• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 19 matches

• 2000
• 
  Jean Michel Daga, Caroline Papaix, Marc Merandat, Stephane Ricard, Giuseppe Medulla, Jeanine Guichaoua, Daniel Auvergne:
  Design Techniques for Embedded EEPROM Memories in Portable ASIC and ASSP Solutions. MTDT 2000: 39-46
• 
  Christophe Frey, F. Genevaux, C. Issartel, D. Turgis, Jean-Pierre Schoellkopf:
  A Low Voltage Embedded Single Port SRAM Generator in a 0.18µm Standard CMOS Process. MTDT 2000: 106-112
• 
  Said Hamdioui, Ad J. van de Goor, Mike Rodgers, David Eastwick:
  March Tests for Realistic Faults in Two-Port Memories. MTDT 2000: 73-78
• 
  Ray Haythornthwaite:
  Failure Mechanisms in Semiconductor Memory Circuits. MTDT 2000: 7-13
• 
  Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri:
  Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28
• 
  Osama Khouri, Rino Micheloni, Stefano Gregori, Guido Torelli:
  Fast Voltage Regulator for Multilevel Flash Memories. MTDT 2000: 34-38
• 
  Valerie Lines, Abdullah Ahmed, Peter Ma, Stanley Ma, Robert McKenzie, Hong-Seok Kim, Cynthia Mar:
  66MHz 2.3M Ternary Dynamic Content Addressable Memory. MTDT 2000: 101-105
• 
  Rino Micheloni, Matteo Zammattio, Giovanni Campardo, Osama Khouri, Guido Torelli:
  Hierarchical Sector Biasing Organization for Flash Memories. MTDT 2000: 29-33
• 
  Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Redeker:
  Diagnostic Testing of Embedded Memories Based on Output Tracing. MTDT 2000: 113-118
• 
  Kamal Rajkanan:
  Yield Analysis Methodology for Low Defectivity Wafer Fabs. MTDT 2000: 65-72
• 
  Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer:
  Using GLFSRs for Pseudo-Random Memory BIST. MTDT 2000: 85-94
• 
  Wen-Tsong Shiue:
  Optimizing Memory Bandwidth with ILP Based Memory Exploration and Assignment for Low Power Embedded Systems. MTDT 2000: 95-100
• 
  Khoan Truong:
  A Simple Built-In Self Test For Dual Ported SRAMs. MTDT 2000: 79-84
• 
  Jörg E. Vollrath:
  Synchronous Dynamic Memory Test Construction: A Field Approach. MTDT 2000: 59-64
• 
  Zemo Yang, Samiha Mourad:
  Crosstalk in Deep Submicron DRAMs. MTDT 2000: 125-130
• 
  Kamran Zarrineh, R. Dean Adams, Aneesha P. Deo:
  Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories. MTDT 2000: 119-124
• 
  Ruili Zhang, William C. Black Jr., Marwan M. Hassoun:
  Windowed MRAM Sensing Scheme. MTDT 2000: 47-58
• 
  Jun Zhao, Fred J. Meyer, Fabrizio Lombardi:
  Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. MTDT 2000: 14-19
• 
  8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA. IEEE Computer Society 2000, ISBN 0-7695-0689-5 [contents]