- Dimitris Mouris
, Charles Gouert, Nektarios Georgios Tsoutsos:
$\text{MP}\ell\circ \mathrm{C}$: Privacy-Preserving IP Verification Using Logic Locking and Secure Multiparty Computation. IOLTS 2023: 1-8 - Pegdwende Romaric Nikiema, Alessandro Palumbo, Allan Aasma, Luca Cassano, Angeliki Kritikakou, Ari Kulmala, Jari Lukkarila, Marco Ottavi, Rafail Psiakis, Marcello Traiola:
Towards Dependable RISC-V Cores for Edge Computing Devices. IOLTS 2023: 1-7 - George Papadimitriou, Dimitris Gizopoulos, Harish Dattatraya Dixit, Sriram Sankar:
Silent Data Corruptions: The Stealthy Saboteurs of Digital Integrity. IOLTS 2023: 1-7 - Ivan Rodriguez-Ferrandez, Leonidas Kosmidis, Maris Tali, David Steenari:
Space Shuttle: A Test Vehicle for the Reliability of the SkyWater 130nm PDK for Future Space Processors. IOLTS 2023: 1-3 - Marcel Sarraseca, Sergi Alcaide, Francisco Fuentes, Juan Carlos Rodriguez, Feng Chang, Ilham Lasfar, Ramon Canal, Francisco J. Cazorla, Jaume Abella:
SafeLS: An Open Source Implementation of a Lockstep NOEL-V RISC-V Core. IOLTS 2023: 1-7 - Hardi Selg, Maksim Jenihhin, Peeter Ellervee, Jaan Raik:
ML-Based Online Design Error Localization for RISC-V Implementations. IOLTS 2023: 1-7 - Corrado De Sio, Daniele Rizzieri, Andrea Portaluri, Salvatore Gabriele La Greca, Sarah Azimi:
Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System. IOLTS 2023: 1-3 - Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard:
Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation. IOLTS 2023: 1-5 - Nasr-Eddine Ouldei Tebina, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri:
Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection. IOLTS 2023: 1-7 - Pierre-Antoine Tissot, Lilian Bossuet, Vincent Grosso:
BALoo: First and Efficient Countermeasure Dedicated to Persistent Fault Attacks. IOLTS 2023: 1-7 - Styliani Tompazi, Georgios Karakonstantis:
Microarchitecture-Aware Timing Error Prediction via Deep Neural Networks. IOLTS 2023: 1-8 - Ioannis Tsounis, Dimitris Agiakatsikas, Mihalis Psarakis:
Detecting Hardware Faults in Approximate Adders via Minimum Redundancy. IOLTS 2023: 1-7 - Fabian Vargas, Douglas Borba, Juliano Benfica, Rizwan Tariq Syed:
Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power Lines. IOLTS 2023: 1-6 - Z. Zhang, Zhihang Wu, Christian Weis, Norbert Wehn, Mehdi Baradaran Tahoori:
A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor Logic. IOLTS 2023: 1-7 - Alessandro Savino, Michail Maniatakos, Stefano Di Carlo, Dimitris Gizopoulos:
29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023, Crete, Greece, July 3-5, 2023. IEEE 2023, ISBN 979-8-3503-4135-5 [contents] - 2022
- Chandramouli N. Amarnath, Mohamed Mejri, Kwondo Ma, Abhijit Chatterjee:
Soft Error Resilient Deep Learning Systems Using Neuron Gradient Statistics. IOLTS 2022: 1-7 - Betis Baheri, Qiang Guan, Vipin Chaudhary, Ang Li:
Quantum Noise in the Flow of Time: A Temporal Study of the Noise in Quantum Computers. IOLTS 2022: 1-5 - Anu Bala, Saurabh Khandelwal, Abusaleh M. Jabir, Marco Ottavi:
Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability. IOLTS 2022: 1-5 - Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero:
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data. IOLTS 2022: 1-7 - Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu:
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS 2022: 1-10 - Nadir Casciola, Edoardo Giusto, Emanuele Dri, Daniel Oliveira, Paolo Rech, Bartolomeo Montrucchio:
Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults. IOLTS 2022: 1-7 - Niccolò Cavagnero, Fernando Fernandes dos Santos, Marco Ciccone, Giuseppe Averta, Tatiana Tommasi, Paolo Rech:
Transient-Fault-Aware Design and Training to Enhance DNNs Reliability with Zero-Overhead. IOLTS 2022: 1-7 - Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty:
Structural Test Generation for AI Accelerators using Neural Twins. IOLTS 2022: 1-6 - Giovanni Corrente, Nella Bentivegna, Sebastiano Russo:
Power Cycling Body Diode Current Flow on SiC MOSFET Device. IOLTS 2022: 1-5 - William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre:
An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation. IOLTS 2022: 1-5 - Georg Duchrau, Michael Gössel:
A New Decoding Method for Double Error Correcting Cross Parity Codes. IOLTS 2022: 1-5 - Tiziano Fiorucci, Giorgio Di Natale, Jean-Marc Daveau, Philippe Roche:
Software Product Reliability Based on Basic Block Metrics Recomposition. IOLTS 2022: 1-5 - Gabriele Gavarini, Diego Stucchi, Annachiara Ruospo, Giacomo Boracchi, Ernesto Sánchez:
Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability. IOLTS 2022: 1-7 - Marco Grossi, Martin Omaña, Daniele Rossi, Biagio Marzulli, Cecilia Metra:
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function. IOLTS 2022: 1-7 - Juan-David Guerrero-Balaguera, Robert Limas Sierra, Matteo Sonza Reorda:
Effective fault simulation of GPU's permanent faults for reliability estimation of CNNs. IOLTS 2022: 1-6
