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ORCIDAmir Sajjad Bahman
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2020 – today
- 2024
[j9]Babak Rooholahi
, Yam Prasad Siwakoti, Hans-Guenter Eckel, Frede Blaabjerg, Amir Sajjad Bahman:
Enhanced Single-Inductor Single-Input Dual-Output DC-DC Converter With Voltage Balancing Capability. IEEE Trans. Ind. Electron. 71(7): 7241-7251 (2024)- 2022
- [j8]Qiang Wang, Jingwei Zhang, Francesco Iannuzzo, Amir Sajjad Bahman, Weifeng Zhang, Fengyou He:
Improved Temperature Monitoring and Protection Method of Three-Level NPC Application Based on Half-Bridge IGBT Modules. IEEE Access 10: 35605-35619 (2022) - 2021
- [j7]Ahmed Abuelnaga, Mehdi Narimani, Amir Sajjad Bahman:
A Review on IGBT Module Failure Modes and Lifetime Testing. IEEE Access 9: 9643-9663 (2021) - [j6]Mohsen Akbari, Mohammad Tavakoli Bina, Amir Sajjad Bahman, Bahman Eskandari, Edris Pouresmaeil, Frede Blaabjerg:
An Extended Multilayer Thermal Model for Multichip IGBT Modules Considering Thermal Aging. IEEE Access 9: 84217-84230 (2021) - [j5]Tomàs Lledó-Ponsati, Amir Sajjad Bahman, Francesco Iannuzzo, Daniel Montesinos-Miracle, Samuel Galceran-Arellano:
Effect of Current Distortion and Unbalanced Loads on Semiconductors Reliability. IEEE Access 9: 162660-162670 (2021)
2010 – 2019
- 2019
- [c4]Omid Alavi, Amir Sajjad Bahman:
A Methodology for Rapid Estimation of Junction Temperature of Power Semiconductors Considering Mission Profiles. ISIE 2019: 2359-2364 - 2018
- [j4]Amir Sajjad Bahman, S. M. Jensen, Francesco Iannuzzo:
Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses. Microelectron. Reliab. 88-90: 304-308 (2018) - [j3]Mohsen Akbari, Amir Sajjad Bahman, Paula Diaz Reigosa, Francesco Iannuzzo, Mohammad Tavakoli Bina:
Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions. Microelectron. Reliab. 88-90: 1135-1140 (2018) - 2017
- [j2]Amir Sajjad Bahman, Francesco Iannuzzo, T. Holmgaard, R. Ø. Nielsen, Frede Blaabjerg:
Reliability-oriented environmental thermal stress analysis of fuses in power electronics. Microelectron. Reliab. 76-77: 25-30 (2017) - [c3]Lorenzo Ceccarelli, Paula Diaz Reigosa, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg:
Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions. IECON 2017: 4879-4884 - 2016
- [j1]Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg:
Mission-profile-based stress analysis of bond-wires in SiC power modules. Microelectron. Reliab. 64: 419-424 (2016) - 2013
- [c2]Poh Chiang Loh, Amir Sajjad Bahman, Zian Qin, Frede Blaabjerg:
Evaluation of switch currents in nine-switch energy conversion systems. IECON 2013: 755-760 - [c1]Amir Sajjad Bahman, Frede Blaabjerg:
Comparison between 9-level hybrid asymmetric and conventional multi-level inverters for medium voltage application. ISIE 2013: 1-7
Coauthor Index
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