- Shyue-Kung Lu, Zhi-Jia Liu, Masaki Hashizume:
Fault Securing Techniques for Yield and Reliability Enhancement of RRAM. ATS 2022: 13-18 - Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich:
Online Periodic Test of Reconfigurable Scan Networks. ATS 2022: 78-83 - Ankush Mamgain, Salvador Mir, Jai Narayan Tripathi
, Manuel J. Barragán:
On-chip calibration for high-speed harmonic cancellation-based sinusoidal signal generators. ATS 2022: 43-48 - Xiaofan Nie, Liwei Chen, Gang Shi:
PointerChecker: Tag-Based and Hardware-Assisted Memory Safety against Memory Corruption. ATS 2022: 96-101 - Masao Ohmatsu, Yuto Ohtera, Yuki Ikiri, Hiroyuki Yotsuyanagi, Shyue-Kung Lu, Masaki Hashizume:
Enhanced Interconnect Test Method for Resistive Open Defects in Final Tests with Relaxation Oscillators. ATS 2022: 49-53 - Irith Pomeranz:
Two-Dimensional Test Generation Objective. ATS 2022: 108-113 - Irith Pomeranz:
Selecting Path Delay Faults Through the Largest Subcircuits of Uncovered Lines. ATS 2022: 114-119 - Irith Pomeranz:
Usable Circuits with Imperfect Scan Logic. ATS 2022: 156-161 - Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. ATS 2022: 37-42 - Sying-Jyan Wang
, Katherine Shu-Min Li, Chen-Yeh Lin, Song-Kong Chong:
Intrusion Detection and Obfuscation Mechanism for PUF-Based Authentication. ATS 2022: 90-95 - Aibin Yan, Liang Ding, Zhen Zhou, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen:
A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage. ATS 2022: 1-6 - Shih-Chun Yeh, Kuen-Jong Lee, Dong-Yi Chen:
An Authentication-Based Secure IJTAG Network. ATS 2022: 25-30 - Weidong Zhu, Jianhui Jiang, Zhanhui Shi
:
Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model. ATS 2022: 7-12 - IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022. IEEE 2022, ISBN 978-1-6654-7227-2 [contents]
- 2021
- Felipe Almeida, Levent Aksoy
, Jaan Raik, Samuel Pagliarini:
Side-Channel Attacks on Triple Modular Redundancy Schemes. ATS 2021: 79-84 - Hung-Yao Chi, Kuen-Jong Lee, Tzu-Chun Jao:
Lightweight Hardware-Based Memory Protection Mechanism on IoT Processors. ATS 2021: 13-18 - William Souza da Cruz
, Raphael Andreoni Camponogara Viera
, Jean-Max Dutertre, Jean-Baptiste Rigaud
, Guillaume Hubert:
Further Analysis of Laser-induced IR-drop. ATS 2021: 91-96 - Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Tobias Faller, Tobias Paxian, Bernd Becker
, Matteo Sonza Reorda
:
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor. ATS 2021: 73-78 - Itsuki Fujita
, Yoshikazu Nagamura, Masayuki Arai, Satoshi Fukumoto:
Note on CapsNet-Based Wafer Map Defect Pattern Classification. ATS 2021: 37-42 - Arne Grünhagen
, Julien Branlard, Annika Eichler, Gianluca Martino
, Görschwin Fey
, Marina Tropmann-Frick:
Fault Analysis of the Beam Acceleration Control System at the European XFEL using Data Mining. ATS 2021: 61-66 - Juan-David Guerrero-Balaguera
, Josie E. Rodriguez Condia
, Matteo Sonza Reorda
:
A Novel Compaction Approach for SBST Test Programs. ATS 2021: 67-72 - Mousum Handique, Jantindra Kumar Deka, Santosh Biswas:
Detection of Stuck-at and Bridging Fault in Reversible Circuits using an Augmented Circuit. ATS 2021: 55-60 - Stefan Holst, Lim Bumun, Xiaoqing Wen:
GPU-Accelerated Timing Simulation of Systolic-Array-Based AI Accelerators. ATS 2021: 127-132 - Hideyuki Ichihara, Kazunori Yukihiro, Tomoo Inoue:
A Design of Approximate Voting Schemes for Fail-Operational Systems. ATS 2021: 121-126 - Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
A Power Reduction Method for Scan Testing in Ultra-Low Power Designs. ATS 2021: 141 - Shogo Katayama, Yudai Abe, Anna Kuwana, Koji Asami, Masahiro Ishida, Ryuya Ohta, Haruo Kobayashi:
Application of Residue Sampling to RF/AMS Device Testing. ATS 2021: 19-24 - Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz:
On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. ATS 2021: 103-108 - Ning Lin, Xiaoming Chen, Chunwei Xia, Jing Ye, Xiaowei Li:
ChaoPIM: A PIM-based Protection Framework for DNN Accelerators Using Chaotic Encryption. ATS 2021: 1-6 - Alireza Mahzoon, Rolf Drechsler
:
Polynomial Formal Verification of Prefix Adders. ATS 2021: 85-90 - Irith Pomeranz:
Positive and Negative Extra Clocking of LFSR Seeds for Reduced Numbers of Stored Tests. ATS 2021: 109-114