• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 55 matches

• 2010
• 
  Takashi Aikyo:
  Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau. DFT 2010: 227
• 
  Luca Amati, Cristiana Bolchini, Fabio Salice:
  Test Selection Policies for Faster Incremental Fault Detection. DFT 2010: 310-318
• 
  Bijan Ansari, Ingrid Verbauwhede:
  A Hybrid Scheme for Concurrent Error Detection of Multiplication over Finite Fields. DFT 2010: 399-407
• 
  Zahra Mashreghian Arani, Masoud Hashempour, Fabrizio Lombardi:
  An Analytical Error Model for Pattern Clipping in DNA Self-Assembly. DFT 2010: 7-15
• 
  Kunihiro Asada, Makoto Ikeda, Benjamin Stefan Devlin, Taku Sogabe:
  Self-Synchrounous Circuits with Completion/Error Detection as a Candidate of Future LSI Resilient for PVT Variations and Aging. DFT 2010: 3
• 
  Cristiana Bolchini, Luca Fossati, David Merodio Codinachs, Antonio Miele, Chiara Sandionigi:
  A Reliable Reconfiguration Controller for Fault-Tolerant Embedded Systems on Multi-FPGA Platforms. DFT 2010: 191-199
• 
  Cristiana Bolchini, Antonio Miele:
  Reliability-Driven System-Level Synthesis of Embedded Systems. DFT 2010: 35-43
• 
  Salvatore Campagna, Moazzam Hussain, Massimo Violante:
  Hypervisor-Based Virtual Hardware for Fault Tolerance in COTS Processors Targeting Space Applications. DFT 2010: 44-51
• 
  Min-Ju Chan, Chun-Lung Hsu:
  A Strategy for Interconnect Testing in Stacked Mesh Network-on-Chip. DFT 2010: 122-128
• 
  Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren:
  Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT 2010: 231-239
• 
  Geunho Cho, Fabrizio Lombardi, Yong-Bin Kim:
  Modelling a CNTFET with Undeposited CNT Defects. DFT 2010: 289-296
• 
  Bishnu Prasad Das, Hidetoshi Onodera:
  Warning Prediction Sequential for Transient Error Prevention. DFT 2010: 382-390
• 
  Srikanth V. Devarapalli, Payman Zarkesh-Ha, Steven C. Suddarth:
  SEU-Hardened Dual Data Rate Flip-Flop Using C-Elements. DFT 2010: 167-171
• 
  Hassan Ebrahimi, Morteza Saheb Zamani, Seyyed Ahmad Razavi:
  A Switch Box Architecture to Mitigate Bridging and Short Faults in SRAM-Based FPGAs. DFT 2010: 218-224
• 
  Navid Farazmand, Masoud Zamani, Mehdi Baradaran Tahoori:
  Online Multiple Fault Detection in Reversible Circuits. DFT 2010: 429-437
• 
  Yusuke Fukushima, Masaru Fukushi, Ikuko Eguchi Yairi, Takeshi Hattori:
  A Hardware-Oriented Fault-Tolerant Routing Algorithm for Irregular 2D-Mesh Network-on-Chip without Virtual Channels. DFT 2010: 52-59
• 
  Anant Narayan Hariharan, Salvatore Pontarelli, Marco Ottavi, Fabrizio Lombardi:
  Modeling Open Defects in Nanometric Scale CMOS. DFT 2010: 249-257
• 
  Nor Zaidi Haron, Said Hamdioui:
  High-Performance Cluster-Fault Tolerance Scheme for Hybrid Nanoelectronic Memories. DFT 2010: 144-151
• 
  Chun-Lung Hsu, Chen-Wei Lan, Yu-Chih Lo, Yu-Sheng Huang:
  Adaptive De-noising Filter Algorithm for CMOS Image Sensor Testing Applications. DFT 2010: 136-143
• 
  Marc Hunger, Sybille Hellebrand:
  The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. DFT 2010: 101-108
• 
  Vijay K. Jain, Glenn H. Chapman:
  Massively Deployable Intelligent Sensors for the Smart Power Grid. DFT 2010: 319-327
• 
  Pilin Junsangsri, Fabrizio Lombardi:
  Time/Temperature Degradation of Solar Cells under the Single Diode Model. DFT 2010: 240-248
• 
  Nobuyasu Kanekawa:
  Industrial Approach for Dependability. DFT 2010: 299
• 
  Osnat Keren, Ilya Levin, Mark G. Karpovsky:
  Duplication Based One-to-Many Coding for Trojan HW Detection. DFT 2010: 160-166
• 
  Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Cheng-Wen Wu, Ching-Cheng Tien, Mike Wang:
  AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. DFT 2010: 340-348
• 
  Erik MacLean, Vijay K. Jain:
  Analog Design for a Power Transmission Line Sensing and Analysis VLSI Chip. DFT 2010: 438-446
• 
  NurQamarina MohdNoor, Azilah Saparon, Yusrina Yusof:
  Programmable MBIST Merging FSM and Microcode Techniques Using Macro Commands. DFT 2010: 115-121
• 
  Tomoyuki Nagase, Kenji Ichijo, Akiko Narita, Yoshio Yoshioka:
  CFBLT: A Closed Feed Back Loop Type Queuing System; Modeling and Analysis. DFT 2010: 109-114
• 
  Yoshiyuki Nakamura, Masashi Tanaka:
  A Multi-dimensional Iddq Testing Method Using Mahalanobis Distance. DFT 2010: 303-309
• 
  Kazuteru Namba, Hideo Ito:
  Soft Error Tolerant BILBO FF. DFT 2010: 73-81

skipping 25 more matches