"Variance reduction and outliers: statistical analysis of semiconductor ..."

W. Robert Daasch, Robert Madge (2005)

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DOI: 10.1109/TEST.2005.1583988

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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W. Robert Daasch, Robert Madge:
Variance reduction and outliers: statistical analysis of semiconductor test data. ITC 2005: 9

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