"Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF."

Abhijit Chatterjee et al. (2005)

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DOI: 10.1109/ICVD.2005.161

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay:
Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF. VLSI Design 2005: 12-13

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