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Publication search results
found 59 matches
- 2008
- Jaume Abella, Pedro Chaparro, Xavier Vera, Javier Carretero, Antonio González:
On-Line Failure Detection and Confinement in Caches. IOLTS 2008: 3-9 - Rob Aitken:
Special Session 4: Reliability and Circuit Simulation. IOLTS 2008: 195-196 - Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris:
On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD. IOLTS 2008: 123-128 - Costas Argyrides, Fabian Vargas, Marlon Moraes, Dhiraj K. Pradhan:
Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. IOLTS 2008: 155-160 - Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell:
On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring. IOLTS 2008: 233-238 - Nikolaos G. Bartzoudis, Vasileios Tantsios, Klaus D. McDonald-Maier:
Dynamic Scheduling of Test Routines for Efficient Online Self-Testing of Embedded Microprocessors. IOLTS 2008: 185-187 - Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante:
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. IOLTS 2008: 135-140 - Antonin Bougerol, Florent Miller, Nadine Buard:
SDRAM Architecture & Single Event Effects Revealed with Laser. IOLTS 2008: 283-288 - Gaetan Canivet, Jessy Clédière, Jean Baptiste Ferron, Frédéric Valette, Marc Renaudin, Régis Leveugle:
Detailed Analyses of Single Laser Shot Effects in the Configuration of a Virtex-II FPGA. IOLTS 2008: 289-294 - Ashish Darbari, Bashir M. Al-Hashimi, Peter Harrod, Daryl Bradley:
A New Approach for Transient Fault Injection Using Symbolic Simulation. IOLTS 2008: 93-98 - Nachiketa Das, Pranab Roy, Hafizur Rahaman:
On Line Testing of Single Feedback Bridging Fault in Cluster Based FPGA by Using Asynchronous Element. IOLTS 2008: 190-191 - Ricardo de Oliveira Duarte, Luiz de Siqueira Martins-Filho, Guilherme F. T. Knop, Ricardo S. Prado:
A Fault-Tolerant Attitude Determination System Based on COTS Devices. IOLTS 2008: 85-90 - Sreenivas Gangadhar, Michael N. Skoufis, Spyros Tragoudas:
Propagation of Transients Along Sensitizable Paths. IOLTS 2008: 129-134 - Piotr Gawkowski, Janusz Sosnowski:
Developing Fault Injection Environment for Complex Experiments. IOLTS 2008: 179-181 - Tino Heijmen:
Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec? IOLTS 2008: 161-162 - Tino Heijmen:
Soft-Error Vulnerability of Sub-100-nm Flip-Flops. IOLTS 2008: 247-252 - Zhengfeng Huang, Huaguo Liang:
A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies. IOLTS 2008: 175-176 - Marc Hunger, Sybille Hellebrand:
Verification and Analysis of Self-Checking Properties through ATPG. IOLTS 2008: 25-30 - Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin:
Integrating Scan Design and Soft Error Correction in Low-Power Applications. IOLTS 2008: 59-64 - Yu (Kevin) Kao:
Modeling and Simulation of Circuit Aging in Scaled CMOS Design. IOLTS 2008: 197 - Naghmeh Karimi, Soheil Aminzadeh, Saeed Safari, Zainalabedin Navabi:
A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing. IOLTS 2008: 173-174 - Tobias Koal, Heinrich Theodor Vierhaus:
Basic Architecture for Logic Self Repair. IOLTS 2008: 177-178 - Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong:
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS 2008: 253-257 - Celia López-Ongil, Alejandro Jiménez-Horas, Marta Portela-García, Mario García-Valderas, Enrique San Millán, Luis Entrena:
Smart Hardening for Round-based Encryption Algorithms: Application to Advanced Encryption Standard. IOLTS 2008: 167-168 - Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick:
A Low-Cost Accumulator-Based Test Pattern Generation Architecture. IOLTS 2008: 267-272 - Paolo Maistri, Cyril Excoffon, Régis Leveugle:
Software Self-Testing of a Symmetric Cipher with Error Detection Capability. IOLTS 2008: 79-84 - Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan:
Design Techniques for Bit-Parallel Galois Field Multipliers with On-Line Single Error Correction and Double Error Detection. IOLTS 2008: 16-21 - Jimson Mathew, Jawar Singh, Anas Abu Taleb, Dhiraj K. Pradhan:
Fault Tolerant Reversible Finite Field Arithmetic Circuits. IOLTS 2008: 188-189 - Andreas Merentitis, George Theodorou, Mihalis Giorgaras, Nektarios Kranitis:
Directed Random SBST Generation for On-Line Testing of Pipelined Processors. IOLTS 2008: 273-279 - Subhasish Mitra:
Soft Error Protection Techniques. IOLTS 2008: 45
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