Xuefeng Yu and
Jiangwei Cui and
Qiwen Zheng and
Hang Zhou and
Dandan Su and
Qi Guo},
title = {Investigating the {TDDB} lifetime growth mechanism caused by proton
irradiation in partially depleted {SOI} devices},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {112--116},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.016},
doi = {10.1016/J.MICROREL.2017.12.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaYCZZSG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MacielMNC18,
author = {Nilson Maciel and
Elaine Crespo Marques and
Lirida A. B. Naviner and
Hao Cai},
title = {Single-event transient effects on dynamic comparator in 28{\unicode{8239}}nm
{FDSOI} {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {965--968},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.114},
doi = {10.1016/J.MICROREL.2018.07.114},
timestamp = {Wed, 11 Dec 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MacielMNC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MagnienMRSHHDK18,
author = {Julien Magnien and
Lisa Mitterhuber and
J{\"{o}}rdis Rosc and
Franz Schrank and
Stefan H{\"{o}}rth and
Matthias Hutter and
Stefan Defregger and
Elke Kraker},
title = {Parameter driven monitoring for a flip-chip {LED} module under power
cycling condition},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {84--89},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.005},
doi = {10.1016/J.MICROREL.2018.01.005},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MagnienMRSHHDK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MagnoneBM18,
author = {Paolo Magnone and
Giacomo Barletta and
A. Magr{\`{\i}}},
title = {Investigation of degradation mechanisms in low-voltage p-channel power
MOSFETs under High Temperature Gate Bias stress},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {438--442},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.029},
doi = {10.1016/J.MICROREL.2018.06.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MagnoneBM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MahapatraP18,
author = {Souvik Mahapatra and
Narendra Parihar},
title = {A review of {NBTI} mechanisms and models},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {127--135},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.027},
doi = {10.1016/J.MICROREL.2017.12.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MahapatraP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MannenW18,
author = {Tomoyuki Mannen and
Keiji Wada},
title = {Operating-waveform analysis based reliability evaluation of power
MOSFETs used for a leg short-circuit initial charge method},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {589--592},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.035},
doi = {10.1016/J.MICROREL.2018.06.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MannenW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ManoharanPHM18,
author = {Subramani Manoharan and
Chandradip Patel and
Stevan Hunter and
F. Patrick McCluskey},
title = {Mechanism of wire bond shear testing},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {738--744},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.061},
doi = {10.1016/J.MICROREL.2018.06.061},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ManoharanPHM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ManoharanPMP18,
author = {Subramani Manoharan and
Chandradip Patel and
F. Patrick McCluskey and
Michael G. Pecht},
title = {Effective decapsulation of copper wire-bonded microelectronic devices
for reliability assessment},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {197--207},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.028},
doi = {10.1016/J.MICROREL.2018.03.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ManoharanPMP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarcaPKRCB18,
author = {Vincenzo Della Marca and
J{\'{e}}r{\'{e}}my Postel{-}Pellerin and
Thibault Kempf and
Arnaud R{\'{e}}gnier and
Philippe Chiquet and
Marc Bocquet},
title = {Quantitative correlation between Flash and equivalent transistor for
endurance electrical parameters extraction},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {159--163},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.116},
doi = {10.1016/J.MICROREL.2018.06.116},
timestamp = {Mon, 19 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MarcaPKRCB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarcelloMM18,
author = {Giulia Marcello and
Eleonora Meda and
Matteo Medda},
title = {Complex automotive ICs defect localization driven by quiescent power
supply current: Three cases study},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {294--298},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.079},
doi = {10.1016/J.MICROREL.2018.06.079},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MarcelloMM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarozauAPSVLSS18,
author = {Ivan Marozau and
Maxime Auchlin and
Vaclav Pejchal and
Fr{\'{e}}d{\'{e}}ric Souchon and
Dietmar Vogel and
Markku Lahti and
Nicolas Saillen and
Olha Sereda},
title = {Reliability assessment and failure mode analysis of {MEMS} accelerometers
for space applications},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {846--854},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.118},
doi = {10.1016/J.MICROREL.2018.07.118},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MarozauAPSVLSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartinMP18,
author = {Carmen Martin and
Alexandre Micol and
Fran{\c{c}}ois P{\'{e}}r{\`{e}}s},
title = {Importance of test parameters, specimen type and use configuration
on the identification of Sn/Ag solder behaviour laws},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {213--223},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.006},
doi = {10.1016/J.MICROREL.2018.01.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MartinMP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartinezAREO18,
author = {Jorge Mart{\'{\i}}nez and
Mert Atamaner and
Pedro Reviriego and
Oguz Ergin and
Marco Ottavi},
title = {Opcode vector: An efficient scheme to detect soft errors in instructions},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {92--97},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.017},
doi = {10.1016/J.MICROREL.2018.03.017},
timestamp = {Thu, 17 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MartinezAREO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartinsVTBB18,
author = {Victor M. Goncalves Martins and
Paulo Ricardo Cechelero Villa and
Rodrigo Travessini and
Marcelo Daniel Berejuck and
Eduardo Augusto Bezerra},
title = {A dynamic partial reconfiguration design flow for permanent faults
mitigation in FPGAs},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {50--63},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.011},
doi = {10.1016/J.MICROREL.2018.01.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MartinsVTBB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MatsumoriUSTI18,
author = {Hiroaki Matsumori and
Kazuki Urata and
Toshihisa Shimizu and
Koushi Takano and
Hitoshi Ishii},
title = {Capacitor loss analysis method for power electronics converters},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {443--446},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.049},
doi = {10.1016/J.MICROREL.2018.07.049},
timestamp = {Tue, 05 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MatsumoriUSTI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/McWilliamKFB18,
author = {Richard McWilliam and
Samir Khan and
Michael Farnsworth and
Colin Bell},
title = {Zero-maintenance of electronic systems: Perspectives, challenges,
and opportunities},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {122--139},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.001},
doi = {10.1016/J.MICROREL.2018.04.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/McWilliamKFB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MedeirosBTVH18,
author = {G. Cardoso Medeiros and
Let{\'{\i}}cia Maria Veiras Bolzani and
Mottaqiallah Taouil and
Fabian Vargas and
Said Hamdioui},
title = {A defect-oriented test approach using on-Chip current sensors for
resistive defects in FinFET SRAMs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {355--359},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.092},
doi = {10.1016/J.MICROREL.2018.07.092},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MedeirosBTVH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MehrTKDZ18,
author = {M. Yazdan Mehr and
M. R. Toroghinejad and
F. Karimzadeh and
W. D. van Driel and
G. Q. Zhang},
title = {A review on discoloration and high accelerated testing of optical
materials in {LED} based-products},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {136--142},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.023},
doi = {10.1016/J.MICROREL.2017.12.023},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MehrTKDZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeiHLGZ18,
author = {Jie Mei and
R. Haug and
O. Lanier and
Tobias Gr{\"{o}}zinger and
Andr{\'{e}} Zimmermann},
title = {Effect of Joule heating on the reliability of solder joints under
power cycling conditions},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {684--690},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.053},
doi = {10.1016/J.MICROREL.2018.06.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeiHLGZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeiNHYHZ18,
author = {Fei Mei and
Liu Ning and
Miao Huiyu and
Pan Yi and
Haoyuan Sha and
Jianyong Zheng},
title = {On-line fault diagnosis model for locomotive traction inverter based
on wavelet transform and support vector machine},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1274--1280},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.069},
doi = {10.1016/J.MICROREL.2018.06.069},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeiNHYHZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghessoMSRZ18,
author = {Gaudenzio Meneghesso and
Matteo Meneghini and
Carlo De Santi and
Maria Ruzzarin and
Enrico Zanoni},
title = {Positive and negative threshold voltage instabilities in GaN-based
transistors},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {257--265},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.004},
doi = {10.1016/J.MICROREL.2017.11.004},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeneghessoMSRZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MengCLST18,
author = {Jinhao Meng and
Lei Cai and
Guangzhao Luo and
Daniel{-}Ioan Stroe and
Remus Teodorescu},
title = {Lithium-ion battery state of health estimation with short-term current
pulse test and support vector machine},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1216--1220},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.025},
doi = {10.1016/J.MICROREL.2018.07.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MengCLST18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MikkonenM18,
author = {Riikka Mikkonen and
Matti M{\"{a}}ntysalo},
title = {Evaluation of screen printed silver trace performance and long-term
reliability against environmental stress on a low surface energy substrate},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {54--65},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.010},
doi = {10.1016/J.MICROREL.2018.05.010},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MikkonenM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MitterhuberDMRH18,
author = {Lisa Mitterhuber and
Stefan Defregger and
Julien Magnien and
J{\"{o}}rdis Rosc and
Ren{\'{e}} Hammer and
Lena Goullon and
Matthias Hutter and
Franz Schrank and
Stefan H{\"{o}}rth and
Elke Kraker},
title = {Thermal transient measurement and modelling of a power cycled flip-chip
{LED} module},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {373--380},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.032},
doi = {10.1016/J.MICROREL.2017.10.032},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MitterhuberDMRH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Miura-Mattausch18,
author = {Mitiko Miura{-}Mattausch and
Hidenori Miyamoto and
Hideyuki Kikuchihara and
Tapas K. Maiti and
Nezam Rohbani and
Dondee Navarro and
Hans J{\"{u}}rgen Mattausch},
title = {Compact modeling of dynamic trap density evolution for predicting
circuit-performance aging},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {164--175},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.003},
doi = {10.1016/J.MICROREL.2017.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Miura-Mattausch18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiuraSN18,
author = {Katsuyoshi Miura and
Atsuki Seko and
Koji Nakamae},
title = {Simulation-based evaluation of probing attacks to arbiter PUFs using
a time-resolved emission microscope},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {360--364},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.103},
doi = {10.1016/J.MICROREL.2018.06.103},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MiuraSN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MohammadiADM18,
author = {Hossein Mohammadi and
Huda Abdullah and
Chang Fu Dee and
P. Susthitha Menon},
title = {A modified two dimensional analytical model for short-channel fully
depleted {SOI} MESFET's},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {173--179},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.004},
doi = {10.1016/J.MICROREL.2018.03.004},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MohammadiADM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MolinKRM18,
author = {Quentin Molin and
Mehdi Kanoun and
Christophe Raynaud and
Herv{\'{e}} Morel},
title = {Measurement and analysis of SiC-MOSFET threshold voltage shift},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {656--660},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.073},
doi = {10.1016/J.MICROREL.2018.06.073},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MolinKRM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MontiMSBPMZ18,
author = {Desiree Monti and
Matteo Meneghini and
Carlo De Santi and
Agata Bojarska and
Piotr Perlin and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Impact of dislocations on {DLTS} spectra and degradation of InGaN-based
laser diodes},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {864--867},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.055},
doi = {10.1016/J.MICROREL.2018.06.055},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MontiMSBPMZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoraesZMR18,
author = {Leonardo B. Moraes and
Alexandra L. Zimpeck and
Cristina Meinhardt and
Ricardo Augusto da Luz Reis},
title = {Evaluation of variability using Schmitt trigger on full adders layout},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {116--121},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.061},
doi = {10.1016/J.MICROREL.2018.07.061},
timestamp = {Mon, 27 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MoraesZMR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoralesMBD18,
author = {Jorgue Daniel Aguirre Morales and
Fran{\c{c}}ois Marc and
A. Bensoussan and
A. Durier},
title = {Simulation and modelling of long term reliability of digital circuits
implemented in {FPGA}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1130--1134},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.151},
doi = {10.1016/J.MICROREL.2018.07.151},
timestamp = {Thu, 23 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoralesMBD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoseSS18,
author = {Bruno R. Mose and
In{-}Seo Son and
Dong{-}Kil Shin},
title = {Adhesion strength of die attach film for thin electronic package at
elevated temperature},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {15--22},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.143},
doi = {10.1016/J.MICROREL.2018.07.143},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoseSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MousnierSLLB18,
author = {Morgane Mousnier and
K{\'{e}}vin Sanchez and
Elsa Locatelli and
Thierry Lebey and
Vincent Bley},
title = {Lock-in thermography for defect localization and thermal characterization
for space application},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {67--74},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.014},
doi = {10.1016/J.MICROREL.2018.07.014},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MousnierSLLB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuhlbauerSS18,
author = {Felix M{\"{u}}hlbauer and
Lukas Schr{\"{o}}der and
Mario Sch{\"{o}}lzel},
title = {Handling of transient and permanent faults in dynamically scheduled
super-scalar processors},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {176--183},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.021},
doi = {10.1016/J.MICROREL.2017.11.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuhlbauerSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MukhopadhyayLL18,
author = {Subhadeep Mukhopadhyay and
Yung{-}Huei Lee and
Jen{-}Hao Lee},
title = {Time-zero-variability and {BTI} impact on advanced FinFET device and
circuit reliability},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {226--231},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.044},
doi = {10.1016/J.MICROREL.2017.12.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MukhopadhyayLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mura18,
author = {Giovanna Mura},
title = {Reliability concerns from the gray market},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {26--30},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.098},
doi = {10.1016/J.MICROREL.2018.06.098},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mura18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NasirabadiH18,
author = {Parizad Shojaee Nasirabadi and
Jesper Henri Hattel},
title = {A 3D numerical study of humidity evolution and condensation risk on
a printed circuit board {(PCB)} exposed to harsh ambient conditions},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {39--49},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.008},
doi = {10.1016/J.MICROREL.2018.02.008},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NasirabadiH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NgAA18,
author = {Fei Chong Ng and
Aizat Abas and
Mohd Zulkifly Abdullah},
title = {Effect of solder bump shapes on underfill flow in flip-chip encapsulation
using analytical, numerical and {PIV} experimental approaches},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {41--63},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.025},
doi = {10.1016/J.MICROREL.2017.12.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NgAA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenDNTDPN18,
author = {Nam Nguyen and
Van{-}Quyen Dinh and
Tung Nguyen{-}Duc and
Quoc{-}Tuan Ta and
Xuan{-}Viet Dao and
Thanh{-}Huy Pham and
Trung{-}Kien Nguyen{-}Duc},
title = {Effect of potting materials on {LED} bulb's driver temperature},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {77--81},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.012},
doi = {10.1016/J.MICROREL.2018.05.012},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NguyenDNTDPN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenLA18,
author = {Tien Anh Nguyen and
St{\'{e}}phane Lefebvre and
Stephane Azzopardi},
title = {Effect of short circuit aging on safe operating area of SiC {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {645--651},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.040},
doi = {10.1016/J.MICROREL.2018.06.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NguyenLA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenRWMBCV18,
author = {Hoang T. Nguyen and
Axel Rodriguez and
Frederic Wrobel and
Alain Michez and
Francoise Bezerra and
Nathalie Chatry and
Benjamin Vandevelde},
title = {{TCAD} simulation of radiation-induced leakage current in 1T1C {SDRAM}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {974--978},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.094},
doi = {10.1016/J.MICROREL.2018.07.094},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NguyenRWMBCV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NieweglowskiLLT18,
author = {Krzysztof Nieweglowski and
Lukas Lorenz and
Sebastian L{\"{u}}ngen and
Tobias Tiedje and
Klaus{-}J{\"{u}}rgen Wolter and
Karlheinz Bock},
title = {Optical coupling with flexible polymer waveguides for chip-to-chip
interconnects in electronic systems},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {121--126},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.020},
doi = {10.1016/J.MICROREL.2018.03.020},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NieweglowskiLLT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NilamaniCR18,
author = {S. Nilamani and
P. Chitra and
V. N. Ramakrishnan},
title = {Topological variation on sub-20{\unicode{8239}}nm double-gate inversion
and Junctionless-FinFET based 6T-SRAM circuits and its {SEU} radiation
performance},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {11--19},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.002},
doi = {10.1016/J.MICROREL.2018.01.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NilamaniCR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NishimotoMONM18,
author = {Shuji Nishimoto and
Seyed Ali Moeini and
Toyo Ohashi and
Yoshiyuki Nagatomo and
F. Patrick McCluskey},
title = {Novel silver die-attach technology on silver pre-sintered {DBA} substrates
for high temperature applications},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {232--237},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.010},
doi = {10.1016/J.MICROREL.2018.06.010},
timestamp = {Tue, 01 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NishimotoMONM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NiuWSWLP18,
author = {Yuling Niu and
Jing Wang and
Shuai Shao and
Huayan Wang and
Hohyung Lee and
Seungbae Park},
title = {A comprehensive solution for electronic packages' reliability assessment
with digital image correlation {(DIC)} method},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {81--88},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.006},
doi = {10.1016/J.MICROREL.2018.06.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NiuWSWLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NiuWYWB18,
author = {Hao Niu and
Shujuan Wang and
Xuerong Ye and
Huai Wang and
Frede Blaabjerg},
title = {Lifetime prediction of aluminum electrolytic capacitors in {LED} drivers
considering parameter shifts},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {453--457},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.027},
doi = {10.1016/J.MICROREL.2018.06.027},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NiuWYWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NogueiraGS18,
author = {Eduardo Nogueira and
Juan Sancho Gil and
Jos{\'{e}}{-}Luis S{\'{a}}nchez{-}Bote},
title = {Lifetime of electret microphones by thermal degradation analysis via
electroacoustic measurements},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {95--100},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.018},
doi = {10.1016/J.MICROREL.2017.12.018},
timestamp = {Wed, 15 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NogueiraGS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NohZYCLS18,
author = {Seungjun Noh and
Hao Zhang and
Jeyun Yeom and
Chuantong Chen and
Caifu Li and
Katsuaki Suganuma},
title = {Large-area die-attachment by silver stress migration bonding for power
device applications},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {701--706},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.131},
doi = {10.1016/J.MICROREL.2018.07.131},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NohZYCLS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NouguierFGRR18,
author = {D. Nouguier and
X. Federspiel and
G{\'{e}}rard Ghibaudo and
M. Rafik and
David Roy},
title = {New {NBTI} models for degradation and relaxation kinetics valid over
extended temperature and stress/recovery ranges},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {106--112},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.009},
doi = {10.1016/J.MICROREL.2018.04.009},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NouguierFGRR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NouibatMCORRF18,
author = {T. H. Nouibat and
Zitouni Messai and
D. Chikouch and
Zahir Ouennoughi and
N. Rouag and
Mathias Rommel and
Lothar Frey},
title = {Normalized differential conductance to study current conduction mechanisms
in {MOS} structures},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {183--187},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.001},
doi = {10.1016/J.MICROREL.2018.10.001},
timestamp = {Mon, 13 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NouibatMCORRF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NovakP18,
author = {Ondrej Nov{\'{a}}k and
Zdenek Pl{\'{\i}}va},
title = {Test response compaction method with improved detection and diagnostic
abilities},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {249--256},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.016},
doi = {10.1016/J.MICROREL.2017.10.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NovakP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NwanoroLYB18,
author = {Kenneth Chimezie Nwanoro and
Hua Lu and
Chunyan Yin and
Chris Bailey},
title = {An analysis of the reliability and design optimization of aluminium
ribbon bonds in power electronics modules using computer simulation
method},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {1--14},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.013},
doi = {10.1016/J.MICROREL.2018.05.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NwanoroLYB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OgdenXYSLP18,
author = {Sean P. Ogden and
Yueming Xu and
Kong Boon Yeap and
Tian Shen and
Toh{-}Ming Lu and
Joel L. Plawsky},
title = {Charge transport model to predict dielectric breakdown as a function
of voltage, temperature, and thickness},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {232--242},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.005},
doi = {10.1016/J.MICROREL.2018.10.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OgdenXYSLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OhBKP18,
author = {Wonwook Oh and
Soo Hyun Bae and
Donghwan Kim and
Nochang Park},
title = {Initial detection of potential-induced degradation using dark {I-V}
characteristics of crystalline silicon photovoltaic modules in the
outdoors},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {998--1002},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.093},
doi = {10.1016/J.MICROREL.2018.06.093},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OhBKP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OstermaierLRP18,
author = {Clemens Ostermaier and
Peter Lagger and
M. Reiner and
Dionyz Pogany},
title = {Review of bias-temperature instabilities at the III-N/dielectric interface},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {62--83},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.039},
doi = {10.1016/J.MICROREL.2017.12.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OstermaierLRP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OualliDPAPGLJTL18,
author = {Mourad Oualli and
Christian Dua and
O. Patard and
P. Altuntas and
S. Piotrowicz and
Piero Gamarra and
Cedric Lacam and
J.{-}C. Jacquet and
L. Teisseire and
D. Lancereau and
Eric Chartier and
C. Potier and
Sylvain L. Delage},
title = {Stability and robustness of InAlGaN/GaN {HEMT} in short-term {DC}
tests for different passivation schemes},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {418--422},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.142},
doi = {10.1016/J.MICROREL.2018.07.142},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OualliDPAPGLJTL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PagnanoLUSIGKC18,
author = {Dario Pagnano and
Giorgia Longobardi and
Florin Udrea and
Jinming Sun and
Mohamed Imam and
Reenu Garg and
Hyeongnam Kim and
Alain Charles},
title = {On the impact of substrate electron injection on dynamic Ron in GaN-on-Si
HEMTs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {610--614},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.102},
doi = {10.1016/J.MICROREL.2018.07.102},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PagnanoLUSIGKC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PalovicsER18,
author = {P{\'{e}}ter P{\'{a}}lovics and
Ferenc Ender and
M{\'{a}}rta Rencz},
title = {Towards the {CFD} model of flow rate dependent enzyme-substrate reactions
in nanoparticle filled flow microreactors},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {84--92},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.035},
doi = {10.1016/J.MICROREL.2018.03.035},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PalovicsER18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PangC18,
author = {Ying Pang and
Mauro Ciappa},
title = {Charge and energy deposition in thick silicon depletion layers by
environmental ionizing radiation and terrestrial cosmic rays},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {992--997},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.146},
doi = {10.1016/J.MICROREL.2018.07.146},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PangC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PapadopoulosCKS18,
author = {Charalampos Papadopoulos and
Chiara Corvasce and
Arnost Kopta and
Daniel Schneider and
Gontran P{\^{a}}ques and
Munaf Rahimo},
title = {The influence of humidity on the high voltage blocking reliability
of power {IGBT} modules and means of protection},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {470--475},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.130},
doi = {10.1016/J.MICROREL.2018.07.130},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PapadopoulosCKS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkKSCP18,
author = {Hee Pyung Park and
Sang Woo Kim and
Joong{-}Won Shin and
Won{-}Ju Cho and
Jong Tae Park},
title = {Effects of the compositional ratios of sputtering target on the device
performance and instability in amorphous InGaZnO thin film transistors},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {873--877},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.052},
doi = {10.1016/J.MICROREL.2018.06.052},
timestamp = {Wed, 20 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ParkKSCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkLCLKLJNHLL18,
author = {Hyun{-}Woong Park and
Sang{-}Jun Lee and
Dong{-}Chul Cho and
Sang{-}Hoon Lee and
Jae{-}Kyun Kim and
Jun{-}Hee Lee and
Sang{-}Kyo Jung and
Hong{-}Sik Nam and
Patrick Hsu and
Shin Low and
Sung{-}Hwan Lim},
title = {Behavior of Au and Pd and the effects of these metals on IMCs in Pd-Au-coated
copper wire},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {283--290},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.014},
doi = {10.1016/J.MICROREL.2018.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkLCLKLJNHLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParvariZK18,
author = {Ramin Parvari and
Mostafa Zarghani and
Shahriyar Kaboli},
title = {{RCD} snubber design based on reliability consideration: {A} case
study for thermal balancing in power electronic converters},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1311--1315},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.072},
doi = {10.1016/J.MICROREL.2018.06.072},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParvariZK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PascalLPLC18,
author = {Yoann Pascal and
Denis Labrousse and
Mickael Petit and
St{\'{e}}phane Lefebvre and
Fran{\c{c}}ois Costa},
title = {Experimental investigation of the reliability of Printed Circuit Board
(PCB)-embedded power dies with pressed contact made of metal foam},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {707--714},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.064},
doi = {10.1016/J.MICROREL.2018.06.064},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PascalLPLC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PatraRHKCRC18,
author = {Devyani Patra and
Ahmed Kamal Reza and
Mohammad Khaled Hassan and
Mehdi Katoozi and
Ethan H. Cannon and
Kaushik Roy and
Yu Cao},
title = {Adaptive accelerated aging for 28 nm {HKMG} technology},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {149--154},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.002},
doi = {10.1016/J.MICROREL.2017.12.002},
timestamp = {Thu, 15 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PatraRHKCRC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PazosAPS18,
author = {Sebasti{\'{a}}n Mat{\'{\i}}as Pazos and
Fernando L. Aguirre and
Felix Palumbo and
Fernando Silveira},
title = {Performance-reliability trade-offs in short range {RF} power amplifier
design},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {38--42},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.089},
doi = {10.1016/J.MICROREL.2018.06.089},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PazosAPS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Pena-FernandezL18,
author = {Manuel Pe{\~{n}}a{-}Fernandez and
Almudena Lindoso and
Luis Entrena and
Mario Garc{\'{\i}}a{-}Valderas and
S. Philippe and
Yolanda Morilla and
Pedro Mart{\'{\i}}n{-}Holgado},
title = {PTM-based hybrid error-detection architecture for {ARM} microprocessors},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {925--930},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.074},
doi = {10.1016/J.MICROREL.2018.07.074},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Pena-FernandezL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PengZLL18,
author = {Yu Peng and
Y. J. Zhang and
Datong Liu and
Liansheng Liu},
title = {Degradation estimation using feature increment stepwise linear regression
for {PWM} Inverter of Electro-Mechanical Actuator},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {514--518},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.025},
doi = {10.1016/J.MICROREL.2018.06.025},
timestamp = {Wed, 19 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PengZLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetrovTUC18,
author = {Aleksandr S. Petrov and
Konstantin I. Tapero and
Viktor N. Ulimov and
A. M. Chlenov},
title = {Impact of elevated temperature applied during low dose rate irradiation
on the degradation of BiCMOS operational amplifiers},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {961--964},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.081},
doi = {10.1016/J.MICROREL.2018.07.081},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PetrovTUC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PeyghamiDWB18,
author = {Saeed Peyghami and
Pooya Davari and
Huai Wang and
Frede Blaabjerg},
title = {System-level reliability enhancement of {DC/DC} stage in a single-phase
{PV} inverter},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1030--1035},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.112},
doi = {10.1016/J.MICROREL.2018.07.112},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PeyghamiDWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PfaffliWXSLYTMM18,
author = {Paul Pf{\"{a}}ffli and
Hiu Yung Wong and
X. Xu and
Luca Silvestri and
X. W. Lin and
T. Yang and
Ravi Tiwari and
Souvik Mahapatra and
Steve Motzny and
Victor Moroz and
Terry Ma},
title = {{TCAD} modeling for reliability},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1083--1089},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.109},
doi = {10.1016/J.MICROREL.2018.06.109},
timestamp = {Wed, 10 Jul 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PfaffliWXSLYTMM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PinGDF18,
author = {S. Pin and
Alexandrine Gu{\'{e}}don{-}Gracia and
Jean{-}Yves Del{\'{e}}tage and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Creep measurement and choice of creep laws for {BGA} assemblies' reliability
simulation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1172--1176},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.029},
doi = {10.1016/J.MICROREL.2018.07.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PinGDF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PitonCS18,
author = {Michel Piton and
Bertrand Chauchat and
Jean{-}Fran{\c{c}}ois Serviere},
title = {Implementation of direct Chip junction temperature measurement in
high power {IGBT} module in operation - Railway traction converter},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1305--1310},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.114},
doi = {10.1016/J.MICROREL.2018.06.114},
timestamp = {Mon, 22 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PitonCS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PohlKP18,
author = {L{\'{a}}szl{\'{o}} Pohl and
Zsolt Koh{\'{a}}ri and
Andr{\'{a}}s Poppe},
title = {Vertical natural convection models and their effect on failure analysis
in electro-thermal simulation of large-surface OLEDs},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {198--206},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.002},
doi = {10.1016/J.MICROREL.2018.05.002},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PohlKP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PolzerHS18,
author = {Thomas Polzer and
Florian Huemer and
Andreas Steininger},
title = {Refined metastability characterization using a time-to-digital converter},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {91--99},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.017},
doi = {10.1016/J.MICROREL.2017.11.017},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PolzerHS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PrathibaSA18,
author = {G. Prathiba and
M. Santhi and
A. Ahilan},
title = {Design and implementation of reliable flash {ADC} for microwave applications},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {91--97},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.095},
doi = {10.1016/J.MICROREL.2018.07.095},
timestamp = {Mon, 28 Oct 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PrathibaSA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PribahsnikBNML18,
author = {Florian Peter Pribahsnik and
Mirko Bernardoni and
Michael Nelhiebel and
M. Mataln and
A. Lindemann},
title = {Combined experimental and numerical approach to study electro-mechanical
resonant phenomena in GaN-on-Si heterostructures},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {389--392},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.042},
doi = {10.1016/J.MICROREL.2018.07.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PribahsnikBNML18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PuJXCLX18,
author = {Jiangbo Pu and
Youcong Jiang and
Xiaobo Xie and
Xiaogang Chen and
Ming Liu and
Shengpu Xu},
title = {Low cost sensor network for obstacle avoidance in share-controlled
smart wheelchairs under daily scenarios},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {180--186},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.003},
doi = {10.1016/J.MICROREL.2018.03.003},
timestamp = {Sun, 22 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PuJXCLX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PugalenthiR18,
author = {Karkulali Pugalenthi and
Nagarajan Raghavan},
title = {A holistic comparison of the different resampling algorithms for particle
filter based prognosis using lithium ion batteries as a case study},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {160--169},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.007},
doi = {10.1016/J.MICROREL.2018.08.007},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PugalenthiR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QiaoZZXSY18,
author = {Dayong Qiao and
Rong Zhao and
Yalong Zhang and
Changfeng Xia and
Xiumin Song and
Qiaoming You},
title = {An exploration for the degradation behavior of 2-D electrostatic microscanners
by accelerated lifetime test},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {284--293},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.07.062},
doi = {10.1016/J.MICROREL.2017.07.062},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QiaoZZXSY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QinWYH18,
author = {Jianhua Qin and
Li Wang and
Shanshui Yang and
Rui Huang},
title = {The effect of solar cell shunt resistance change on the bus voltage
ripple in spacecraft power system},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1047--1050},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.095},
doi = {10.1016/J.MICROREL.2018.06.095},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QinWYH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QinZCHL18,
author = {Qi Qin and
Shuai Zhao and
Shaowei Chen and
Dengshan Huang and
Jian Liang},
title = {Adaptive and robust prediction for the remaining useful life of electrolytic
capacitors},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {64--74},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.020},
doi = {10.1016/J.MICROREL.2018.05.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QinZCHL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QuCLHLZ18,
author = {Yiming Qu and
Bing Chen and
Wei Liu and
Jinghui Han and
Jiwu Lu and
Yi Zhao},
title = {Sub-1{\unicode{8239}}ns characterization methodology for transistor
electrical parameter extraction},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {93--98},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.022},
doi = {10.1016/J.MICROREL.2018.03.022},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/QuCLHLZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RajaM18,
author = {P. Vigneshwara Raja and
Neti V. L. Narasimha Murty},
title = {Thermal annealing studies in epitaxial 4H-SiC Schottky barrier diodes
over wide temperature range},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {213--221},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.021},
doi = {10.1016/J.MICROREL.2018.06.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RajaM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RajaguruLBCPUU18,
author = {Pushparajah Rajaguru and
H. Lu and
Chris Bailey and
Alberto Castellazzi and
V. Pathirana and
N. Udugampola and
Florin Udrea},
title = {Impact of underfill and other physical dimensions on Silicon Lateral
{IGBT} package reliability using computer model with discrete and
continuous design variables},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {146--156},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.024},
doi = {10.1016/J.MICROREL.2018.02.024},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RajaguruLBCPUU18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RajendiranS18,
author = {P. Rajendiran and
R. Srinivasan},
title = {Heavy ion impact on narrow band cascoded low noise amplifier},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {31--37},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.001},
doi = {10.1016/J.MICROREL.2018.08.001},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RajendiranS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RameyPR18,
author = {Stephen M. Ramey and
Chetan Prasad and
A. Rahman},
title = {Technology scaling implications for {BTI} reliability},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {42--50},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.004},
doi = {10.1016/J.MICROREL.2018.01.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RameyPR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RannestadNMGJ18,
author = {Bj{\o}rn Rannestad and
Peter Nielsen and
Stig Munk{-}Nielsen and
Kristian Gadgaard and
Soren Jorgensen},
title = {Converter monitoring in a wind turbine application},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1008--1013},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.125},
doi = {10.1016/J.MICROREL.2018.07.125},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RannestadNMGJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaszkowskiSZ18,
author = {Tomasz Raszkowski and
Agnieszka Samson and
Mariusz Zubert},
title = {Influence of temperature and heat flux time lags on the temperature
distribution in modern {GAAFET} structure based on Dual-Phase-Lag
thermal model},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {10--19},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.004},
doi = {10.1016/J.MICROREL.2018.05.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaszkowskiSZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RavikumarLCPY18,
author = {Venkat Krishnan Ravikumar and
Gabriel Lim and
Jiann Min Chin and
Kin Leong Pey and
Joel K. W. Yang},
title = {Understanding spatial resolution of laser voltage imaging},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {255--261},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.051},
doi = {10.1016/J.MICROREL.2018.07.051},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RavikumarLCPY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Redondo-Iglesias18,
author = {Eduardo Redondo{-}Iglesias and
Pascal Venet and
Serge Pelissier},
title = {Calendar and cycling ageing combination of batteries in electric vehicles},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1212--1215},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.113},
doi = {10.1016/J.MICROREL.2018.06.113},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Redondo-Iglesias18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReggianiBGGBDVT18,
author = {Susanna Reggiani and
Luigi Balestra and
Antonio Gnudi and
Elena Gnani and
Giorgio Baccarani and
J. Dobrzynska and
J. Vobeck{\'{y}} and
C. Tosi},
title = {{TCAD} study of {DLC} coatings for large-area high-power diodes},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1094--1097},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.075},
doi = {10.1016/J.MICROREL.2018.06.075},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReggianiBGGBDVT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReggianiRGTMMDC18,
author = {Susanna Reggiani and
Mattia Rossetti and
Antonio Gnudi and
Andrea Natale Tallarico and
Antonio Molfese and
Stefano Manzini and
Riccardo Depetro and
Giuseppe Croce and
Enrico Sangiorgi and
Claudio Fiegna},
title = {{TCAD} investigation on hot-electron injection in new-generation technologies},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1090--1093},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.097},
doi = {10.1016/J.MICROREL.2018.07.097},
timestamp = {Mon, 22 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReggianiRGTMMDC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReigosaIC18,
author = {Paula Diaz Reigosa and
Francesco Iannuzzo and
Lorenzo Ceccarelli},
title = {Effect of short-circuit stress on the degradation of the SiO\({}_{\mbox{2}}\)
dielectric in SiC power MOSFETs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {577--583},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.144},
doi = {10.1016/J.MICROREL.2018.07.144},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReigosaIC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReisRH18,
author = {Daniel Monteiro Diniz Reis and
Sven Rzepka and
Karla Hiller},
title = {Reliability testing of integrated low-temperature {PVD} {PZT} films},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {835--839},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.060},
doi = {10.1016/J.MICROREL.2018.06.060},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ReisRH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RensoBSRMZM18,
author = {N. Renso and
Matteo Buffolo and
Carlo De Santi and
Matteo Ronzani and
Gaudenzio Meneghesso and
Enrico Zanoni and
Matteo Meneghini},
title = {Failure limits and electro-optical characteristics of GaN-based LEDs
under electrical overstress},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {887--890},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.054},
doi = {10.1016/J.MICROREL.2018.06.054},
timestamp = {Tue, 19 Nov 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RensoBSRMZM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rodriguez-Fernandez18,
author = {Alberto Rodriguez{-}Fernandez and
J. Mu{\~{n}}oz{-}Gorriz and
Jordi Su{\~{n}}{\'{e}} and
Enrique Miranda},
title = {A new method for estimating the conductive filament temperature in
OxRAM devices based on escape rate theory},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {142--146},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.120},
doi = {10.1016/J.MICROREL.2018.06.120},
timestamp = {Mon, 20 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Rodriguez-Fernandez18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoeschH18,
author = {William J. Roesch and
Dorothy June M. Hamada},
title = {Discovering and reducing defects in {MIM} capacitors},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {299--305},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.021},
doi = {10.1016/J.MICROREL.2017.10.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoeschH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RogieCMBLDDMdR18,
author = {Brice Rogi{\'{e}} and
Lorenzo Codecasa and
Eric Monier{-}Vinard and
Valentin Bissuel and
Najib Laraqi and
Olivier Daniel and
Dario D'Amore and
Alessandro Magnani and
Vincenzo d'Alessandro and
Niccol{\`{o}} Rinaldi},
title = {Multi-port dynamic compact thermal models of dual-chip package using
model order reduction and metaheuristic optimization},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {222--231},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.009},
doi = {10.1016/J.MICROREL.2018.06.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RogieCMBLDDMdR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RovenskyPVL18,
author = {Tibor Rovensky and
Alena Pietrikova and
Igor Vehec and
Lubomir Livovsky},
title = {Stability of miniaturized non-trimmed thick- and thin-film resistors},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {88--94},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.011},
doi = {10.1016/J.MICROREL.2018.03.011},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RovenskyPVL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyoSMAC18,
author = {Guillermo Royo and
Carlos S{\'{a}}nchez{-}Azqueta and
Antonio D. Mart{\'{\i}}nez{-}P{\'{e}}rez and
Concepci{\'{o}}n Aldea and
Santiago Celma},
title = {Fully-differential transimpedance amplifier for reliable wireless
communications},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {25--28},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.007},
doi = {10.1016/J.MICROREL.2018.02.007},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoyoSMAC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RuzzarinMSSPMZ18,
author = {Maria Ruzzarin and
Matteo Meneghini and
Carlo De Santi and
Min Sun and
Tom{\'{a}}s Palacios and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Degradation of vertical GaN-on-GaN fin transistors: Step-stress and
constant voltage experiments},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {620--626},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.044},
doi = {10.1016/J.MICROREL.2018.06.044},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RuzzarinMSSPMZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RzepaFOSSHWJKWR18,
author = {Gerhard Rzepa and
Jacopo Franco and
Barry J. O'Sullivan and
A. Subirats and
Marko Simicic and
Geert Hellings and
Pieter Weckx and
Markus Jech and
Theresia Knobloch and
Michael Waltl and
Philippe Roussel and
Dimitri Linten and
Ben Kaczer and
Tibor Grasser},
title = {Comphy - {A} compact-physics framework for unified modeling of {BTI}},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {49--65},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.002},
doi = {10.1016/J.MICROREL.2018.04.002},
timestamp = {Sun, 19 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RzepaFOSSHWJKWR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RzinCSMHHSMSSGB18,
author = {Mehdi Rzin and
Alessandro Chini and
Carlo De Santi and
Matteo Meneghini and
A. Hugger and
Marc Hollmer and
H. Stieglauer and
M. Madel and
J. Splettst{\"{o}}{\ss}er and
Daniel Sommer and
Jan Gr{\"{u}}nenp{\"{u}}tt and
K. Beilenhoff and
Herv{\'{e}} Blanck and
J.{-}T. Chen and
O. Kordina and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {On-wafer {RF} stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {397--401},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.122},
doi = {10.1016/J.MICROREL.2018.07.122},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RzinCSMHHSMSSGB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SaghaeianKSM18,
author = {F. Saghaeian and
J. Keckes and
K. A. Schreiber and
T. Mittereder},
title = {Design and development of MEMS-based structures for in-situ characterization
of thermo-mechanical behaviour of thin metal films},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {829--834},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.005},
doi = {10.1016/J.MICROREL.2018.07.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SaghaeianKSM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SajjadeGVM18,
author = {Faisal Mustafa Sajjade and
Neeraj Kumar Goyal and
B. K. S. V. L. Varaprasad and
Ravindra Moogina},
title = {Radiation Hardened by Design Latches - {A} Review and {SEU} Fault
Simulations},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {127--135},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.017},
doi = {10.1016/J.MICROREL.2018.02.017},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SajjadeGVM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SakamotoHS18,
author = {Junji Sakamoto and
Ryoma Hirata and
Tadahiro Shibutani},
title = {Potential failure mode identification of operational amplifier circuit
board by using high accelerated limit test},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {19--24},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.005},
doi = {10.1016/J.MICROREL.2018.04.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SakamotoHS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SamavatianAI18,
author = {Vahid Samavatian and
Yvan Avenas and
Hossein Iman{-}Eini},
title = {Mutual and self-aging effects of power semiconductors on the thermal
behaviour of {DC-DC} boost power converter},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {493--499},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.022},
doi = {10.1016/J.MICROREL.2018.06.022},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SamavatianAI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SangwongwanichZ18,
author = {Ariya Sangwongwanich and
Dao Zhou and
Elizaveta Liivik and
Frede Blaabjerg},
title = {Mission profile resolution impacts on the thermal stress and reliability
of power devices in {PV} inverters},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1003--1007},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.094},
doi = {10.1016/J.MICROREL.2018.06.094},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SangwongwanichZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SasakiHKOOOTY18,
author = {Hajime Sasaki and
Takayuki Hisaka and
Kaoru Kadoiwa and
Tomoki Oku and
Shinobu Onoda and
Takeshi Ohshima and
Eiji Taguchi and
Hidehiro Yasuda},
title = {Ultra-high voltage electron microscopy investigation of irradiation
induced displacement defects on AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {312--319},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.10.005},
doi = {10.1016/J.MICROREL.2017.10.005},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SasakiHKOOOTY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SasangkaGGT18,
author = {Wardhana A. Sasangka and
Yu Gao and
Chee Lip Gan and
Carl V. Thompson},
title = {Impact of carbon impurities on the initial leakage current of AlGaN/GaN
high electron mobility transistors},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {393--396},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.048},
doi = {10.1016/J.MICROREL.2018.06.048},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SasangkaGGT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchaffusABDGHKM18,
author = {T. Schaffus and
P. Albert and
W. Breuer and
D. Debie and
M. Graml and
C. Hollerith and
F. Kroninger and
W. Mack and
H. Pfaff and
M. Schaffus and
J. Walter},
title = {Influence of sample preparation on intrinsic stresses inside a model
Chip - First results of partial decapsulation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {299--303},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.093},
doi = {10.1016/J.MICROREL.2018.07.093},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchaffusABDGHKM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlunderPRGR18,
author = {Christian Schl{\"{u}}nder and
Katja Puschkarsky and
Gunnar Andreas Rott and
Wolfgang Gustin and
Hans Reisinger},
title = {{NBTI:} Experimental investigation, physical modelling, circuit aging
simulations and verification},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {1--10},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.043},
doi = {10.1016/J.MICROREL.2017.12.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchlunderPRGR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SelvanayagamMR18,
author = {Cheryl Selvanayagam and
Rathin Mandal and
Nagarajan Raghavan},
title = {Comparison of experimental, analytical and simulation methods to estimate
substrate material properties for warpage reliability analysis},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {817--823},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.110},
doi = {10.1016/J.MICROREL.2018.07.110},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SelvanayagamMR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShahYBV18,
author = {Ambika Prasad Shah and
Nandakishor Yadav and
Ankur Beohar and
Santosh Kumar Vishvakarma},
title = {An efficient {NBTI} sensor and compensation circuit for stable and
reliable {SRAM} cells},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {15--23},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.015},
doi = {10.1016/J.MICROREL.2018.05.015},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShahYBV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShahrakiG18,
author = {Mehran Gholipour Shahraki and
Saeed Ghorbanali},
title = {The temperature and oxygen vacancy effects on the diffusion coefficient
and ionic conductivity in ferroelectric BaTiO\({}_{\mbox{3}}\) nanowires;
{A} molecular dynamics study},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {153--158},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.019},
doi = {10.1016/J.MICROREL.2018.01.019},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ShahrakiG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShanC18,
author = {Xiuyang Shan and
Yun Chen},
title = {Experimental and modeling study on viscosity of encapsulant for electronic
packaging},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {42--46},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.011},
doi = {10.1016/J.MICROREL.2017.11.011},
timestamp = {Fri, 09 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ShanC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShaoWBZZL18,
author = {Huakai Shao and
Aiping Wu and
Yudian Bao and
Yue Zhao and
Guisheng Zou and
Lei Liu},
title = {Thermal reliability investigation of Ag-Sn {TLP} bonds for high-temperature
power electronics application},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {38--45},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.004},
doi = {10.1016/J.MICROREL.2018.08.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShaoWBZZL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShenWB18,
author = {Yanfeng Shen and
Huai Wang and
Frede Blaabjerg},
title = {Thermal resistance modelling and design optimization of {PCB} vias},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1118--1123},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.028},
doi = {10.1016/J.MICROREL.2018.07.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShenWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShuWLJW18,
author = {Ji Shu and
Shunliang Wang and
Tianqi Liu and
Ning Jiao and
Yanbo Wang},
title = {A novel current-limiting circuit based on resistive-type {SFCL} for
fault in {DC} power system},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1201--1205},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.024},
doi = {10.1016/J.MICROREL.2018.07.024},
timestamp = {Mon, 03 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ShuWLJW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShyuJ18,
author = {Jin{-}Cherng Shyu and
Shu{-}Kai Jheng},
title = {Cooling performance and characteristics of metal piezoelectric fans
in a heat sink-equipped handheld projector},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {75--87},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.012},
doi = {10.1016/J.MICROREL.2018.03.012},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ShyuJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SimonLS18,
author = {F. B. Simon and
S. A. Letz and
Andreas Schletz},
title = {Influence of the pulse length and temperature swing on the relative
lifetime estimation for sintered/soldered chip-on-substrate samples
via FE-simulation of power cycles},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1183--1188},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.113},
doi = {10.1016/J.MICROREL.2018.07.113},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SimonLS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SivasankariAJM18,
author = {B. Sivasankari and
Ahilan Appathurai and
R. Jothin and
A. Jasmine Gnana Malar},
title = {Reliable {N} sleep shuffled phase damping design for ground bouncing
noise mitigation},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1316--1321},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.078},
doi = {10.1016/J.MICROREL.2018.07.078},
timestamp = {Mon, 02 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SivasankariAJM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SmirnovSGS18,
author = {V. I. Smirnov and
V. A. Sergeev and
Andrey Anatolievich Gavrikov and
A. M. Shorin},
title = {Modulation method for measuring thermal impedance components of semiconductor
devices},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {205--212},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.024},
doi = {10.1016/J.MICROREL.2017.11.024},
timestamp = {Thu, 18 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SmirnovSGS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SootkaneungHC18,
author = {Warin Sootkaneung and
Suppachai Howimanporn and
Sasithorn Chookaew},
title = {Temperature effects on {BTI} and soft errors in modern logic circuits},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {259--270},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.032},
doi = {10.1016/J.MICROREL.2018.07.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SootkaneungHC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SousaFCP18,
author = {Renata Oliveira de Sousa and
Joao Victor Matos Farias and
Allan Fagner Cupertino and
Heverton Augusto Pereira},
title = {Life consumption of a {MMC-STATCOM} supporting wind power plants:
Impact of the modulation strategies},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1063--1070},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.111},
doi = {10.1016/J.MICROREL.2018.06.111},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SousaFCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SovcikKASP18,
author = {Michal Sovcik and
Martin Kov{\'{a}}c and
Daniel Arbet and
Viera Stopjakov{\'{a}} and
Miroslav Potocn{\'{y}}},
title = {Ultra-low-voltage boosted driver for self-powered systems},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {155--163},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.006},
doi = {10.1016/J.MICROREL.2017.11.006},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SovcikKASP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StamenkovicNP18,
author = {Zoran Stamenkovic and
Ondrej Nov{\'{a}}k and
Witold A. Pleskacz},
title = {Foreword to the special issue on 20th {IEEE} international symposium
on design and diagnostics of electronic circuits and systems {(DDECS2017)}},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {287},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.042},
doi = {10.1016/J.MICROREL.2017.12.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StamenkovicNP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StathisMG18,
author = {James H. Stathis and
Souvik Mahapatra and
Tibor Grasser},
title = {Controversial issues in negative bias temperature instability},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {244--251},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.035},
doi = {10.1016/J.MICROREL.2017.12.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StathisMG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StellaOYCP18,
author = {Fausto Stella and
Olufisayo Olanrewaju and
Zineng Yang and
Alberto Castellazzi and
Gianmario Pellegrino},
title = {Experimentally validated methodology for real-time temperature cycle
tracking in SiC power modules},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {615--619},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.072},
doi = {10.1016/J.MICROREL.2018.07.072},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StellaOYCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StiasnyQWM18,
author = {Th. Stiasny and
Olivier Quittard and
Daniel Waltisberg and
U. Meier},
title = {Reliability evaluation of {IGCT} from accelerated testing, quality
monitoring and field return analysis},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {510--513},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.079},
doi = {10.1016/J.MICROREL.2018.07.079},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StiasnyQWM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicDDG18,
author = {Ninoslav Stojadinovic and
Snezana Djoric{-}Veljkovic and
Vojkan Davidovic and
Snezana Golubovic and
Srboljub Stankovic and
Aneta Prijic and
Zoran Prijic and
Ivica Manic and
Danijel Dankovic},
title = {{NBTI} and irradiation related degradation mechanisms in power {VDMOS}
transistors},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {135--141},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.138},
doi = {10.1016/J.MICROREL.2018.07.138},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicDDG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StroeKS18,
author = {Ana{-}Irina Stroe and
Vaclav Knap and
Daniel{-}Ioan Stroe},
title = {Comparison of lithium-ion battery performance at beginning-of-life
and end-of-life},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1251--1255},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.077},
doi = {10.1016/J.MICROREL.2018.07.077},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StroeKS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuCCC18,
author = {Te{-}Jen Su and
Yi{-}Feng Chen and
Jui{-}Chuan Cheng and
Chien{-}Liang Chiu},
title = {An artificial neural network approach for wafer dicing saw quality
prediction},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {257--261},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.013},
doi = {10.1016/J.MICROREL.2018.10.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuCCC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuCLCLCT18,
author = {Meiying Su and
Liqiang Cao and
Tingyu Lin and
Feng Chen and
Jun Li and
Cheng Chen and
Gengxin Tian},
title = {Warpage simulation and experimental verification for 320{\unicode{8239}}mm{\unicode{8239}}{\texttimes}{\unicode{8239}}320{\unicode{8239}}mm
panel level fan-out packaging based on die-first process},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {29--38},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.010},
doi = {10.1016/J.MICROREL.2018.02.010},
timestamp = {Thu, 14 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuCLCLCT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunGCLW18,
author = {Siyu Sun and
Qiang Guo and
Hongtao Chen and
Mingyu Li and
Chunqing Wang},
title = {Solderless bonding with nanoporous copper as interlayer for high-temperature
applications},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {198--204},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.012},
doi = {10.1016/J.MICROREL.2017.12.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SunGCLW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunHLZ18,
author = {Xiaoman Sun and
Meng Huang and
Yi Liu and
Xiaoming Zha},
title = {Investigation of artificial neural network algorithm based {IGBT}
online condition monitoring},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {103--106},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.068},
doi = {10.1016/J.MICROREL.2018.07.068},
timestamp = {Mon, 15 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SunHLZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunHPZ18,
author = {Yongquan Sun and
Xueling Hao and
Michael G. Pecht and
Yapeng Zhou},
title = {Remaining useful life prediction for lithium-ion batteries based on
an integrated health indicator},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1189--1194},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.047},
doi = {10.1016/J.MICROREL.2018.07.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SunHPZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaberoRPPRSM18,
author = {Jes{\'{u}}s Tabero and
Alberto Regad{\'{\i}}o and
C{\'{e}}sar P{\'{e}}rez and
Jes{\'{u}}s Pazos and
Pedro Reviriego and
Alfonso S{\'{a}}nchez{-}Maci{\'{a}}n and
Juan Antonio Maestro},
title = {Modular fault tolerant processor architecture on a SoC for space},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {84--90},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.011},
doi = {10.1016/J.MICROREL.2018.02.011},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TaberoRPPRSM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TajalliCNMSMZM18,
author = {Alaleh Tajalli and
Eleonora Canato and
Arianna Nardo and
Matteo Meneghini and
Arno Stockman and
Peter Moens and
Enrico Zanoni and
Gaudenzio Meneghesso},
title = {Impact of sidewall etching on the dynamic performance of GaN-on-Si
E-mode transistors},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {572--576},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.037},
doi = {10.1016/J.MICROREL.2018.06.037},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TajalliCNMSMZM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanLXFG18,
author = {Ligang Tan and
Ziwen Li and
Yunxiu Xiang and
Pengfei Feng and
Yage Guo},
title = {A critical analysis of the bulk current injection immunity test based
on common-mode and differential-mode},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {188--193},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.004},
doi = {10.1016/J.MICROREL.2018.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanLXFG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanZRLPHTM18,
author = {Pik Kee Tan and
Yuzhe Zhao and
Francis Rivai and
Binghai Liu and
Yanlin Pan and
Ran He and
Hao Tan and
Zhihong Mai},
title = {Cross-sectional nanoprobing sample preparation on sub-micron device
with fast laser grooving technique},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {309--314},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.054},
doi = {10.1016/J.MICROREL.2018.07.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanZRLPHTM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TangYWZSYSW18,
author = {Sai Tang and
Xin Yin and
Daming Wang and
Chao Zhang and
Zhikang Shuai and
Xin Yang and
Zheng John Shen and
Jun Wang},
title = {Detection and identification of power switch failures for fault-tolerant
operation of flying capacitor Buck-boost converters},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1236--1241},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.102},
doi = {10.1016/J.MICROREL.2018.06.102},
timestamp = {Sat, 27 Jul 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TangYWZSYSW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TariqBK18,
author = {Muhammad Tariq and
Saad A. Butt and
Hassan Abbas Khan},
title = {Impact of module and inverter failures on the performance of central-,
string-, and micro-inverter {PV} systems},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1042--1046},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.096},
doi = {10.1016/J.MICROREL.2018.06.096},
timestamp = {Thu, 01 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TariqBK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TianHMG18,
author = {Yu Tian and
Jing Han and
Limin Ma and
Fu Guo},
title = {The dominant effect of c-axis orientation in tin on the electromigration
behaviors in tricrystal Sn-3.0Ag-0.5Cu solder joints},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {7--13},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.005},
doi = {10.1016/J.MICROREL.2017.11.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TianHMG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TilfordSLJBBB18,
author = {Tim Tilford and
Stoyan Stoyanov and
Jessica B. S. Langbaum and
Jan Christoph Janhsen and
Matthias Burgard and
Richard B. Buxton and
Chris Bailey},
title = {Design, manufacture and test for reliable 3D printed electronics packaging},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {109--117},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.008},
doi = {10.1016/J.MICROREL.2018.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TilfordSLJBBB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TraiolaBB18,
author = {Marcello Traiola and
Mario Barbareschi and
Alberto Bosio},
title = {Estimating dynamic power consumption for memristor-based CiM architecture},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {241--248},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.009},
doi = {10.1016/J.MICROREL.2017.12.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TraiolaBB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TripathiTO18,
author = {Ravi N. Tripathi and
Masanori Tsukuda and
Ichiro Omura},
title = {A fully digital feedback control of gate driver for current balancing
of parallel connected power devices},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {505--509},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.030},
doi = {10.1016/J.MICROREL.2018.06.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TripathiTO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TrivellinMSBMZM18,
author = {Nicola Trivellin and
Desiree Monti and
Carlo De Santi and
Matteo Buffolo and
Gaudenzio Meneghesso and
Enrico Zanoni and
Matteo Meneghini},
title = {Current induced degradation study on state of the art {DUV} LEDs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {868--872},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.145},
doi = {10.1016/J.MICROREL.2018.07.145},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TrivellinMSBMZM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Tsai18,
author = {Chin{-}Yi Tsai},
title = {A theoretical model for calculating the effects of carrier heating
with nonequilibrium hot phonons on semiconductor devices and the current-voltage
relations},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {335--343},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.126},
doi = {10.1016/J.MICROREL.2018.07.126},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Tsai18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsukudaAHNO18,
author = {Masanori Tsukuda and
Seiya Abe and
Kazunori Hasegawa and
Tamotsu Ninomiya and
Ichiro Omura},
title = {Bias voltage criteria of gate shielding effect for protecting IGBTs
from shoot-through phenomena},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {482--485},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.026},
doi = {10.1016/J.MICROREL.2018.06.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsukudaAHNO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TuanCWLWFL18,
author = {Fu{-}Yuan Tuan and
Chii{-}Wen Chen and
Mu{-}Chun Wang and
Wen{-}Shiang Liao and
Shea{-}Jue Wang and
Shou{-}Kong Fan and
Wen{-}How Lan},
title = {Thermal stress probing the channel-length modulation effect of nano
n-type FinFETs},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {260--270},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.06.067},
doi = {10.1016/J.MICROREL.2017.06.067},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TuanCWLWFL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UbarKJRJ18,
author = {Raimund Ubar and
Sergei Kostin and
Maksim Jenihhin and
Jaan Raik and
Lembit J{\"{u}}rim{\"{a}}gi},
title = {Fast identification of true critical paths in sequential circuits},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {252--261},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.027},
doi = {10.1016/J.MICROREL.2017.11.027},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/UbarKJRJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UhrenfeldtMB18,
author = {Christian Uhrenfeldt and
Stig Munk{-}Nielsen and
Szymon Beczkowski},
title = {Frequency domain scanning acoustic microscopy for power electronics:
Physics-based feature identification and selectivity},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {726--732},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.043},
doi = {10.1016/J.MICROREL.2018.07.043},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/UhrenfeldtMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UnterreitmeierN18,
author = {Marianne Unterreitmeier and
Oliver Nagler and
Lothar Pfitzner and
Robert Weigel and
Rainer Holmer},
title = {An acoustic emission sensor system for thin layer crack detection},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {16--21},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.015},
doi = {10.1016/J.MICROREL.2018.07.015},
timestamp = {Tue, 12 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/UnterreitmeierN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ValiSMPDPC18,
author = {Indudhar Panduranga Vali and
Pramoda Kumara Shetty and
M. G. Mahesha and
V. C. Petwal and
Jishnu Dwivedi and
D. M. Phase and
R. J. Choudhary},
title = {Implications of electron beam irradiation on Al/n-Si Schottky junction
properties},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {179--184},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.031},
doi = {10.1016/J.MICROREL.2018.07.031},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ValiSMPDPC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VanziMM18,
author = {Massimo Vanzi and
Giovanna Mura and
G. Martines},
title = {Further improvements of an extended Hakki-Paoli method},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {859--863},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.086},
doi = {10.1016/J.MICROREL.2018.07.086},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VanziMM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Veenhuizen18,
author = {Marc van Veenhuizen},
title = {Void detection in solder bumps with deep learning},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {315--320},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.081},
doi = {10.1016/J.MICROREL.2018.06.081},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Veenhuizen18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VernicaWB18,
author = {Ionut Vernica and
Huai Wang and
Frede Blaabjerg},
title = {Uncertainty analysis of capacitor reliability prediction due to uneven
thermal loading in photovoltaic applications},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1036--1041},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.059},
doi = {10.1016/J.MICROREL.2018.07.059},
timestamp = {Thu, 27 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VernicaWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VieraDFPNRB18,
author = {Raphael Andreoni Camponogara Viera and
Jean{-}Max Dutertre and
Marie{-}Lise Flottes and
Olivier Potin and
Giorgio Di Natale and
Bruno Rouzeyre and
Rodrigo Possamai Bastos},
title = {Assessing body built-in current sensors for detection of multiple
transient faults},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {128--134},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.111},
doi = {10.1016/J.MICROREL.2018.07.111},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VieraDFPNRB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VillaGR18,
author = {Emanuele Villa and
Audrey Garnier and
Antoine Reverdy},
title = {Exploitation of Laser Voltage techniques for identification and complete
characterization of a scan chain transition fail issue using the second
harmonic approach},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {267--272},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.073},
doi = {10.1016/J.MICROREL.2018.07.073},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VillaGR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VogtNMB18,
author = {Ivo Vogt and
Tomonori Nakamura and
B. Motamedi and
Christian Boit},
title = {Device characterization of 16/14{\unicode{8239}}nm FinFETs for reliability
assessment with infrared emission spectra},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {11--15},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.012},
doi = {10.1016/J.MICROREL.2018.07.012},
timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VogtNMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VogtNWB18,
author = {Ivo Vogt and
Tomonori Nakamura and
Ingrid De Wolf and
Christian Boit},
title = {Detection of failure mechanisms in 24-40{\unicode{8239}}nm FinFETs
with (spectral) photon emission techniques using InGaAs camera},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {334--338},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.080},
doi = {10.1016/J.MICROREL.2018.06.080},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VogtNWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WalterKNS18,
author = {Thomas Walter and
Golta Khatibi and
Michael Nelhiebel and
M. Stefenelli},
title = {Characterization of cyclic delamination behavior of thin film multilayers},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {721--725},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.062},
doi = {10.1016/J.MICROREL.2018.06.062},
timestamp = {Fri, 01 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WalterKNS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WanLHQXLJ18,
author = {Yongqiang Wan and
Shuang Li and
Xiaowu Hu and
Yu Qiu and
Tao Xu and
Yulong Li and
Xiongxin Jiang},
title = {Shear strength and fracture surface analysis of Sn58Bi/Cu solder joints
under a wide range of strain rates},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {27--37},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.007},
doi = {10.1016/J.MICROREL.2018.05.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WanLHQXLJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangCLSBWS18,
author = {Jing Wang and
Yi{-}xi Cai and
Xiao{-}hua Li and
Yun{-}fei Shi and
Ya{-}chao Bao and
Jun Wang and
Yun{-}xi Shi},
title = {Experimental study on optical-thermal associated characteristics of
{LED} car lamps under the action of ionic wind},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {113--123},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.008},
doi = {10.1016/J.MICROREL.2018.01.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangCLSBWS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangDWNCSSBLGCB18,
author = {Haibin Wang and
Xixi Dai and
Yangsheng Wang and
Issam Nofal and
Li Cai and
Zicai Shen and
Wanxiu Sun and
Jinshun Bi and
Bo Li and
Gang Guo and
Li Chen and
Sang H. Baeg},
title = {A single event upset tolerant latch design},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {909--913},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.019},
doi = {10.1016/J.MICROREL.2018.07.019},
timestamp = {Wed, 26 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangDWNCSSBLGCB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLHZYZGXGCC18,
author = {Jian Wang and
Binhong Li and
Yang Huang and
Kai Zhao and
Fang Yu and
Qiwen Zheng and
Qi Guo and
Liewei Xu and
J. Gao and
X. Cai and
Y. Cui},
title = {The total ionizing dose response of leading-edge {FDSOI} MOSFETs},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {979--983},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.080},
doi = {10.1016/J.MICROREL.2018.07.080},
timestamp = {Fri, 26 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLHZYZGXGCC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLS18,
author = {Guohua Wang and
Song Liu and
Jiangtao Sun},
title = {A dynamic partial reconfigurable system with combined task allocation
method to improve the reliability of {FPGA}},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {14--24},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.005},
doi = {10.1016/J.MICROREL.2018.02.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLWP18,
author = {Benkuan Wang and
Datong Liu and
Wenjuan Wang and
Xiyuan Peng},
title = {A hybrid approach for {UAV} flight data estimation and prediction
based on flight mode recognition},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {253--262},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.032},
doi = {10.1016/J.MICROREL.2018.03.032},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLWP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangW18,
author = {Haoran Wang and
Huai Wang},
title = {An analytical circuit based nonlinear thermal model for capacitor
banks},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {524--527},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.112},
doi = {10.1016/J.MICROREL.2018.06.112},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWD18,
author = {Weiliang Wang and
Pengjun Wang and
Mingzhi Dai},
title = {Simplification of sub-gap density of states extraction method for
amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage
curve},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {111--114},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.007},
doi = {10.1016/J.MICROREL.2018.01.007},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangWD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWHSHG18,
author = {Tun Wang and
Baoming Wang and
Aman Haque and
Michael Snure and
Eric Heller and
Nicholas Glavin},
title = {Mechanical stress effects on electrical breakdown of freestanding
GaN thin films},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {181--185},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.033},
doi = {10.1016/J.MICROREL.2017.12.033},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangWHSHG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWZB18,
author = {Zhongxu Wang and
Huai Wang and
Yi Zhang and
Frede Blaabjerg},
title = {A multi-port thermal coupling model for multi-chip power modules suitable
for circuit simulators},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {519--523},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.031},
doi = {10.1016/J.MICROREL.2018.06.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangWZB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWZWZLF18,
author = {Zhihua Wang and
Qiong Wu and
Xiongjian Zhang and
Xinlei Wen and
Yongbo Zhang and
Chengrui Liu and
Huimin Fu},
title = {A generalized degradation model based on Gaussian process},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {207--214},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.001},
doi = {10.1016/J.MICROREL.2018.05.001},
timestamp = {Thu, 29 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangWZWZLF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangXWZ18,
author = {Longjun Wang and
Jiayou Xu and
Gang Wang and
Zheng Zhang},
title = {Lifetime estimation of {IGBT} modules for {MMC-HVDC} application},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {90--99},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.009},
doi = {10.1016/J.MICROREL.2018.01.009},
timestamp = {Wed, 25 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangXWZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangZYCSS18,
author = {He Wang and
Pan Zhao and
Hong Yang and
Jipeng Chang and
Dengyuan Song and
Shiyu Sang},
title = {Performance variation of dark current density-voltage characteristics
for PID-affected monocrystalline silicon solar modules from the field},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {320--327},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.003},
doi = {10.1016/J.MICROREL.2017.11.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangZYCSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WatanabeKYOHKMS18,
author = {Kazuki Watanabe and
Yoshiharu Kariya and
Naoyuki Yajima and
Kizuku Obinata and
Yoshiyuki Hiroshima and
Shunichi Kikuchi and
Akiko Matsui and
Hiroshi Shimizu},
title = {Low-cycle fatigue testing and thermal fatigue life prediction of electroplated
copper thin film for through hole via},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {20--27},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.045},
doi = {10.1016/J.MICROREL.2017.12.045},
timestamp = {Wed, 22 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WatanabeKYOHKMS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WatanabeO18,
author = {Akihiko Watanabe and
Ichiro Omura},
title = {A power cycling degradation inspector of power semiconductor devices},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {458--461},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.071},
doi = {10.1016/J.MICROREL.2018.06.071},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WatanabeO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WildLGZ18,
author = {Paul Wild and
Dominik Lorenz and
Tobias Gr{\"{o}}zinger and
Andr{\'{e}} Zimmermann},
title = {Effect of voids on thermo-mechanical reliability of chip resistor
solder joints: Experiment, modelling and simulation},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {163--175},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.014},
doi = {10.1016/J.MICROREL.2018.04.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WildLGZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WlanisHELSGRM18,
author = {Thomas Wlanis and
Ren{\'{e}} Hammer and
Werner Ecker and
Sandrine Lhostis and
Cl{\'{e}}ment Sart and
S{\'{e}}bastien Gallois{-}Garreignot and
Bernhard Rebhan and
G{\"{u}}nther A. Maier},
title = {Cu-SiO2 hybrid bonding simulation including surface roughness and
viscoplastic material modeling: {A} critical comparison of 2D and
3D modeling approach},
journal = {Microelectron. Reliab.},
volume = {86},
pages = {1--9},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.005},
doi = {10.1016/J.MICROREL.2018.05.005},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WlanisHELSGRM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WozniakKJJ18,
author = {Lukasz Wozniak and
Pawel Kalinowski and
Grzegorz Jasinski and
Piotr Jasinski},
title = {{FFT} analysis of temperature modulated semiconductor gas sensor response
for the prediction of ammonia concentration under humidity interference},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {163--169},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.034},
doi = {10.1016/J.MICROREL.2018.03.034},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WozniakKJJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wu18,
author = {Chunlei Wu},
title = {Electrically induced physical damage {(EIPD)} cases study: From electrical
overstress {(EOS)} to product defects},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {203--207},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.011},
doi = {10.1016/J.MICROREL.2018.07.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wu18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuCZH18,
author = {Tiezhou Wu and
Zhihao Cheng and
Jiasheng Zhang and
Zhangqing He},
title = {A {PCH} strong tracking control strategy for power coordinated allocation
of Li-SC {HESS}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1261--1267},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.066},
doi = {10.1016/J.MICROREL.2018.06.066},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuCZH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuL18,
author = {Mei{-}Ling Wu and
Jia{-}Shen Lan},
title = {Reliability and failure analysis of {SAC} 105 and {SAC} 1205N lead-free
solder alloys during drop test events},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {213--222},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.013},
doi = {10.1016/J.MICROREL.2017.12.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuTZLCG18,
author = {Zheng{-}Yuan Wu and
Shiang{-}Feng Tang and
Hong{-}Yuan Zeng and
Wen{-}Jen Lin and
Tzu{-}Chiang Chen and
Yau{-}Tang Gau},
title = {Infrared response of vanadium oxide (VO\({}_{\mbox{x}}\))/SiN\({}_{\mbox{x}}\)/reduced
graphene oxide (rGO) composite microbolometer},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {313--318},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.003},
doi = {10.1016/J.MICROREL.2018.02.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuTZLCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuZLLWW18,
author = {Jianfei Wu and
Wei Zhu and
Binhong Li and
Yafei Li and
Hongyi Wang and
Mengjun Wang},
title = {Investigations on immunity of interfaces between intelligent media
processor and {DDR3} {SDRAM} memory},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {230--235},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.127},
doi = {10.1016/J.MICROREL.2018.07.127},
timestamp = {Tue, 26 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuZLLWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuestTJSS18,
author = {Felix Wuest and
S. Trampert and
S. Janzen and
Stefan Straube and
Martin Schneider{-}Ramelow},
title = {Comparison of temperature sensitive electrical parameter based methods
for junction temperature determination during accelerated aging of
power electronics},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {534--539},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.124},
doi = {10.1016/J.MICROREL.2018.07.124},
timestamp = {Sat, 23 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WuestTJSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuDLZZMGL18,
author = {Guoning Xu and
Xiaowei Du and
Zhaojie Li and
Xiaojun Zhang and
Minxin Zheng and
Ying Miao and
Yang Gao and
Qianshi Liu},
title = {Reliability design of battery management system for power battery},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1286--1292},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.115},
doi = {10.1016/J.MICROREL.2018.06.115},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/XuDLZZMGL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuLXHDCQKZ18,
author = {Zhaozhao Xu and
Donghua Liu and
Wei Xiong and
Jun Hu and
Wenting Duan and
Hualun Chen and
Wensheng Qian and
Weiran Kong and
Shichang Zou},
title = {Investigation and impact of {LDD} variations on the drain disturb
in normally-on {SONOS} {NOR} flash device},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {157--162},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.039},
doi = {10.1016/J.MICROREL.2018.03.039},
timestamp = {Sat, 25 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XuLXHDCQKZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuWWZD18,
author = {Shunqiang Xu and
Hongyi Wang and
Jianfei Wu and
Liming Zheng and
Jietao Diao},
title = {A new multitime programmable non-volatile memory cell using high voltage
{NMOS}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {169--172},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.089},
doi = {10.1016/J.MICROREL.2018.07.089},
timestamp = {Tue, 26 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XuWWZD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamagishiC18,
author = {Yuji Yamagishi and
Y. Cho},
title = {High resolution observation of defects at SiO\({}_{\mbox{2}}\)/4H-SiC
interfaces using time-resolved scanning nonlinear dielectric microscopy},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {242--245},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.058},
doi = {10.1016/J.MICROREL.2018.07.058},
timestamp = {Wed, 28 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YamagishiC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamaguchiWMEHHL18,
author = {Shimpei Yamaguchi and
Liesbeth Witters and
J{\'{e}}r{\^{o}}me Mitard and
Geert Eneman and
Geert Hellings and
Andriy Hikavyy and
Roger Loo and
Naoto Horiguchi},
title = {Scalability comparison between raised- and embedded-SiGe source/drain
structures for Si\({}_{\mbox{0.55}}\)Ge\({}_{\mbox{0.45}}\) implant
free quantum well pFET},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {157--161},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.006},
doi = {10.1016/J.MICROREL.2018.03.006},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YamaguchiWMEHHL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YanYGSXX18,
author = {Wei Yan and
Zhinong Yu and
Jian Guo and
Dawei Shi and
Jianshe Xue and
Wei Xue},
title = {Recovery behaviors in n-channel LTPS-TFTs under {DC} stress},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {117--120},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.026},
doi = {10.1016/J.MICROREL.2017.12.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YanYGSXX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangFYCHHC18,
author = {Guoliang Yang and
Chuntian Fu and
Haitao Yi and
Chunhua Chai and
Bingxu Huang and
Shuai Hao and
Zhe Chen},
title = {Direct power control of three-level {NPC} grid-connected system combined
with fault-tolerant technology},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1057--1062},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.140},
doi = {10.1016/J.MICROREL.2018.07.140},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangFYCHHC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangLLF18,
author = {Jianqun Yang and
Xingji Li and
Chaoming Liu and
Daniel M. Fleetwood},
title = {The effect of ionization and displacement damage on minority carrier
lifetime},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {124--129},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.012},
doi = {10.1016/J.MICROREL.2018.01.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangLLF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangSZ18,
author = {Jun Yang and
Xiao Shi and
Jianchun Zhang},
title = {A new processing method for accelerated degradation data based on
quantile regression and pseudo-failure lifetime},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1141--1145},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.076},
doi = {10.1016/J.MICROREL.2018.06.076},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangSZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangXFR18,
author = {Zhizhan Yang and
Xiaodong Xie and
Xue Fan and
Yubo Ren},
title = {A novel single-event-hardened charge pump using cascode voltage switch
logic gates},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {269--277},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.016},
doi = {10.1016/J.MICROREL.2018.10.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangXFR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YapabandaraMWKU18,
author = {Kosala Yapabandara and
Vahid Mirkhani and
Shiqiang Wang and
Min P. Khanal and
Sunil Uprety and
Tamara Isaacs{-}Smith and
Michael C. Hamilton and
Minseo Park},
title = {Proton-induced displacement damage in ZnO thin film transistors: Impact
of damage location},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {262--268},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.011},
doi = {10.1016/J.MICROREL.2018.10.011},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YapabandaraMWKU18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YeCWWZ18,
author = {Xuerong Ye and
Cen Chen and
Yixing Wang and
L. Wang and
Guofu Zhai},
title = {{VDMOSFET} {HEF} degradation modelling considering turn-around phenomenon},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {37--41},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.015},
doi = {10.1016/J.MICROREL.2017.11.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YeCWWZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YeCZ18,
author = {Xuerong Ye and
Cen Chen and
Guofu Zhai},
title = {Fault localization of a switched mode power supply based on extended
integer-coded dictionary method},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {339--344},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.107},
doi = {10.1016/J.MICROREL.2018.06.107},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YeCZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YeLWNZ18,
author = {Xuerong Ye and
Yigang Lin and
Qingmin Wang and
Hao Niu and
Guofu Zhai},
title = {Manufacturing process-based storage degradation modelling and reliability
assessment},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {107--110},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.085},
doi = {10.1016/J.MICROREL.2018.06.085},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YeLWNZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YeZCLWZ18,
author = {Xuerong Ye and
Kaixin Zhang and
Cen Chen and
Zhongwei Li and
Yue Wang and
Guofu Zhai},
title = {The threshold voltage degradation model of {N} Channel VDMOSFETs under
{PBT} stress},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {46--51},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.003},
doi = {10.1016/J.MICROREL.2018.08.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YeZCLWZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YeZLMLLWH18,
author = {Zhipeng Ye and
Jiawei Zhu and
Qian Li and
Bing Mo and
Baimao Lei and
Yaqiu Li and
Chunhui Wang and
Chuangmian Huang},
title = {A novel method of reliability-centered process optimization for additive
manufacturing},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1151--1156},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.149},
doi = {10.1016/J.MICROREL.2018.07.149},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YeZLMLLWH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YiD18,
author = {Shipeng Yi and
Zhengwei Du},
title = {The influence of microwave pulse width on the thermal burnout effect
of an {LNA} constructed by a GaAs {PHEMT}},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {140--147},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.016},
doi = {10.1016/J.MICROREL.2018.04.016},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YiD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YiD18a,
author = {Shipeng Yi and
Zhengwei Du},
title = {The influence of microwave pulse repetition frequency on the thermal
burnout effect of a {PIN} diode limiting-amplifying system},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {156--162},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.018},
doi = {10.1016/J.MICROREL.2018.04.018},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YiD18a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YimSK18,
author = {Byung{-}seung Yim and
Young{-}Eui Shin and
Jong{-}Min Kim},
title = {Influence of multi-walled carbon nanotube {(MWCNT)} concentration
on the thermo-mechanical reliability properties of solderable anisotropic
conductive adhesives (SACAs)},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {201--212},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.008},
doi = {10.1016/J.MICROREL.2018.10.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YimSK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YinLYWB18,
author = {Limeng Yin and
Dong Li and
Zongxiang Yao and
Gang Wang and
Adrian Blackburn},
title = {Microstructures and properties of Bi10Ag high temperature solder doped
with Cu element},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {79--84},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.013},
doi = {10.1016/J.MICROREL.2017.11.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YinLYWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YinZZHWH18,
author = {Xiao{-}Jing Yin and
Bangcheng Zhang and
Zhi{-}Jie Zhou and
Xiaoxia Han and
Zhanli Wang and
Guan{-}Yu Hu},
title = {A new health estimation model for {CNC} machine tool based on infinite
irrelevance and belief rule base},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {187--196},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.031},
doi = {10.1016/J.MICROREL.2018.03.031},
timestamp = {Wed, 29 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YinZZHWH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuPLH18,
author = {Tzu{-}Yu Yu and
Liang{-}Shuan Peng and
Chun{-}Wei Lin and
Yue{-}Ming Hsin},
title = {GaAsSb/InGaAs tunnel field effect transistor with a pocket layer},
journal = {Microelectron. Reliab.},
volume = {83},
pages = {235--237},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.05.017},
doi = {10.1016/J.MICROREL.2017.05.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuPLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuSLMLLLT18,
author = {Qingkui Yu and
Yi Sun and
Zheng Li and
Bo Mei and
Xiaoliang Li and
He Lv and
Pengwei Li and
Min Tang},
title = {Experimental and simulation study of the correlation between displacement
damage and incident proton energy for GaAs devices},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {952--956},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.083},
doi = {10.1016/J.MICROREL.2018.07.083},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuSLMLLLT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuTTL18,
author = {Jinsong Yu and
Weiqi Tang and
Diyin Tang and
Jingjing Liu},
title = {A prediction method for discharge voltage of lithium-ion batteries
under unknown dynamic loads},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1206--1211},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.022},
doi = {10.1016/J.MICROREL.2018.07.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuTTL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuXHLL18,
author = {Fei Yu and
Chuanzhong Xu and
Gongyi Huang and
Wei Lin and
Tsair{-}Chun Liang},
title = {A closed-form trapped-charge-included drain current compact model
for amorphous oxide semiconductor thin-film transistors},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {307--312},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.004},
doi = {10.1016/J.MICROREL.2018.02.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuXHLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YunKSSK18,
author = {Yeohyeok Yun and
Gang{-}Jun Kim and
Ji{-}Hoon Seo and
Donghee Son and
Bongkoo Kang},
title = {Method to extract parameters of power law for nano-scale SiON pMOSFETs
under negative bias temperature instability},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {191--195},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.056},
doi = {10.1016/J.MICROREL.2018.07.056},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YunKSSK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YunSSK18,
author = {Yeohyeok Yun and
Ji{-}Hoon Seo and
Donghee Son and
Bongkoo Kang},
title = {Method to estimate profile of threshold voltage degradation in MOSFETs
due to electrical stress},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {186--190},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.055},
doi = {10.1016/J.MICROREL.2018.07.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YunSSK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZachariaszSIZHW18,
author = {Piotr Zachariasz and
Agata Skwarek and
Bal{\'{a}}zs Ill{\'{e}}s and
Jan Zukrowski and
Tam{\'{a}}s Hurtony and
Krzysztof Witek},
title = {M{\"{o}}ssbauer studies of {\(\beta\)}{\unicode{8239}}{\(\rightarrow\)}{\unicode{8239}}{\(\alpha\)}
phase transition in Sn-rich solder alloys},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {165--170},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.016},
doi = {10.1016/J.MICROREL.2018.01.016},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZachariaszSIZHW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZajacN18,
author = {Piotr Zajac and
Andrzej Napieralski},
title = {Novel thermal model of microchannel cooling system designed for fast
simulation of liquid-cooled ICs},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {245--258},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.020},
doi = {10.1016/J.MICROREL.2018.06.020},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZajacN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZanellaECFC18,
author = {S. Zanella and
A. Lecavelier des Etangs{-}Levallois and
Eric Charkaluk and
W. C. Maia Filho and
A. Constantinescu},
title = {Importance of electric resistance monitoring in shear test},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {733--737},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.063},
doi = {10.1016/J.MICROREL.2018.06.063},
timestamp = {Sat, 26 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZanellaECFC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZebrevOGD18,
author = {Gennady I. Zebrev and
Vasily V. Orlov and
Maxim S. Gorbunov and
Maxim G. Drosdetsky},
title = {Physics-based modeling of {TID} induced global static leakage in different
{CMOS} circuits},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {181--186},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.014},
doi = {10.1016/J.MICROREL.2018.03.014},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZebrevOGD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZengWL18,
author = {Guang Zeng and
F. Wenisch{-}Kober and
Josef Lutz},
title = {Study on power cycling test with different control strategies},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {756--761},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.088},
doi = {10.1016/J.MICROREL.2018.07.088},
timestamp = {Thu, 12 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZengWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZerarkaC18,
author = {Moustafa Zerarka and
Olivier Cr{\'{e}}pel},
title = {Radiation robustness of normally-off GaN/HEMT power transistors {(COTS)}},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {984--991},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.148},
doi = {10.1016/J.MICROREL.2018.07.148},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZerarkaC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangAB18,
author = {Teng Zhang and
Bruno Allard and
Jinshun Bi},
title = {The synergetic effects of high temperature gate bias and total ionization
dose on 1.2{\unicode{8239}}kV SiC devices},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {631--635},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.046},
doi = {10.1016/J.MICROREL.2018.06.046},
timestamp = {Wed, 25 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangAB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangBDMCV18,
author = {Yuan Ci Zhang and
Olivier Briat and
Jean{-}Yves Del{\'{e}}tage and
Cyril Martin and
Nicolas Chadourne and
Jean{-}Michel Vinassa},
title = {Efficient state of health estimation of Li-ion battery under several
ageing types for aeronautic applications},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1231--1235},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.038},
doi = {10.1016/J.MICROREL.2018.07.038},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangBDMCV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangCHLF18,
author = {Jizuo Zhang and
Jianjun Chen and
Pengcheng Huang and
Shouping Li and
Liang Fang},
title = {Angular dependency on heavy-ion-induced single-event multiple transients
{(SEMT)} in 65{\unicode{8239}}nm twin-well and triple-well {CMOS}
technology},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {278--282},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.015},
doi = {10.1016/J.MICROREL.2018.10.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangCHLF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangGGLHWLW18,
author = {Jinxin Zhang and
Qi Guo and
Hongxia Guo and
Wu Lu and
Chaohui He and
Xin Wang and
Pei Li and
Lin Wen},
title = {Investigation of enhanced low dose rate sensitivity in SiGe HBTs by
\({}^{\mbox{60}}\)Co {\(\gamma\)} irradiation under different biases},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {105--111},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.007},
doi = {10.1016/J.MICROREL.2018.03.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangGGLHWLW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangJ18,
author = {Dan Zhang and
Jianguo Jiang},
title = {A reliable speed controller for suppressing low frequency concussion
of electric vehicle},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1256--1260},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.013},
doi = {10.1016/J.MICROREL.2018.07.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangJZ18,
author = {Jianfu Zhang and
Zhigang Ji and
Wei Dong Zhang},
title = {As-grown-generation {(AG)} model of {NBTI:} {A} shift from fitting
test data to prediction},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {109--123},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.026},
doi = {10.1016/J.MICROREL.2017.11.026},
timestamp = {Fri, 22 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangJZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLLWZW18,
author = {Qingwei Zhang and
Ping Li and
Yongbo Liao and
Gang Wang and
Rongzhou Zeng and
Heng Wang},
title = {A reverse hysteresis effect of graphene transistors with amorphous
silicon gate dielectric},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {118--121},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.012},
doi = {10.1016/J.MICROREL.2018.04.012},
timestamp = {Thu, 19 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangLLWZW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLWFFSZ18,
author = {Hao Zhang and
Yang Liu and
Lingen Wang and
Jiajie Fan and
Xuejun Fan and
Fenglian Sun and
Guoqi Zhang},
title = {A new hermetic sealing method for ceramic package using nanosilver
sintering technology},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {143--149},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.030},
doi = {10.1016/J.MICROREL.2017.12.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLWFFSZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLZJRHZWGW18,
author = {D. Zhang and
T. R. Li and
J. W. Zhou and
Y. C. Jiang and
B. Ren and
J. Huang and
J. M. Zhang and
Lin Wang and
Ju Gao and
L. J. Wang},
title = {Asymmetric resistive switching behaviour in a Au/a-C: Co/Au planar
structure},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {52--56},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.021},
doi = {10.1016/J.MICROREL.2018.05.021},
timestamp = {Fri, 07 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangLZJRHZWGW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangMZL18,
author = {Heng Zhang and
Qiang Miao and
Xin Zhang and
Zhiwen Liu},
title = {An improved unscented particle filter approach for lithium-ion battery
remaining useful life prediction},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {288--298},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.036},
doi = {10.1016/J.MICROREL.2017.12.036},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangMZL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangSDH18,
author = {Jian{-}Xun Zhang and
Xiao{-}Sheng Si and
Dang{-}Bo Du and
Chang{-}Hua Hu},
title = {Specification analysis of the deteriorating sensor for required lifetime
prognostic performance},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {71--83},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.004},
doi = {10.1016/J.MICROREL.2018.04.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangSDH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangWCZ18,
author = {Qi Zhang and
Yuping Wu and
Lan Chen and
Xuelian Zhang},
title = {A robust asynchronous 16{\unicode{8239}}{\texttimes}{\unicode{8239}}16-bit
subthreshold multiplier using {SAPTL} technique},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {98--111},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.08.006},
doi = {10.1016/J.MICROREL.2018.08.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangWCZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangWWB18,
author = {Yi Zhang and
Huai Wang and
Zhongxu Wang and
Frede Blaabjerg},
title = {An empirical model for thermal interface materials based on experimental
characterizations under realistic conditions},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {806--811},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.057},
doi = {10.1016/J.MICROREL.2018.06.057},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangWWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangWWWLP18,
author = {Yujie Zhang and
Lulu Wang and
Shaonian Wang and
Peng Wang and
Haitao Liao and
Yu Peng},
title = {Auxiliary power unit failure prediction using quantified generalized
renewal process},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {215--225},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.002},
doi = {10.1016/J.MICROREL.2018.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangWWWLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangXLCQLW18,
author = {Rongsheng Zhang and
Liyi Xiao and
Jie Li and
Xuebing Cao and
Chunhua Qi and
Jiaqiang Li and
Mingjiang Wang},
title = {A fast fault injection platform of multiple SEUs for SRAM-based FPGAs},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {147--152},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.01.014},
doi = {10.1016/J.MICROREL.2018.01.014},
timestamp = {Fri, 13 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangXLCQLW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangXMY18,
author = {Zhen Zhang and
Yaoting Xue and
Ruiqing Ma and
Yongheng Yang},
title = {An easy-implemented confidence filter for signal processing in the
complex electromagnetic environment},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {225--229},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.105},
doi = {10.1016/J.MICROREL.2018.07.105},
timestamp = {Mon, 10 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangXMY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoHCCCZWSZGD18,
author = {Wen Zhao and
Chaohui He and
Wei Chen and
Rongmei Chen and
Peitian Cong and
Fengqi Zhang and
Zujun Wang and
Chen Shen and
Lisang Zheng and
Xiaoqiang Guo and
Lili Ding},
title = {Single-event multiple transients in guard-ring hardened inverter chains
of different layout designs},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {151--157},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.014},
doi = {10.1016/J.MICROREL.2018.06.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoHCCCZWSZGD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoJMQ18,
author = {Zheng Zhao and
Ningyue Jiang and
Zhenqiang Ma and
Guoxuan Qin},
title = {Impact of finger numbers on the performance of proton-radiated SiGe
power HBTs at room and cryogenic temperatures},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {194--200},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.006},
doi = {10.1016/J.MICROREL.2018.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoJMQ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoLPL18,
author = {Ke Zhao and
Nanxi Li and
Boan Pan and
Ting Li},
title = {Performance assessment of the NIRS-based medical system of evaluating
therapeutic effect},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {188--193},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.017},
doi = {10.1016/J.MICROREL.2018.06.017},
timestamp = {Thu, 22 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhaoLPL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoPLZWL18,
author = {Ke Zhao and
Boan Pan and
Zebing Li and
Fulin Zhong and
Pengbo Wang and
Ting Li},
title = {Performance evaluation for a novel optoelectronic device for noninvasive
monitoring thrombosis},
journal = {Microelectron. Reliab.},
volume = {84},
pages = {134--139},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.021},
doi = {10.1016/J.MICROREL.2018.03.021},
timestamp = {Thu, 22 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhaoPLZWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoQZF18,
author = {Qi Zhao and
Xiaoli Qin and
Hongbo Zhao and
Wenquan Feng},
title = {A novel prediction method based on the support vector regression for
the remaining useful life of lithium-ion batteries},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {99--108},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.007},
doi = {10.1016/J.MICROREL.2018.04.007},
timestamp = {Thu, 15 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhaoQZF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoXSPL18,
author = {Yue Zhao and
Guoyi Xu and
Yunlong Sun and
Boan Pan and
Ting Li},
title = {A portable high-density absolute-measure {NIRS} imager for detecting
prefrontal lobe activity under fatigue driving},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {197--203},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.02.002},
doi = {10.1016/J.MICROREL.2018.02.002},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhaoXSPL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhengHLZ18,
author = {Tao Zheng and
Meng Huang and
Yi Liu and
Xiaoming Zha},
title = {Reliability model of bond wire fatigue for {IGBT} in {MMC} with system
redundancy consideration},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {1164--1167},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.099},
doi = {10.1016/J.MICROREL.2018.07.099},
timestamp = {Mon, 15 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhengHLZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhihongXY18,
author = {Zhihong Wu and
Su Xiezu and
Zhu Yuan},
title = {{IGBT} junction and coolant temperature estimation by thermal model},
journal = {Microelectron. Reliab.},
volume = {87},
pages = {168--182},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.018},
doi = {10.1016/J.MICROREL.2018.06.018},
timestamp = {Sun, 11 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhihongXY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuCW18,
author = {Ze Zhu and
Yan{-}Cheong Chan and
Fengshun Wu},
title = {Failure mechanisms of solder interconnects under current stressing
in advanced electronic packages: An update on the effect of alternating
current {(AC)} stressing},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {179--182},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.10.002},
doi = {10.1016/J.MICROREL.2018.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuCW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZimpeckMAHKR18,
author = {Alexandra L. Zimpeck and
Cristina Meinhardt and
Laurent Artola and
Guillaume Hubert and
Fernanda Lima Kastensmidt and
Ricardo Augusto da Luz Reis},
title = {Impact of different transistor arrangements on gate variability},
journal = {Microelectron. Reliab.},
volume = {88-90},
pages = {111--115},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.06.090},
doi = {10.1016/J.MICROREL.2018.06.090},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZimpeckMAHKR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZubertRSZ18,
author = {Mariusz Zubert and
Tomasz Raszkowski and
Agnieszka Samson and
Piotr Zajac},
title = {Methodology of determining the applicability range of the {DPL} model
to heat transfer in modern integrated circuits comprised of FinFETs},
journal = {Microelectron. Reliab.},
volume = {91},
pages = {139--153},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.07.141},
doi = {10.1016/J.MICROREL.2018.07.141},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZubertRSZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AamirMAW17,
author = {Muhammad Aamir and
Riaz Muhammad and
Naseer Ahmed and
Muhammad Waqas},
title = {Impact of thermal aging on the intermetallic compound particle size
and mechanical properties of lead free solder for green electronics},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {311--318},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.022},
doi = {10.1016/J.MICROREL.2017.09.022},
timestamp = {Tue, 27 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AamirMAW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbbasHZ17,
author = {Haider Muhi Abbas and
Basel Halak and
Mark Zwolinski},
title = {{BTI} mitigation by anti-ageing software patterns},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {79--90},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.009},
doi = {10.1016/J.MICROREL.2017.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbbasHZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbbateBSTV17,
author = {Carmine Abbate and
Giovanni Busatto and
Annunziata Sanseverino and
D. Tedesco and
Francesco Velardi},
title = {Experimental study of the instabilities observed in 650 {V} enhancement
mode GaN {HEMT} during short circuit},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {314--320},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.020},
doi = {10.1016/J.MICROREL.2017.07.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbbateBSTV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbeHTWON17,
author = {Seiya Abe and
Kazunori Hasegawa and
Masanori Tsukuda and
Keiji Wada and
Ichiro Omura and
Tamotsu Ninomiya},
title = {Modelling of the shoot-through phenomenon introduced by the next generation
{IGBT} in inverter applications},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {465--469},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.087},
doi = {10.1016/J.MICROREL.2017.06.087},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbeHTWON17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbubakarIW17,
author = {Hadiza Ahmad Abubakar and
Dino Isa and
Wong Yee Wan},
title = {Comparing the degradation effect of a 'two-cell' Supercapacitor-module
with and without voltage equalization circuit(s) under experimental
self-discharge and load cycling tests},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {140--148},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.025},
doi = {10.1016/J.MICROREL.2017.10.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbubakarIW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Aghaei17,
author = {Babak Aghaei},
title = {A high fault coverage test approach for communication channels in
network on chip},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {178--186},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.010},
doi = {10.1016/J.MICROREL.2017.07.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Aghaei17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AguiarAHMKR17,
author = {Y. Q. de Aguiar and
Laurent Artola and
Guillaume Hubert and
Cristina Meinhardt and
Fernanda Lima Kastensmidt and
Ricardo Augusto da Luz Reis},
title = {Evaluation of radiation-induced soft error in majority voters designed
in 7 nm FinFET technology},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {660--664},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.077},
doi = {10.1016/J.MICROREL.2017.06.077},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AguiarAHMKR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhnPK17,
author = {Key{-}one Ahn and
Se{-}Hoon Park and
Young{-}Ho Kim},
title = {Degradation of adhesion between Cu and epoxy-based dielectric during
exposure to hot humid environments},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {1--10},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.083},
doi = {10.1016/J.MICROREL.2017.07.083},
timestamp = {Wed, 07 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AhnPK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Al-ObaidyYM17,
author = {Furat Al{-}Obaidy and
Farhang Yazdani and
Farah A. Mohammadi},
title = {Fault detection using thermal image based on soft computing methods:
Comparative study},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {56--64},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.013},
doi = {10.1016/J.MICROREL.2017.02.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Al-ObaidyYM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AliyuC17,
author = {Attahir Murtala Aliyu and
Alberto Castellazzi},
title = {Measuring structure functions of power devices in inverters},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {395--404},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.036},
doi = {10.1016/J.MICROREL.2017.03.036},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AliyuC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AmsterSFYDD17,
author = {Oskar Amster and
Fred Stanke and
Stuart Friedman and
Yongliang Yang and
St. John B. Dixon{-}Warren and
B. Drevniok},
title = {Practical quantitative scanning microwave impedance microscopy},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {214--217},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.082},
doi = {10.1016/J.MICROREL.2017.07.082},
timestamp = {Mon, 13 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AmsterSFYDD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AuvrayASJB17,
author = {Etienne Auvray and
Paul Armagnat and
Luc Saury and
Maheshwaran Jothi and
Michael Br{\"{u}}gel},
title = {Effective scan chain failure analysis method},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {201--213},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.024},
doi = {10.1016/J.MICROREL.2017.07.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AuvrayASJB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzarifarD17,
author = {Mohammad Azarifar and
Nazli Donmezer},
title = {A multiscale analytical correction technique for two-dimensional thermal
models of AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {82--87},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.020},
doi = {10.1016/J.MICROREL.2017.05.020},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AzarifarD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaberG17,
author = {Forrest Baber and
Ibrahim Guven},
title = {Solder joint fatigue life prediction using peridynamic approach},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {20--31},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.004},
doi = {10.1016/J.MICROREL.2017.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaberG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BahmanIHNB17,
author = {Amir Sajjad Bahman and
Francesco Iannuzzo and
T. Holmgaard and
R. {\O}. Nielsen and
Frede Blaabjerg},
title = {Reliability-oriented environmental thermal stress analysis of fuses
in power electronics},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {25--30},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.089},
doi = {10.1016/J.MICROREL.2017.06.089},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BahmanIHNB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaiAHM17,
author = {Xuezong Bai and
Zongwen An and
Yunfeng Hou and
Qiang Ma},
title = {Health assessment and management of wind turbine blade based on the
fatigue test data},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {205--214},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.009},
doi = {10.1016/J.MICROREL.2017.05.009},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaiAHM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bairi17,
author = {Abderrahmane Ba{\"{\i}}ri},
title = {Junction temperature of {QFN32} and 64 electronic devices subjected
to free convection. Effects of the resin's thermal conductivity},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {67--73},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.006},
doi = {10.1016/J.MICROREL.2017.05.006},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Bairi17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BairiRMAM17,
author = {Abderrahmane Ba{\"{\i}}ri and
Lu{\'{\i}}s M. Roseiro and
Alexander Mart{\'{\i}}n{-}Gar{\'{\i}}n and
Kemi Adeyeye and
J. A. Mill{\'{a}}n{-}Garc{\'{\i}}a},
title = {Thermal state of electronic assemblies applied to smart building equipped
with {QFN64} device subjected to natural convection},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {79--83},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.002},
doi = {10.1016/J.MICROREL.2017.01.002},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BairiRMAM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarriereGWBH17,
author = {Maxime Barri{\`{e}}re and
Alexandrine Gu{\'{e}}don{-}Gracia and
Eric Woirgard and
Serge Bontemps and
Fran{\c{c}}ois Le Henaff},
title = {Innovative conception of SiC MOSFET-Schottky 3D power inverter module
with double side cooling and stacking using silver sintering},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {431--437},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.037},
doi = {10.1016/J.MICROREL.2017.07.037},
timestamp = {Thu, 10 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BarriereGWBH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BartraAMVR17,
author = {Walter E. Calienes Bartra and
Y. Q. de Aguiar and
Cristina Meinhardt and
Andrei Vladimirescu and
Ricardo Augusto da Luz Reis},
title = {Evaluation of heavy-ion impact in bulk and {FDSOI} devices under {ZTC}
condition},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {655--659},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.063},
doi = {10.1016/J.MICROREL.2017.06.063},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BartraAMVR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeckerLCB17,
author = {Thales E. Becker and
Alisson J. C. Lanot and
Guilherme Schwanke Cardoso and
Tiago R. Balen},
title = {Single event transient effects on charge redistribution {SAR} ADCs},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {22--35},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.002},
doi = {10.1016/J.MICROREL.2017.04.002},
timestamp = {Thu, 20 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BeckerLCB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BernsteinBB17,
author = {Joseph B. Bernstein and
Alain Bensoussan and
Emmanuel Bender},
title = {Reliability prediction with {MTOL}},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {91--97},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.09.005},
doi = {10.1016/J.MICROREL.2016.09.005},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BernsteinBB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BertholdBFBRN17,
author = {Tobias Berthold and
Guenther Benstetter and
Werner Frammelsberger and
Manuel Bogner and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a},
title = {Protective nanometer films for reliable Cu-Cu connections},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {383--389},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.001},
doi = {10.1016/J.MICROREL.2017.07.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BertholdBFBRN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bey-TemsamaniKD17,
author = {Abdellatif Bey{-}Temsamani and
S. Kauffmann and
Y. Descas and
Bart Vandevelde and
Franco Zanon and
Geert Willems},
title = {Improved and accurate physics-of-failure (PoF) methodology for qualification
and lifetime assessment of electronic systems},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {42--46},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.047},
doi = {10.1016/J.MICROREL.2017.06.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bey-TemsamaniKD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BheesayagariGPP17,
author = {Chenna Reddy Bheesayagari and
Sergi Gorreta and
Joan Pons{-}Nin and
Manuel Dom{\'{\i}}nguez Pumar},
title = {Second order sigma-delta control of charge trapping for {MOS} capacitors},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {635--639},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.096},
doi = {10.1016/J.MICROREL.2017.06.096},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BheesayagariGPP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BiroHDB17,
author = {Ferenc Bir{\'{o}} and
Zolt{\'{a}}n Hajnal and
Csaba D{\"{u}}cso and
Istv{\'{a}}n B{\'{a}}rsony},
title = {The critical impact of temperature gradients on Pt filament failure},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {118--125},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.006},
doi = {10.1016/J.MICROREL.2017.08.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BiroHDB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoigeR17,
author = {F. Boige and
Fr{\'{e}}d{\'{e}}ric Richardeau},
title = {Gate leakage-current analysis and modelling of planar and trench power
SiC {MOSFET} devices in extreme short-circuit operation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {532--538},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.084},
doi = {10.1016/J.MICROREL.2017.06.084},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BoigeR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoigeRTLG17,
author = {F. Boige and
Fr{\'{e}}d{\'{e}}ric Richardeau and
David Tr{\'{e}}mouilles and
St{\'{e}}phane Lefebvre and
G. Guibaud},
title = {Investigation on damaged planar-oxide of 1200 {V} SiC power MOSFETs
in non-destructive short-circuit operation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {500--506},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.085},
doi = {10.1016/J.MICROREL.2017.06.085},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BoigeRTLG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Boit17,
author = {Christian Boit},
title = {Technologies for Heterogeneous Integration - Challenges and chances
for fault isolation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {184--187},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.071},
doi = {10.1016/J.MICROREL.2017.06.071},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Boit17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoostandoostGP17,
author = {Mahyar Boostandoost and
Dieter Gr{\"{a}}fje and
Florin Pop},
title = {Circuit simulation assisting Physical Fault Isolation for effective
root cause analysis},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {194--200},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.074},
doi = {10.1016/J.MICROREL.2017.07.074},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoostandoostGP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoscaroJSPB17,
author = {Anthony Boscaro and
Sabir Jacquir and
Kevin Sanchez and
Philippe Perdu and
St{\'{e}}phane Binczak},
title = {Pattern image enhancement by automatic focus correction},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {249--254},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.012},
doi = {10.1016/J.MICROREL.2017.07.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoscaroJSPB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrinckerSEP17,
author = {Mads Brincker and
S. S{\"{o}}hl and
R. Eisele and
Vladimir N. Popok},
title = {Strength and reliability of low temperature transient liquid phase
bonded Cu-Sn-Cu interconnects},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {378--382},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.041},
doi = {10.1016/J.MICROREL.2017.06.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrinckerSEP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CasanoP17,
author = {G. Casano and
S. Piva},
title = {Experimental investigation of a Peltier cells cooling system for a
Switch-Mode Power Supply},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {426--432},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.042},
doi = {10.1016/J.MICROREL.2017.05.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CasanoP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CeccarelliRIB17,
author = {Lorenzo Ceccarelli and
Paula Diaz Reigosa and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {A survey of SiC power MOSFETs short-circuit robustness and failure
mode analysis},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {272--276},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.093},
doi = {10.1016/J.MICROREL.2017.06.093},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CeccarelliRIB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChatbouriTKS17,
author = {S. Chatbouri and
M. Troudi and
A. Kalboussi and
A. Souifi},
title = {Interface traps effect on the charge transport mechanisms in metal
oxide semiconductor structures based on silicon nanocrystals},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {227--232},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.010},
doi = {10.1016/J.MICROREL.2017.09.010},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChatbouriTKS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChatzikyriakouR17,
author = {Eleni Chatzikyriakou and
William Redman{-}White and
C. H. De Groot},
title = {Total Ionizing Dose, Random Dopant Fluctuations, and its combined
effect in the 45 nm {PDSOI} node},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {21--29},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.007},
doi = {10.1016/J.MICROREL.2016.11.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChatzikyriakouR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenANRNNYLM17,
author = {Changqing Chen and
Ghim Boon Ang and
Peng Tiong Ng and
Francis Rivai and
Soh Ping Neo and
Dayanand Nagalingam and
Kim Hong Yip and
Jeffery Lam and
Zhihong Mai},
title = {Application of Scanning Capacitance Microscopy on {SOI} device with
wafer edge low yield pattern},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {141--144},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.014},
doi = {10.1016/J.MICROREL.2017.07.014},
timestamp = {Tue, 21 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenANRNNYLM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenANRNQTLM17,
author = {Changqing Chen and
Ghim Boon Ang and
Peng Tiong Ng and
Francis Rivai and
Hui Peng Ng and
Alfred C. T. Quah and
Angela Teo and
Jeffery Lam and
Zhihong Mai},
title = {Embed {SRAM} {IDDOFF} fail root cause identification by combination
of device analysis and localized circuit analysis},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {261--266},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.015},
doi = {10.1016/J.MICROREL.2017.07.015},
timestamp = {Tue, 21 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenANRNQTLM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenC17,
author = {Hung{-}Wei Chen and
Mi{-}Chang Chang},
title = {Improving the {ESD} self-protection capability of 60 {V} {HV} p-channel
{LDMOS} large array device in 0.25 {\(\mu\)}m {BCD} process},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {110--117},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.019},
doi = {10.1016/J.MICROREL.2017.05.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenCGSZZZDLGWL17,
author = {Rongmei Chen and
Wei Chen and
Xiaoqiang Guo and
Chen Shen and
Fengqi Zhang and
Lisang Zheng and
Wen Zhao and
Lili Ding and
Yinhong Luo and
Hongxia Guo and
Yuanming Wang and
Yinong Liu},
title = {Improved on-chip self-triggered single-event transient measurement
circuit design and applications},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {99--105},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.004},
doi = {10.1016/J.MICROREL.2017.03.004},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenCGSZZZDLGWL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenCLKCLWLLS17,
author = {Shao{-}Wen Chen and
Wan{-}June Chiu and
Min{-}Song Lin and
Feng{-}Jiun Kuo and
Min{-}Lun Chai and
Jin{-}Der Lee and
Jong{-}Rong Wang and
Hao{-}Tzu Lin and
Wei{-}Keng Lin and
Chunkuan Shih},
title = {1D and {Q2D} thermal resistance analysis of micro channel structure
and flat plate heat pipe},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {103--114},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.030},
doi = {10.1016/J.MICROREL.2017.03.030},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenCLKCLWLLS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenDCLSQ17,
author = {Zhiqiang Chen and
Shengcai Deng and
Xudong Chen and
Chuan Li and
Ren{\'{e}}{-}Vinicio S{\'{a}}nchez and
Huafeng Qin},
title = {Deep neural networks-based rolling bearing fault diagnosis},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {327--333},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.006},
doi = {10.1016/J.MICROREL.2017.03.006},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenDCLSQ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenHL17,
author = {Qi Chen and
Run Hu and
Xiaobing Luo},
title = {A statistical study to identify the effects of packaging structures
on lumen reliability of LEDs},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {51--55},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.011},
doi = {10.1016/J.MICROREL.2017.02.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenHLSCW17,
author = {Cheng Chen and
Fengze Hou and
Fengman Liu and
Qian She and
Liqiang Cao and
Lixi Wan},
title = {Thermo-mechanical reliability analysis of a {RF} SiP module based
on {LTCC} substrate},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {38--47},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.003},
doi = {10.1016/J.MICROREL.2017.10.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenHLSCW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenJFZ17,
author = {Yilong Chen and
Jianyuan Jia and
Hongzhi Fu and
Zhaofei Zhu},
title = {Development of numerical algorithm to guide solder joint structure
and component structural design during manufacturing},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {134--142},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.007},
doi = {10.1016/J.MICROREL.2017.02.007},
timestamp = {Thu, 29 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenJFZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenJK17,
author = {Yunxia Chen and
Yi Jin and
Rui Kang},
title = {Coupling damage and reliability modeling for creep and fatigue of
solder joint},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {233--238},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.016},
doi = {10.1016/J.MICROREL.2017.03.016},
timestamp = {Fri, 18 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenJK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenLC17,
author = {Chun{-}Yu Chen and
Jyi{-}Tsong Lin and
Meng{-}Hsueh Chiang},
title = {Threshold-voltage variability analysis and modeling for junctionless
double-gate transistors},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {22--26},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.002},
doi = {10.1016/J.MICROREL.2017.05.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenLC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenLL17,
author = {Xuanlong Chen and
Liyuan Liu and
Enliang Li},
title = {Metal defect localization of GaAs or Si based ICs by dynamic emission
microscopy},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {24--29},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.003},
doi = {10.1016/J.MICROREL.2017.03.003},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenLL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenPCYC17,
author = {Zhen Chen and
Yang Peng and
Hao Cheng and
Zizhou Yang and
Mingxiang Chen},
title = {Void-free and high-speed filling of through ceramic holes by copper
electroplating},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {171--177},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.074},
doi = {10.1016/J.MICROREL.2017.06.074},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenPCYC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenZCZF17,
author = {Liangbiao Chen and
Jiang Zhou and
Hsing{-}wei Chu and
Guoqi Zhang and
Xuejun Fan},
title = {Modeling nonlinear moisture diffusion in inhomogeneous media},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {162--170},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.055},
doi = {10.1016/J.MICROREL.2017.06.055},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenZCZF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChengHP17,
author = {Shunfeng Cheng and
Chien{-}Ming Huang and
Michael G. Pecht},
title = {A review of lead-free solders for electronics applications},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {77--95},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.016},
doi = {10.1016/J.MICROREL.2017.06.016},
timestamp = {Mon, 04 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChengHP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChernyakovAKZSS17,
author = {Anton E. Chernyakov and
Andrey V. Aladov and
Ivan A. Kalashnikov and
Alexander L. Zakgeim and
Vitaliy I. Smirnov and
Viacheslav Andreevich Sergeev},
title = {Experimental study of electroluminescence and temperature distribution
in high-power AlGaInN LEDs {\&} {LED} arrays},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {457--461},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.035},
doi = {10.1016/J.MICROREL.2017.04.035},
timestamp = {Tue, 27 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChernyakovAKZSS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuCCKC17,
author = {Hsien{-}Chin Chiu and
Min{-}Li Chou and
Chun{-}Hu Cheng and
Hsuan{-}Ling Kao and
Cheng{-}Lin Cho},
title = {Effect of body bias and temperature on low-frequency noise in 40-nm
nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {267--271},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.002},
doi = {10.1016/J.MICROREL.2017.09.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuCCKC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoiBI17,
author = {Ui{-}Min Choi and
Frede Blaabjerg and
Francesco Iannuzzo},
title = {Advanced power cycler with intelligent monitoring strategy of {IGBT}
module under test},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {522--526},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.029},
doi = {10.1016/J.MICROREL.2017.06.029},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChoiBI17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChuCLCWSCCT17,
author = {David T. Chu and
Yi{-}Cheng Chu and
Jie{-}An Lin and
Yi{-}Ting Chen and
Chun{-}Chieh Wang and
Yen{-}Fang Song and
Cheng{-}Cheng Chiang and
Chih Chen and
King{-}Ning Tu},
title = {Growth competition between layer-type and porous-type Cu\({}_{\mbox{3}}\)Sn
in microbumps},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {32--37},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.001},
doi = {10.1016/J.MICROREL.2017.10.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChuCLCWSCCT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChuLPS17,
author = {Kunmo Chu and
Changseung Lee and
Sung{-}Hoon Park and
Yoonchul Sohn},
title = {Effects of Ag addition and Ag\({}_{\mbox{3}}\)Sn formation on the
mechanical reliability of Ni/Sn solder joints},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {53--58},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.012},
doi = {10.1016/J.MICROREL.2017.06.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChuLPS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChvalaMPSSPDD17,
author = {Ales Chv{\'{a}}la and
Juraj Marek and
Patrik Pribytny and
Alexander Satka and
Steve Stoffels and
Niels Posthuma and
Stefaan Decoutere and
Daniel Donoval},
title = {Analysis of multifinger power HEMTs supported by effective 3-D device
electrothermal simulation},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {148--155},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.012},
doi = {10.1016/J.MICROREL.2017.08.012},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChvalaMPSSPDD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CodecasadMR17,
author = {Lorenzo Codecasa and
Vincenzo d'Alessandro and
Alessandro Magnani and
Niccol{\`{o}} Rinaldi},
title = {3-D thermal models calibration by parametric dynamic compact thermal
models},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {371--379},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.025},
doi = {10.1016/J.MICROREL.2017.04.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CodecasadMR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CodecasadMRMBP17,
author = {Lorenzo Codecasa and
Vincenzo d'Alessandro and
Alessandro Magnani and
Niccol{\`{o}} Rinaldi and
Andre G. Metzger and
Robin Bornoff and
John Parry},
title = {Partition-based approach to parametric dynamic compact thermal modeling},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {361--370},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.059},
doi = {10.1016/J.MICROREL.2017.06.059},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CodecasadMRMBP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ColacoKKCJ17,
author = {A. M. Colaco and
Ciji Pearl Kurian and
Savitha G. Kini and
S. G. Colaco and
Cherian Johny},
title = {Thermal characterization of multicolor {LED} luminaire},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {379--388},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.026},
doi = {10.1016/J.MICROREL.2017.04.026},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ColacoKKCJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CorneliusTRP17,
author = {Ben Cornelius and
Shay Treivish and
Yair Rosenthal and
Michael G. Pecht},
title = {The phenomenon of tin pest: {A} review},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {175--192},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.030},
doi = {10.1016/J.MICROREL.2017.10.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CorneliusTRP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaACCDLP17,
author = {Paolo Cova and
Attahir Murtala Aliyu and
Alberto Castellazzi and
Diego Chiozzi and
Nicola Delmonte and
P. Lasserre and
N. Pignoloni},
title = {Thermal design and characterization of a modular integrated liquid
cooled 1200 {V-35} {A} SiC {MOSFET} bi-directional switch},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {277--281},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.062},
doi = {10.1016/J.MICROREL.2017.06.062},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CovaACCDLP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DaiLZZHBZZ17,
author = {Lihua Dai and
Xiaonian Liu and
Mengying Zhang and
Leqing Zhang and
Zhiyuan Hu and
Dawei Bi and
Zhengxuan Zhang and
Shichang Zou},
title = {Degradation induced by {TID} radiation and hot-carrier stress in 130-nm
short channel {PDSOI} NMOSFETs},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {74--80},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.021},
doi = {10.1016/J.MICROREL.2017.05.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DaiLZZHBZZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dakhel17,
author = {A. A. Dakhel},
title = {Improving carrier mobility with vanadium doping of transparent conducting
CdO},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {276--280},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.038},
doi = {10.1016/J.MICROREL.2017.05.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dakhel17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DammannBPBKQMGS17,
author = {Maximilian Dammann and
Martina Baeumler and
Vladimir Polyakov and
Peter Br{\"{u}}ckner and
Helmer Konstanzer and
R{\"{u}}diger Quay and
Michael Mikulla and
Andreas Graff and
Mich{\'{e}}l Simon{-}Najasek},
title = {Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {292--297},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.008},
doi = {10.1016/J.MICROREL.2017.07.008},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DammannBPBKQMGS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DaoKAJSL17,
author = {Cong Nguyen Dao and
Abdallah El Kass and
Mostafa Rahimi Azghadi and
Craig T. Jin and
Jonathan Scott and
Philip Heng Wai Leong},
title = {An enhanced {MOSFET} threshold voltage model for the 6-300 {K} temperature
range},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {36--39},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.007},
doi = {10.1016/J.MICROREL.2016.12.007},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DaoKAJSL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DbeissAZ17,
author = {Mouhannad Dbeiss and
Yvan Avenas and
Henri Zara},
title = {Comparison of the electro-thermal constraints on SiC {MOSFET} and
Si {IGBT} power modules in photovoltaic {DC/AC} inverters},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {65--71},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.087},
doi = {10.1016/J.MICROREL.2017.07.087},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DbeissAZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DcharBM17,
author = {Ilyas Dchar and
Cyril Buttay and
Herv{\'{e}} Morel},
title = {SiC power devices packaging with a short-circuit failure mode capability},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {400--404},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.003},
doi = {10.1016/J.MICROREL.2017.07.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DcharBM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DengZXZH17,
author = {Erping Deng and
Zhibin Zhao and
Qingming Xin and
Jingwei Zhang and
Yongzhang Huang},
title = {Analysis on the difference of the characteristic between high power
{IGBT} modules and press pack IGBTs},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {25--37},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.095},
doi = {10.1016/J.MICROREL.2017.07.095},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DengZXZH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DengZZHL17,
author = {Erping Deng and
Zhibin Zhao and
Peng Zhang and
Yongzhang Huang and
Jinyuan Li},
title = {Optimization of the thermal contact resistance within press pack IGBTs},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {17--28},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.003},
doi = {10.1016/J.MICROREL.2017.01.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DengZZHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DengZZLH17,
author = {Erping Deng and
Zhibin Zhao and
Peng Zhang and
Jinyuan Li and
Yongzhang Huang},
title = {Study on the methods to measure the junction-to-case thermal resistance
of {IGBT} modules and press pack IGBTs},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {248--256},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.032},
doi = {10.1016/J.MICROREL.2017.05.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DengZZLH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DiyarogluOOMHH17,
author = {Cagan Diyaroglu and
Selda Oterkus and
Erkan Oterkus and
Erdogan Madenci and
S. Han and
Y. Hwang},
title = {Peridynamic wetness approach for moisture concentration analysis in
electronic packages},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {103--111},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.008},
doi = {10.1016/J.MICROREL.2017.01.008},
timestamp = {Mon, 23 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DiyarogluOOMHH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DobriJPJCPB17,
author = {Adam Dobri and
Simon Jeannot and
Fausto Piazza and
Carine Jahan and
Jean Coignus and
Luca Perniola and
Francis Balestra},
title = {Development and application of the Oxide Stress Separation technique
for the measurement of {ONO} leakage currents at low electric fields
in 40 nm floating gate embedded-flash memory},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {47--51},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.006},
doi = {10.1016/J.MICROREL.2016.12.006},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DobriJPJCPB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DongSPZLHL17,
author = {Aihua Dong and
Javier A. Salcedo and
Srivatsan Parthasarathy and
Yuanzhong Paul Zhou and
Sirui Luo and
Jean{-}Jacques Hajjar and
Juin J. Liou},
title = {{ESD} protection structure with reduced capacitance and overshoot
voltage for high speed interface applications},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {201--205},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.014},
doi = {10.1016/J.MICROREL.2017.03.014},
timestamp = {Wed, 29 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DongSPZLHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DoumitDCCBR17,
author = {Nicole Doumit and
B. Danoumb{\'{e}} and
St{\'{e}}phane Capraro and
J. P. Chatelon and
M.{-}F. Blanc{-}Mignon and
Jean Jacques Rousseau},
title = {Temperature impact on inductance and resistance values of a coreless
inductor (Cu/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\))},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {30--33},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.037},
doi = {10.1016/J.MICROREL.2017.03.037},
timestamp = {Fri, 26 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DoumitDCCBR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuLLZDHRYY17,
author = {Xuecheng Du and
Shuhuan Liu and
Dongyang Luo and
Yao Zhang and
Xiaozhi Du and
Chaohui He and
Xiaotang Ren and
Weitao Yang and
Yuan Yuan},
title = {Single event effects sensitivity of low energy proton in Xilinx Zynq-7010
system-on chip},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {65--70},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.014},
doi = {10.1016/J.MICROREL.2017.02.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuLLZDHRYY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DugalC17,
author = {Franc Dugal and
Mauro Ciappa},
title = {Reliability investigation of the copper-zinc system for solid diffusion
bonding in power modules},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {460--464},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.023},
doi = {10.1016/J.MICROREL.2017.07.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DugalC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuongTR17,
author = {Pham Luu Trung Duong and
Trong Toan Tran and
Nagarajan Raghavan},
title = {Application of multiplicative dimensional reduction method for uncertainty
quantification and sensitivity analysis of {MEMS} electrostatic actuators},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {619--625},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.091},
doi = {10.1016/J.MICROREL.2017.07.091},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuongTR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuschlFGW17,
author = {Rainer Duschl and
Armin H. Fischer and
Achim Gratz and
Robert Wiesner},
title = {Static and dynamic hot carrier accelerated {TDDB:} Influencing factors
and impact on product lifetime},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {149--153},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.051},
doi = {10.1016/J.MICROREL.2017.06.051},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuschlFGW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EftaxiopoulosAP17,
author = {Nikolaos Eftaxiopoulos and
Nicholas Axelos and
Kiamal Z. Pekmestzi},
title = {{DIRT} latch: {A} novel low cost double node upset tolerant latch},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {57--68},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.006},
doi = {10.1016/J.MICROREL.2016.11.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EftaxiopoulosAP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM17,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {1},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.011},
doi = {10.1016/J.MICROREL.2016.12.011},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ErslandM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EscudieCNB17,
author = {Fr{\'{e}}d{\'{e}}ric Escudi{\'{e}} and
Fabrice Caignet and
Nicolas Nolhier and
Marise Bafleur},
title = {Prediction of {LIN} communication robustness against {EFT} events
using dedicated failure models},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {685--691},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.032},
doi = {10.1016/J.MICROREL.2017.07.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EscudieCNB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanYQFZ17,
author = {Jiajie Fan and
Chaohua Yu and
Cheng Qian and
Xuejun Fan and
Guoqi Zhang},
title = {Thermal/luminescence characterization and degradation mechanism analysis
on phosphor-converted white {LED} chip scale packages},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {179--185},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.012},
doi = {10.1016/J.MICROREL.2017.04.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FanYQFZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FeilHGN17,
author = {D. Feil and
T. Herberholz and
M. Guyenot and
Mathias Nowottnick},
title = {Highly variable Sn-Cu diffusion soldering process for high performance
power electronics},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {455--459},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.058},
doi = {10.1016/J.MICROREL.2017.07.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FeilHGN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleuryNRP17,
author = {Cl{\'{e}}ment Fleury and
Guido Notermans and
Hans{-}Martin Ritter and
Dionyz Pogany},
title = {TIM, {EMMI} and 3D {TCAD} analysis of discrete-technology SCRs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {698--702},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.070},
doi = {10.1016/J.MICROREL.2017.06.070},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FleuryNRP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FortierP17,
author = {Aleksandra Fortier and
Michael G. Pecht},
title = {A perspective of the {IPC} report on lead-free electronics in military/aerospace
applications},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {66--70},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.001},
doi = {10.1016/J.MICROREL.2017.01.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FortierP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FotoohiH17,
author = {Somayeh Fotoohi and
Saeed Haji{-}Nasiri},
title = {Transfer matrix model of multilayer graphene nanoribbon interconnects},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {193--200},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.041},
doi = {10.1016/J.MICROREL.2017.05.041},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FotoohiH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FukushiSHK17,
author = {Daisuke Fukushi and
Akito Sasaki and
Hideaki Hirabayashi and
Masaaki Kitano},
title = {Effect of oxygen vacancy in tungsten oxide on the photocatalytic activity
for decomposition of organic materials in the gas phase},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {1--4},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.025},
doi = {10.1016/J.MICROREL.2017.09.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FukushiSHK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalyS17,
author = {Philippe Galy and
Wim Schoenmaker},
title = {Exploration of robustness limits and {ESD} {EMI} impact in a protection
device for advanced {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {680--684},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.073},
doi = {10.1016/J.MICROREL.2017.06.073},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GalyS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GanM17,
author = {Chong Leong Gan and
Mohamad Zainudeen Moideen},
title = {Book Review: Carbon Nanotubes for Interconnects: Process, Design and
Applications (2017), Springer, {ISBN:} {ISBN} 978-3-319-29744-6 (Print)
{ISBN} 978-3-319-29746-0 (Online)},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {122--123},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.004},
doi = {10.1016/J.MICROREL.2017.01.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GanM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GanM17a,
author = {Chong Leong Gan and
Mohamad Zainudeen Moideen},
title = {Soft error mechanisms, modeling and mitigation. Springer {(2016)}},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {81},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.016},
doi = {10.1016/J.MICROREL.2017.05.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GanM17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GeissmannMCRA17,
author = {Silvan Geissmann and
L. De Michielis and
Chiara Corvasce and
Munaf Rahimo and
M. Andenna},
title = {Extraction of dynamic avalanche during {IGBT} turn off},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {495--499},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.008},
doi = {10.1016/J.MICROREL.2017.08.008},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GeissmannMCRA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhasemiRH17,
author = {Seyed Ebrahim Ghasemi and
A. A. Ranjbar and
M. J. Hosseini},
title = {Experimental and numerical investigation of circular minichannel heat
sinks with various hydraulic diameter for electronic cooling application},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {97--105},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.028},
doi = {10.1016/J.MICROREL.2017.04.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhasemiRH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhosalB17,
author = {Sanghamitra Ghosal and
Partha Bhattacharyya},
title = {A potential gas sensor device based on Pd/RGO/TiO\({}_{\mbox{2}}\)
nanotube ternary hybrid junction},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {299--306},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.020},
doi = {10.1016/J.MICROREL.2017.09.020},
timestamp = {Tue, 03 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GhosalB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhoshKK17,
author = {Rituparna Ghosh and
Anwesha Kanjilal and
Praveen Kumar},
title = {Effect of type of thermo-mechanical excursion on growth of interfacial
intermetallic compounds in Cu/Sn-Ag-Cu solder joints},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {44--51},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.011},
doi = {10.1016/J.MICROREL.2017.05.011},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhoshKK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GiacciDL17,
author = {Federico Giacci and
Stefano Dellea and
Giacomo Langfelder},
title = {Signal integrity in capacitive and piezoresistive single- and multi-axis
{MEMS} gyroscopes under vibrations},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {59--68},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.019},
doi = {10.1016/J.MICROREL.2017.06.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GiacciDL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoncalvesSKA17,
author = {Marcio Gon{\c{c}}alves and
Mateus Saquetti and
Fernanda Lima Kastensmidt and
Jos{\'{e}} Rodrigo Azambuja},
title = {A low-level software-based fault tolerance approach to detect SEUs
in GPUs' register files},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {665--669},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.035},
doi = {10.1016/J.MICROREL.2017.07.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoncalvesSKA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GonzalezA17,
author = {Jose Angel Ortiz Gonzalez and
Olayiwola Alatise},
title = {Impact of the gate driver voltage on temperature sensitive electrical
parameters for condition monitoring of SiC power MOSFETs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {470--474},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.082},
doi = {10.1016/J.MICROREL.2017.06.082},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GonzalezA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoreckiGZ17,
author = {Pawel G{\'{o}}recki and
Krzysztof G{\'{o}}recki and
Janusz Zarebski},
title = {Modelling the temperature influence on dc characteristics of the {IGBT}},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {96--103},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.019},
doi = {10.1016/J.MICROREL.2017.10.019},
timestamp = {Fri, 17 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GoreckiGZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoreckiP17,
author = {Krzysztof G{\'{o}}recki and
Przemyslaw Ptak},
title = {Modelling {LED} lamps in {SPICE} with thermal phenomena taken into
account},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {440--447},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.024},
doi = {10.1016/J.MICROREL.2017.03.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoreckiP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GraffSAKGHJBGB17,
author = {Andreas Graff and
Mich{\'{e}}l Simon{-}Najasek and
Frank Altmann and
J{\'{a}}n Kuzm{\'{\i}}k and
Dagmar Gregusov{\'{a}} and
S. Hascik and
Helmut Jung and
T. Baur and
Jan Gr{\"{u}}nenp{\"{u}}tt and
Herv{\'{e}} Blanck},
title = {High resolution physical analysis of ohmic contact formation at GaN-HEMT
devices},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {338--343},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.031},
doi = {10.1016/J.MICROREL.2017.06.031},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GraffSAKGHJBGB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuZRSZY17,
author = {Qi{-}Lin Gu and
Peng Zhang and
Yi Ru and
Hao Song and
Wen{-}Sheng Zhao and
Wen{-}Yan Yin},
title = {A comparative study on electrothermal characteristics of nanoscale
multiple gate MOSFETs},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {362--369},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.003},
doi = {10.1016/J.MICROREL.2017.09.003},
timestamp = {Thu, 01 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GuZRSZY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuoZCL17,
author = {Wei Guo and
Zheming Zhou and
Cheng Chen and
Xiang Li},
title = {Multi-frequency weak signal detection based on multi-segment cascaded
stochastic resonance for rolling bearings},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {239--252},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.018},
doi = {10.1016/J.MICROREL.2017.03.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuoZCL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuoZS17,
author = {Qinhan Guo and
Zhenjiang Zhao and
Chunlong Shen},
title = {Comparison study on microstructure and mechanical properties of Sn-10Bi
and Sn-Ag-Cu solder alloys and joints},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {72--79},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.004},
doi = {10.1016/J.MICROREL.2017.08.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuoZS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Hairoud-Airieau17,
author = {S. Hairoud{-}Airieau and
Genevi{\`{e}}ve Duchamp and
Tristan Dubois and
Jean{-}Yves Del{\'{e}}tage and
Andr{\'{e}} Durier and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Effects of ageing on the conducted immunity of a voltage reference:
Experimental study and modelling approach},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {674--679},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.030},
doi = {10.1016/J.MICROREL.2017.07.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Hairoud-Airieau17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HammadI17,
author = {Ahmed E. Hammad and
A. A. Ibrahiem},
title = {Enhancing the microstructure and tensile creep resistance of Sn-3.0Ag-0.5Cu
solder alloy by reinforcing nano-sized ZnO particles},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {187--194},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.034},
doi = {10.1016/J.MICROREL.2017.07.034},
timestamp = {Tue, 17 Sep 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HammadI17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanK17,
author = {Dong{-}Woon Han and
Ho{-}Kyung Kim},
title = {Effect of normal forces on fretting corrosion of tin-coated electrical
contacts},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {321--327},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.048},
doi = {10.1016/J.MICROREL.2017.07.048},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HanK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanLKPLYHLJJ17,
author = {Seung Uk Han and
Youngyoun Lee and
Yongdoo Kim and
Jemin Park and
Junhee Lim and
Satoru Yamada and
Hyeongsun Hong and
Kyupil Lee and
Gyoyoung Jin and
Eunseung Jung},
title = {The improvement of {HEIP} immunity using {STI} engineering at {DRAM}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {164--167},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.039},
doi = {10.1016/J.MICROREL.2017.07.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HanLKPLYHLJJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HantosHR17,
author = {Guszt{\'{a}}v Hantos and
Jozsef Hegedus and
M{\'{a}}rta Rencz},
title = {An efficient reliability testing method combined with thermal performance
monitoring},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {126--130},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.011},
doi = {10.1016/J.MICROREL.2017.08.011},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HantosHR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaoHLWKZ17,
author = {Minru Hao and
Huiyong Hu and
Chen{-}Guang Liao and
Bin Wang and
Haiyan Kang and
He{-}Ming Zhang},
title = {Influence of {\(\gamma\)}-ray total dose radiation effect on the hot
carrier gate current of the uniaxial strained Si nano-scale {NMOSFET}},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {69--76},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.018},
doi = {10.1016/J.MICROREL.2017.06.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaoHLWKZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaslindaAAJSA17,
author = {M. S. Haslinda and
Aizat Abas and
F. Che Ani and
A. Jalar and
Abdullah Aziz Saad and
Mohd Zulkifly Abdullah},
title = {Discrete phase method particle simulation of ultra-fine package assembly
with SAC305-TiO\({}_{\mbox{2}}\) nano-reinforced lead free solder
at different weighted percentages},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {336--351},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.054},
doi = {10.1016/J.MICROREL.2017.07.054},
timestamp = {Fri, 25 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaslindaAAJSA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HassanR17,
author = {Mohammad Khaled Hassan and
Kaushik Roy},
title = {Investigation of dependence between time-zero and time-dependent variability
in high-{\(\kappa\)} {NMOS} transistors},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {22--31},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.009},
doi = {10.1016/J.MICROREL.2017.01.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HassanR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeCPQ17,
author = {Qingchuan He and
Wenhua Chen and
Jun Pan and
Ping Qian},
title = {A prognostic method for predicting failure of dc/dc converter},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {27--33},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.014},
doi = {10.1016/J.MICROREL.2017.05.014},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeCPQ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HegedusHP17,
author = {Jozsef Hegedus and
Guszt{\'{a}}v Hantos and
Andr{\'{a}}s Poppe},
title = {Light output stabilisation of {LED} based streetlighting luminaires
by adaptive current control},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {448--456},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.060},
doi = {10.1016/J.MICROREL.2017.06.060},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HegedusHP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeiderhoffHDR17,
author = {Ralf Heiderhoff and
T. Haeger and
K. Dawada and
Thomas Riedl},
title = {From diffusive in-plane to ballistic out-of-plane heat transport in
thin non-crystalline films},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {222--226},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.064},
doi = {10.1016/J.MICROREL.2017.06.064},
timestamp = {Mon, 23 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HeiderhoffHDR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeilmannNZMPW17,
author = {Jens Heilmann and
Ivan Nikitin and
Uwe Zschenderlein and
Daniel May and
Klaus Pressel and
Bernhard Wunderle},
title = {Reliability experiments of sintered silver based interconnections
by accelerated isothermal bending tests},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {136--146},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.016},
doi = {10.1016/J.MICROREL.2017.04.016},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HeilmannNZMPW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HelmutWG17,
author = {Dennis Helmut and
Gerhard K. M. Wachutka and
Gerhard Groos},
title = {Transient analysis of latent damage formation in {SMD} capacitors
by Transmission Line Pulsing {(TLP)}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {97--101},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.076},
doi = {10.1016/J.MICROREL.2017.06.076},
timestamp = {Sun, 16 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HelmutWG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HernandezPGTME17,
author = {Isa{\'{\i}} Hern{\'{a}}ndez and
C{\'{e}}sar Adri{\'{a}}n Pons{-}Flores and
Ivan Gardu{\~{n}}o and
Julio C. Tinoco and
Israel Mejia and
Magali Estrada},
title = {Characterization of {MIS} structures and thin film transistors using
RF-sputtered HfO\({}_{\mbox{2}}\)/HIZO layers},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {9--13},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.003},
doi = {10.1016/J.MICROREL.2017.06.003},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HernandezPGTME17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HigashiTKSNTMMO17,
author = {Yusuke Higashi and
Riichiro Takaishi and
Koichi Kato and
Masamichi Suzuki and
Yasushi Nakasaki and
Mitsuhiro Tomita and
Yuichiro Mitani and
Masuaki Matsumoto and
Shohei Ogura and
Katsuyuki Fukutani and
Kikuo Yamabe},
title = {Mechanism of gate dielectric degradation by hydrogen migration from
the cathode interface},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {12--21},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.011},
doi = {10.1016/J.MICROREL.2017.01.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HigashiTKSNTMMO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HirlerBALSLAH17,
author = {Alexander Hirler and
Josef Biba and
Adnan Alsioufy and
T. Lehndorff and
Torsten Sulima and
H. Lochner and
U. Abelein and
Walter Hansch},
title = {Evaluation of effective stress times and stress levels from mission
profiles for semiconductor reliability},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {38--41},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.022},
doi = {10.1016/J.MICROREL.2017.06.022},
timestamp = {Sun, 28 Jul 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HirlerBALSLAH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HlaliHMKS17,
author = {Slah Hlali and
Neila Hizem and
Liviu Militaru and
A. Kalboussi and
Abdelkader Souifi},
title = {Effect of interface traps for ultra-thin high-k gate dielectric based
{MIS} devices on the capacitance-voltage characteristics},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {154--161},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.056},
doi = {10.1016/J.MICROREL.2017.06.056},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HlaliHMKS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HommelKASK17,
author = {S{\"{o}}ren Hommel and
Nicole Killat and
A. Altes and
Thomas Schweinb{\"{o}}ck and
Franz Kreupl},
title = {Determination of doping type by calibrated capacitance scanning microwave
microscopy},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {218--221},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.050},
doi = {10.1016/J.MICROREL.2017.06.050},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HommelKASK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuaH17,
author = {L. Hua and
H. N. Hou},
title = {Electrochemical corrosion and electrochemical migration of 64Sn-35Bi-1Ag
solder doping with xGe on printed circuit boards},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {27--36},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.005},
doi = {10.1016/J.MICROREL.2017.06.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuaH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangSWY17,
author = {Huizhen Huang and
Gewang Shuai and
Xiuqin Wei and
Chuanqiang Yin},
title = {Effects of sulfur addition on the wettability and corrosion resistance
of Sn-0.7Cu lead-free solder},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {15--21},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.010},
doi = {10.1016/J.MICROREL.2017.05.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangSWY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangT17,
author = {Hualiang Huang and
Jing Tian},
title = {Effects of electric field and bias voltage on corrosion behavior of
tin under a thin electrolyte layer},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {131--142},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.013},
doi = {10.1016/J.MICROREL.2017.08.013},
timestamp = {Tue, 20 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuangT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangZCLHJCXL17,
author = {Su{-}Dan Huang and
Lin Zhou and
Guang{-}Zhong Cao and
Huai{-}Yuan Liu and
Yi{-}Min Hu and
Gang Jing and
Ming{-}Gao Cao and
Wen{-}Peng Xiao and
Yan Liu},
title = {A novel multiple-stress-based predictive model of LEDs for rapid lifetime
estimation},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {46--52},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.094},
doi = {10.1016/J.MICROREL.2017.07.094},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangZCLHJCXL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuardMCB17,
author = {Vincent Huard and
Souhir Mhira and
Florian Cacho and
Alain Bravaix},
title = {Enabling robust automotive electronic components in advanced {CMOS}
nodes},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {13--24},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.064},
doi = {10.1016/J.MICROREL.2017.07.064},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuardMCB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ikuno17,
author = {Hajime Ikuno},
title = {A newly developed rapid uniform thermal cycle test system for electronic
components},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {53--64},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.090},
doi = {10.1016/J.MICROREL.2017.07.090},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ikuno17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IonitaNI17,
author = {Claudiu Ionita and
Muhammad Nawaz and
Kalle Ilves},
title = {On the short-circuit and avalanche ruggedness reliability assessment
of SiC {MOSFET} modules},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {6--16},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.004},
doi = {10.1016/J.MICROREL.2017.02.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IonitaNI17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IshizakiMKHUY17,
author = {Toshitaka Ishizaki and
D. Miura and
A. Kuno and
K. Hasegawa and
Masanori Usui and
Y. Yamada},
title = {Young's modulus of a sintered Cu joint and its influence on thermal
stress},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {405--408},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.015},
doi = {10.1016/J.MICROREL.2017.06.015},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IshizakiMKHUY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobF17,
author = {Peter Jacob and
Roman Furrer},
title = {A very unusual transistor failure, caused by a solenoid},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {102--105},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.058},
doi = {10.1016/J.MICROREL.2017.06.058},
timestamp = {Tue, 26 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JacobF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobT17,
author = {Peter Jacob and
Uwe Thiemann},
title = {New {ESD} challenges in {RFID} manufacturing},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {395--399},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.048},
doi = {10.1016/J.MICROREL.2017.06.048},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JacobT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobsWSGCWB17,
author = {Kristof J. P. Jacobs and
T. Wang and
Michele Stucchi and
Mario Gonzalez and
Kris Croes and
Ingrid De Wolf and
Eric Beyne},
title = {Lock-in thermal laser stimulation for non-destructive failure localization
in 3-D devices},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {188--193},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.034},
doi = {10.1016/J.MICROREL.2017.06.034},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JacobsWSGCWB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Janeczek17,
author = {Kamil Janeczek},
title = {Reliability analysis of {UHF} {RFID} tags under long-term mechanical
cycling},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {96--101},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.024},
doi = {10.1016/J.MICROREL.2017.06.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Janeczek17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangMSSK17,
author = {Min{-}Seok Jang and
Sung Woo Ma and
Jongsoo Song and
Myungmo Sung and
Young{-}Ho Kim},
title = {Adhesion of {NCF} to oxidized Si wafers after oxygen plasma treatment},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {220--226},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.001},
doi = {10.1016/J.MICROREL.2017.09.001},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JangMSSK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JaniP17,
author = {L{\'{a}}z{\'{a}}r Jani and
Andr{\'{a}}s Poppe},
title = {Framework for thermal-aware verification of digital and mixed signal
systems},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {499--508},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.023},
doi = {10.1016/J.MICROREL.2017.03.023},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JaniP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JanickiTSRSZN17,
author = {Marcin Janicki and
Tomasz Torzewicz and
Agnieszka Samson and
Tomasz Raszkowski and
Artur Sobczak and
Mariusz Zubert and
Andrzej Napieralski},
title = {Experimental investigation of discrete air cooled device thermal resistance
dependence on cooling conditions},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {405--409},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.008},
doi = {10.1016/J.MICROREL.2017.05.008},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JanickiTSRSZN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JannounAPPH17,
author = {Mayssam Jannoun and
Younes Aoues and
Emmanuel Pagnacco and
Philippe Pougnet and
Abdelkhalak El Hami},
title = {Probabilistic fatigue damage estimation of embedded electronic solder
joints under random vibration},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {249--257},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.005},
doi = {10.1016/J.MICROREL.2017.08.005},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JannounAPPH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongKO17,
author = {J.{-}H. Jeong and
J.{-}H. Kim and
Chung{-}Seog Oh},
title = {Quantitative evaluation of bending reliability for a flexible near-field
communication tag},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {121--126},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.030},
doi = {10.1016/J.MICROREL.2017.06.030},
timestamp = {Wed, 10 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JeongKO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongLLC17,
author = {Jae{-}Seong Jeong and
Won{-}kyoung Lee and
Chung{-}kuk Lee and
Joongho Choi},
title = {Lifetime and failure analysis of perovskite-based ceramic {NTC} thermistors
by thermal cycling and abrasion combined stress},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {112--116},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.080},
doi = {10.1016/J.MICROREL.2017.07.080},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongLLC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiaoJHLX17,
author = {Xiaoxuan Jiao and
Bo Jing and
Yifeng Huang and
Juan Li and
Guangyue Xu},
title = {Research on fault diagnosis of airborne fuel pump based on {EMD} and
probabilistic neural networks},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {296--308},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.007},
doi = {10.1016/J.MICROREL.2017.03.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiaoJHLX17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JongSS17,
author = {Maurits J. de Jong and
Cora Salm and
Jurriaan Schmitz},
title = {Observations on the recovery of hot carrier degradation of hydrogen/deuterium
passivated nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {136--140},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.038},
doi = {10.1016/J.MICROREL.2017.07.038},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JongSS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JunghaenelS17,
author = {M. Junghaenel and
Uwe Scheuermann},
title = {Impact of load pulse duration on power cycling lifetime of chip interconnection
solder joints},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {480--484},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.081},
doi = {10.1016/J.MICROREL.2017.06.081},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JunghaenelS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KabaarBDEGG17,
author = {A. Ben Kabaar and
Cyril Buttay and
O. Dezellus and
R. Estevez and
Anthony Gravouil and
Laurent Gremillard},
title = {Characterization of materials and their interfaces in a direct bonded
copper substrate for power electronics applications},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {288--296},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.001},
doi = {10.1016/J.MICROREL.2017.06.001},
timestamp = {Wed, 19 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KabaarBDEGG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KakarlaNMZKG17,
author = {Bhagyalakshmi Kakarla and
Selamnesh Nida and
Johanna Mueting and
Thomas Ziemann and
Ivana Kovacevic{-}Badstuebner and
Ulrike Grossner},
title = {Trade-off analysis of the p-base doping on ruggedness of SiC MOSFETs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {267--271},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.016},
doi = {10.1016/J.MICROREL.2017.07.016},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KakarlaNMZKG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaluzaWMHC17,
author = {Marcin Kaluza and
Boguslaw Wiecek and
Gilbert De Mey and
Alkis A. Hatzopoulos and
Vasilis Chatziathanasiou},
title = {Thermal impedance measurement of integrated inductors on bulk silicon
substrate},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {54--59},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.005},
doi = {10.1016/J.MICROREL.2017.04.005},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaluzaWMHC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KangWHCWWF17,
author = {Xue Kang and
Yiping Wang and
Qunwu Huang and
Yong Cui and
Chen Wang and
Chen Wen and
Jiangyang Fan},
title = {Phase-change immersion cooling high power light emitting diodes and
heat transfer improvement},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {257--264},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.033},
doi = {10.1016/J.MICROREL.2017.05.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KangWHCWWF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kerber17,
author = {Andreas Kerber},
title = {Assessment of sense measurement duration on {BTI} degradation in {MG/HK}
{CMOS} technologies using a novel stacked transistor test structure},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {153--157},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.003},
doi = {10.1016/J.MICROREL.2017.05.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kerber17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhaledKBKANW17,
author = {Ahmad Khaled and
Luka Kljucar and
Sebastian Brand and
Michael K{\"{o}}gel and
Robert Aertgeerts and
Ruben Nicasy and
Ingrid De Wolf},
title = {Study of GHz-SAM sensitivity to delamination in {BEOL} layers},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {238--242},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.075},
doi = {10.1016/J.MICROREL.2017.06.075},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhaledKBKANW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhanLBBL17,
author = {Saqib A. Khan and
Chul Seung Lim and
GeunYong Bak and
Sanghyeon Baeg and
Soonyoung Lee},
title = {An alternative approach to measure alpha-particle-induced {SEU} cross-section
for flip-chip packaged {SRAM} devices: High energy alpha backside
irradiation},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {100--108},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.004},
doi = {10.1016/J.MICROREL.2016.12.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KhanLBBL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Khoshvaght-Aliabadi17,
author = {Morteza Khoshvaght{-}Aliabadi and
Seyedmasoud Hassani and
Seyed Hossein Mazloumi},
title = {Comparison of hydrothermal performance between plate fins and plate-pin
fins subject to nanofluid-cooled corrugated miniature heat sinks},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {84--96},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.005},
doi = {10.1016/J.MICROREL.2017.01.005},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Khoshvaght-Aliabadi17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Khoshvaght-Aliabadi17a,
author = {Morteza Khoshvaght{-}Aliabadi and
Seyedmasoud Hassani and
Seyed Hossein Mazloumi and
M. Nekoei},
title = {Effects of nooks configuration on hydrothermal performance of zigzag
channels for nanofluid-cooled microelectronic heat sink},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {153--165},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.024},
doi = {10.1016/J.MICROREL.2017.10.024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Khoshvaght-Aliabadi17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimK17,
author = {Min{-}Jung Kim and
Ho{-}Kyung Kim},
title = {Effects of temperature and span amplitude on fretting corrosion behavior
of tin-plated electrical contacts},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {80--87},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.014},
doi = {10.1016/J.MICROREL.2016.12.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKCP17,
author = {Sang Min Kim and
Min{-}Soo Kang and
Won{-}Ju Cho and
Jong Tae Park},
title = {Negative bias illumination stress instability in amorphous InGaZnO
thin film transistors with {ITO} local conducting buried layer},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {327--332},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.020},
doi = {10.1016/J.MICROREL.2017.06.020},
timestamp = {Thu, 21 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimKCP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimLKK17,
author = {Cheolgyu Kim and
Tae{-}Ik Lee and
Min Sung Kim and
Taek{-}Soo Kim},
title = {Mechanism of warpage orientation rotation due to viscoelastic polymer
substrates during thermal processing},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {136--145},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.021},
doi = {10.1016/J.MICROREL.2017.04.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimLKK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimM17,
author = {Dae{-}Hyun Kim and
Linda Milor},
title = {Analysis of errors in estimating wearout characteristics of time-dependent
dielectric breakdown using system-level accelerated life test},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {47--52},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.039},
doi = {10.1016/J.MICROREL.2017.06.039},
timestamp = {Thu, 06 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimN17,
author = {Min{-}Su Kim and
Hiroshi Nishikawa},
title = {Influence of {ENIG} defects on shear strength of pressureless Ag nanoparticle
sintered joint under isothermal aging},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {420--425},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.083},
doi = {10.1016/J.MICROREL.2017.06.083},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimSCP17,
author = {Hyun Jong Kim and
Byung Sang Song and
Won{-}Ju Cho and
Jong Tae Park},
title = {Reliability of amorphous InGaZnO TFTs with {ITO} local conducting
buried layer for {BEOL} power transistors},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {333--337},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.023},
doi = {10.1016/J.MICROREL.2017.06.023},
timestamp = {Thu, 21 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimSCP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KljucarGCWMMNVB17,
author = {Luka Kljucar and
Mario Gonzalez and
Kristof Croes and
Ingrid De Wolf and
Joke De Messemaeker and
Gayle Murdoch and
Philip Nolmans and
Joeri De Vos and
J{\"{u}}rgen B{\"{o}}mmels and
Eric Beyne and
Zsolt T{\"{o}}kei},
title = {Impact of via density and passivation thickness on the mechanical
integrity of advanced Back-End-Of-Line interconnects},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {297--305},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.017},
doi = {10.1016/J.MICROREL.2017.07.017},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KljucarGCWMMNVB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KocaayRCCSW17,
author = {Deniz Kocaay and
Philippe Roussel and
Kris Croes and
Ivan Ciofi and
Yves Saad and
Ingrid De Wolf},
title = {{LER} and spacing variability on {BEOL} {TDDB} using E-field mapping:
Impact of field acceleration},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {131--135},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.053},
doi = {10.1016/J.MICROREL.2017.06.053},
timestamp = {Thu, 05 Dec 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KocaayRCCSW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KolkovskySW17,
author = {Vladimir Kolkovsky and
Ronald St{\"{u}}bner and
J{\"{o}}rg Weber},
title = {Carbon-related defects in microelectronics},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {145--148},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.066},
doi = {10.1016/J.MICROREL.2017.06.066},
timestamp = {Fri, 09 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KolkovskySW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KotasK17,
author = {A. Betzwar Kotas and
Golta Khatibi},
title = {Isothermal bending fatigue response of solder joints in high power
semiconductor test structures},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {357--361},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.095},
doi = {10.1016/J.MICROREL.2017.06.095},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KotasK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoutsoureliSBKP17,
author = {Matroni Koutsoureli and
George Stavrinidis and
Dimitrios Birmpiliotis and
George Konstantinidis and
George J. Papaioannou},
title = {Electrical properties of SiN\({}_{\mbox{x}}\) films with embedded
CNTs for {MEMS} capacitive switches},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {614--618},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.041},
doi = {10.1016/J.MICROREL.2017.07.041},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KoutsoureliSBKP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoutsoureliSP17,
author = {Matroni Koutsoureli and
N. Siannas and
George J. Papaioannou},
title = {Temperature accelerated discharging processes through the bulk of
{PECVD} silicon nitride films for {MEMS} capacitive switches},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {631--634},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.018},
doi = {10.1016/J.MICROREL.2017.07.018},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KoutsoureliSP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrammerIBD17,
author = {Oliv{\'{e}}r Krammer and
Bal{\'{a}}zs Ill{\'{e}}s and
R{\'{e}}ka B{\'{a}}torfi and
Karel Dusek},
title = {Automatic characterisation method for statistical evaluation of tin
whisker growth},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {14--21},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.007},
doi = {10.1016/J.MICROREL.2017.04.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KrammerIBD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrempS17,
author = {S. Kremp and
O. Schilling},
title = {Realistic climatic profiles and their effect on condensation in encapsulated
test structures representing power modules},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {409--414},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.029},
doi = {10.1016/J.MICROREL.2017.07.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KrempS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuczynskaSBMKBW17,
author = {Marta Kuczynska and
Natalja Schafet and
Ulrich Becker and
B. M{\'{e}}tais and
Alexander Kabakchiev and
P. Buhl and
Stefan Weihe},
title = {The role of stress state and stress triaxiality in lifetime prediction
of solder joints in different packages utilized in automotive electronics},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {155--164},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.013},
doi = {10.1016/J.MICROREL.2017.04.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KuczynskaSBMKBW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumarDRK17,
author = {K. R. Suresh Kumar and
Dinesh Rajan and
A. Ameelia Roseline and
S. Kalaiselvam},
title = {Performance analysis of heat pipe aided {NEPCM} heat sink for transient
electronic cooling},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {1--13},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.006},
doi = {10.1016/J.MICROREL.2017.04.006},
timestamp = {Tue, 10 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KumarDRK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KungH17,
author = {Huang{-}Kuang Kung and
Chi{-}Lung Hsieh},
title = {A theoretical study to improve wire sag of ultra-long wire bond loops
for 3D/MCM packaging},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {272--279},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.013},
doi = {10.1016/J.MICROREL.2017.09.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KungH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LabatMFB17,
author = {Nathalie Labat and
Fran{\c{c}}ois Marc and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Marise Bafleur},
title = {Proceedings of the 28th European Symposium on the reliability of electron
devices, failure physics and analysis},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {1--5},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.002},
doi = {10.1016/J.MICROREL.2017.08.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LabatMFB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiKYC17,
author = {Zhongmin Lai and
Xinda Kong and
Qingrong You and
Xiubin Cao},
title = {Microstructure and mechanical properties of Co/Sn-10Bi couple and
Co/Sn-10Bi/Co joint},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {69--76},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.008},
doi = {10.1016/J.MICROREL.2016.11.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiKYC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LajmiCLBBHF17,
author = {R. Lajmi and
Florian Cacho and
Estelle Lauga{-}Larroze and
Sylvain Bourdel and
Ph. Benech and
Vincent Huard and
X. Federspiel},
title = {Characterization of Low Drop-Out during ageing and design for yield},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {92--96},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.047},
doi = {10.1016/J.MICROREL.2017.07.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LajmiCLBBHF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LampioK17,
author = {Kaj Lampio and
Reijo Karvinen},
title = {Optimization of convectively cooled heat sinks},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {473--479},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.011},
doi = {10.1016/J.MICROREL.2017.06.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LampioK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaorARCM17,
author = {Ari Laor and
Depayne Athia and
Alireza Rezvani and
Horst Clauberg and
Michael Mayer},
title = {Monitoring of thermo-mechanical stress via {CMOS} sensor array: Effects
of warpage and tilt in flip chip thermo-compression bonding},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {60--68},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.001},
doi = {10.1016/J.MICROREL.2017.03.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaorARCM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LassnigLKPRN17,
author = {Alice Lassnig and
Martin Lederer and
Golta Khatibi and
Rainer Pelzer and
W. Robl and
Michael Nelhiebel},
title = {High cycle fatigue testing of thermosonic ball bonds},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {91--98},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.019},
doi = {10.1016/J.MICROREL.2017.02.019},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LassnigLKPRN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeBHW17,
author = {Hosung Lee and
Sanghyeon Baeg and
Nelson Hua and
Shi{-}Jie Wen},
title = {Temporal and frequency characteristic analysis of margin-related failures
caused by an intermittent nano-scale fracture of the solder ball in
a {BGA} package device},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {88--99},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.010},
doi = {10.1016/J.MICROREL.2016.12.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeBHW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeKBLYKY17,
author = {Byung{-}Suk Lee and
Yong{-}Ho Ko and
Jung{-}Hwan Bang and
Chang{-}Woo Lee and
Sehoon Yoo and
Jun{-}Ki Kim and
Jeong{-}Won Yoon},
title = {Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/Ni/Cu
and Au-20Sn/Ni/Cu solder joints for power electronics applications},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {119--125},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.011},
doi = {10.1016/J.MICROREL.2017.03.011},
timestamp = {Thu, 01 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeKBLYKY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeW17,
author = {Meng Chuan Lee and
Hin Yong Wong},
title = {Investigation on X-ray irradiation on nanoscale nitride based charge
trapping flash memory devices},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {59--68},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.015},
doi = {10.1016/J.MICROREL.2017.10.015},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeY17,
author = {Sang Myung Lee and
Ilgu Yun},
title = {Effect of selectively passivated layer on foldable low temperature
polycrystalline silicon thin film transistor characteristics under
dynamic mechanical stress},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {606--609},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.092},
doi = {10.1016/J.MICROREL.2017.07.092},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LefebvreMR17,
author = {Charles{-}Alexis Lefebvre and
Jose Luis Montero and
Leire Rubio},
title = {Implementation of a fast relative digital temperature sensor to achieve
thermal protection in Zynq SoC technology},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {433--439},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.029},
doi = {10.1016/J.MICROREL.2017.05.029},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LefebvreMR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeslieDM17,
author = {David Leslie and
Abhijit Dasgupta and
Carlos Morillo},
title = {Viscoplastic properties of pressure-less sintered silver materials
using indentation},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {121--130},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.009},
doi = {10.1016/J.MICROREL.2017.04.009},
timestamp = {Sun, 10 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeslieDM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiCCHLGCWHCY17,
author = {Yan{-}Lin Li and
Kuei{-}Shu Chang{-}Liao and
Yu{-}Wei Chang and
Tse{-}Jung Huang and
Chen{-}Chien Li and
Zhao{-}Chen Gu and
Po{-}Yen Chen and
Tzung{-}Yu Wu and
Jiayi Huang and
Fu{-}Chuan Chu and
Shih{-}Han Yi},
title = {Improved reliability characteristics of Ge {MOS} devices by capping
Hf or Zr on interfacial layer},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {136--139},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.018},
doi = {10.1016/J.MICROREL.2017.10.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiCCHLGCWHCY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLKX17,
author = {Xiaoyang Li and
Yue Liu and
Rui Kang and
Lianghua Xiao},
title = {Service reliability modeling and evaluation of active-active cloud
data center based on the {IT} infrastructure},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {271--282},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.009},
doi = {10.1016/J.MICROREL.2017.03.009},
timestamp = {Fri, 30 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiLKX17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiRWJ17,
author = {Ling{-}Ling Li and
Yu{-}Han Ren and
Ching{-}Hsin Wang and
Ching{-}Tsung Jen},
title = {A new method to estimate the state of charge of the green battery},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {306--313},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.031},
doi = {10.1016/J.MICROREL.2017.07.031},
timestamp = {Thu, 19 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiRWJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiSWPL17,
author = {Ting Li and
Yu Su and
Lanhui Wu and
Boan Pan and
Yan Li},
title = {Reliability analysis of a newly developed detector for monitoring
spine health},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {411--414},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.026},
doi = {10.1016/J.MICROREL.2017.05.026},
timestamp = {Thu, 22 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiSWPL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiWGKLZZHL17,
author = {B. Li and
Jianfei Wu and
J. Gao and
Y. Kuang and
Jiancheng Li and
X. Zhao and
K. Zhao and
Z. Han and
J. Luo},
title = {The total ionizing dose response of a {DSOI} 4Kb {SRAM}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {714--718},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.068},
doi = {10.1016/J.MICROREL.2017.07.068},
timestamp = {Tue, 26 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiWGKLZZHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiangKMZZ17,
author = {Shuibao Liang and
Changbo Ke and
Wenjing Ma and
Minbo Zhou and
Xinping Zhang},
title = {Numerical simulations of migration and coalescence behavior of microvoids
driven by diffusion and electric field in solder interconnects},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {71--81},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.018},
doi = {10.1016/J.MICROREL.2017.02.018},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiangKMZZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoGMJGSWF17,
author = {Zhiheng Liao and
Chunsheng Guo and
Ju Meng and
Boyang Jiang and
Li Gao and
Ya Su and
Ruomin Wang and
Shiwei Feng},
title = {Thermal evaluation of GaN-based HEMTs with various layer sizes and
structural parameters using finite-element thermal simulation},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {52--57},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.012},
doi = {10.1016/J.MICROREL.2017.05.012},
timestamp = {Wed, 15 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoGMJGSWF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimAAA17,
author = {Chong Hooi Lim and
Mohd Zulkifly Abdullah and
Ishak Abdul Azid and
M. S. Abdul Aziz},
title = {Experimental and numerical investigation of flow and thermal effects
on flexible printed circuit board},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {5--17},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.022},
doi = {10.1016/J.MICROREL.2017.03.022},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LimAAA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinCHYK17,
author = {Chan{-}Ching Lin and
Kuei{-}Shu Chang{-}Liao and
Tzung{-}Bin Huang and
Cheng{-}Jung Yu and
Hsueh{-}Chao Ko},
title = {A new erase method for scaled {NAND} flash memory device},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {34--38},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.031},
doi = {10.1016/J.MICROREL.2017.03.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinCHYK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinLK17,
author = {Chun{-}Yu Lin and
Rui{-}Hong Liu and
Ming{-}Dou Ker},
title = {Design of 2.4-GHz {T/R} switch with embedded {ESD} protection devices
in {CMOS} process},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {258--266},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.005},
doi = {10.1016/J.MICROREL.2017.09.005},
timestamp = {Wed, 04 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LinLK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LisianskyRRMYS17,
author = {M. Lisiansky and
Y. Raskin and
Y. Roizin and
B. Meyler and
S. Yofis and
Y. Shneider},
title = {Peculiarities of hole trapping in Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)-SiO\({}_{\mbox{2}}\)
gate dielectric stack},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {265--269},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.035},
doi = {10.1016/J.MICROREL.2017.05.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LisianskyRRMYS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuCLPZ17,
author = {Xin{-}long Liu and
Zhenbing Cai and
Shan{-}bang Liu and
Jin{-}fang Peng and
Minhao Zhu},
title = {Effect of roughness on electrical contact performance of electronic
components},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {100--109},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.024},
doi = {10.1016/J.MICROREL.2017.05.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuCLPZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLLHLRSL17,
author = {Fan Liu and
Zhiwei Liu and
Jizhi Liu and
Cheng Hui and
Zhao Liu and
Tian Rui and
Shiyu Song and
Juin J. Liou},
title = {A novel vertical {SCR} for {ESD} protection in 40 {V} {HV} bipolar
process},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {307--310},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.018},
doi = {10.1016/J.MICROREL.2017.09.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuLLHLRSL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLRLLH17,
author = {Jizhi Liu and
Qian Lingli and
Tian Rui and
Zhiwei Liu and
Zhao Liu and
Cheng Hui},
title = {Self-triggered stacked silicon-controlled rectifier structure {(STSSCR)}
for on-chip electrostatic discharge {(ESD)} protection},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {1--5},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.014},
doi = {10.1016/J.MICROREL.2016.11.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuLRLLH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLZLC17,
author = {L. Liu and
S. Li and
Y. M. Zhou and
L. Y. Liu and
Xian An Cao},
title = {High-current stressing of organic light-emitting diodes with different
electron-transport materials},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {106--110},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.002},
doi = {10.1016/J.MICROREL.2017.03.002},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuLZLC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuRSMX17,
author = {Shanshan Liu and
Pedro Reviriego and
Alfonso S{\'{a}}nchez{-}Maci{\'{a}}n and
Juan Antonio Maestro and
Liyi Xiao},
title = {Comments on "Extend orthogonal Latin square codes for 32-bit data
protection in memory applications" Microelectron. Reliab. 63 278-283
{(2016)}},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {126--129},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.009},
doi = {10.1016/J.MICROREL.2016.12.009},
timestamp = {Wed, 10 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuRSMX17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuRXM17,
author = {Shanshan Liu and
Pedro Reviriego and
Liyi Xiao and
Juan Antonio Maestro},
title = {A method to recover critical bits under a double error in {SEC-DED}
protected memories},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {92--96},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.020},
doi = {10.1016/J.MICROREL.2017.04.020},
timestamp = {Wed, 10 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuRXM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuSFYHL17,
author = {Fan Liu and
Lei Su and
Mengying Fan and
Jian Yin and
Zhenzhi He and
Xiangning Lu},
title = {Using scanning acoustic microscopy and {LM-BP} algorithm for defect
inspection of micro solder bumps},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {166--174},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.029},
doi = {10.1016/J.MICROREL.2017.10.029},
timestamp = {Mon, 02 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuSFYHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuWLP17,
author = {Liansheng Liu and
Shaojun Wang and
Datong Liu and
Yu Peng},
title = {Quantitative selection of sensor data based on improved permutation
entropy for system remaining useful life prediction},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {264--270},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.008},
doi = {10.1016/J.MICROREL.2017.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuWLP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuZBWE17,
author = {E. Liu and
Thomas Zahner and
Sebastian Besold and
Bernhard Wunderle and
Gordon Elger},
title = {Location resolved transient thermal analysis to investigate crack
growth in solder joints},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {533--546},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.014},
doi = {10.1016/J.MICROREL.2017.06.014},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuZBWE17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuZLZHN17,
author = {Jizhi Liu and
Yaohui Zeng and
Zhiwei Liu and
Jianming Zhao and
Cheng Hui and
Liu Nie},
title = {Low-voltage triggering SCRs for {ESD} protection in a 0.35 {\(\mu\)}m
SiGe BiCMOS process},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {122--128},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.029},
doi = {10.1016/J.MICROREL.2017.04.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuZLZHN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuCHXSD17,
author = {Jia Lu and
Zhennian Cao and
ChuangJun Huang and
Kunhui Xiao and
Alan Street and
YuFeng Dai},
title = {Failure analysis of projected capacitance touch panel liquid crystal
displays - Two case studies},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {571--574},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.028},
doi = {10.1016/J.MICROREL.2017.06.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuCHXSD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuDFFQZ17,
author = {Guangjun Lu and
W. D. van Driel and
Xuejun Fan and
Jiajie Fan and
Cheng Qian and
G. Q. Zhang},
title = {Color shift acceleration on mid-power {LED} packages},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {294--298},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.014},
doi = {10.1016/J.MICROREL.2017.09.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuDFFQZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuLZZCJL17,
author = {Bin Lu and
Hongliang Lu and
Yuming Zhang and
Yimen Zhang and
Xiaoran Cui and
Chengji Jin and
Chen Liu},
title = {Improved analytical model of surface potential with modified boundary
conditions for double gate tunnel FETs},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {231--238},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.013},
doi = {10.1016/J.MICROREL.2017.05.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuLZZCJL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuoBIB17,
author = {Haoze Luo and
Nick Baker and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {Die degradation effect on aging rate in accelerated cycling tests
of SiC power {MOSFET} modules},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {415--419},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.004},
doi = {10.1016/J.MICROREL.2017.07.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuoBIB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuoLHIB17,
author = {Haoze Luo and
Wuhua Li and
Xiangning He and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {Uneven temperature effect evaluation in high-power {IGBT} inverter
legs and relative test platform design},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {123--130},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.054},
doi = {10.1016/J.MICROREL.2017.06.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuoLHIB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LvYB17,
author = {Zhixing Lv and
Nan Yan and
Bingliang Bao},
title = {Pin-pin {ESD} protection for electro-explosive device under severe
human body {ESD}},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {37--42},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.004},
doi = {10.1016/J.MICROREL.2017.06.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LvYB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaXGBBGWWWN17,
author = {Yao Ma and
Pengfei Xu and
Mingyue Guan and
Filippo Boi and
Gao Bo and
Min Gong and
Xue Wu and
Yuxin Wang and
Hua Wang and
ZengQiang Niao},
title = {Analysis of deep level defects in bipolar junction transistors irradiated
by 2 MeV electrons},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {149--152},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.023},
doi = {10.1016/J.MICROREL.2017.10.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaXGBBGWWWN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MadeGSSZNTHTG17,
author = {Riko I. Made and
Yu Gao and
Govindo J. Syaranamual and
Wardhana A. Sasangka and
L. Zhang and
Xuan Sang Nguyen and
Y. Y. Tay and
Jason Scott Herrin and
Carl V. Thompson and
Chee Lip Gan},
title = {Characterisation of defects generated during constant current InGaN-on-silicon
{LED} operation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {561--565},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.072},
doi = {10.1016/J.MICROREL.2017.07.072},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MadeGSSZNTHTG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MagnienMRSHGHDK17,
author = {Julien Magnien and
Lisa Mitterhuber and
J{\"{o}}rdis Rosc and
Franz Schrank and
Stefan H{\"{o}}rth and
Lena Goullon and
Matthias Hutter and
Stefan Defregger and
Elke Kraker},
title = {Reliability and failure analysis of solder joints in flip chip LEDs
via thermal impedance characterisation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {601--605},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.052},
doi = {10.1016/J.MICROREL.2017.07.052},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MagnienMRSHGHDK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MahaneTBTDJ17,
author = {Mouna Mahane and
David Tr{\'{e}}mouilles and
Marise Bafleur and
Benjamin Thon and
Marianne Diatta and
Lionel Jaouen},
title = {New triggering-speed-characterization method for diode-triggered {SCR}
using {TLP}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {692--697},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.063},
doi = {10.1016/J.MICROREL.2017.07.063},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MahaneTBTDJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MajumdarBB17,
author = {Shubhankar Majumdar and
Ankush Bag and
Dhrubes Biswas},
title = {Comparative analysis of parameter extraction techniques for AlGaN/GaN
{HEMT} on silicon/sapphire substrate},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {389--395},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.016},
doi = {10.1016/J.MICROREL.2017.08.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MajumdarBB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MalagonBTGPFMQS17,
author = {Daniel Malag{\'{o}}n and
Sebasti{\`{a}} A. Bota and
Gabriel Torrens and
Xavier Gili and
Javier Praena and
B. Fern{\'{a}}ndez and
Miguel Mac{\'{\i}}as and
Jos{\'{e}} Manuel Quesada and
Carlos Guerrero Sanchez and
Mar{\'{\i}}a del Carmen Jim{\'{e}}nez{-}Ramos and
Javier Garc{\'{\i}}a L{\'{o}}pez and
Jos{\'{e}} Luis Merino and
Jaume Segura},
title = {Soft error rate comparison of 6T and 8T {SRAM} ICs using mono-energetic
proton and neutron irradiation sources},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {38--45},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.093},
doi = {10.1016/J.MICROREL.2017.07.093},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MalagonBTGPFMQS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mazloum-Nejadari17,
author = {Ali Mazloum{-}Nejadari and
Golta Khatibi and
Bernhard Czerny and
Martin Lederer and
Johann Nicolics and
L. Weiss},
title = {Reliability of Cu wire bonds in microelectronic packages},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {147--154},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.014},
doi = {10.1016/J.MICROREL.2017.04.014},
timestamp = {Fri, 25 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mazloum-Nejadari17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MbarekDLF17,
author = {Safa Mbarek and
Pascal Dherb{\'{e}}court and
Olivier Latry and
Fran{\c{c}}ois Fouquet},
title = {Short-circuit robustness test and in depth microstructural analysis
study of SiC {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {527--531},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.002},
doi = {10.1016/J.MICROREL.2017.07.002},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MbarekDLF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MehrTKDZ17,
author = {M. Yazdan Mehr and
M. R. Toroghinejad and
F. Karimzadeh and
W. D. van Driel and
G. Q. Zhang},
title = {Reliability and diffusion-controlled through thickness oxidation of
optical materials in LED-based products},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {143--147},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.014},
doi = {10.1016/J.MICROREL.2017.08.014},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MehrTKDZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MelamedWNSKA17,
author = {Samson Melamed and
Naoya Watanabe and
Shunsuke Nemoto and
Haruo Shimamoto and
Katsuya Kikuchi and
Masahiro Aoyagi},
title = {Thermal impact of extreme die thinning in bump-bonded three-dimensional
integrated circuits},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {380--386},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.030},
doi = {10.1016/J.MICROREL.2017.05.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MelamedWNSKA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeszmerRSZW17,
author = {Peter Meszmer and
Raul D. Rodriguez and
Evgeniya Sheremet and
Dietrich R. T. Zahn and
Bernhard Wunderle},
title = {Stress imaging in structural challenging {MEMS} with high sensitivity
using micro-Raman spectroscopy},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {104--110},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.010},
doi = {10.1016/J.MICROREL.2017.10.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeszmerRSZW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MezzahCK17,
author = {Ibrahim Mezzah and
Hamimi Chemali and
Omar Kermia},
title = {Emulation-based fault analysis on {RFID} tags for robustness and security
evaluation},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {115--125},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.008},
doi = {10.1016/J.MICROREL.2016.12.008},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MezzahCK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiaoL17,
author = {Qiang Miao and
Datong Liu},
title = {Recent progress on electro-mechanical system prognostics and health
management},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {195--196},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.089},
doi = {10.1016/J.MICROREL.2017.07.089},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MiaoL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiaoZLZ17,
author = {Qiang Miao and
Xin Zhang and
Zhiwen Liu and
Heng Zhang},
title = {Condition multi-classification and evaluation of system degradation
process using an improved support vector machine},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {223--232},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.020},
doi = {10.1016/J.MICROREL.2017.03.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MiaoZLZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiddendorfGJLW17,
author = {A. Middendorf and
A. Grams and
S. Janzen and
Klaus{-}Dieter Lang and
Olaf Wittler},
title = {Laser cuts increase the reliability of heavy-wire bonds and enable
on-line process control using thermography},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {450--454},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.033},
doi = {10.1016/J.MICROREL.2017.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MiddendorfGJLW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MitterhuberDHMS17,
author = {Lisa Mitterhuber and
Stefan Defregger and
Ren{\'{e}} Hammer and
Julien Magnien and
Franz Schrank and
Stefan H{\"{o}}rth and
Matthias Hutter and
Elke Kraker},
title = {Validation methodology to analyze the temperature-dependent heat path
of a 4-chip {LED} module using a finite volume simulation},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {462--472},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.024},
doi = {10.1016/J.MICROREL.2017.04.024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MitterhuberDHMS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MizuuchiIA17,
author = {Kiyoshi Mizuuchi and
Kanryu Inoue and
Yasuyuki Agari},
title = {Trend of the development of metal-based heat dissipative materials},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {5--19},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.007},
doi = {10.1016/J.MICROREL.2017.10.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MizuuchiIA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoindjieAMGR17,
author = {Soilihi Moindjie and
Jean{-}Luc Autran and
Daniela Munteanu and
Gilles Gasiot and
Philippe Roche},
title = {Multi-Poisson process analysis of real-time soft-error rate measurements
in bulk 65 nm and 40 nm SRAMs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {53--57},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.045},
doi = {10.1016/J.MICROREL.2017.07.045},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoindjieAMGR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MontiMSMZBP17,
author = {Desiree Monti and
Matteo Meneghini and
Carlo De Santi and
Gaudenzio Meneghesso and
Enrico Zanoni and
Agata Bojarska and
Piotr Perlin},
title = {Long-term degradation of InGaN-based laser diodes: Role of defects},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {584--587},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.043},
doi = {10.1016/J.MICROREL.2017.06.043},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MontiMSMZBP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoultifJML17,
author = {N. Moultif and
Eric Joubert and
M. Masmoudi and
Olivier Latry},
title = {Characterization of {HTRB} stress effects on SiC MOSFETs using photon
emission spectral signatures},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {243--248},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.013},
doi = {10.1016/J.MICROREL.2017.07.013},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MoultifJML17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MukherjeeDCML17,
author = {Kalparupa Mukherjee and
Fr{\'{e}}d{\'{e}}ric Darracq and
Arnaud Curutchet and
Nathalie Malbert and
Nathalie Labat},
title = {{TCAD} simulation capabilities towards gate leakage current analysis
of advanced AlGaN/GaN {HEMT} devices},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {350--356},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.049},
doi = {10.1016/J.MICROREL.2017.07.049},
timestamp = {Fri, 07 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MukherjeeDCML17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MukherjeeJCZBAM17,
author = {C. Mukherjee and
Thomas Jacquet and
Anjan Chakravorty and
Thomas Zimmer and
Josef Boeck and
Klaus Aufinger and
Cristell Maneux},
title = {Random telegraph noise in SiGe HBTs: Reliability analysis close to
{SOA} limit},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {146--152},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.001},
doi = {10.1016/J.MICROREL.2017.05.001},
timestamp = {Wed, 31 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MukherjeeJCZBAM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MunteanuAM17,
author = {Daniela Munteanu and
Jean{-}Luc Autran and
Soilihi Moindjie},
title = {Single-event-transient effects in Junctionless Double-Gate MOSFETs
with Dual-Material Gate investigated by 3D simulation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {719--724},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.040},
doi = {10.1016/J.MICROREL.2017.07.040},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MunteanuAM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NajibASSA17,
author = {A. M. Najib and
Mohd Zulkifly Abdullah and
Abdullah Aziz Saad and
Z. Samsudin and
F. Che Ani},
title = {Numerical simulation of self-alignment of chip resistor components
for different silver content during reflow soldering},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {69--78},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.011},
doi = {10.1016/J.MICROREL.2017.10.011},
timestamp = {Fri, 25 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NajibASSA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NeoQANMTSCML17,
author = {Soh Ping Neo and
Alfred C. T. Quah and
Ghim Boon Ang and
Dayanand Nagalingam and
Hnin Hnin Ma and
Siong Luong Ting and
C. W. Soo and
Changqing Chen and
Zhihong Mai and
Jeffrey Lam},
title = {Failure analysis methodology on donut pattern failure due to photovoltaic
electrochemical effect},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {255--260},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.036},
doi = {10.1016/J.MICROREL.2017.07.036},
timestamp = {Tue, 21 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NeoQANMTSCML17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NgAGAAA17,
author = {Fei Chong Ng and
Aizat Abas and
Z. L. Gan and
Mohd Zulkifly Abdullah and
F. Che Ani and
M. Yusuf Tura Ali},
title = {Discrete phase method study of ball grid array underfill process using
nano-silica filler-reinforced composite-encapsulant with varying filler
loadings},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {45--64},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.034},
doi = {10.1016/J.MICROREL.2017.03.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NgAGAAA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NikolicSNPJD17,
author = {Goran S. Nikolic and
Mile K. Stojcev and
Tatjana R. Nikolic and
Branislav D. Petrovic and
Goran S. Jovanovic and
Bojan Dimitrijevic},
title = {Implementation and evaluation of 2D {SEC-DED} forward error correction
scheme in wireless sensor networks},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {161--180},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.010},
doi = {10.1016/J.MICROREL.2017.08.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NikolicSNPJD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NishikawaYO17,
author = {Naoyuki Nishikawa and
Seira Yamaguchi and
Keisuke Ohdaira},
title = {Direct observation of changes in the effective minority-carrier lifetime
of SiN\({}_{\mbox{x}}\)-passivated n-type crystalline-silicon substrates
caused by potential-induced degradation and recovery tests},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {91--95},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.012},
doi = {10.1016/J.MICROREL.2017.10.012},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NishikawaYO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NiuL17,
author = {Gang Niu and
Hao Li},
title = {{IETM} centered intelligent maintenance system integrating fuzzy semantic
inference and data fusion},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {197--204},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.015},
doi = {10.1016/J.MICROREL.2017.03.015},
timestamp = {Wed, 09 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NiuL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NiuWYWB17,
author = {Hao Niu and
Huai Wang and
X. Ye and
S. Wang and
Frede Blaabjerg},
title = {Converter-level {FEM} simulation for lifetime prediction of an {LED}
driver with improved thermal modelling},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {117--122},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.079},
doi = {10.1016/J.MICROREL.2017.06.079},
timestamp = {Thu, 27 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NiuWYWB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NunesO17,
author = {Rafael O. Nunes and
R. L. de Orio},
title = {Study of the impact of electromigration on integrated circuit performance
and reliability at design level},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {75--80},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.027},
doi = {10.1016/J.MICROREL.2017.06.027},
timestamp = {Tue, 28 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NunesO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OederCP17,
author = {Thorsten Oeder and
Alberto Castellazzi and
Martin Pfost},
title = {Electrical and thermal failure modes of 600 {V} p-gate GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {321--326},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.046},
doi = {10.1016/J.MICROREL.2017.06.046},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OederCP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OhBCLKP17,
author = {Wonwook Oh and
Soo Hyun Bae and
Sung{-}Il Chan and
Hae{-}Seok Lee and
Donghwan Kim and
Nochang Park},
title = {Field degradation prediction of potential induced degradation of the
crystalline silicon photovoltaic modules based on accelerated test
and climatic data},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {596--600},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.079},
doi = {10.1016/J.MICROREL.2017.07.079},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OhBCLKP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ortiz-CondeSZTM17,
author = {Adelmo Ortiz{-}Conde and
Andrea Sucre{-}Gonz{\'{a}}lez and
Fabi{\'{a}}n Z{\'{a}}rate{-}Rinc{\'{o}}n and
Reydezel Torres{-}Torres and
Roberto S. Murphy{-}Arteaga and
Juin J. Liou and
Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez},
title = {A review of {DC} extraction methods for {MOSFET} series resistance
and mobility degradation model parameters},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {1--16},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.016},
doi = {10.1016/J.MICROREL.2016.12.016},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ortiz-CondeSZTM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OssaiXYR17,
author = {Chinedu I. Ossai and
Xuechu Xu and
Qing Yang and
Nagarajan Raghavan},
title = {Uncertainty quantification in nanowire growth modeling - {A} precursor
to quality semiconductor nanomanufacturing},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {106--111},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.085},
doi = {10.1016/J.MICROREL.2017.07.085},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OssaiXYR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OsvaldVCCC17,
author = {Jozef Osvald and
Gabriel Vanko and
L. Chow and
N. C. Chen and
L. B. Chang},
title = {Transition voltage of AlGaN/GaN heterostructure {MSM} varactor with
two-dimensional electron gas},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {243--248},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.004},
doi = {10.1016/J.MICROREL.2017.09.004},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OsvaldVCCC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OtteFK17,
author = {Rik J. Otte and
Rob F. Fonville and
Martin D. Knotter},
title = {Identification of foreign particles in packages of failed products
by application of our modified failure analysis flow},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {426--430},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.065},
doi = {10.1016/J.MICROREL.2017.07.065},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OtteFK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OuakadA17,
author = {Hassen M. Ouakad and
Jihad E. AlQasimi},
title = {Reliability of {MEMS} shallow arches based actuator under the combined
effect of mechanical shock and electric loads},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {352--359},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.017},
doi = {10.1016/J.MICROREL.2017.10.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OuakadA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaknejadM17,
author = {Seyed Amir Paknejad and
Samjid H. Mannan},
title = {Review of silver nanoparticle based die attach materials for high
power/temperature applications},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {1--11},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.010},
doi = {10.1016/J.MICROREL.2017.01.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PaknejadM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PalczynskaPGHMM17,
author = {Alicja Palczynska and
Alexandru Prisacaru and
Przemyslaw Jakub Gromala and
Bongtae Han and
Dirk Mayer and
Tobias Melz},
title = {Towards prognostics and health monitoring: The potential of fault
detection by piezoresistive silicon stress sensor},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {165--172},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.011},
doi = {10.1016/J.MICROREL.2017.04.011},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PalczynskaPGHMM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanCWCYLS17,
author = {Cheng{-}Tang Pan and
Y. C. Chen and
Shao{-}Yu Wang and
Y. T. Cheng and
Chung{-}Kun Yen and
Y. L. Lin and
W. C. Shih},
title = {{TSV} by 355 {UV} laser for 4G component packaging with micro-electroforming},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {331--338},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.023},
doi = {10.1016/J.MICROREL.2017.09.023},
timestamp = {Tue, 18 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PanCWCYLS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanLHLZ17,
author = {Yuanxing Pan and
Fei Li and
Hu He and
Junhui Li and
Wenhui Zhu},
title = {Effects of dimension parameters and defect on {TSV} thermal behavior
for 3D {IC} packaging},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {97--102},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.001},
doi = {10.1016/J.MICROREL.2017.02.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PanLHLZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanLLX17,
author = {Boan Pan and
Ting Li and
Yan Li and
Guoyi Xu},
title = {A reliable integrative autocorrelator device for particle fluctuation
rate monitoring},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {280--284},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.017},
doi = {10.1016/J.MICROREL.2017.09.017},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PanLLX17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkSK17,
author = {Dong Hyun Park and
Sojin Shin and
Yeong K. Kim},
title = {Module packaging effects on {MEMS} airbag sensor performance for automobiles},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {328--335},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.051},
doi = {10.1016/J.MICROREL.2017.07.051},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkSK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkY17,
author = {Chuntaek Park and
Ilgu Yun},
title = {Mechanical stress-induced degradation model of amorphous InGaZnO thin
film transistors by strain-initiated defect generation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {592--595},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.094},
doi = {10.1016/J.MICROREL.2017.06.094},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PayetGRC17,
author = {Pierre Payet and
M. Guery and
J{\'{e}}r{\'{e}}my Raoult and
Laurent Chusseau},
title = {Out-of-band disturbance of mm-wave {EMI} on {RF} front-ends},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {670--673},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.073},
doi = {10.1016/J.MICROREL.2017.07.073},
timestamp = {Thu, 10 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PayetGRC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PazDCBRVFP17,
author = {Bruna Cardoso Paz and
Renan Trevisoli Doria and
Mika{\"{e}}l Cass{\'{e}} and
Sylvain Barraud and
Gilles Reimbold and
Maud Vinet and
Olivier Faynot and
Marcelo Antonio Pavanello},
title = {Harmonic distortion analysis of triple gate {SOI} nanowire {MOSFETS}
down to 100 {K}},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {111--118},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.008},
doi = {10.1016/J.MICROREL.2017.10.008},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PazDCBRVFP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PedersenNCKIPP17,
author = {Kristian Bonderup Pedersen and
Dennis A. Nielsen and
Bernhard Czerny and
Golta Khatibi and
Francesco Iannuzzo and
Vladimir N. Popok and
Kjeld Pedersen},
title = {Wire bond degradation under thermo- and pure mechanical loading},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {373--377},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.055},
doi = {10.1016/J.MICROREL.2017.07.055},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PedersenNCKIPP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PengEZLL17,
author = {Chao Peng and
Yunfei En and
Zhengxuan Zhang and
Yuan Liu and
Zhifeng Lei},
title = {Radiation induced transconductance overshoot in the 130 nm partially-depleted
{SOI} MOSFETs},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {135--141},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.035},
doi = {10.1016/J.MICROREL.2017.06.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PengEZLL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PenzesDMSNLP17,
author = {Maxime Penzes and
S. Dudit and
Frederic Monsieur and
Luca Silvestri and
F. Nallet and
D. Lewis and
P. Perdu},
title = {Simulation of the thermal stress induced by {CW} 1340 nm laser on
28 nm advanced technologies},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {227--232},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.027},
doi = {10.1016/J.MICROREL.2017.07.027},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PenzesDMSNLP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PershenkovPBUFR17,
author = {V. S. Pershenkov and
Aleksandr S. Petrov and
Alexander S. Bakerenkov and
Viktor N. Ulimov and
V. A. Felytsyn and
A. S. Rodin and
V. V. Belyakov and
V. A. Telets and
V. V. Shurenkov},
title = {True dose rate physical mechanism of {ELDRS} effect in bipolar devices},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {703--707},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.025},
doi = {10.1016/J.MICROREL.2017.07.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PershenkovPBUFR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetrosyantsKLSS17,
author = {Konstantin O. Petrosyants and
Igor A. Kharitonov and
Sergey V. Lebedev and
Lev M. Sambursky and
Sergey O. Safonov and
Veniamin G. Stakhin},
title = {Electrical characterization and reliability of submicron {SOI} {CMOS}
technology in the extended temperature range (to 300 {\textdegree}C)},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {416--425},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.018},
doi = {10.1016/J.MICROREL.2017.05.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PetrosyantsKLSS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PinFG17,
author = {S. Pin and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Alexandrine Gu{\'{e}}don{-}Gracia},
title = {Combined creep characterisation from single lap shear tests and 3D
implementation for fatigue simulations},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {368--372},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.053},
doi = {10.1016/J.MICROREL.2017.07.053},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PinFG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PlesaNBN17,
author = {Cosmin{-}Sorin Plesa and
Marius Neag and
Cristian Boianceanu and
Andrei Negoita},
title = {Design methodology for over-temperature and over-current protection
of an {LDO} voltage regulator by using electro-thermal simulations},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {509--516},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.028},
doi = {10.1016/J.MICROREL.2017.03.028},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PlesaNBN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PohlUM17,
author = {L{\'{a}}szl{\'{o}} Pohl and
Soma Ur and
J{\'{a}}nos Mizsei},
title = {Thermoelectrical modelling and simulation of devices based on VO\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {387--394},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.027},
doi = {10.1016/J.MICROREL.2017.03.027},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PohlUM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PolingVBJM17,
author = {Brian S. Poling and
Glen David Via and
Ken D. Bole and
E. E. Johnson and
J. M. McDermott},
title = {Commercial-off-the-shelf algan/gan hemt device reliability study after
exposure to heavy ion radiation},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {13--20},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.09.017},
doi = {10.1016/J.MICROREL.2016.09.017},
timestamp = {Wed, 13 Nov 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PolingVBJM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PoothBRHPTMWCUK17,
author = {Alexander Pooth and
Johan Bergsten and
Niklas Rorsman and
Hassan Hirshy and
R. Perks and
Paul J. Tasker and
Trevor Martin and
Richard F. Webster and
Dave Cherns and
Michael J. Uren and
Martin Kuball},
title = {Morphological and electrical comparison of Ti and Ta based ohmic contacts
for AlGaN/GaN-on-SiC HFETs},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {2--4},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.002},
doi = {10.1016/J.MICROREL.2016.11.002},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PoothBRHPTMWCUK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PopelkaHZ17,
author = {Stanislav Popelka and
Pavel Hazdra and
V. Z{\'{a}}hlava},
title = {Operation of 4H-SiC high voltage normally-OFF {V-JFET} in radiation
hard conditions: Simulations and experiment},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {58--66},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.015},
doi = {10.1016/J.MICROREL.2017.05.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PopelkaHZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Poppe17,
author = {Andr{\'{a}}s Poppe},
title = {Simulation of {LED} based luminaires by using multi-domain compact
models of LEDs and compact thermal models of their thermal environment},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {65--74},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.039},
doi = {10.1016/J.MICROREL.2017.03.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Poppe17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PougetJJVWS17,
author = {Vincent Pouget and
S. Jonathas and
R. Job and
J.{-}R. Vaill{\'{e}} and
Frederic Wrobel and
Fr{\'{e}}d{\'{e}}ric Saign{\'{e}}},
title = {Structural pattern extraction from asynchronous two-photon laser fault
injection using spectral analysis},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {650--654},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.028},
doi = {10.1016/J.MICROREL.2017.07.028},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PougetJJVWS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PougnetCLM17,
author = {Philippe Pougnet and
Gerard Coquery and
Richard Lallemand and
A. Makhloufi},
title = {Power module thermal cycling tester for in-situ ageing detection},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {544--548},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.042},
doi = {10.1016/J.MICROREL.2017.06.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PougnetCLM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PribahsnikNMBPA17,
author = {Florian Peter Pribahsnik and
Michael Nelhiebel and
M. Mataln and
Mirko Bernardoni and
G. Prechtl and
Frank Altmann and
David Poppitz and
A. Lindemann},
title = {Exploring the thermal limit of GaN power devices under extreme overload
conditions},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {304--308},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.046},
doi = {10.1016/J.MICROREL.2017.07.046},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PribahsnikNMBPA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PunDCC17,
author = {Kelvin P. L. Pun and
Navdeep S. Dhaka and
Chee{-}wah Cheung and
Alan H. S. Chan},
title = {Effect of {ENEPIG} metallization for solid-state gold-gold diffusion
bonds},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {339--348},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.019},
doi = {10.1016/J.MICROREL.2017.09.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PunDCC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QianLFFFZZ17,
author = {Cheng Qian and
Yun Li and
Jiajie Fan and
Xuejun Fan and
Jiajia Fu and
Lixia Zhao and
Guoqi Zhang},
title = {Studies of the light output properties for a GaN based blue {LED}
using an electro-optical simulation method},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {173--178},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.015},
doi = {10.1016/J.MICROREL.2017.04.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QianLFFFZZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QiuCWHW17,
author = {Delong Qiu and
Liqiang Cao and
Qidong Wang and
Fengze Hou and
Xugang Wang},
title = {Experimental and numerical study of 3D stacked dies under forced air
cooling and water immersion cooling},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {34--43},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.016},
doi = {10.1016/J.MICROREL.2017.02.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QiuCWHW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QuahNMSANLM17,
author = {Alfred C. T. Quah and
Dayanand Nagalingam and
Seung Je Moon and
Edy Susanto and
Ghim Boon Ang and
Soh Ping Neo and
Jeffrey Lam and
Zhihong Mai},
title = {Static fault localization of subtle metallization defects using near
infrared photon emission microscopy},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {76--91},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.010},
doi = {10.1016/J.MICROREL.2017.04.010},
timestamp = {Tue, 21 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QuahNMSANLM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaineGLDP17,
author = {M{\'{e}}lanie Raine and
Marc Gaillardin and
Thierry Lagutere and
Olivier Duhamel and
Philippe Paillet},
title = {Estimating the Single-Event Upset sensitivity of a memory array using
simulation},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {349--354},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.016},
doi = {10.1016/J.MICROREL.2017.09.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaineGLDP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rajaei17,
author = {Ramin Rajaei},
title = {Single event double node upset tolerance in MOS/spintronic sequential
and combinational logic circuits},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {109--114},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.003},
doi = {10.1016/J.MICROREL.2016.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rajaei17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rajaei17a,
author = {Ramin Rajaei},
title = {Highly reliable and low-power magnetic full-adder designs for nanoscale
technologies},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {129--135},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.033},
doi = {10.1016/J.MICROREL.2017.04.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rajaei17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RajaguruLBGA17,
author = {Pushparajah Rajaguru and
Hua Lu and
Chris Bailey and
Jose Angel Ortiz Gonzalez and
Olayiwola Alatise},
title = {Evaluation of the impact of the physical dimensions and material of
the semiconductor chip on the reliability of Sn3.5Ag solder interconnect
in power electronic module: {A} finite element analysis perspective},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {77--85},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.002},
doi = {10.1016/J.MICROREL.2016.12.002},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RajaguruLBGA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RamosMR17,
author = {Alexis Ramos and
Juan Antonio Maestro and
Pedro Reviriego},
title = {Characterizing a {RISC-V} SRAM-based {FPGA} implementation against
Single Event Upsets using fault injection},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {205--211},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.007},
doi = {10.1016/J.MICROREL.2017.09.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RamosMR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RanieriAPC17,
author = {Marco Ranieri and
Diego Alberto and
H{\'{e}}l{\`{e}}ne Piret and
Viviane Cattin},
title = {Electronic module for the thermal monitoring of a Li-ion battery cell
through the electrochemical impedance estimation},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {410--415},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.010},
doi = {10.1016/J.MICROREL.2017.06.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RanieriAPC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReigosaIRB17,
author = {Paula Diaz Reigosa and
Francesco Iannuzzo and
Munaf Rahimo and
Frede Blaabjerg},
title = {Capacitive effects in IGBTs limiting their reliability under short
circuit},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {485--489},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.059},
doi = {10.1016/J.MICROREL.2017.07.059},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ReigosaIRB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rencz17,
author = {M{\'{a}}rta Rencz},
title = {Thermal investigations of integrated circuits and systems, THERMINIC'16},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {360},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.015},
doi = {10.1016/J.MICROREL.2017.09.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rencz17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RensoMBSMZ17,
author = {N. Renso and
Matteo Meneghini and
Matteo Buffolo and
Carlo De Santi and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Understanding the degradation processes of GaN based LEDs submitted
to extremely high current density},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {556--560},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.044},
doi = {10.1016/J.MICROREL.2017.06.044},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RensoMBSMZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReviriegoPM17,
author = {Pedro Reviriego and
Salvatore Pontarelli and
Juan Antonio Maestro},
title = {A method to protect Cuckoo filters from soft errors},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {85--89},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.040},
doi = {10.1016/J.MICROREL.2017.03.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReviriegoPM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RitterP17,
author = {Matthias Ritter and
Martin Pfost},
title = {Aging sensors for on-chip metallization of integrated {LDMOS} transistors
under cyclic thermo-mechanical stress},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {512--516},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.009},
doi = {10.1016/J.MICROREL.2017.06.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RitterP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RochaTB17,
author = {Raphael de Oliveira Rocha and
Frank Sill Torres and
Rodrigo Possamai Bastos},
title = {Towards high-sensitive built-in current sensors enabling detection
of radiation-induced soft errors},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {190--196},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.015},
doi = {10.1016/J.MICROREL.2017.08.015},
timestamp = {Thu, 25 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RochaTB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rodriguez-Fernandez17,
author = {Alberto Rodriguez{-}Fernandez and
Carlo Cagli and
Luca Perniola and
Jordi Su{\~{n}}{\'{e}} and
Enrique Miranda},
title = {Identification of the generation/rupture mechanism of filamentary
conductive paths in ReRAM devices using oxide failure analysis},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {178--183},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.088},
doi = {10.1016/J.MICROREL.2017.06.088},
timestamp = {Sat, 25 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Rodriguez-Fernandez17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RohKKKK17,
author = {Giyoun Roh and
Hyeokjin Kim and
Cheolgyu Kim and
Dongwoo Kim and
Bongkoo Kang},
title = {Fast and accurate method of lifetime estimation for HfSiON/SiO\({}_{\mbox{2}}\)
dielectric n-MOSFETs under positive bias temperature instability},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {98--102},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.035},
doi = {10.1016/J.MICROREL.2017.03.035},
timestamp = {Mon, 16 Sep 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RohKKKK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RossVKRPP17,
author = {Glenn Ross and
Vesa Vuorinen and
Michael Krause and
S. Reissaus and
Matthias Petzold and
Mervi Paulasto{-}Kr{\"{o}}ckel},
title = {{XRD} and ToF-SIMS study of intermetallic void formation in Cu-Sn
micro-connects},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {390--394},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.044},
doi = {10.1016/J.MICROREL.2017.07.044},
timestamp = {Thu, 28 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RossVKRPP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RossettoMCBSPDT17,
author = {Isabella Rossetto and
Matteo Meneghini and
Eleonora Canato and
Marco Barbato and
Steve Stoffels and
Niels Posthuma and
Stefaan Decoutere and
Andrea Natale Tallarico and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Field- and current-driven degradation of GaN-based power HEMTs with
p-GaN gate: Dependence on Mg-doping level},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {298--303},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.061},
doi = {10.1016/J.MICROREL.2017.06.061},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RossettoMCBSPDT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RousselinHRGB17,
author = {Thomas Rousselin and
G. Hubert and
Didier Regis and
Marc Gatti and
A. Bensoussan},
title = {Impact of aging on the soft error rate of 6T {SRAM} for planar and
bulk technologies},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {159--163},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.078},
doi = {10.1016/J.MICROREL.2017.07.078},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RousselinHRGB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyEAA17,
author = {Avisek Roy and
Ferenc Ender and
Mehdi Azadmehr and
Knut E. Aasmundtveit},
title = {{CMOS} micro-heater design for direct integration of carbon nanotubes},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {517--525},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.031},
doi = {10.1016/J.MICROREL.2017.05.031},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoyEAA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RuffilliBDLWL17,
author = {R. Ruffilli and
Mounira Berkani and
Philippe Dupuy and
St{\'{e}}phane Lefebvre and
Y. Weber and
Marc Legros},
title = {Mechanisms of power module source metal degradation during electro-thermal
aging},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {507--511},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.086},
doi = {10.1016/J.MICROREL.2017.06.086},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RuffilliBDLWL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SabbahAABTM17,
author = {Wissam Sabbah and
Faical Arabi and
Oriol Avino{-}Salvado and
Cyril Buttay and
L. Th{\'{e}}olier and
Herv{\'{e}} Morel},
title = {Lifetime of power electronics interconnections in accelerated test
conditions: High temperature storage and thermal cycling},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {444--449},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.091},
doi = {10.1016/J.MICROREL.2017.06.091},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SabbahAABTM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SabbahBABFGM17,
author = {Wissam Sabbah and
Pierre Bondue and
Oriol Avino{-}Salvado and
Cyril Buttay and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Alexandrine Gu{\'{e}}don{-}Gracia and
Herv{\'{e}} Morel},
title = {High temperature ageing of microelectronics assemblies with {SAC}
solder joints},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {362--367},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.065},
doi = {10.1016/J.MICROREL.2017.06.065},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SabbahBABFGM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SaitoN17,
author = {Wataru Saito and
Toshiyuki Naka},
title = {Relation between {UIS} withstanding capability and {I-V} characteristics
in high-voltage GaN-HEMTs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {309--313},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.009},
doi = {10.1016/J.MICROREL.2017.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SaitoN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SajidCTGBMK17,
author = {Muhammad Sajid and
Nikolay G. Chechenin and
Frank Sill Torres and
Usman Ali Gulzari and
Muhammad Usman Butt and
Zhu Ming and
E. U. Khan},
title = {Single Event Upset rate determination for 65 nm {SRAM} bit-cell in
{LEO} radiation environments},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {11--16},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.084},
doi = {10.1016/J.MICROREL.2017.07.084},
timestamp = {Tue, 18 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SajidCTGBMK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SakamotoOS17,
author = {Junji Sakamoto and
Hisakazu Ohara and
Tadahiro Shibutani},
title = {Finite element analysis of thermal and mechanical stresses due to
the grain anisotropy of polycrystalline {\(\beta\)}-Sn},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {29--34},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.009},
doi = {10.1016/J.MICROREL.2017.02.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SakamotoOS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SantiMCDZMZM17,
author = {Carlo De Santi and
Matteo Meneghini and
Alessandro Caria and
E. Dogmus and
M. Zegaoui and
F. Medjdoub and
Enrico Zanoni and
Gaudenzio Meneghesso},
title = {Degradation of InGaN-based {MQW} solar cells under 405 nm laser excitation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {575--578},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.072},
doi = {10.1016/J.MICROREL.2017.06.072},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SantiMCDZMZM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SantiniMFMGA17,
author = {Thomas Santini and
S{\'{e}}bastien Morand and
Mitra Fouladirad and
Florent Miller and
Antoine Grall and
Bruno Allard},
title = {Non-homogenous gamma process: Application to SiC {MOSFET} threshold
voltage instability},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {14--19},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.007},
doi = {10.1016/J.MICROREL.2017.06.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SantiniMFMGA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SasakiONAKSKLKT17,
author = {Akito Sasaki and
Hideyuki Oozu and
Miho Nakamura and
Katsuaki Aoki and
Yoshinori Kataoka and
Syuichi Saito and
Kumpei Kobayashi and
Wei Li and
Kuniyuki Kakushima and
Kazuo Tsutsui and
Hiroshi Iwai},
title = {Durability evaluation of hexagonal WO\({}_{\mbox{3}}\) electrode for
lithium ion secondary batteries},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {86--90},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.015},
doi = {10.1016/J.MICROREL.2016.11.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SasakiONAKSKLKT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SasangkaSGMGT17,
author = {Wardhana A. Sasangka and
Govindo J. Syaranamual and
Y. Gao and
Riko I. Made and
Chee Lip Gan and
Carl V. Thompson},
title = {Improved reliability of AlGaN/GaN-on-Si high electron mobility transistors
(HEMTs) with high density silicon nitride passivation},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {287--291},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.057},
doi = {10.1016/J.MICROREL.2017.06.057},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SasangkaSGMGT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SenguptaK17,
author = {Anirban Sengupta and
Deepak Kachave},
title = {Low cost fault tolerance against k\({}_{\mbox{c}}\)-cycle and k\({}_{\mbox{m}}\)-unit
transient for loop based control data flow graphs during physically
aware high level synthesis},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {88--99},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.023},
doi = {10.1016/J.MICROREL.2017.05.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SenguptaK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeptimioCVGC17,
author = {Rudimylla S. Septimio and
Thiago A. Costa and
Talita A. Vida and
Amauri Garcia and
No{\'{e}} Cheung},
title = {Interrelationship of thermal parameters, microstructure and microhardness
of directionally solidified Bi-Zn solder alloys},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {100--110},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.007},
doi = {10.1016/J.MICROREL.2017.08.007},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SeptimioCVGC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShibutaniS17,
author = {Tadahiro Shibutani and
Jing Wen Sun},
title = {Nucleation and shrinkage of defects on the surface of tin induced
by local strain distribution},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {119--123},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.026},
doi = {10.1016/J.MICROREL.2017.10.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShibutaniS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShihLCT17,
author = {Chun{-}Hsing Shih and
Yen{-}Hsiang Lo and
Yu{-}Hsuan Chen and
Jr{-}Jie Tsai},
title = {Impact of gate-to-source/drain misalignments on source-side injection
Schottky barrier charge-trapping memory cells evaluated using numerical
programming-trapping iterations},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {9--14},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.032},
doi = {10.1016/J.MICROREL.2017.04.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShihLCT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShinPCY17,
author = {Dongseok Shin and
Byungchoul Park and
Youngcheol Chae and
Ilgu Yun},
title = {Structure variation effects on device reliability of single photon
avalanche diodes},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {610--613},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.050},
doi = {10.1016/J.MICROREL.2017.07.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShinPCY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShiwakotiBAA17,
author = {N. Shiwakoti and
A. Bobby and
K. Asokan and
Bobby Antony},
title = {The role of electronic energy loss in {SHI} irradiated Ni/oxide/n-GaP
Schottky diode},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {40--46},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.005},
doi = {10.1016/J.MICROREL.2016.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShiwakotiBAA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Shokravi17,
author = {M. Shokravi},
title = {Dynamic pull-in and pull-out analysis of viscoelastic nanoplates under
electrostatic and Casimir forces via sinusoidal shear deformation
theory},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {17--28},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.006},
doi = {10.1016/J.MICROREL.2017.02.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Shokravi17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SilvestriniBCCV17,
author = {M. Silvestrini and
Marco Barbato and
Sonia Costantini and
L. Castoldi and
Federico Vercesi and
Luigi Zanotti and
Gaudenzio Meneghesso},
title = {Long-term stresses on linear micromirrors for pico projector application},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {626--630},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.081},
doi = {10.1016/J.MICROREL.2017.07.081},
timestamp = {Tue, 15 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SilvestriniBCCV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SinhaC17,
author = {Dheeraj Kumar Sinha and
Amitabh Chatterjee},
title = {{SPICE} level implementation of physics of filamentation in {ESD}
protection devices},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {239--247},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.022},
doi = {10.1016/J.MICROREL.2017.05.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SinhaC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SlimaniBN17,
author = {Mariem Slimani and
K. Benkalaia and
Lirida A. B. Naviner},
title = {Analysis of ageing effects on {ARTIX7} {XILINX} {FPGA}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {168--173},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.006},
doi = {10.1016/J.MICROREL.2017.07.006},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SlimaniBN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongHZLDZZ17,
author = {Lei Song and
Zhiyuan Hu and
Mengying Zhang and
Xiaonian Liu and
Lihua Dai and
Zhengxuan Zhang and
Shichang Zou},
title = {Influences of silicon-rich shallow trench isolation on total ionizing
dose hardening and gate oxide integrity in a 130 nm partially depleted
{SOI} {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {1--8},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.007},
doi = {10.1016/J.MICROREL.2017.05.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SongHZLDZZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongJ17,
author = {K. H. Song and
J. S. Jang},
title = {Semiconductor package qualification based on the swelling temperature},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {71--79},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.013},
doi = {10.1016/J.MICROREL.2016.12.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SongJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongLYP17,
author = {Yuchen Song and
Datong Liu and
Chen Yang and
Yu Peng},
title = {Data-driven hybrid remaining useful life estimation approach for spacecraft
lithium-ion battery},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {142--153},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.045},
doi = {10.1016/J.MICROREL.2017.06.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SongLYP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongMU17,
author = {Sungyoung Song and
Stig Munk{-}Nielsen and
Christian Uhrenfeldt},
title = {Failure mechanism analysis of off-state drain-to-source leakage current
failure of a commercial 650 {V} discrete GaN-on-Si {HEMT} power device
by accelerated power cycling test},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {539--543},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.011},
doi = {10.1016/J.MICROREL.2017.07.011},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SongMU17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SoutoPTJ17,
author = {Jorge Souto and
Jos{\'{e}} Luis Pura and
Alfredo Torres and
Juan Ignacio Jim{\'{e}}nez L{\'{o}}pez},
title = {Thermomechanical degradation of single and multiple quantum well AlGaAs/GaAs
laser diodes},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {588--591},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.005},
doi = {10.1016/J.MICROREL.2017.07.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SoutoPTJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StaliulionisMJH17,
author = {Zygimantas Staliulionis and
Sankhya Mohanty and
Masoud Jabbari and
Jesper Henri Hattel},
title = {Mathematical modelling of moisture transport into an electronic enclosure
under non-isothermal conditions},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {526--532},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.027},
doi = {10.1016/J.MICROREL.2017.04.027},
timestamp = {Tue, 12 Nov 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StaliulionisMJH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SterponeB17,
author = {Luca Sterpone and
Luca Boragno},
title = {A probe-based {SEU} detection method for SRAM-based FPGAs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {154--158},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.077},
doi = {10.1016/J.MICROREL.2017.07.077},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SterponeB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuCL17,
author = {Ting{-}Hong Su and
Chia{-}Hung Chiang and
Yow{-}Jon Lin},
title = {Temperature dependence of current-voltage characteristics of MoS\({}_{\mbox{2}}\)/Si
devices prepared by the chemical vapor deposition method},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {374--378},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.002},
doi = {10.1016/J.MICROREL.2017.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuCL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuWPZY17,
author = {Xiaohong Su and
Shuai Wang and
Michael G. Pecht and
Lingling Zhao and
Zhe Ye},
title = {Interacting multiple model particle filter for prognostics of lithium-ion
batteries},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {59--69},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.003},
doi = {10.1016/J.MICROREL.2017.02.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuWPZY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SufianA17,
author = {Shaker Farid Sufian and
Mohd Zulkifly Abdullah},
title = {Heat transfer enhancement of LEDs with a combination of piezoelectric
fans and a heat sink},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {39--50},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.011},
doi = {10.1016/J.MICROREL.2016.11.011},
timestamp = {Mon, 11 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SufianA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunKZLLWD17,
author = {Yun{-}Na Sun and
Dongwoo Kang and
Yazhou Zhang and
Jiangbo Luo and
Yanmei Liu and
Yan Wang and
Guifu Ding},
title = {Plastic analysis for through silicon via with actual etching defect
of triangular-teeth and scallops},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {43--52},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.013},
doi = {10.1016/J.MICROREL.2017.06.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SunKZLLWD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TadeusiewiczH17,
author = {Michal Tadeusiewicz and
Stanislaw Halgas},
title = {Diagnosis of a soft short and local variations of parameters occurring
simultaneously in analog {CMOS} circuits},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {90--97},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.025},
doi = {10.1016/J.MICROREL.2017.03.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TadeusiewiczH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaghipourA17,
author = {Shiva Taghipour and
Rahebeh Niaraki Asli},
title = {Aging comparative analysis of high-performance FinFET and {CMOS} flip-flops},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {52--59},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.012},
doi = {10.1016/J.MICROREL.2016.12.012},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TaghipourA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TajalliMRMBZM17,
author = {Alaleh Tajalli and
Matteo Meneghini and
Isabella Rossetto and
Peter Moens and
Abhishek Banerjee and
Enrico Zanoni and
Gaudenzio Meneghesso},
title = {Field and hot electron-induced degradation in GaN-based power MIS-HEMTs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {282--286},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.021},
doi = {10.1016/J.MICROREL.2017.06.021},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TajalliMRMBZM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TakacsBBRS17,
author = {G{\'{a}}bor Tak{\'{a}}cs and
Gy{\"{o}}rgy Bogn{\'{a}}r and
Eniko B{\'{a}}ndy and
G{\'{a}}bor R{\'{o}}zs{\'{a}}s and
P{\'{e}}ter G. Szab{\'{o}}},
title = {Fabrication and characterization of microscale heat sinks},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {480--487},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.028},
doi = {10.1016/J.MICROREL.2017.05.028},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TakacsBBRS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TallaricoRMCDGS17,
author = {Andrea Natale Tallarico and
Susanna Reggiani and
Paolo Magnone and
Giuseppe Croce and
Riccardo Depetro and
P. Gattari and
Enrico Sangiorgi and
Claudio Fiegna},
title = {Investigation of the hot carrier degradation in power {LDMOS} transistors
with customized thick oxide},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {475--479},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.043},
doi = {10.1016/J.MICROREL.2017.07.043},
timestamp = {Fri, 07 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TallaricoRMCDGS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TambaraCKTDBM17,
author = {Lucas A. Tambara and
Eduardo Chielle and
Fernanda Lima Kastensmidt and
Georgios Tsiligiannis and
Salvatore Danzeca and
Markus Brugger and
A. Masi},
title = {Analyzing the impact of radiation-induced failures in flash-based
APSoC with and without fault tolerance techniques at {CERN} environment},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {640--643},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.049},
doi = {10.1016/J.MICROREL.2017.06.049},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TambaraCKTDBM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanHG17,
author = {Shihai Tan and
Jing Han and
Fu Guo},
title = {Effects of twin grain boundaries on the subgrain rotation of the solder
joint during thermal shock},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {126--133},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.013},
doi = {10.1016/J.MICROREL.2017.03.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanHG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TangYWLFCFZ17,
author = {Hongyu Tang and
Huaiyu Ye and
Cell K. Y. Wong and
Stanely Y. Y. Leung and
Jiajie Fan and
Xianping Chen and
Xuejun Fan and
Guoqi Zhang},
title = {Overdriving reliability of chip scale packaged LEDs: Quantitatively
analyzing the impact of component},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {197--204},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.008},
doi = {10.1016/J.MICROREL.2017.09.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TangYWLFCFZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaoPK17,
author = {Qi Tao and
Gerald Pinter and
Thomas Krivec},
title = {Influence of cooling rate and annealing on the {DSC} Tg of an epoxy
resin},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {396--400},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.088},
doi = {10.1016/J.MICROREL.2017.07.088},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TaoPK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TartarinLSLMBRR17,
author = {Jean{-}Guy Tartarin and
O. Lazar and
D. Saugnon and
Benoit Lambert and
C. Moreau and
C. Bouexi{\`{e}}re and
E. Romain{-}Latu and
K. Rousseau and
A. David and
J.{-}L. Roux},
title = {Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction
of the Schottky Barrier Height, electrical modelling, {T-CAD} simulations
and {TEM} imaging},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {344--349},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.057},
doi = {10.1016/J.MICROREL.2017.07.057},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TartarinLSLMBRR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TorrenteCVORG17,
author = {Giulio Torrente and
Jean Coignus and
Alexandre Vernhet and
Jean{-}Luc Ogier and
David Roy and
G{\'{e}}rard Ghibaudo},
title = {Physically-based evaluation of aging contributions in HC/FN-programmed
40 nm {NOR} Flash technology},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {281--287},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.039},
doi = {10.1016/J.MICROREL.2017.05.039},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TorrenteCVORG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TranKMMHP17,
author = {Hiep Tran and
Masturina Kracica and
Dougal McCulloch and
Edwin Mayes and
Anthony Holland and
James Partridge},
title = {Energetic deposition, measurement and simulation of graphitic contacts
to 6H-SiC},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {82--85},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.017},
doi = {10.1016/J.MICROREL.2017.02.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TranKMMHP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsukudaNTHO17,
author = {Masanori Tsukuda and
K. Nakashima and
S. Tabata and
Kazunori Hasegawa and
Ichiro Omura},
title = {Clamp type built-in current sensor using {PCB} in high-voltage power
modules},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {517--521},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.026},
doi = {10.1016/J.MICROREL.2017.06.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsukudaNTHO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsurumakiNH17,
author = {Ryouhei Tsurumaki and
Naohiro Noda and
Kazushige Horio},
title = {Similarities of lag phenomena and current collapse in field-plate
AlGaN/GaN HEMTs with different types of buffer layers},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {36--41},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.019},
doi = {10.1016/J.MICROREL.2017.04.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsurumakiNH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UbochiFAIK17,
author = {Brendan Ubochi and
Soroush Faramehr and
Khaled Ahmeda and
Petar Igic and
Karol Kalna},
title = {Operational frequency degradation induced trapping in scaled GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {35--40},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.008},
doi = {10.1016/J.MICROREL.2017.02.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/UbochiFAIK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UllahSSCF17,
author = {Anees Ullah and
Ernesto S{\'{a}}nchez and
Luca Sterpone and
Luis Andr{\'{e}}s Cardona and
Carles Ferrer},
title = {An FPGA-based dynamically reconfigurable platform for emulation of
permanent faults in ASICs},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {110--120},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.032},
doi = {10.1016/J.MICROREL.2017.06.032},
timestamp = {Thu, 16 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/UllahSSCF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UsuiSKTHSK17,
author = {Masanori Usui and
Toshikazu Satoh and
Hidehiko Kimura and
S. Tajima and
Y. Hayashi and
Daigo Setoyama and
Masashi Kato},
title = {Effects of thermal aging on Cu nanoparticle/Bi-Sn solder hybrid bonding},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {93--99},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.096},
doi = {10.1016/J.MICROREL.2017.07.096},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/UsuiSKTHSK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VaionMMMPT17,
author = {Riccardo Enrici Vaion and
Matteo Medda and
Alberto Mancaleoni and
Giovanna Mura and
A. Pintus and
M. De Tomasi},
title = {Qualification extension of automotive smart power and digital ICs
to harsh aerospace mission profiles: Gaps and opportunities},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {438--443},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.061},
doi = {10.1016/J.MICROREL.2017.07.061},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VaionMMMPT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VallabhaneniIMK17,
author = {Renuka Vallabhaneni and
Ehsan Izadi and
Carl R. Mayer and
C. Shashank Kaira and
Sudhanshu S. Singh and
Jagannathan Rajagopalan and
Nikhilesh Chawla},
title = {In situ tensile testing of tin (Sn) whiskers in a focused ion beam
(FIB)/scanning electron microscope {(SEM)}},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {314--320},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.042},
doi = {10.1016/J.MICROREL.2017.07.042},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VallabhaneniIMK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VandeveldeVPDBA17,
author = {Bart Vandevelde and
Filip Vanhee and
Davy Pissoort and
Lieven Degrendele and
Johan de Baets and
Bart Allaert and
Ralph Lauwaert and
Franco Zanon and
Riet Labie and
Geert Willems},
title = {Four-point bending cycling: The alternative for thermal cycling solder
fatigue testing of electronic components},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {131--135},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.008},
doi = {10.1016/J.MICROREL.2017.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VandeveldeVPDBA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VanziMMGJDB17,
author = {Massimo Vanzi and
Giulia Marcello and
Giovanna Mura and
G. Le Gal{\`{e}}s and
S. Joly and
Yannick Deshayes and
Laurent B{\'{e}}chou},
title = {Practical optical gain by an extended Hakki-Paoli method},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {579--583},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.060},
doi = {10.1016/J.MICROREL.2017.07.060},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VanziMMGJDB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VeenL17,
author = {N. van Veen and
W. Luiten},
title = {Force and collapsed shape of a liquid solder bump under load},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {547--553},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.040},
doi = {10.1016/J.MICROREL.2017.05.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VeenL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VenkitusamyPPAS17,
author = {Karthikeyan Venkitusamy and
Sanjeevikumar Padmanaban and
Michael G. Pecht and
Abhishek Awasthi and
Rajasekar Selvamuthukumaran},
title = {A modified boost rectifier for elimination of circulating current
in power factor correction applications},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {29--35},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.015},
doi = {10.1016/J.MICROREL.2016.12.015},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VenkitusamyPPAS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VerdingovasJA17,
author = {Vadimas Verdingovas and
Morten Stendahl Jellesen and
Rajan Ambat},
title = {Colorimetric visualization of tin corrosion: {A} method for early
stage corrosion detection on printed circuit boards},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {158--166},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.005},
doi = {10.1016/J.MICROREL.2017.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VerdingovasJA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VernicaMB17,
author = {Ionut Vernica and
Ke Ma and
Frede Blaabjerg},
title = {Reliability assessment platform for the power semiconductor devices
- Study case on 3-phase grid-connected inverter application},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {31--37},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.052},
doi = {10.1016/J.MICROREL.2017.06.052},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VernicaMB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VersenEG17,
author = {Martin Versen and
W. Ernst and
Prince Gulati},
title = {A row hammer pattern analysis of {DDR2} {SDRAM}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {64--67},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.022},
doi = {10.1016/J.MICROREL.2017.07.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VersenEG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VieraBDMJ17,
author = {Raphael Andreoni Camponogara Viera and
Rodrigo Possamai Bastos and
Jean{-}Max Dutertre and
Philippe Maurine and
Rodrigo Iga Jadue},
title = {Method for evaluation of transient-fault detection techniques},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {68--74},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.007},
doi = {10.1016/J.MICROREL.2017.07.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VieraBDMJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VillaltaBGLA17,
author = {Igor Villalta and
Unai Bidarte and
Julen Gomez{-}Cornejo and
Jes{\'{u}}s L{\'{a}}zaro and
Armando Astarloa},
title = {Estimating the {SEU} failure rate of designs implemented in FPGAs
in presence of MCUs},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {85--92},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.003},
doi = {10.1016/J.MICROREL.2017.08.003},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VillaltaBGLA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VogtNB17,
author = {Ivo Vogt and
Tomonori Nakamura and
Christian Boit},
title = {Optical interaction in active analog circuit elements},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {233--237},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.075},
doi = {10.1016/J.MICROREL.2017.07.075},
timestamp = {Tue, 31 Mar 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VogtNB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangGWQ17,
author = {Bo Wang and
Bin Gao and
Huaqiang Wu and
He Qian},
title = {New structure with SiO\({}_{\mbox{2}}\)-gate-dielectric select gates
in vertical-channel three-dimensional {(3D)} {NAND} flash memory},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {80--84},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.001},
doi = {10.1016/J.MICROREL.2017.08.001},
timestamp = {Fri, 21 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangGWQ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLLHFWYGGS17,
author = {Yang Wang and
Wenxiao Liu and
Wei Liu and
Peng He and
Zhonghua Fan and
Xiaorong Wang and
Dingkun Yu and
Jiayu Guo and
Bing Guo and
Hangyan Shen},
title = {Synthesis of SnAgCu nanoparticles with low melting point by the chemical
reduction method},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {17--24},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.069},
doi = {10.1016/J.MICROREL.2017.07.069},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLLHFWYGGS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLLP17,
author = {Jing Wang and
Ruiyang Liu and
Dapeng Liu and
Seungbae Park},
title = {Advancement in simulating moisture diffusion in electronic packages
under dynamic thermal loading conditions},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {42--53},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.018},
doi = {10.1016/J.MICROREL.2017.04.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLLP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLTZWY17,
author = {Fengjiang Wang and
Dongyang Li and
Shuang Tian and
Zhijie Zhang and
Jiheng Wang and
Chao Yan},
title = {Interfacial behaviors of Sn-Pb, Sn-Ag-Cu Pb-free and mixed Sn-Ag-Cu/Sn-Pb
solder joints during electromigration},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {106--115},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.031},
doi = {10.1016/J.MICROREL.2017.04.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLTZWY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangSJL17,
author = {Pengbo Wang and
Jiajing Sun and
Qian Jiang and
Ting Li},
title = {Cooling-controlled and reliable driving module for low-level light
therapy {LED} helmet},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {370--373},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.021},
doi = {10.1016/J.MICROREL.2017.09.021},
timestamp = {Thu, 22 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangSJL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangSWBCL17,
author = {Haibin Wang and
Ao Sheng and
Shiqi Wang and
Jinshun Bi and
Li Chen and
Xiaofeng Liu},
title = {{SEU} reduction effectiveness of common centroid layout in differential
latch at 130-nm {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {39--44},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.003},
doi = {10.1016/J.MICROREL.2017.04.003},
timestamp = {Thu, 19 Sep 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangSWBCL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWK17,
author = {Mingna Wang and
Jianqiu Wang and
Wei Ke},
title = {Corrosion behavior of Sn-3.0Ag-0.5Cu lead-free solder joints},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {69--75},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.017},
doi = {10.1016/J.MICROREL.2017.04.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangWK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangYZT17,
author = {Dong Wang and
Fangfang Yang and
Yang Zhao and
Kwok{-}Leung Tsui},
title = {Prognostics of Lithium-ion batteries based on state space modeling
with heterogeneous noise variances},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {1--8},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.002},
doi = {10.1016/J.MICROREL.2017.06.002},
timestamp = {Tue, 10 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangYZT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangYZT17a,
author = {Dong Wang and
Fangfang Yang and
Yang Zhao and
Kwok{-}Leung Tsui},
title = {Battery remaining useful life prediction at different discharge rates},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {212--219},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.009},
doi = {10.1016/J.MICROREL.2017.09.009},
timestamp = {Tue, 10 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangYZT17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WatanabeNO17,
author = {Akihiko Watanabe and
R. Nagao and
Ichiro Omura},
title = {Real-time imaging of temperature distribution inside a power device
under a power cycling test},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {490--494},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.092},
doi = {10.1016/J.MICROREL.2017.06.092},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WatanabeNO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WeiHYSKM17,
author = {Hsiu{-}Ping Wei and
Bongtae Han and
Byeng Dong Youn and
Hyuk Shin and
Ilho Kim and
Hojeong Moon},
title = {Assembly yield prediction of plastically encapsulated packages with
a large number of manufacturing variables by advanced approximate
integration method},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {319--330},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.006},
doi = {10.1016/J.MICROREL.2017.09.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WeiHYSKM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Weide-Zaage17,
author = {Kirsten Weide{-}Zaage},
title = {Simulation of packaging under harsh environment conditions (temperature,
pressure, corrosion and radiation)},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {6--12},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.026},
doi = {10.1016/J.MICROREL.2017.07.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Weide-Zaage17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WenCLJ17,
author = {Hua{-}Chiang Wen and
Wu{-}Ching Chou and
Shiuan Huei Lin and
Don Son Jiang},
title = {Nanomechanical properties of Ag solder bumps doped with Pd and Au},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {270--275},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.037},
doi = {10.1016/J.MICROREL.2017.05.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WenCLJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WenCLJCCJC17,
author = {Hua{-}Chiang Wen and
Wu{-}Ching Chou and
Po{-}Chen Lin and
Yeau{-}Ren Jeng and
Chien{-}Chang Chen and
Hung{-}Ming Chen and
Don Son Jiang and
Chun{-}Hu Cheng},
title = {Using nanoindentation to investigate the temperature cycling of Sn-37Pb
solders},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {111--117},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.004},
doi = {10.1016/J.MICROREL.2017.05.004},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WenCLJCCJC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WhitingHLPJLKRX17,
author = {Patrick G. Whiting and
M. R. Holzworth and
A. G. Lind and
Stephen J. Pearton and
Kevin S. Jones and
Lu Liu and
T. S. Kang and
Fan Ren and
Y. Xin},
title = {Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility
transistors},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {32--40},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.007},
doi = {10.1016/J.MICROREL.2017.01.007},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WhitingHLPJLKRX17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WhitingRHPJLKR17,
author = {Patrick G. Whiting and
Nicholas G. Rudawski and
M. R. Holzworth and
Stephen J. Pearton and
Kevin S. Jones and
Lu Liu and
T. S. Kang and
Fan Ren},
title = {Nanocrack formation in AlGaN/GaN high electron mobility transistors
utilizing Ti/Al/Ni/Au ohmic contacts},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {41--48},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.005},
doi = {10.1016/J.MICROREL.2017.02.005},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WhitingRHPJLKR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WhitmanMZ17,
author = {Charles S. Whitman and
Michael G. Meeder and
Peter J. Zampardi},
title = {Determination of safe reliability region over temperature and current
density for through wafer vias},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {5--12},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.09.011},
doi = {10.1016/J.MICROREL.2016.09.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WhitmanMZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongL17,
author = {Ee{-}Hua Wong and
Johan Liu},
title = {Interface and interconnection stresses in electronic assemblies -
{A} critical review of analytical solutions},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {206--220},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.010},
doi = {10.1016/J.MICROREL.2017.03.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WrobelTPDBS17,
author = {Frederic Wrobel and
Antoine D. Touboul and
Vincent Pouget and
Luigi Dilillo and
Jerome Boch and
Fr{\'{e}}d{\'{e}}ric Saign{\'{e}}},
title = {A calculation method to estimate single event upset cross section},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {644--649},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.056},
doi = {10.1016/J.MICROREL.2017.07.056},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WrobelTPDBS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuHZL17,
author = {Feng Wu and
Yang Hao and
Jin Zhao and
Yang Liu},
title = {Current similarity based open-circuit fault diagnosis for induction
motor drives with discrete wavelet transform},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {309--316},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.036},
doi = {10.1016/J.MICROREL.2017.05.036},
timestamp = {Tue, 25 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WuHZL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuLWLZ17,
author = {Jianfei Wu and
Cong Li and
Hongyi Wang and
J. Li and
Liming Zheng},
title = {Modelling of initial fast charge loss mechanism for logic embedded
non-volatile memories},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {174--177},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.090},
doi = {10.1016/J.MICROREL.2017.06.090},
timestamp = {Thu, 21 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuLWLZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuLZWZ17,
author = {Jianfei Wu and
Binhong Li and
W. Zhu and
H. Wang and
L. Zheng},
title = {Investigations on the {EFT} immunity of microcontrollers with different
architectures},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {708--713},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.078},
doi = {10.1016/J.MICROREL.2017.06.078},
timestamp = {Tue, 26 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuLZWZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuSBL17,
author = {Yuelin Wu and
K. N. Subramanian and
Scott Calabrese Barton and
Andre Lee},
title = {Electrochemical studies of Pd-doped Cu and Pd-doped Cu-Al intermetallics
for understanding corrosion behavior in wire-bonding packages},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {355--361},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.024},
doi = {10.1016/J.MICROREL.2017.09.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuSBL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuXWW17,
author = {Jie Wu and
Songbai Xue and
Jingwen Wang and
Jianxin Wang},
title = {Comparative studies on microelectronic reliability issue of Sn whisker
growth in Sn-0.3Ag-0.7Cu-1Pr solder under different environments},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {124--135},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.020},
doi = {10.1016/J.MICROREL.2017.10.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuXWW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wymyslowski17,
author = {Artur Wymyslowski},
title = {Guest Editorial: 2016 EuroSimE International Conference on Thermal,
Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics
and Micro-Systems},
journal = {Microelectron. Reliab.},
volume = {74},
pages = {118--120},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.025},
doi = {10.1016/J.MICROREL.2017.05.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wymyslowski17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiaCLL17,
author = {Jiang Xia and
LanXian Cheng and
Guoyuan Li and
Bin Li},
title = {Reliability study of package-on-package stacking assembly under vibration
loading},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {285--293},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.012},
doi = {10.1016/J.MICROREL.2017.09.012},
timestamp = {Thu, 27 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiaCLL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiaLLCZ17,
author = {Jiang Xia and
Guoyuan Li and
Bin Li and
LanXian Cheng and
Bin Zhou},
title = {Fatigue life prediction of Package-on-Package stacking assembly under
random vibration loading},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {111--118},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.005},
doi = {10.1016/J.MICROREL.2017.03.005},
timestamp = {Thu, 27 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiaLLCZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiangZ17,
author = {Jiawei Xiang and
Yongteng Zhong},
title = {A fault detection strategy using the enhancement ensemble empirical
mode decomposition and random decrement technique},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {317--326},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.032},
doi = {10.1016/J.MICROREL.2017.03.032},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/XiangZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiongGYHNLSXL17,
author = {Huaping Xiong and
Chuanhai Gan and
Xiaobing Yang and
Zhigang Hu and
Haiyan Niu and
Jianfeng Li and
Jianfang Si and
Pengfei Xing and
Xuetao Luo},
title = {Corrosion behavior of crystalline silicon solar cells},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {49--58},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.01.006},
doi = {10.1016/J.MICROREL.2017.01.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiongGYHNLSXL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuMCWSWZWHY17,
author = {Xiuqin Xu and
Jiongjiong Mo and
Wei Chen and
Zhiyu Wang and
Yong{-}Heng Shang and
Yang Wang and
Qin Zheng and
Liping Wang and
Zheng{-}Liang Huang and
Fa{-}Xin Yu},
title = {A new meshing criterion for the equivalent thermal analysis of GaAs
{PHEMT} MMICs},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {30--38},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.012},
doi = {10.1016/J.MICROREL.2016.11.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XuMCWSWZWHY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamaguchiBHUSYC17,
author = {Shimpei Yamaguchi and
Zeynel Bayindir and
Xiaoli He and
Suresh Uppal and
Purushothaman Srinivasan and
Chloe Yong and
Dongil Choi and
Manoj Joshi and
Hyuck Soo Yang and
Owen Hu and
Srikanth Samavedam and
Dong Kyun Sohn},
title = {Effective work-function control technique applicable to p-type FinFET
high-k/metal gate devices},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {80--84},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.004},
doi = {10.1016/J.MICROREL.2017.04.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YamaguchiBHUSYC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangLZKM17,
author = {Kexin Yang and
Taizhi Liu and
Rui Zhang and
Dae Hyun Kim and
Linda Milor},
title = {Front-end of line and middle-of-line time-dependent dielectric breakdown
reliability simulator for logic circuits},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {81--86},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.038},
doi = {10.1016/J.MICROREL.2017.06.038},
timestamp = {Thu, 06 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangLZKM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangSL17,
author = {Chenglin Yang and
Ruoshan Su and
Bing Long},
title = {Methods of sequential test optimization in dynamic environment},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {112--121},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.017},
doi = {10.1016/J.MICROREL.2016.12.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangSL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangWWCSS17,
author = {Hong Yang and
Fumei Wang and
He Wang and
Jipeng Chang and
Dengyuan Song and
Chengfeng Su},
title = {Performance deterioration of p-type single crystalline silicon solar
modules affected by potential induced degradation in photovoltaic
power plant},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {18--23},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.017},
doi = {10.1016/J.MICROREL.2017.03.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangWWCSS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangWXT17,
author = {Fangfang Yang and
Dong Wang and
Yinjiao Xing and
Kwok{-}Leung Tsui},
title = {Prognostics of Li(NiMnCo)O\({}_{\mbox{2}}\)-based lithium-ion batteries
using a novel battery degradation model},
journal = {Microelectron. Reliab.},
volume = {70},
pages = {70--78},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.002},
doi = {10.1016/J.MICROREL.2017.02.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangWXT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YiD17,
author = {Shipeng Yi and
Zhengwei Du},
title = {The influence of microwave pulse width on the thermal burnout effect
of a {PIN} diode limiting-amplifying system},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {102--109},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.025},
doi = {10.1016/J.MICROREL.2017.06.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YiD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoonCBMEJ17,
author = {Hyungseok Yoon and
Kwang{-}Seong Choi and
Hyun{-}Cheol Bae and
Jong{-}Tae Moon and
Yong{-}Sung Eom and
Insu Jeon},
title = {Evaluating the material properties of underfill for a reliable 3D
{TSV} integration package using numerical analysis},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {41--50},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.010},
doi = {10.1016/J.MICROREL.2017.02.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YoonCBMEJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZajacMN17,
author = {Piotr Zajac and
Cezary Maj and
Andrzej Napieralski},
title = {Peak temperature reduction by optimizing power density distribution
in 3D ICs with microchannel cooling},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {488--498},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.023},
doi = {10.1016/J.MICROREL.2017.04.023},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZajacMN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZengLWSSGHCZ17,
author = {Yan Zeng and
Xiaojin Li and
YanLing Wang and
Yabin Sun and
Yanling Shi and
Ao Guo and
ShaoJian Hu and
Shoumian Chen and
Yuhang Zhao},
title = {Analytical long-term {NBTI} recovery model with slowing diffusivity
and locking effect of hydrogen considered},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {20--26},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.006},
doi = {10.1016/J.MICROREL.2017.06.006},
timestamp = {Wed, 19 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZengLWSSGHCZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangAVSD17,
author = {Qiutao Zhang and
Sarah Azimi and
Germano La Vaccara and
Luca Sterpone and
Boyang Du},
title = {A new approach for Total Ionizing Dose effect analysis on Flash-based
{FPGA}},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {58--63},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.066},
doi = {10.1016/J.MICROREL.2017.07.066},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangAVSD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangGWLL17,
author = {Li Zhang and
Hongli Gao and
Juan Wen and
Shichao Li and
Qi Liu},
title = {A deep learning-based recognition method for degradation monitoring
of ball screw with multi-sensor data fusion},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {215--222},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.038},
doi = {10.1016/J.MICROREL.2017.03.038},
timestamp = {Wed, 19 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangGWLL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLHP17,
author = {Shuye Zhang and
Tiesong Lin and
Peng He and
Kyung{-}Wook Paik},
title = {Effects of acrylic adhesives property and optimized bonding parameters
on Sn-58Bi solder joint morphology for flex-on-board assembly},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {181--189},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.08.009},
doi = {10.1016/J.MICROREL.2017.08.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLHP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLYM17,
author = {Rui Zhang and
Taizhi Liu and
Kexin Yang and
Linda Milor},
title = {Analysis of time-dependent dielectric breakdown induced aging of {SRAM}
cache with different configurations},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {87--91},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.040},
doi = {10.1016/J.MICROREL.2017.06.040},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLYM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLYPP17,
author = {Yujie Zhang and
Datong Liu and
Jinxiang Yu and
Yu Peng and
Xiyuan Peng},
title = {{EMA} remaining useful life prediction with weighted bagging {GPR}
algorithm},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {253--263},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.021},
doi = {10.1016/J.MICROREL.2017.03.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLYPP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangML17,
author = {Xin Zhang and
Qiang Miao and
Zhiwen Liu},
title = {Remaining useful life prediction of lithium-ion battery using an improved
{UPF} method based on {MCMC}},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {288--295},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.012},
doi = {10.1016/J.MICROREL.2017.02.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangML17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangW17,
author = {Lei Zhang and
Cailin Wang},
title = {Influence of carrier lifetime distribution on the current filament
in high voltage diode},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {75--79},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.001},
doi = {10.1016/J.MICROREL.2017.04.001},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangWRJY17,
author = {Zhi{-}Hao Zhang and
Xi{-}Shu Wang and
Huai{-}Hui Ren and
Su Jia and
Hui{-}Hua Yang},
title = {Simulation study on thermo-fatigue failure behavior of solder joints
in package-on-package structure},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {127--134},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.033},
doi = {10.1016/J.MICROREL.2017.06.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangWRJY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangWYCYZTZ17,
author = {Peijian Zhang and
Xue Wu and
Qianning Yi and
Wensuo Chen and
Yonghui Yang and
Kunfeng Zhu and
Kaizhou Tan and
Yi Zhong},
title = {A comparison of the effects of cobalt-60 {\(\gamma\)} ray irradiation
on {DPSA} bipolar transistors at high and low injection levels},
journal = {Microelectron. Reliab.},
volume = {71},
pages = {86--90},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.02.015},
doi = {10.1016/J.MICROREL.2017.02.015},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangWYCYZTZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangZYB17,
author = {G. Zhang and
Dao Zhou and
Jian Yang and
Frede Blaabjerg},
title = {Fundamental-frequency and load-varying thermal cycles effects on lifetime
estimation of {DFIG} power converter},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {549--555},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.069},
doi = {10.1016/J.MICROREL.2017.06.069},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangZYB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoC17,
author = {Xiangfu Zhao and
Wei{-}Ting Kary Chien},
title = {Exploration of baking temperature effects on 28 nm {BEOL} reliability},
journal = {Microelectron. Reliab.},
volume = {72},
pages = {1--4},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.019},
doi = {10.1016/J.MICROREL.2017.03.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoLZZ17,
author = {Xiao{-}Hong Zhao and
Hong{-}Liang Lu and
Yu{-}Ming Zhang and
Yimen Zhang},
title = {Model of phonon contribution to nonionizing energy loss {(NIEL)} for
InP/InGaAs heterojunction},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {156--160},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.097},
doi = {10.1016/J.MICROREL.2017.07.097},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoLZZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoQZLSMHL17,
author = {Yue Zhao and
Lina Qiu and
Ke Zhao and
Kai Li and
Yunlong Sun and
Lingkang Meng and
Zhe Huang and
Ting Li},
title = {Effect of 805 nm on reliability of 735/805/850-nm {LED} involved near-infrared
spectroscopy biomedical device},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {406--410},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.05.027},
doi = {10.1016/J.MICROREL.2017.05.027},
timestamp = {Fri, 28 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhaoQZLSMHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoYSYCL17,
author = {Qifeng Zhao and
Guoqing Yang and
YongJie Sun and
PeiFu Yu and
Jianjun Chen and
Bin Liang},
title = {Research on the effect of single-event transient of an on-chip linear
voltage regulator fabricated on 130 nm commercial {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {73},
pages = {116--121},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.04.030},
doi = {10.1016/J.MICROREL.2017.04.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoYSYCL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoZF17,
author = {Youhu Zhao and
Enrico Zio and
Guicui Fu},
title = {Remaining storage life prediction for an electromagnetic relay by
a particle filtering-based method},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {221--230},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.026},
doi = {10.1016/J.MICROREL.2017.03.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoZF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhongKXL17,
author = {Fulin Zhong and
Zhenglun Kong and
Guoyi Xu and
Ting Li},
title = {High stability and robustness of a developed novel laser acupuncture
theranostic device},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {401--405},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.071},
doi = {10.1016/J.MICROREL.2017.07.071},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhongKXL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhouHPH17,
author = {Xunfei Zhou and
Sheng{-}Jen Hsieh and
Bo Peng and
Daniel Hsieh},
title = {Cycle life estimation of lithium-ion polymer batteries using artificial
neural network and support vector machine with time-resolved thermography},
journal = {Microelectron. Reliab.},
volume = {79},
pages = {48--58},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.10.013},
doi = {10.1016/J.MICROREL.2017.10.013},
timestamp = {Thu, 15 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhouHPH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuLYKZ17,
author = {Wenyi Zhu and
Binghan Li and
Tao Yu and
Weiran Kong and
Shichang Zou},
title = {Investigation of read disturb in split-gate memory and its feasible
solution},
journal = {Microelectron. Reliab.},
volume = {68},
pages = {51--56},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.11.009},
doi = {10.1016/J.MICROREL.2016.11.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuLYKZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZiboldDSKK17,
author = {Andreas Zibold and
Maximilian Dammann and
Ralf Schmidt and
Helmer Konstanzer and
Michael Kunzer},
title = {Influence of air pollutants on the lifetime of LEDs and analysis of
degradation effects},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {566--570},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.019},
doi = {10.1016/J.MICROREL.2017.07.019},
timestamp = {Tue, 01 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZiboldDSKK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZuWK17,
author = {Tianpei Zu and
Meilin Wen and
Rui Kang},
title = {An optimal evaluating method for uncertainty metrics in reliability
based on uncertain data envelopment analysis},
journal = {Microelectron. Reliab.},
volume = {75},
pages = {283--287},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.03.033},
doi = {10.1016/J.MICROREL.2017.03.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZuWK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZumuukhorolKYWL17,
author = {Munkhsaikhan Zumuukhorol and
Zagarzusem Khurelbaatar and
Shim{-}Hoon Yuk and
Jonghan Won and
Sungnam Lee and
Chel{-}Jong Choi},
title = {Effects of finger dimension on low-frequency noise and optoelectronic
properties of Ge metal-semiconductor-metal photodetectors with interdigitated
Pt finger electrodes},
journal = {Microelectron. Reliab.},
volume = {69},
pages = {60--65},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2016.12.001},
doi = {10.1016/J.MICROREL.2016.12.001},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZumuukhorolKYWL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/dAlessandroCMCR17,
author = {Vincenzo d'Alessandro and
Antonio Pio Catalano and
Alessandro Magnani and
Lorenzo Codecasa and
Niccol{\`{o}} Rinaldi and
Brian Moser and
Peter J. Zampardi},
title = {Simulation comparison of InGaP/GaAs {HBT} thermal performance in wire-bonding
and flip-chip technologies},
journal = {Microelectron. Reliab.},
volume = {78},
pages = {233--242},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.09.011},
doi = {10.1016/J.MICROREL.2017.09.011},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/dAlessandroCMCR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Aal16,
author = {Andreas Aal},
title = {Reliability management - The central enabler for advanced Technologies
in Automotive},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {13--18},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.117},
doi = {10.1016/J.MICROREL.2016.07.117},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Aal16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbasIAAK16,
author = {Aizat Abas and
Muhammad Hafifi Hafiz Ishak and
Mohd Zulkifly Abdullah and
F. Che Ani and
Soon Fuat Khor},
title = {Lattice Boltzmann method study of bga bump arrangements on void formation},
journal = {Microelectron. Reliab.},
volume = {56},
pages = {170--181},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.10.014},
doi = {10.1016/J.MICROREL.2015.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbasIAAK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AdliJ16,
author = {A. R. Rezaie Adli and
Kaspar M. B. Jansen},
title = {Numerical investigation and experimental validation of residual stresses
building up in microelectronics packaging},
journal = {Microelectron. Reliab.},
volume = {62},
pages = {26--38},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.03.015},
doi = {10.1016/J.MICROREL.2016.03.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AdliJ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AgostinhoGW16,
author = {Peterson R. Agostinho and
Odair Lelis Goncalez and
Gilson I. Wirth},
title = {Rail to rail radiation hardened operational amplifier in standard
{CMOS} technology with standard layout techniques},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {99--103},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.11.001},
doi = {10.1016/J.MICROREL.2016.11.001},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AgostinhoGW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AguiarZMR16,
author = {Y. Q. de Aguiar and
Alexandra L. Zimpeck and
Cristina Meinhardt and
Ricardo Augusto da Luz Reis},
title = {Permanent and single event transient faults reliability evaluation
{EDA} tool},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {63--67},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.072},
doi = {10.1016/J.MICROREL.2016.07.072},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AguiarZMR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Al-RashedDKSW16,
author = {Mohsen H. Al{-}Rashed and
Grzegorz Dzido and
Mateusz Korpys and
Jacek Smolka and
Janusz W{\'{o}}jcik},
title = {Investigation on the {CPU} nanofluid cooling},
journal = {Microelectron. Reliab.},
volume = {63},
pages = {159--165},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.06.016},
doi = {10.1016/J.MICROREL.2016.06.016},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Al-RashedDKSW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AliSJS16,
author = {Bakhtiar Ali and
Mohd Faizul Mohd Sabri and
Iswadi Jauhari and
Nazatul Liana Sukiman},
title = {Impact toughness, hardness and shear strength of Fe and Bi added Sn-1Ag-0.5Cu
lead-free solders},
journal = {Microelectron. Reliab.},
volume = {63},
pages = {224--230},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.05.004},
doi = {10.1016/J.MICROREL.2016.05.004},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AliSJS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlordaCTB16,
author = {Bartomeu Alorda and
Cristian Carmona and
Gabriel Torrens and
Sebasti{\`{a}} A. Bota},
title = {An affordable experimental technique for {SRAM} write margin characterization
for nanometer {CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {65},
pages = {280--288},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.154},
doi = {10.1016/J.MICROREL.2016.07.154},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlordaCTB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AnderssonIVK16,
author = {Caroline Andersson and
Jonny Ingman and
Elise Varescon and
Mika Kiviniemi},
title = {Detection of cracks in multilayer ceramic capacitors by X-ray imaging},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {352--356},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.110},
doi = {10.1016/J.MICROREL.2016.07.110},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AnderssonIVK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndresenBL16,
author = {Markus Andresen and
Giampaolo Buticchi and
Marco Liserre},
title = {Study of reliability-efficiency tradeoff of active thermal control
for power electronic systems},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {119--125},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.017},
doi = {10.1016/J.MICROREL.2015.12.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AndresenBL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArabiTMDMW16,
author = {Faical Arabi and
Loic Th{\'{e}}olier and
Donatien Martineau and
Jean{-}Yves Del{\'{e}}tage and
M. Medina and
Eric Woirgard},
title = {Power electronic assemblies: Thermo-mechanical degradations of gold-tin
solder for attaching devices},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {409--414},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.028},
doi = {10.1016/J.MICROREL.2016.07.028},
timestamp = {Sun, 06 Oct 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ArabiTMDMW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArehartSVPHR16,
author = {Aaron R. Arehart and
A. Sasikumar and
Glen David Via and
Brian S. Poling and
E. R. Heller and
S. A. Ringel},
title = {Evidence for causality between GaN {RF} {HEMT} degradation and the
E\({}_{\mbox{C}}\)-0.57 eV trap in GaN},
journal = {Microelectron. Reliab.},
volume = {56},
pages = {45--48},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.007},
doi = {10.1016/J.MICROREL.2015.11.007},
timestamp = {Fri, 29 Nov 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ArehartSVPHR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArjmandACLMJ16,
author = {Elaheh Arjmand and
Pearl A. Agyakwa and
Martin R. Corfield and
Jianfeng Li and
Bassem Mouawad and
C. Mark Johnson},
title = {A thermal cycling reliability study of ultrasonically bonded copper
wires},
journal = {Microelectron. Reliab.},
volume = {59},
pages = {126--133},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.01.009},
doi = {10.1016/J.MICROREL.2016.01.009},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ArjmandACLMJ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsenovSTWZ16,
author = {Asen Asenov and
Ulf Schlichtmann and
Cher Ming Tan and
Hei Wong and
Xing Zhou},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {61},
pages = {1--2},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.03.028},
doi = {10.1016/J.MICROREL.2016.03.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AsenovSTWZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AuerspergCDVW16,
author = {J{\"{u}}rgen Auersperg and
Christian Collet and
Thierry Dean and
Dietmar Vogel and
Thomas Winkler},
title = {Effects of residual stresses on cracking and delamination risks of
an avionics {MEMS} pressure sensor},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {665--668},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.084},
doi = {10.1016/J.MICROREL.2016.07.084},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AuerspergCDVW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzimiDS16,
author = {Sarah Azimi and
Boyang Du and
Luca Sterpone},
title = {On the prediction of radiation-induced SETs in flash-based FPGAs},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {230--234},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.106},
doi = {10.1016/J.MICROREL.2016.07.106},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AzimiDS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzizaP16,
author = {Hassen Aziza and
Jean{-}Michel Portal},
title = {Resistive {RAM} variability monitoring using a ring oscillator based
test chip},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {59--62},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.097},
doi = {10.1016/J.MICROREL.2016.07.097},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AzizaP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaghdadiBDGV16,
author = {Issam Baghdadi and
Olivier Briat and
Jean{-}Yves Del{\'{e}}tage and
Philippe Gyan and
Jean{-}Michel Vinassa},
title = {Chemical rate phenomenon approach applied to lithium battery capacity
fade estimation},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {134--139},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.058},
doi = {10.1016/J.MICROREL.2016.07.058},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaghdadiBDGV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bahat-TreidelHT16,
author = {Eldad Bahat{-}Treidel and
Oliver Hilt and
O. Bahat Treidel and
Joachim W{\"{u}}rfl},
title = {Temperature dependent dynamic on-state resistance in GaN-on-Si based
normally-off HFETs},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {556--559},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.077},
doi = {10.1016/J.MICROREL.2016.07.077},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Bahat-TreidelHT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BahmanIB16,
author = {Amir Sajjad Bahman and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {Mission-profile-based stress analysis of bond-wires in SiC power modules},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {419--424},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.102},
doi = {10.1016/J.MICROREL.2016.07.102},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BahmanIB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bairi16,
author = {Abderrahmane Ba{\"{\i}}ri},
title = {Free convective heat transfer coefficient for high powered and tilted
{QFN64} electronic device},
journal = {Microelectron. Reliab.},
volume = {66},
pages = {85--91},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.09.009},
doi = {10.1016/J.MICROREL.2016.09.009},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Bairi16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BajwaW16,
author = {Adeel Ahmad Bajwa and
J{\"{u}}rgen Wilde},
title = {Reliability modeling of Sn-Ag transient liquid phase die-bonds for
high-power SiC devices},
journal = {Microelectron. Reliab.},
volume = {60},
pages = {116--125},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.02.016},
doi = {10.1016/J.MICROREL.2016.02.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BajwaW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BanuSMMG16,
author = {Viorel Banu and
Victor Soler and
Josep Montserrat and
Jos{\'{e}} Mill{\'{a}}n and
Philippe Godignon},
title = {Power cycling analysis method for high-voltage SiC diodes},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {429--433},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.047},
doi = {10.1016/J.MICROREL.2016.07.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BanuSMMG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarinkMJ16,
author = {Marco Barink and
A. Mavinkurve and
J. Janssen},
title = {Predicting non-Fickian moisture diffusion in EMCs for application
in micro-electronic devices},
journal = {Microelectron. Reliab.},
volume = {62},
pages = {45--49},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.03.016},
doi = {10.1016/J.MICROREL.2016.03.016},
timestamp = {Wed, 18 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BarinkMJ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarlettaN16,
author = {Giacomo Barletta and
V. C. Ngwan},
title = {Study of gate leakage mechanism in advanced charge-coupled {MOSFET}
{(CC-MOSFET)} technology},
journal = {Microelectron. Reliab.},
volume = {57},
pages = {20--23},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.019},
doi = {10.1016/J.MICROREL.2015.11.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarlettaN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BartraVR16,
author = {Walter E. Calienes Bartra and
Andrei Vladimirescu and
Ricardo Augusto da Luz Reis},
title = {{FDSOI} and Bulk {CMOS} {SRAM} Cell Resilience to Radiation Effects},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {152--157},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.133},
doi = {10.1016/J.MICROREL.2016.07.133},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BartraVR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BatunluA16,
author = {Canras Batunlu and
Al{-}Hussein Albarbar},
title = {Real-time system for monitoring the electro-thermal behaviour of power
electronic devices used in boost converters},
journal = {Microelectron. Reliab.},
volume = {62},
pages = {82--90},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.03.033},
doi = {10.1016/J.MICROREL.2016.03.033},
timestamp = {Tue, 21 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BatunluA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeckmeierM16,
author = {Daniel Beckmeier and
Andreas Martin},
title = {Plasma process induced damage detection by fast wafer level reliability
monitoring for automotive applications},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {189--193},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.129},
doi = {10.1016/J.MICROREL.2016.07.129},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeckmeierM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelaidKS16,
author = {Mohamed Ali Bela{\"{\i}}d and
H. Kaouach and
Jaleleddine Ben Hadj Slama},
title = {Evolution study of the ElectroMagnetic Interference for {RF} {LDMOS}
in series chopper application after thermal accelerated tests},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {93--97},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.109},
doi = {10.1016/J.MICROREL.2016.07.109},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BelaidKS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bensoussan16,
author = {Alain Bensoussan},
title = {How to quantify and predict long term multiple stress operation: Application
to Normally-Off Power GaN transistor technologies},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {103--112},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.020},
doi = {10.1016/J.MICROREL.2015.12.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bensoussan16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenvegnuLMQRZB16,
author = {Agostino Benvegn{\`{u}} and
Sylvain Laurent and
Matteo Meneghini and
Raymond Qu{\'{e}}r{\'{e}} and
Jean{-}Luc Roux and
Enrico Zanoni and
Denis Barataud},
title = {Continuous time-domain {RF} waveforms monitoring under overdrive stress
condition of AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {535--540},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.122},
doi = {10.1016/J.MICROREL.2016.07.122},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BenvegnuLMQRZB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BerryTHZNL16,
author = {David Berry and
Adrian Townsend and
Weikun He and
Hanguang Zheng and
Khai D. T. Ngo and
Guo{-}Quan Lu},
title = {Thermal characterization of planar high temperature power module packages
with sintered nanosilver interconnection},
journal = {Microelectron. Reliab.},
volume = {63},
pages = {104--110},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.04.008},
doi = {10.1016/J.MICROREL.2016.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BerryTHZNL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BishnoiLGZ16,
author = {Rimpy Bishnoi and
Vijay Laxmi and
Manoj Singh Gaur and
Mark Zwolinski},
title = {Resilient routing implementation in 2D mesh NoC},
journal = {Microelectron. Reliab.},
volume = {56},
pages = {189--201},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.003},
doi = {10.1016/J.MICROREL.2015.11.003},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BishnoiLGZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoscaroJMSPB16,
author = {Anthony Boscaro and
Sabir Jacquir and
Kevin Melendez and
Kevin Sanchez and
Philippe Perdu and
St{\'{e}}phane Binczak},
title = {Automatic process for time-frequency scan of {VLSI}},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {299--305},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.052},
doi = {10.1016/J.MICROREL.2016.07.052},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BoscaroJMSPB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoscoSK16,
author = {Nick Bosco and
Timothy J. Silverman and
Sarah Kurtz},
title = {Climate specific thermomechanical fatigue of flat plate photovoltaic
module solder joints},
journal = {Microelectron. Reliab.},
volume = {62},
pages = {124--129},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.03.024},
doi = {10.1016/J.MICROREL.2016.03.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoscoSK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BouguezziAG16,
author = {Sihem Bouguezzi and
Moez Ayadi and
Moez Ghariani},
title = {Developing a Simplified Analytical Thermal Model of Multi-chip Power
Module},
journal = {Microelectron. Reliab.},
volume = {66},
pages = {64--77},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.09.022},
doi = {10.1016/J.MICROREL.2016.09.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BouguezziAG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrandSKJPA16,
author = {Sebastian Brand and
Mich{\'{e}}l Simon{-}Najasek and
Michael K{\"{o}}gel and
Joerg Jatzkowski and
R. Portius and
Frank Altmann},
title = {Detection and analysis of stress-induced voiding in Al-power lines
by acoustic GHz-microscopy},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {341--345},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.041},
doi = {10.1016/J.MICROREL.2016.07.041},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BrandSKJPA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BravaixCFNMH16,
author = {Alain Bravaix and
Florian Cacho and
X. Federspiel and
Cheikh Ndiaye and
Souhir Mhira and
Vincent Huard},
title = {Potentiality of healing techniques in hot-carrier damaged 28 nm {FDSOI}
{CMOS} nodes},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {163--167},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.092},
doi = {10.1016/J.MICROREL.2016.07.092},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BravaixCFNMH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrezmesB16,
author = {Angel Ochoa Brezmes and
Cornelia Breitkopf},
title = {Mechanical analysis of wafer testing with {FEM} simulations},
journal = {Microelectron. Reliab.},
volume = {63},
pages = {166--182},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.06.006},
doi = {10.1016/J.MICROREL.2016.06.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrezmesB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrinckerKPP16,
author = {Mads Brincker and
Peter Kj{\ae}r Kristensen and
Kristian Bonderup Pedersen and
Vladimir N. Popok},
title = {Mechanisms of metallization degradation in high power diodes},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {489--493},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.033},
doi = {10.1016/J.MICROREL.2016.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrinckerKPP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BroasGSPAJB16,
author = {Mikael Broas and
Andreas Graff and
Mich{\'{e}}l Simon{-}Najasek and
David Poppitz and
Frank Altmann and
Helmut Jung and
Herv{\'{e}} Blanck},
title = {Correlation of gate leakage and local strain distribution in GaN/AlGaN
{HEMT} structures},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {541--546},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.050},
doi = {10.1016/J.MICROREL.2016.07.050},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BroasGSPAJB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuMW16,
author = {Fan Bu and
Qing Ma and
Zheyao Wang},
title = {Delamination of bonding Interface between benzocyclobutene {(BCB)}
and silicon dioxide/silicon nitride},
journal = {Microelectron. Reliab.},
volume = {65},
pages = {225--233},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.08.003},
doi = {10.1016/J.MICROREL.2016.08.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BuMW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuffoloMSFRMZ16,
author = {Matteo Buffolo and
Matteo Meneghini and
Carlo De Santi and
Henry Felber and
N. Renso and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Experimental observation of TDDB-like behavior in reverse-biased green
InGaN LEDs},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {610--613},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.103},
doi = {10.1016/J.MICROREL.2016.07.103},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BuffoloMSFRMZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusekDRPMUS16,
author = {David Busek and
Karel Dusek and
D. Ruzicka and
M. Placek and
P. Mach and
J. Urb{\'{a}}nek and
Jir{\'{\i}} Star{\'{y}}},
title = {Flux effect on void quantity and size in soldered joints},
journal = {Microelectron. Reliab.},
volume = {60},
pages = {135--140},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.03.009},
doi = {10.1016/J.MICROREL.2016.03.009},
timestamp = {Mon, 23 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BusekDRPMUS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaddemiCSP16,
author = {Alina Caddemi and
Emanuele Cardillo and
Giuseppe Salvo and
Salvatore Patan{\`{e}}},
title = {Microwave effects of {UV} light exposure of a GaN {HEMT:} Measurements
and model extraction},
journal = {Microelectron. Reliab.},
volume = {65},
pages = {310--317},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.08.020},
doi = {10.1016/J.MICROREL.2016.08.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaddemiCSP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaiLNWSN16,
author = {Hao Cai and
Kaikai Liu and
Lirida Alves de Barros Naviner and
You Wang and
Mariem Slimani and
Jean{-}Fran{\c{c}}ois Naviner},
title = {Efficient reliability evaluation methodologies for combinational circuits},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {19--25},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.116},
doi = {10.1016/J.MICROREL.2016.07.116},
timestamp = {Wed, 11 Dec 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaiLNWSN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaiYZHLXZZC16,
author = {Miao Cai and
Dao{-}Guo Yang and
Jianna Zheng and
Jianlin Huang and
Dongjing Liu and
Jing Xiao and
Ping Zhang and
Guoqi Zhang and
Xianping Chen},
title = {Effects of stress-loading test methods on the degradation of light-emitting
diode modules},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {635--639},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.009},
doi = {10.1016/J.MICROREL.2016.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaiYZHLXZZC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CanetPA16,
author = {Pierre Canet and
J{\'{e}}r{\'{e}}my Postel{-}Pellerin and
Hassen Aziza},
title = {Impact of resistive paths on {NVM} array reliability: Application
to Flash {\&} ReRAM memories},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {36--41},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.096},
doi = {10.1016/J.MICROREL.2016.07.096},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CanetPA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CastellazziFRYR16,
author = {Alberto Castellazzi and
Asad Fayyaz and
Gianpaolo Romano and
Li Yang and
Michele Riccio and
Andrea Irace},
title = {SiC power MOSFETs performance, robustness and technology maturity},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {164--176},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.034},
doi = {10.1016/J.MICROREL.2015.12.034},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CastellazziFRYR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CatelaniCV16,
author = {Marcantonio Catelani and
Lorenzo Ciani and
Matteo Venzi},
title = {Component Reliability Importance assessment on complex systems using
Credible Improvement Potential},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {113--119},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.055},
doi = {10.1016/J.MICROREL.2016.07.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CatelaniCV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CerdeiraEMPI16,
author = {Antonio Cerdeira and
Magali Estrada and
Llu{\'{\i}}s F. Marsal and
Josep Pallar{\`{e}}s and
Benjam{\'{\i}}n I{\~{n}}{\'{\i}}guez},
title = {On the series resistance in staggered amorphous thin film transistors},
journal = {Microelectron. Reliab.},
volume = {63},
pages = {325--335},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.05.005},
doi = {10.1016/J.MICROREL.2016.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CerdeiraEMPI16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChanTLT16,
author = {Marvin Chan and
Cher Ming Tan and
Kheng Chooi Lee and
Chuan Seng Tan},
title = {Non-destructive degradation study of copper wire bond for its temperature
cycling reliability evaluation},
journal = {Microelectron. Reliab.},
volume = {61},
pages = {56--63},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.026},
doi = {10.1016/J.MICROREL.2015.12.026},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChanTLT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChaoHCLHKL16,
author = {Shin{-}Hua Chao and
Chih{-}Ping Hung and
Mark Chen and
Youru Lee and
Joey Huang and
Golden Kao and
Ding{-}Bang Luh},
title = {An embedded trace {FCCSP} substrate without glass cloth},
journal = {Microelectron. Reliab.},
volume = {57},
pages = {101--110},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.016},
doi = {10.1016/J.MICROREL.2015.11.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChaoHCLHKL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CheZL16,
author = {Fa Xing Che and
Xiaowu Zhang and
Jong{-}Kai Lin},
title = {Reliability study of 3D {IC} packaging based on through-silicon interposer
{(TSI)} and silicon-less interconnection technology {(SLIT)} using
finite element analysis},
journal = {Microelectron. Reliab.},
volume = {61},
pages = {64--70},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.041},
doi = {10.1016/J.MICROREL.2015.12.041},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CheZL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenFHBL16,
author = {Weinan Chen and
J{\"{o}}rg Franke and
Christian Herold and
Riteshkumar Bhojani and
Josef Lutz},
title = {Internal processes in power semiconductors at virtual junction temperature
measurement},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {464--468},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.125},
doi = {10.1016/J.MICROREL.2016.07.125},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenFHBL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenKWTINNK16,
author = {J. Chen and
Takamasa Kawanago and
Hitoshi Wakabayashi and
Kazuo Tsutsui and
Hiroshi Iwai and
D. Nohata and
Hiroshi Nohira and
Kuniyuki Kakushima},
title = {La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) gate dielectrics for AlGaN/GaN
{HEMT}},
journal = {Microelectron. Reliab.},
volume = {60},
pages = {16--19},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.02.004},
doi = {10.1016/J.MICROREL.2016.02.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenKWTINNK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenNAaRMNLM16,
author = {Changqing Chen and
P. T. Ng and
Ghinboon Ang and
H. Tan and
Francis Rivai and
Y. Z. Ma and
Huipeng Ng and
Jeffrey Lam and
Zhihong Mai},
title = {Electrical analysis on implantation-related defect by nanoprobing
methodology},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {317--320},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.091},
doi = {10.1016/J.MICROREL.2016.07.091},
timestamp = {Thu, 10 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenNAaRMNLM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenQACXS16,
author = {Si Chen and
Fei Qin and
Tong An and
Pei Chen and
Bin Xie and
Xunqing Shi},
title = {Protrusion of electroplated copper filled in through silicon vias
during annealing process},
journal = {Microelectron. Reliab.},
volume = {63},
pages = {183--193},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.04.005},
doi = {10.1016/J.MICROREL.2016.04.005},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenQACXS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-12-20 15:43 CET from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
