"March Tests for Realistic Faults in Two-Port Memories."

Said Hamdioui et al. (2000)

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DOI: 10.1109/MTDT.2000.868618

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Said Hamdioui, Ad J. van de Goor, Mike Rodgers, David Eastwick:
March Tests for Realistic Faults in Two-Port Memories. MTDT 2000: 73-78

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