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"A Multi-Mode Scannable Memory Element for High Test Application Efficiency ..."

Egor S. Sogomonyan, Adit D. Singh, Michael Gössel (1999)

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DOI: 10.1023/A:1008328101088

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - journals/et/SogomonyanSG99
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  - https://dblp.org/rec/journals/et/SogomonyanSG99
Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electron. Test. 15(1-2): 87-96 (1999)

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