"A Power Reduction Method for Scan Testing in Ultra-Low Power Designs."

Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (2021)

> Home

Details and statistics

DOI: 10.1109/ATS52891.2021.00037

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ats/IwataMM21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/IwataMM21
Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
A Power Reduction Method for Scan Testing in Ultra-Low Power Designs. ATS 2021: 141

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.