"Leakage and Process Variation Effects in Current Testing on Future CMOS ..."

Ali Keshavarzi et al. (2002)

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DOI: 10.1109/MDT.2002.1033790

access: closed

type: Journal Article

metadata version: 2022-02-28

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Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins:
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19(5): 36-43 (2002)

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