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ORCIDReydezel Torres-Torres
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2020 – today
- 2024
[j6]German A. Alvarez-Botero
, Eduardo Moctezuma-Pascual, Miguel A. G. Laso, Reydezel Torres-Torres:
Assessment of Performance of One-Turn Inductors in Series Configuration Through a Transmission-Line Modeling Approach. IEEE Access 12: 96404-96410 (2024)- [j5]Roberto S. Murphy-Arteaga, Edgar Colín-Beltrán, María T. Serrano-Serrano, Chudy Nwachukwu, Svetlana Carsof Sejas Garcia, Reydezel Torres-Torres:
An Improved Method to Measure, Characterize, and Model Microstrip Antennas in the W Band. IEEE Instrum. Meas. Mag. 27(2): 53-58 (2024) - [c7]Alan Y. Otero-Carrascal, Dora A. Chaparro-Ortiz, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Gonzalez, P. Srinivasan:
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. IRPS 2024: 53 - 2023
- [c6]Dora A. Chaparro-Ortiz, Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Guevara, P. Srinivasan, Fernando Guarin:
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. IRPS 2023: 1-6 - 2021
- [c5]José Valdés, Reydezel Torres-Torres, Roberto S. Murphy:
Modeling Passive Devices for CMOS RF Circuits. MIXDES 2021: 20-24 - 2020
- [j4]Carlos Alberto Sanabria Diaz, Mónico Linares Aranda, Reydezel Torres-Torres, Alejandro Díaz-Sánchez:
Characterization and modeling of on-chip via stacks for RF-CMOS applications. IEICE Electron. Express 17(4): 20190735 (2020)
2010 – 2019
- 2018
- [j3]Mónico Linares Aranda, Oscar González-Díaz, D. M. Cortes-Hernandez, Reydezel Torres-Torres:
Semiempirical Model for IC Interconnects Considering the Coupling Between the Signal Trace and the Ground Plane. Circuits Syst. Signal Process. 37(9): 3888-3902 (2018) - 2017
- [j2]Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez:
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69: 1-16 (2017) - 2016
- [c4]Abel Perez-Fajardo, D. M. Cortes-Hernandez, Reydezel Torres-Torres, Alfonso Torres-Jácome:
Characterization of transmission lines in a novel high-frequency laminate. LASCAS 2016: 391-394 - 2015
- [c3]Abel Perez-Fajardo, Alfonso Torres-Jácome, Reydezel Torres-Torres:
Novel PCB fabrication process roughness free for high frequency applications. CCE 2015: 1-3 - 2013
- [c2]Emmanuel Torres-Rios, Svetlana Carsof Sejas Garcia, Luiz Carlos Moreira, Reydezel Torres-Torres, Wilhelmus A. M. Van Noije:
Analysis of the effects of coupling through substrate and the calculus of the Q factor. LASCAS 2013: 1-4 - 2011
- [j1]German A. Alvarez-Botero, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga:
Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs. Microelectron. Reliab. 51(2): 342-349 (2011) - 2010
- [c1]Oscar González-Díaz, Mónico Linares Aranda, Reydezel Torres-Torres:
Transmission line characterization for high frequency synchronization systems design. CONIELECOMP 2010: 43-47
Coauthor Index
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