"Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: ..."

Takashi Aikyo (2010)

> Home

Details and statistics

DOI: 10.1109/DFT.2010.34

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/Aikyo10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/Aikyo10
Takashi Aikyo:
Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau. DFT 2010: 227

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.