"Identifying Reliability High-Correlated Gates of Logic Circuits With ..."

Zhanhui Shi et al. (2024)

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DOI: 10.1109/TCSII.2023.3334390

access: closed

type: Journal Article

metadata version: 2024-04-15

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Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou:
Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 2319-2323 (2024)

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