"Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions."

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins (2000)

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DOI: 10.1109/92.902266

access: closed

type: Journal Article

metadata version: 2020-03-11

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Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins:
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 717-723 (2000)

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