default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDMichael Gössel
Person information
- affiliation: University of Potsdam, Germany
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
showing all ?? records
2020 – today
- 2024
[c84]Alexander Benedict Behrens, Michael Gössel:
Determination of Optimal H-Matrices for 2-Bit Error Correcting Codes. ARCS 2024: 344-357- 2023
- [c83]Georg Duchrau, Michael Gössel:
Modified Cross Parity Codes for Adjacent Double Error Correction. ARCS 2023: 94-102 - 2022
- [c82]Georg Duchrau, Michael Gössel:
A New Decoding Method for Double Error Correcting Cross Parity Codes. IOLTS 2022: 1-5
2010 – 2019
- 2019
- [c81]Paul-Patrick Nordmann, Michael Gössel:
A New DEC/TED Code for Fast Correction of 2-Bit-Errors. IOLTS 2019: 171-175 - 2018
- [j37]Paul-Patrick Nordmann, Michael Gössel:
Regular LPDC Codes with Guaranteed Minimal Hamming Distance. J. Autom. Lang. Comb. 23(1-3): 271-280 (2018) - 2017
- [c80]Alexander Klockmann, Georg Georgakos, Michael Gössel:
A new 3-bit burst-error correcting code. IOLTS 2017: 3-4 - 2015
- [c79]Günther Nieß, Thomas Kern, Michael Gössel:
Möglichkeiten der Modellierung von Fehlern in MLC-Flash-Speichern durch Fehlergraphen. GI-Jahrestagung 2015: 1445-1459 - 2014
- [c78]Christian Badack, Michael Gössel:
Triple error detection for Imai-Kamiyanagi codes based on subsyndrome computations. ETS 2014: 1-2 - [c77]Milos Krstic
, Stefan Weidling, Vladimir Petrovic, Michael Gössel:
Improved circuitry for soft error correction in combinational logic in pipelined designs. IOLTS 2014: 93-98 - [c76]Christian Badack, Thomas Kern, Michael Gössel:
Modified DEC BCH codes for parallel correction of 3-bit errors comprising a pair of adjacent errors. IOLTS 2014: 116-121 - [c75]Stefan Weidling, Michael Gössel:
Fault tolerant linear state machines. LATW 2014: 1-6 - 2013
- [c74]Egor S. Sogomonyan, Stefan Weidling, Michael Gössel:
A new method for correcting time and soft errors in combinational circuits. DDECS 2013: 283-286 - [c73]Stefan Weidling, Egor S. Sogomonyan, Michael Gössel:
Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. DSD 2013: 855-862 - 2012
- [j36]Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel:
Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 950-957 (2012) - 2011
- [j35]Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Masking of X-Values by Use of a Hierarchically Configurable Register. J. Electron. Test. 27(1): 31-41 (2011) - [c72]Michael Augustin, Michael Gössel, Rolf Kraemer:
Implementation of Selective Fault Tolerance with conventional synthesis tools. DDECS 2011: 213-218 - [c71]Michael Augustin, Michael Gössel, Rolf Kraemer:
Selective fault tolerance for finite state machines. IOLTS 2011: 43-48 - 2010
- [c70]Thomas Rabenalt, Michael Richter, Michael Gössel:
High Performance Compaction for Test Responses with Many Unknowns. Asian Test Symposium 2010: 179-184 - [c69]Michael Augustin, Michael Gössel, Rolf Kraemer:
Reducing the area overhead of TMR-systems by protecting specific signals. IOLTS 2010: 268-273
2000 – 2009
- 2009
- [j34]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electron. Test. 25(4-5): 247-258 (2009) - [c68]Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. ETS 2009: 39-44 - [c67]Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Masking of X-values by Use of a Hierarchically Configurable Register. ETS 2009: 149-154 - [c66]Michael Richter, Michael Gössel:
Concurrent checking with split-parity codes. IOLTS 2009: 159-163 - 2008
- [j33]Michael Gössel, Egor S. Sogomonyan:
A Non-linear Split Error Detection Code. Fundam. Informaticae 83(1-2): 109-115 (2008) - [c65]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
Accelerated Shift Registers for X-tolerant Test Data Compaction. ETS 2008: 133-139 - [c64]Michael Richter, Klaus Oberländer, Michael Gössel:
New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. IOLTS 2008: 37-42 - 2007
- [j32]Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel:
On-chip evaluation, compensation and storage of scan diagnosis data. IET Comput. Digit. Tech. 1(3): 207-212 (2007) - [c63]Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel:
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. ITC 2007: 1-9 - 2006
- [j31]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld:
Modulo p=3 Checking for a Carry Select Adder. J. Electron. Test. 22(1): 101-107 (2006) - [c62]Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel:
Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE 2006: 1270-1275 - [c61]Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz:
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. ETS 2006: 239-246 - [c60]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS 2006: 23-30 - 2005
- [c59]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium 2005: 76-81 - [c58]Vitalij Ocheretnij, G. Kouznetsov, Ramesh Karri, Michael Gössel:
On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations. IOLTS 2005: 141-146 - 2004
- [j30]Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger:
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electron. Test. 20(6): 611-622 (2004) - [c57]Andrej A. Morosov, Michael Gössel, Valerij V. Saposhnikov, Vladimir V. Saposhnikov:
Complementary Circuits for On-Line Detection for 1-out-of-3 Codes. ARCS Workshops 2004: 76-83 - [c56]Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel:
Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops 2004: 84-91 - [c55]Andreas Leininger, Michael Gössel, Peter Muhmenthaler:
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE 2004: 1302-1309 - [c54]Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE 2004: 1360-1361 - [c53]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. ETS 2004: 30-35 - [c52]Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Andrej A. Morosov, Michael Gössel:
Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits. IOLTS 2004: 25-30 - [c51]Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel:
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS 2004: 31-36 - [c50]Kaijie Wu, Ramesh Karri, Grigori Kuznetsov, Michael Gössel:
Low Cost Concurrent Error Detection for the Advanced Encryption Standard. ITC 2004: 1242-1248 - 2003
- [j29]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel:
Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output. IEEE Trans. Computers 52(12): 1646-1651 (2003) - [j28]Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003) - [c49]Ramesh Karri, Grigori Kuznetsov, Michael Gössel:
Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers. CHES 2003: 113-124 - [c48]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld:
A Modulo p Checked Self-Checking Carry Select Adder. IOLTS 2003: 25-29 - [c47]Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba:
Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS 2003: 35- - [c46]Ramesh Karri, Grigori Kuznetsov, Michael Gössel:
Parity-Based Concurrent Error Detection in Symmetric Block Ciphers. ITC 2003: 919-926 - 2002
- [j27]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty:
Synthesis of single-output space compactors for scan-based sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(10): 1171-1179 (2002) - [c45]Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty:
Robust Space Compaction of Test Responses. Asian Test Symposium 2002: 254-259 - [c44]Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel:
An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. DATE 2002: 382-386 - [c43]Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan:
Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT 2002: 78-86 - [c42]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW 2002: 39-43 - [c41]Michael Gössel, Egor S. Sogomonyan, Adit D. Singh:
Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS 2002: 47-52 - 2001
- [c40]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty:
Synthesis of single-output space compactors with application to scan-based IP cores. ASP-DAC 2001: 496-502 - [c39]Michael Gössel, Vitalij Ocheretnij, S. Chakrabarty:
Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA. Asian Test Symposium 2001: 57-62 - [c38]Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel:
A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium 2001: 365- - [c37]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan:
Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW 2001: 147-152 - [c36]Andrej A. Morosov, Michael Gössel, Krishnendu Chakrabarty, Bhargab B. Bhattacharya:
Design of Parameterizable Error-Propagating Space Compactors for Response Observation. VTS 2001: 48-53 - [c35]Egor S. Sogomonyan, Andrej A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh:
Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS 2001: 184-189 - 2000
- [j26]Alexej Dmitriev, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel, V. Moshanin, Andrej A. Morosov:
New Self-dual Circuits for Error Detection and Testing. VLSI Design 11(1): 1-21 (2000) - [c34]Vitalij Ocheretnij, Michael Gössel, Vladimir V. Saposhnikov, Valerij V. Saposhnikov:
A New Method of Redundancy Addition for Circuit Optimization. EUROMICRO 2000: 1172- - [c33]Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel:
New Self-Checking Circuits by Use of Berger-Codes. IOLTW 2000: 141-146 - [c32]Michael Gössel, Alexej Dmitriev, Vladimir V. Saposhnikov, Valerij V. Saposhnikov:
A New Method for Concurrent Checking by Use of a 1-out-of-4 Code. IOLTW 2000: 147-152 - [c31]Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel:
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. IOLTW 2000: 171- - [c30]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel:
Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores. VLSI Design 2000: 382-391
1990 – 1999
- 1999
- [j25]Vladimir V. Saposhnikov, V. Moshanin, Valerij V. Saposhnikov, Michael Gössel:
Experimental Results for Self-Dual Multi-Output Combinational Circuits. J. Electron. Test. 14(3): 295-300 (1999) - [j24]Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electron. Test. 15(1-2): 87-96 (1999) - [c29]Markus Seuring, Michael Gössel:
A Structural Approach for Space Compaction for Sequential Circuits. DFT 1999: 227- - [c28]Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring:
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293 - [c27]Michael Gössel, Andrej A. Morosov, Egor S. Sogomonyan:
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS 1999: 49-57 - [c26]Markus Seuring, Michael Gössel:
A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits. WIA 1999: 158-163 - 1998
- [j23]Valerij V. Saposhnikov, Andrej A. Morosov, Vladimir V. Saposhnikov, Michael Gössel:
A New Design Method for Self-Checking Unidirectional Combinational Circuits. J. Electron. Test. 12(1-2): 41-53 (1998) - [j22]Sebastian T. J. Fenn, Michael Gössel, Mohammed Benaissa, David Taylor:
On-Line Error Detection for Bit-Serial Multipliers in GF(2m). J. Electron. Test. 13(1): 29-40 (1998) - [j21]Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel:
Self-Checking Combinational Circuits with Unidirectionally Independent Outputs. VLSI Design 5(4): 333-345 (1998) - [c25]Vladimir V. Saposhnikov, Valerij V. Saposhnikov, Alexej Dmitriev, Michael Gössel:
Self-Dual Duplication for Error Detection. Asian Test Symposium 1998: 296-300 - [c24]T. Bogue, Michael Gössel, Helmut Jürgensen, Yervant Zorian:
Built-In Self-Test with an Alternating Output. DATE 1998: 180-184 - [c23]Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS 1998: 324-331 - [c22]Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS 1998: 354-361 - 1997
- [c21]Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan:
Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium 1997: 100- - [c20]Michael Gössel, Sebastian T. J. Fenn, David Taylor:
On-line error detection for finite field multipliers. DFT 1997: 307-312 - [c19]Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan:
A linear code-preserving signature analyzer COPMISR. VTS 1997: 350-355 - 1996
- [j20]Michael Gössel, Egor S. Sogomonyan:
A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electron. Test. 8(2): 165-177 (1996) - [j19]Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick:
Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45(3): 379-380 (1996) - [c18]Egor S. Sogomonyan, Michael Gössel:
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS 1996: 138-144 - [c17]Vladimir V. Saposhnikov, Alexej Dmitriev, Michael Gössel, Valerij V. Saposhnikov:
Self-dual parity checking-A new method for on-line testing. VTS 1996: 162-168 - 1995
- [c16]T. Bogue, Helmut Jürgensen, Michael Gössel:
BIST with negligible aliasing through random cover circuits. ASP-DAC 1995 - 1994
- [c15]T. Bogue, Helmut Jürgensen, Michael Gössel:
Design of Cover Circuits for Monitoring the Output of a MISA. DFT 1994: 124-132 - [c14]Stefan Gerber, Michael Gössel:
Detection of Permanent Hardware Faults of a Floating Point Adder by Pseudoduplication. EDCC 1994: 327-335 - [c13]Michael Gössel, Egor S. Sogomonyan:
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS 1994: 151-157 - 1993
- [j18]Egor S. Sogomonyan, Michael Gössel:
Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electron. Test. 4(3): 267-281 (1993) - [c12]Egor S. Sogomonyan, Michael Gössel:
Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT 1993: 239-246 - [c11]Michael Gössel, Helmut Jürgensen:
Monitoring BIST by covers. EURO-DAC 1993: 208-213 - [c10]Michael Gössel, Egor S. Sogomonyan:
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI 1993: 103-111 - 1992
- [c9]Egor S. Sogomonyan, Michael Gössel:
Self-testing and self-checking combinational circuits with weakly independent outputs. VTS 1992: 298-303 - 1991
- [c8]Michael Gössel:
Optimal Error Detection Circuits for Sequential Circuits with Observable States. Fault-Tolerant Computing Systems 1991: 171-180 - [c7]Wolfgang Hahn, Michael Gössel:
Pseudoduplication of floating-point addition. A method of compiler generated checking of permanent hardware faults. VTS 1991: 161-165
1980 – 1989
- 1989
- [c6]Michael Gössel, J. Saedler:
Parallel computing of line-codings by use of a display processor system and the parallel determination of a discrete curvature. Recent Issues in Pattern Analysis and Recognition 1989: 29-41 - [c5]Rolf-Jürgen Vilser, Reiner Creutzburg, Hans-Jörg Grundmann, Michael Gössel:
Parallel matrix multiplication on an array-logical processor. Recent Issues in Pattern Analysis and Recognition 1989: 72-78 - [c4]Wolfgang Luth, Michael Gössel:
Linear image operations on the A6472 image processing system by use of the residue arithmetics. Recent Issues in Pattern Analysis and Recognition 1989: 162-168 - [c3]Michael Gössel, Burghard Rebel:
Parallel Access, to rectangles. Recent Issues in Pattern Analysis and Recognition 1989: 201-213 - 1988
- [j17]Wolfgang Luth, Rolf-Jürgen Vilser, Norbert Eichhorn, Michael Gössel:
Bitgenaue schnelle Arithmethik mit dem Bildverarbeitunssystem BVS A 6472. Angew. Inform. 30(3): 110-115 (1988) - [c2]Michael Gössel, V. V. Kaversnev, Burghard Rebel:
Parallel memories for straight line and rectangle access. Parcella 1988: 89-109 - 1987
- [c1]Michael Gössel, R. Rebel:
Memories for Parallel Subtree-Access. Parallel Algorithms and Architectures 1987: 122-130 - 1985
- [j16]Ferdinand Börner, Reinhard Pöschel, Michael Gössel:
Sets of Permutations and Their Realization by Permutation Networks. J. Inf. Process. Cybern. 21(7/8): 331-342 (1985) - 1983
- [j15]Michael Gössel:
Bemerkung über die Existenz von Signaturregistern zur Erkennung geradzahliger Fehler. Elektron. Rechenanlagen 25(5): 233 (1983) - 1980
- [j14]Michael Gössel, Reinhard Pöschel:
Invariant Relations for Automata - A Proposal. J. Inf. Process. Cybern. 16(4): 147-169 (1980)
1970 – 1979
- 1977
- [j13]Michael Gössel, Heinz D. Modrow:
Verallgemeinerte Superposition bei binären Automaten. Acta Cybern. 3(2): 163-171 (1977) - [j12]Michael Gössel, Reinhard Pöschel:
On the Characterization of Linear and Linearizable Automata by a Superposition Principle. Math. Syst. Theory 11: 61-76 (1977) - 1975
- [j11]Michael Gössel, Heinz D. Modrow:
Ein verallgemeinertes Superpositionsprinzig für binäre Automaten. J. Inf. Process. Cybern. 11(10-12): 630-631 (1975) - 1973
- [j10]Michael Gössel:
Über stabile Umkehrautomaten linearer Automaten. J. Inf. Process. Cybern. 9(1/2): 49-60 (1973) - [j9]Heinz D. Modrow, Michael Gössel:
Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten I. J. Inf. Process. Cybern. 9(7/8): 433-454 (1973) - [j8]Heinz D. Modrow, Michael Gössel:
Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten II. J. Inf. Process. Cybern. 9(9): 549-567 (1973) - 1972
- [j7]Michael Gössel, Hans-Volker Pürschel:
Über Momente der Autokorrelationsfunktion eines Zeichens. J. Inf. Process. Cybern. 8(1): 49-53 (1972) - [j6]Michael Gössel, Heinz D. Modrow:
Zur Realisierung stochastischer Automaten aus Zufallsgeneratoren und determinierten Automaten. J. Inf. Process. Cybern. 8(6/7): 325-333 (1972) - 1971
- [j5]K. Bellmann, Michael Gössel:
Versuch einer automatentheoretischen Beschreibung von Selektionsprozessen. Acta Cybern. 1(2): 93-96 (1971) - [j4]Michael Gössel:
Über die Reduktion eines erweiterten linearen Automaten. J. Inf. Process. Cybern. 7(1): 49-52 (1971) - [j3]Michael Gössel:
Zur minimalen Modellbildung bei linearen diskreten Systemen. J. Inf. Process. Cybern. 7(5/6): 355-369 (1971) - 1970
- [j2]Michael Gössel:
Abstandsmatrix eines Zeichens. J. Inf. Process. Cybern. 6(3): 145-153 (1970)
1960 – 1969
- 1969
- [j1]Michael Gössel:
Ein Algorithmus für die Diagrammtechnik der Greenschen Funktion. J. Inf. Process. Cybern. 5(2): 127-137 (1969)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-08-08 20:11 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
