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ORCIDAli Keshavarzi
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2020 – today
- 2024
[j17]Sunshine A. De Caires, Ali Keshavarzi, Eduardo Leonel Bottega
, Fuat Kaya:
Towards site-specific management of soil organic carbon: Comparing support vector machine and ordinary kriging approaches based on pedo-geomorphometric factors. Comput. Electron. Agric. 216: 108545 (2024)- [c27]Ali Keshavarzi, Elsa Angelini:
Few-Shot Airway-Tree Modeling Using Data-Driven Sparse Priors. ISBI 2024: 1-5 - [i2]Ali Keshavarzi, Elsa Angelini:
Few-Shot Airway-Tree Modeling using Data-Driven Sparse Priors. CoRR abs/2407.04507 (2024) - 2021
- [j16]Ali Keshavarzi, Henry Oppong Tuffour, Jimmy Clifford Oppong, Mojtaba Zeraatpisheh, Vinod Kumar:
Dealing with soil organic carbon modeling: some insights from an agro-ecosystem in Northeast Iran. Earth Sci. Informatics 14(4): 1833-1845 (2021) - 2020
- [j15]Ali Keshavarzi, Kai Ni, Wilbert van den Hoek, Suman Datta, Arijit Raychowdhury:
FerroElectronics for Edge Intelligence. IEEE Micro 40(6): 33-48 (2020)
2010 – 2019
- 2019
- [j14]Jesús Rodrigo-Comino, Ali Keshavarzi, Mojtaba Zeraatpisheh, Yeboah Gyasi-Agyei, Artemi Cerdà:
Determining the best ISUM (Improved stock unearthing Method) sampling point number to model long-term soil transport and micro-topographical changes in vineyards. Comput. Electron. Agric. 159: 147-156 (2019) - [j13]Ali Keshavarzi, Wilbert van den Hoek:
Edge Intelligence - On the Challenging Road to a Trillion Smart Connected IoT Devices. IEEE Des. Test 36(2): 41-64 (2019) - 2017
- [j12]Jalal Shiri, Ali Keshavarzi, Özgür Kisi, Ursula Iturrarán-Viveros, Ali Bagherzadeh, Seyed Rohollah Mousavi, Sepideh Karimi:
Modeling soil cation exchange capacity using soil parameters: Assessing the heuristic models. Comput. Electron. Agric. 135: 242-251 (2017) - [j11]Jalal Shiri, Ali Keshavarzi, Özgür Kisi, Sepideh Karimi:
Using soil easily measured parameters for estimating soil water capacity: Soft computing approaches. Comput. Electron. Agric. 141: 327-339 (2017) - 2014
- [c26]Ali Keshavarzi, Dinesh Maheshwari, Derwin Mattos, Ravi Kapre, Sandeep Krishnegowda, Morgan Whately, Sudhir Gopalswamy:
Directions in future of SRAM with QDR-WideIO for high performance networking applications and beyond. CICC 2014: 1-6 - 2013
- [c25]Shekhar Borkar, Uming Ko, Ali Keshavarzi, Eugenio Cantatore:
EP3: Empowering the killer SoC applications of 2020. ISSCC 2013: 517 - 2011
- [j10]Ali Keshavarzi, Fereydoon Sarmadian, Reza Labbafi, Abbas Ahmadi:
Developing Pedotransfer Functions for Estimating Field Capacity and Permanent Wilting Point Using Fuzzy Table Look-up Scheme. Comput. Inf. Sci. 4(1): 130-141 (2011)
2000 – 2009
- 2009
- [j9]Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Borkar, Vivek K. De, Ali Keshavarzi:
2 GHz 2 Mb 2T Gain Cell Memory Macro With 128 GBytes/sec Bandwidth in a 65 nm Logic Process Technology. IEEE J. Solid State Circuits 44(1): 174-185 (2009) - [e3]Jörg Henkel, Ali Keshavarzi, Naehyuck Chang, Tahir Ghani:
Proceedings of the 2009 International Symposium on Low Power Electronics and Design, 2009, San Fancisco, CA, USA, August 19-21, 2009. ACM 2009, ISBN 978-1-60558-684-7 [contents] - 2008
- [c24]Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Y. Borkar, Vivek De, Ali Keshavarzi:
2GHz 2Mb 2T Gain-Cell Memory Macro with 128GB/s Bandwidth in a 65nm Logic Process. ISSCC 2008: 274-275 - [e2]Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle:
Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008. ACM 2008, ISBN 978-1-60558-109-5 [contents] - 2007
- [e1]Diana Marculescu, Anand Raghunathan, Ali Keshavarzi, Vijaykrishnan Narayanan:
Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007. ACM 2007, ISBN 978-1-59593-709-4 [contents] - [i1]José Luis Rosselló, Vicent Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura:
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs. CoRR abs/0710.4759 (2007) - 2006
- [j8]Sebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura:
Impact of Thermal Gradients on Clock Skew and Testing. IEEE Des. Test Comput. 23(5): 414-424 (2006) - 2005
- [c23]José Luis Rosselló, Vicent Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura:
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs. DATE 2005: 206-211 - [c22]James W. Tschanz, Siva G. Narendra, Ali Keshavarzi, Vivek De:
Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power. ISCAS (1) 2005: 9-12 - [c21]Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De:
Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED 2005: 26-29 - [c20]Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay:
Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF. VLSI Design 2005: 12-13 - 2004
- [j7]Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi:
DFT for Delay Fault Testing of High-Performance Digital Circuits. IEEE Des. Test Comput. 21(3): 248-258 (2004) - [c19]Arman Vassighi, Ali Keshavarzi, Siva G. Narendra, Gerhard Schrom, Yibin Ye, Seri Lee, Greg Chrysler, Manoj Sachdev, Vivek De:
Design optimizations for microprocessors at low temperature. DAC 2004: 2-5 - [c18]Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi:
A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ITC 2004: 1108-1117 - [c17]Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi:
Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. ITC 2004: 1276-1284 - 2003
- [j6]Siva G. Narendra, Ali Keshavarzi, Bradley A. Bloechel, Shekhar Borkar, Vivek De:
Forward body bias for microprocessors in 130-nm technology generation and beyond. IEEE J. Solid State Circuits 38(5): 696-701 (2003) - [j5]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. IEEE Trans. Very Large Scale Integr. Syst. 11(5): 863-870 (2003) - [c16]Charles F. Hawkins, Ali Keshavarzi, Jaume Segura:
CMOS IC nanometer technology failure mechanisms. CICC 2003: 605-611 - [c15]Shekhar Borkar, Tanay Karnik, Siva G. Narendra, James W. Tschanz, Ali Keshavarzi, Vivek De:
Parameter variations and impact on circuits and microarchitecture. DAC 2003: 338-342 - [c14]Charles F. Hawkins, Ali Keshavarzi, Jaume Segura:
A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT 2003: 267- - [c13]Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi:
Thermal Management of High Performance Microprocessors. DFT 2003: 313-319 - [c12]Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins:
Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC 2003: 95-104 - [c11]Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura:
CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. ITC 2003: 719-726 - 2002
- [j4]Zhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy:
IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions. IEEE Des. Test Comput. 19(2): 24-33 (2002) - [j3]Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins:
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19(5): 36-43 (2002) - [j2]Fatih Hamzaoglu, Yibin Ye, Ali Keshavarzi, Kevin Zhang, Siva G. Narendra, Shekhar Borkar, Mircea R. Stan, Vivek De:
Analysis of dual-VT SRAM cells with full-swing single-ended bit line sensing for on-chip cache. IEEE Trans. Very Large Scale Integr. Syst. 10(2): 91-95 (2002) - [c10]Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi:
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT 2002: 12-19 - [c9]Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins:
Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC 2002: 90-99 - [c8]Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi:
A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. ITC 2002: 1130-1139 - [c7]Zhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy:
IDDQ Testing for Deep Submicron ICs: Challenges and Solutions. LATW 2002: 186-192 - [c6]Jaume Segura, Vivek De, Ali Keshavarzi:
Challenges in Nanometric Technology Scaling: Trends and Projections. VTS 2002: 447-448 - 2001
- [c5]Ali Keshavarzi, Sean Ma, Siva G. Narendra, Brad Bloechel, K. Mistry, Tahir Ghani, Shekhar Borkar, Vivek De:
Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs. ISLPED 2001: 207-212 - [c4]Kaushik Roy, Ali Keshavarzi:
Design and Test of Low Voltage CMOS Circuits. ISQED 2001: 7 - 2000
- [j1]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins:
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 717-723 (2000) - [c3]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC 2000: 1051-1059
1990 – 1999
- 1999
- [c2]Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De:
Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED 1999: 252-254 - 1997
- [c1]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins:
Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC 1997: 146-155
Coauthor Index
aka: Vivek K. De
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last updated on 2024-10-07 22:22 CEST by the dblp team
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