"A review of DC extraction methods for MOSFET series resistance and ..."

Adelmo Ortiz-Conde et al. (2017)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.12.016

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/Ortiz-CondeSZTM17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/Ortiz-CondeSZTM17
Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez:
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69: 1-16 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.