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ORCIDRyuichi Nakajima
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2020 – today
- 2024
[j3]Haruto Sugisaki, Ryuichi Nakajima
, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi:
Frequency dependence of soft error rates induced by alpha-particle and heavy ion. IEICE Electron. Express 21(13): 20240247 (2024)- [j2]Ryuichi Nakajima, Takafumi Ito, Shotaro Sugitani, Tomoya Kii, Mitsunori Ebara, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard:
Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies. IEICE Trans. Electron. 107(7): 191-200 (2024) - [j1]Jun Furuta, Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Kazutoshi Kobayashi:
Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy Ion and Neutron Irradiation. IEICE Trans. Electron. 107(9): 255-262 (2024) - [c7]Jun Furuta, Shotaro Sugitani, Ryuichi Nakajima, Kazutoshi Kobayashi:
A Partially-redundant Flip-flip Suitable for Mitigating Single Event Upsets in a FD-SOI Process with Low Performance Overhead. IRPS 2024: 1-4 - [c6]Ryuichi Nakajima, Shotaro Sugitani, Haruto Sugisaki, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Makoto Sakai:
An Approach to Neutron-Induced SER Evaluation Using a Clinical 290 MeV/ u Carbon Beam and Particle Transport Simulations. IRPS 2024: 1-4 - 2023
- [c5]Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi:
Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements. ICICDT 2023: 68-71 - [c4]Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi:
SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation. ICICDT 2023: 72-75 - [c3]Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard:
Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation. IOLTS 2023: 1-5 - [c2]Shotaro Sugitani, Ryuichi Nakajima, Keita Yoshida, Jun Furuta, Kazutoshi Kobayashi:
Radiation Hardened Flip-Flops with low Area, Delay and Power Overheads in a 65 nm bulk process. IRPS 2023: 1-5 - 2022
- [c1]Ryuichi Nakajima, Kazuya Ioki, Jun Furuta, Kazutoshi Kobayashi:
Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process. IOLTS 2022: 1-5
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