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ORCIDW. Robert Daasch
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Journal Articles
- 2014
[j9]C. Glenn Shirley, W. Robert Daasch:
Copula Models of Correlation: A DRAM Case Study. IEEE Trans. Computers 63(10): 2389-2401 (2014)- 2009
- [j8]W. Robert Daasch, C. Glenn Shirley, Amit Nahar:
Statistics in Semiconductor Test: Going beyond Yield. IEEE Des. Test Comput. 26(5): 64-73 (2009) - [j7]Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26(5): 74-82 (2009) - 2006
- [j6]Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23(2): 100-109 (2006) - 2003
- [j5]Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20(5): 46-53 (2003) - 2002
- [j4]Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins:
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19(5): 36-43 (2002) - [j3]W. Robert Daasch, James McNames, Robert Madge, Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Des. Test Comput. 19(5): 74-81 (2002) - 1995
- [j2]Michael A. Driscoll, W. Robert Daasch:
Accurate Predictions of Parallel Program Execution Time. J. Parallel Distributed Comput. 25(1): 16-30 (1995) - 1992
- [j1]W. Robert Daasch, Martine Wedlake, Rolf Schaumann, Pan Wu:
Automation of the ic layout of continuous-time transconductance-capacitor filters. Int. J. Circuit Theory Appl. 20(3): 267-282 (1992)
Conference and Workshop Papers
- 2016
- [c30]Kenneth M. Butler, Amit Nahar, W. Robert Daasch:
What we know after twelve years developing and deploying test data analytics solutions. ITC 2016: 1-8 - [c29]Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang
, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli:
Consistency in wafer based outlier screening. VTS 2016: 1-6 - 2015
- [c28]Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch:
Generalization of an outlier model into a "global" perspective. ITC 2015: 1-10 - 2014
- [c27]C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy:
Board manufacturing test correlation to IC manufacturing test. ITC 2014: 1-8 - 2011
- [c26]Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar:
Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10 - 2009
- [c25]Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin:
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC 2009: 1-10 - 2008
- [c24]Saurabh Jain, W. Robert Daasch, David Armbrust:
Analyzing the Impact of Fault Tolerant BIST for VLSI Design. DFT 2008: 152-160 - 2007
- [c23]Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10 - 2005
- [c22]W. Robert Daasch, Robert Madge:
Variance reduction and outliers: statistical analysis of semiconductor test data. ITC 2005: 9 - [c21]W. Robert Daasch, Robert Madge:
Data-driven models for statistical testing: measurements, estimates and residuals. ITC 2005: 10 - [c20]Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10 - [c19]Amit Nahar, W. Robert Daasch, Suresh Subramaniam:
Burn-in reduction using principal component analysis. ITC 2005: 10 - [c18]Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432 - 2004
- [c17]Haiqiao Xiao, Rolf Schaumann, W. Robert Daasch, Phillip K. Wong, Branimir Pejcinovic:
A radio-frequency CMOS active inductor and its application in designing high-Q filters. ISCAS (4) 2004: 197-200 - [c16]Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 - [c15]Chris Schuermyer, Jens Ruffler, W. Robert Daasch:
Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308 - [c14]W. Robert Daasch, Manu Rehani:
Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428 - [c13]Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192 - 2003
- [c12]Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573 - [c11]Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46 - 2002
- [c10]Chee How Lim, W. Robert Daasch, George Cai:
A Thermal-Aware Superscalar Microprocessor (invited). ISQED 2002: 517-522 - [c9]David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge:
Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471 - [c8]Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682 - [c7]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC 2002: 1240 - [c6]Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74 - 2001
- [c5]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC 2001: 92-100 - 2000
- [c4]W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota:
Variance reduction using wafer patterns in I_ddQ data. ITC 2000: 189-198 - [c3]Ashutosh S. Dhodapkar, Chee How Lim, George Cai, W. Robert Daasch:
TEM2P2EST: A Thermal Enabled Multi-model Power/Performance ESTimator. PACS 2000: 112-125 - 1993
- [c2]Pan Wu, Rolf Schaumann, W. Robert Daasch:
A 20 MHz Fully-balanced Transconductance-C Filter in 2 µm CMOS Technology. ISCAS 1993: 1188-1191 - 1987
- [c1]William A. Payne III, Fillia Makedon, W. Robert Daasch:
High Speed Interconnection Using the Clos Network. ICS 1987: 96-111
Coauthor Index
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