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2010 – 2019
- 2012
[j9]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
:
Physical-Defect Modeling and Optimization for Fault-Insertion Test. IEEE Trans. Very Large Scale Integr. Syst. 20(4): 723-736 (2012)- [c15]Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty:
Diagnostic system based on support-vector machines for board-level functional diagnosis. ETS 2012: 1-6 - 2011
- [c14]Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu:
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. ITC 2011: 1-9 - 2010
- [j8]Seongmoon Wang, Wenlong Wei, Zhanglei Wang:
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. IEEE Trans. Very Large Scale Integr. Syst. 18(12): 1672-1685 (2010) - [c13]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test. Asian Test Symposium 2010: 429-432 - [c12]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Board-level fault diagnosis using an error-flow dictionary. ITC 2010: 485-494 - [c11]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Board-level fault diagnosis using Bayesian inference. VTS 2010: 244-249
2000 – 2009
- 2009
- [j7]Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek:
Deviation-Based LFSR Reseeding for Test-Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 259-271 (2009) - [j6]Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang:
Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(8): 1251-1264 (2009) - [c10]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Physical defect modeling for fault insertion in system reliability test. ITC 2009: 1-10 - 2008
- [j5]Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault:
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electron. Test. 24(4): 353-364 (2008) - [j4]Zhanglei Wang, Krishnendu Chakrabarty:
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 352-365 (2008) - [j3]Zhanglei Wang, Krishnendu Chakrabarty:
Test Data Compression Using Selective Encoding of Scan Slices. IEEE Trans. Very Large Scale Integr. Syst. 16(11): 1429-1440 (2008) - 2007
- [j2]Zhanglei Wang, Krishnendu Chakrabarty:
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. J. Electron. Test. 23(2-3): 145-161 (2007) - [j1]Lei Li, Zhanglei Wang, Krishnendu Chakrabarty:
Scan-BIST based on cluster analysis and the encoding of repeating sequences. ACM Trans. Design Autom. Electr. Syst. 12(1): 4:1-4:21 (2007) - [c9]Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang:
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. DATE 2007: 201-206 - [c8]Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek:
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. ETS 2007: 125-130 - [c7]Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar:
A low cost test data compression technique for high n-detection fault coverage. ITC 2007: 1-10 - 2006
- [c6]Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Serge Pravossoudovitch, Christian Landrault:
Power-Aware Test Data Compression for Embedded IP Cores. ATS 2006: 5-10 - [c5]Zhanglei Wang, Krishnendu Chakrabarty:
An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time. ATS 2006: 333-338 - [c4]Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel:
Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE 2006: 1270-1275 - 2005
- [c3]Zhanglei Wang, Krishnendu Chakrabarty:
Built-in self-test of molecular electronics-based nanofabrics. ETS 2005: 168-173 - [c2]Zhanglei Wang, Krishnendu Chakrabarty:
Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. ITC 2005: 10 - [c1]Zhanglei Wang, Krishnendu Chakrabarty:
Test data compression for IP embedded cores using selective encoding of scan slices. ITC 2005: 10
Coauthor Index
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