"Locating Critical-Reliability Gates for Sequential Circuits based on the ..."

Weidong Zhu, Jianhui Jiang, Zhanhui Shi (2022)

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DOI: 10.1109/ATS56056.2022.00014

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Weidong Zhu, Jianhui Jiang, Zhanhui Shi:
Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model. ATS 2022: 7-12

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