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ORCIDMike Rodgers
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2000 – 2009
- 2006
[c12]Ajay Khoche, Mike Rodgers, Pete O'Neil:
Session Abstract. VTS 2006: 426- 2004
- [j4]Don Edenfeld, Andrew B. Kahng, Mike Rodgers, Yervant Zorian:
2003 Technology Roadmap for Semiconductors. Computer 37(1): 47-56 (2004) - [j3]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(5): 737-757 (2004) - 2003
- [j2]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. J. Electron. Test. 19(2): 195-205 (2003) - [c11]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
March SL: A Test For All Static Linked Memory Faults. Asian Test Symposium 2003: 372-377 - [c10]Said Hamdioui, Ad J. van de Goor, Mike Rodgers:
Detecting Intra-Word Faults in Word-Oriented Memories. VTS 2003: 241-247 - 2002
- [j1]Alan Allan, Don Edenfeld, William H. Joyner Jr., Andrew B. Kahng, Mike Rodgers, Yervant Zorian:
2001 Technology Roadmap for Semiconductors. Computer 35(1): 42-53 (2002) - [c9]Said Hamdioui, Ad J. van de Goor, Mike Rodgers:
March SS: A Test for All Static Simple RAM Faults. MTDT 2002: 95-100 - [c8]Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers:
Debating the Future of Burn-In. VTS 2002: 311-314 - 2001
- [c7]Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers:
Detecting Unique Faults in Multi-port SRAMs. Asian Test Symposium 2001: 37-42 - [c6]Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers:
Realistic Fault Models and Test Procedures for Multi-Port SRAMs. MTDT 2001: 65-72 - [c5]Mike Rodgers:
ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing. VTS 2001: 155-157 - 2000
- [c4]Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy:
Test challenges for deep sub-micron technologies. DAC 2000: 142-149 - [c3]Yervant Zorian, Sujit Dey, Mike Rodgers:
Test of Future System-on-Chips. ICCAD 2000: 392-398 - [c2]Mike Rodgers:
Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors. ITC 2000: 464-467 - [c1]Said Hamdioui, Ad J. van de Goor, Mike Rodgers, David Eastwick:
March Tests for Realistic Faults in Two-Port Memories. MTDT 2000: 73-78
Coauthor Index
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