"A Reliability-Critical Path Identifying Method With Local and Global ..."

Zhanhui Shi et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TC.2023.3323772

access: closed

type: Journal Article

metadata version: 2024-01-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tc/ShiXZJ24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/ShiXZJ24
Zhanhui Shi, Jie Xiao, Weidong Zhu, Jianhui Jiang:
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits. IEEE Trans. Computers 73(1): 123-137 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.