"Multiple-parameter CMOS IC testing with increased sensitivity for ..."

Ali Keshavarzi et al. (2003)

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DOI: 10.1109/TVLSI.2003.812298

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type: Journal Article

metadata version: 2020-03-11

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Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. IEEE Trans. Very Large Scale Integr. Syst. 11(5): 863-870 (2003)

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