• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
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Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 16 matches

• 2017
• 
  Cong Nguyen Dao, Abdallah El Kass, Mostafa Rahimi Azghadi, Craig T. Jin, Jonathan Scott, Philip Heng Wai Leong:
  An enhanced MOSFET threshold voltage model for the 6-300 K temperature range. Microelectron. Reliab. 69: 36-39 (2017)
• 
  Erping Deng, Zhibin Zhao, Peng Zhang, Yongzhang Huang, Jinyuan Li:
  Optimization of the thermal contact resistance within press pack IGBTs. Microelectron. Reliab. 69: 17-28 (2017)
• 
  Adam Dobri, Simon Jeannot, Fausto Piazza, Carine Jahan, Jean Coignus, Luca Perniola, Francis Balestra:
  Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory. Microelectron. Reliab. 69: 47-51 (2017)
• 
  Aleksandra Fortier, Michael G. Pecht:
  A perspective of the IPC report on lead-free electronics in military/aerospace applications. Microelectron. Reliab. 69: 66-70 (2017)
• 
  Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee:
  An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69: 100-108 (2017)
• 
  Min-Jung Kim, Ho-Kyung Kim:
  Effects of temperature and span amplitude on fretting corrosion behavior of tin-plated electrical contacts. Microelectron. Reliab. 69: 80-87 (2017)
• 
  Hosung Lee, Sanghyeon Baeg, Nelson Hua, Shi-Jie Wen:
  Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device. Microelectron. Reliab. 69: 88-99 (2017)
• 
  Shanshan Liu, Pedro Reviriego, Alfonso Sánchez-Macián, Juan Antonio Maestro, Liyi Xiao:
  Comments on "Extend orthogonal Latin square codes for 32-bit data protection in memory applications" Microelectron. Reliab. 63 278-283 (2016). Microelectron. Reliab. 69: 126-129 (2017)
• 
  Ibrahim Mezzah, Hamimi Chemali, Omar Kermia:
  Emulation-based fault analysis on RFID tags for robustness and security evaluation. Microelectron. Reliab. 69: 115-125 (2017)
• 
  Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez:
  A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69: 1-16 (2017)
• 
  Ramin Rajaei:
  Single event double node upset tolerance in MOS/spintronic sequential and combinational logic circuits. Microelectron. Reliab. 69: 109-114 (2017)
• 
  N. Shiwakoti, A. Bobby, K. Asokan, Bobby Antony:
  The role of electronic energy loss in SHI irradiated Ni/oxide/n-GaP Schottky diode. Microelectron. Reliab. 69: 40-46 (2017)
• 
  K. H. Song, J. S. Jang:
  Semiconductor package qualification based on the swelling temperature. Microelectron. Reliab. 69: 71-79 (2017)
• 
  Shiva Taghipour, Rahebeh Niaraki Asli:
  Aging comparative analysis of high-performance FinFET and CMOS flip-flops. Microelectron. Reliab. 69: 52-59 (2017)
• 
  Karthikeyan Venkitusamy, Sanjeevikumar Padmanaban, Michael G. Pecht, Abhishek Awasthi, Rajasekar Selvamuthukumaran:
  A modified boost rectifier for elimination of circulating current in power factor correction applications. Microelectron. Reliab. 69: 29-35 (2017)
• 
  Munkhsaikhan Zumuukhorol, Zagarzusem Khurelbaatar, Shim-Hoon Yuk, Jonghan Won, Sungnam Lee, Chel-Jong Choi:
  Effects of finger dimension on low-frequency noise and optoelectronic properties of Ge metal-semiconductor-metal photodetectors with interdigitated Pt finger electrodes. Microelectron. Reliab. 69: 60-65 (2017)