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2020 – today
- 2025
[j8]Yuhao Zhou, Jianhui Jiang
, Zhenxue He, Ying Zhang, Chengcheng Chen, Zhanhui Shi, Wei Zhang, Keying Yang:
An Efficient Area and Reliability Optimization Method for MPRM Circuits Based on High-dimensional Genetic Algorithm. ACM Trans. Design Autom. Electr. Syst. 30(2): 31:1-31:22 (2025)- 2024
- [j7]Zhanhui Shi, Jie Xiao, Weidong Zhu, Jianhui Jiang:
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits. IEEE Trans. Computers 73(1): 123-137 (2024) - [j6]Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou:
ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(8): 2479-2492 (2024) - [j5]Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou:
Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 2319-2323 (2024) - 2022
- [j4]Jie Xiao, Zhanhui Shi, Xuhua Yang, Jungang Lou:
BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Trans. Computers 71(5): 1063-1076 (2022) - [c1]Weidong Zhu, Jianhui Jiang, Zhanhui Shi:
Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model. ATS 2022: 7-12
2010 – 2019
- 2019
- [j3]Jie Xiao, Weifeng Ma, Jungang Lou, Jianhui Jiang, Yujiao Huang, Zhanhui Shi, Qing Shen, Xuhua Yang:
Circuit reliability prediction based on deep autoencoder network. Neurocomputing 370: 140-154 (2019) - [j2]Jie Xiao, Zhanhui Shi, Jianhui Jiang, Xu-Hua Yang, Yujiao Huang, Haigen Hu:
A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm. J. Comput. Sci. Technol. 34(5): 1136-1151 (2019) - 2018
- [j1]Jie Xiao, Jianhui Jiang, Xiaoxin Li, Yujiao Huang, Xuhua Yang, Zhanhui Shi, Jungang Lou:
A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model. IEEE Access 6: 35683-35696 (2018)
Coauthor Index
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