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Ray Haythornthwaite

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2000 – 2009

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2000
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Ray Haythornthwaite:
Failure Mechanisms in Semiconductor Memory Circuits. MTDT 2000: 7-13

1990 – 1999

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1999
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Sue Brown, Jeff Campbell, Sherri Griffin, Dick James, Ray Haythornthwaite:
Failure Mechanisms Detected in Memory Chips during Routine Construction Analysis. MTDT 1999: 34-39

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