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Publication search results
found 33 matches
- 2010
- Waseem Ahmed, Doug Myers:
Concept-based partitioning for large multidomain multifunctional embedded systems. ACM Trans. Design Autom. Electr. Syst. 15(3): 22:1-22:41 (2010) - Nicolas Blanc, Daniel Kroening:
Race analysis for systemc using model checking. ACM Trans. Design Autom. Electr. Syst. 15(3): 21:1-21:32 (2010) - Talal Bonny, Jörg Henkel:
Huffman-based code compression techniques for embedded processors. ACM Trans. Design Autom. Electr. Syst. 15(4): 31:1-31:37 (2010) - Gianpiero Cabodi, Luciano Lavagno, Marco Murciano, Alex Kondratyev, Yosinori Watanabe:
Speeding-up heuristic allocation, scheduling and binding with SAT-based abstraction/refinement techniques. ACM Trans. Design Autom. Electr. Syst. 15(2): 12:1-12:34 (2010) - Kai-Hui Chang, Valeria Bertacco, Igor L. Markov, Alan Mishchenko:
Logic synthesis and circuit customization using extensive external don't-cares. ACM Trans. Design Autom. Electr. Syst. 15(3): 26:1-26:24 (2010) - Naehyuck Chang, Jörg Henkel:
Call for papers ACM transactions on design automation of electronic systems (TODAES) special section on low-power electronics and design. ACM Trans. Design Autom. Electr. Syst. 15(2): 20:1-20:2 (2010) - Dipankar Das, P. P. Chakrabarti, Rajeev Kumar:
Thermal analysis of multiprocessor SoC applications by simulation and verification. ACM Trans. Design Autom. Electr. Syst. 15(2): 15:1-15:52 (2010) - Xuan Guan, Yunsi Fei:
Register file partitioning and recompilation for register file power reduction. ACM Trans. Design Autom. Electr. Syst. 15(3): 24:1-24:30 (2010) - Peter Jamieson, Tobias Becker, Peter Y. K. Cheung, Wayne Luk, Tero Rissa, Teemu Pitkänen:
Benchmarking and evaluating reconfigurable architectures targeting the mobile domain. ACM Trans. Design Autom. Electr. Syst. 15(2): 14:1-14:24 (2010) - Masanori Kurimoto, Hiroaki Suzuki, Rei Akiyama, Tadao Yamanaka, Haruyuki Ohkuma, Hidehiro Takata, Hirofumi Shinohara:
Phase-adjustable error detection flip-flops with 2-stage hold-driven optimization, slack-based grouping scheme and slack distribution control for dynamic voltage scaling. ACM Trans. Design Autom. Electr. Syst. 15(2): 17:1-17:17 (2010) - Seongnam Kwon, Soonhoi Ha:
Serialized parallel code generation framework for MPSoC. ACM Trans. Design Autom. Electr. Syst. 15(2): 11:1-11:27 (2010) - Kyoungwoo Lee, Aviral Shrivastava, Nikil D. Dutt, Nalini Venkatasubramanian:
Partitioning techniques for partially protected caches in resource-constrained embedded systems. ACM Trans. Design Autom. Electr. Syst. 15(4): 30:1-30:30 (2010) - Zhifang Li, Wenjian Luo, Lihua Yue, Xufa Wang:
On the completeness of the polymorphic gate set. ACM Trans. Design Autom. Electr. Syst. 15(4): 32:1-32:25 (2010) - Duo Li, Sheldon X.-D. Tan, Eduardo H. Pacheco, Murli Tirumala:
Parameterized architecture-level dynamic thermal models for multicore microprocessors. ACM Trans. Design Autom. Electr. Syst. 15(2): 16:1-16:22 (2010) - Shenghua Liu, Guoqiang Chen, Tom Tong Jing, Lei He, Robi Dutta, Xianlong Hong:
Effective congestion reduction for IC package substrate routing. ACM Trans. Design Autom. Electr. Syst. 15(3): 27:1-27:21 (2010) - Somnath Paul, Hamid Mahmoodi, Swarup Bhunia:
Low-overhead Fmax calibration at multiple operating points using delay-sensitivity-based path selection. ACM Trans. Design Autom. Electr. Syst. 15(2): 19:1-19:34 (2010) - Rajkumar K. Raval, Carlos Fernández, Chris J. Bleakley:
Low-power TinyOS tuned processor platform for wireless sensor network motes. ACM Trans. Design Autom. Electr. Syst. 15(3): 23:1-23:17 (2010) - Pedro Reviriego, Juan Antonio Maestro, Chris J. Bleakley:
Reliability analysis of memories protected with BICS and a per-word parity bit. ACM Trans. Design Autom. Electr. Syst. 15(2): 18:1-18:15 (2010) - Gunar Schirner, Andreas Gerstlauer, Rainer Dömer:
Fast and accurate processor models for efficient MPSoC design. ACM Trans. Design Autom. Electr. Syst. 15(2): 10:1-10:26 (2010) - Youngsoo Shin, Jun Seomun, Kyu-Myung Choi, Takayasu Sakurai:
Power gating: Circuits, design methodologies, and best practice for standard-cell VLSI designs. ACM Trans. Design Autom. Electr. Syst. 15(4): 28:1-28:37 (2010) - Renshen Wang, Evangeline F. Y. Young, Chung-Kuan Cheng:
Complexity of 3-D floorplans by analysis of graph cuboidal dual hardness. ACM Trans. Design Autom. Electr. Syst. 15(4): 33:1-33:22 (2010) - Cheng-Juei Yu, Yi-Hsin Wu, Sheng-De Wang:
An in-place search algorithm for the resource constrained scheduling problem during high-level synthesis. ACM Trans. Design Autom. Electr. Syst. 15(4): 29:1-29:13 (2010) - Mingxuan Yuan, Zonghua Gu, Xiuqiang He, Xue Liu, Lei Jiang:
Hardware/software partitioning and pipelined scheduling on runtime reconfigurable FPGAs. ACM Trans. Design Autom. Electr. Syst. 15(2): 13:1-13:41 (2010) - Yufu Zhang, Ankur Srivastava, Mohamed M. Zahran:
On-chip sensor-driven efficient thermal profile estimation algorithms. ACM Trans. Design Autom. Electr. Syst. 15(3): 25:1-25:27 (2010) - 2009
- Li-Pin Chang, Chun-Da Du:
Design and implementation of an efficient wear-leveling algorithm for solid-state-disk microcontrollers. ACM Trans. Design Autom. Electr. Syst. 15(1): 6:1-6:36 (2009) - Bert Geelen, Vissarion Ferentinos, Francky Catthoor, Gauthier Lafruit, Diederik Verkest, Rudy Lauwereins, Thanos Stouraitis:
Spatial locality exploitation for runtime reordering of JPEG2000 wavelet data layouts. ACM Trans. Design Autom. Electr. Syst. 15(1): 8:1-8:6 (2009) - Kurt Keutzer, Peng Li, Li Shang, Hai Zhou:
ACM Transactions on Design Automation of Electronic Systems (TODAES) special section call for papers: Parallel CAD: Algorithm design and programming. ACM Trans. Design Autom. Electr. Syst. 15(1): 9:1-9:2 (2009) - Jaehyun Kim, Chungki Oh, Youngsoo Shin:
Minimizing leakage power of sequential circuits through mixed-Vt flip-flops and multi-Vt combinational gates. ACM Trans. Design Autom. Electr. Syst. 15(1): 4:1-4:22 (2009) - Jingqing Mu, Roman L. Lysecky:
Autonomous hardware/software partitioning and voltage/frequency scaling for low-power embedded systems. ACM Trans. Design Autom. Electr. Syst. 15(1): 2:1-2:20 (2009) - Irith Pomeranz, Sudhakar M. Reddy:
Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits. ACM Trans. Design Autom. Electr. Syst. 15(1): 7:1-7:22 (2009)
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