"Optimizing Memory Tests by Analyzing Defect Coverage."

Alvin Jee et al. (2000)

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DOI: 10.1109/MTDT.2000.868611

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri:
Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28

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