"An alternative approach to measure alpha-particle-induced SEU ..."

Saqib A. Khan et al. (2017)

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DOI: 10.1016/J.MICROREL.2016.12.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee:
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation. Microelectron. Reliab. 69: 100-108 (2017)

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