"Defect Analysis and Realistic Fault Model Extensions for Static Random ..."

Kamran Zarrineh, R. Dean Adams, Aneesha P. Deo (2000)

> Home

Details and statistics

DOI: 10.1109/MTDT.2000.868625

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/mtdt/ZarrinehAD00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mtdt/ZarrinehAD00
Kamran Zarrineh, R. Dean Adams, Aneesha P. Deo:
Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories. MTDT 2000: 119-124

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.