"A Low Overhead High Test Compression Technique Using Pattern Clustering ..."

Seongmoon Wang, Wenlong Wei, Zhanglei Wang (2010)

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DOI: 10.1109/TVLSI.2009.2026420

access: closed

type: Journal Article

metadata version: 2020-03-11

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Seongmoon Wang, Wenlong Wei, Zhanglei Wang:
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. IEEE Trans. Very Large Scale Integr. Syst. 18(12): 1672-1685 (2010)

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