"Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI ..."

Alan Y. Otero-Carrascal et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529489

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Alan Y. Otero-Carrascal, Dora A. Chaparro-Ortiz, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Gonzalez, P. Srinivasan:
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. IRPS 2024: 53

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