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Kamal Rajkanan

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Journal Articles

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1994
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  - journals/vlsi/RajsumanR94
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  - https://dblp.org/rec/journals/vlsi/RajsumanR94
Rochit Rajsuman, Kamal Rajkanan:
STD Architecture: A Practical Approach to Test M-Bits Random Access Memories. VLSI Design 1(4): 327-334 (1994)

Conference and Workshop Papers

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2000
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Kamal Rajkanan:
Yield Analysis Methodology for Low Defectivity Wafer Fabs. MTDT 2000: 65-72

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