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ORCIDDirk Niggemeyer
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- affiliation: University of Hanover, Germany
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2000 – 2009
- 2004
[j3]Dirk Niggemeyer, Elizabeth M. Rudnick:
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing. IEEE Trans. Computers 53(9): 1134-1146 (2004)- 2003
- [j2]Dirk Niggemeyer, Elizabeth M. Rudnick:
A data acquisition methodology for on-chip repair of embedded memories. ACM Trans. Design Autom. Electr. Syst. 8(4): 560-576 (2003) - 2001
- [j1]Dirk Niggemeyer, Kevin J. Stephano, Elizabeth M. Rudnick:
Use of a field programmable gate array for education in manufacturing test and automatic test equipment. IEEE Trans. Educ. 44(3): 239-245 (2001) - [c10]Dirk Niggemeyer, Elizabeth M. Rudnick:
Automatic Generation of Diagnostic March Tests. VTS 2001: 299-305 - 2000
- [c9]Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick:
Diagnostic Testing of Embedded Memories Using BIST. DATE 2000: 305-309 - [c8]Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer:
Using GLFSRs for Pseudo-Random Memory BIST. MTDT 2000: 85-94 - [c7]Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Redeker:
Diagnostic Testing of Embedded Memories Based on Output Tracing. MTDT 2000: 113-118
1990 – 1999
- 1999
- [c6]Dirk Niggemeyer, M. Rüffer:
Parametric Built-In Self-Test of VLSI Systems. DATE 1999: 376- - [c5]Markus Rudack, Dirk Niggemeyer:
Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM. DFT 1999: 31-39 - 1998
- [c4]Jörg Hilgenstock, Klaus Herrmann, Jan Otterstedt, Dirk Niggemeyer, Peter Pirsch:
A Video Signal Processor for MIMD Multiprocessing. DAC 1998: 50-55 - [c3]Petra Nordholz, Hartmut Grabinski, Dieter Treytnar, Jan Otterstedt, Dirk Niggemeyer, Uwe Arz, T. W. Williams:
Core Interconnect Testing Hazards. DATE 1998: 953-954 - [c2]Jan Otterstedt, Dirk Niggemeyer, T. W. Williams:
Detection of CMOS address decoder open faults with March and pseudo random memory tests. ITC 1998: 53-62 - [c1]Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams:
Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. VTS 1998: 28-33
Coauthor Index
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